Abstract: The present invention discloses a SAADC circuit having optimized linearity. A lower-bit capacitor array includes lower-bit capacitors. A higher-bit capacitor array includes unit capacitors. In an initializing mode, a control circuit sorts the unit capacitors according to unit capacitances thereof such that the unit capacitors are configured to be higher-bit capacitors having a linearity parameter within a predetermined range. In an operation mode, the capacitor array receives an analog input signal and a reference voltage to generate an analog output signal, a comparator generates a comparison result according to the analog output signal and the control circuit generates an enabling signal according to the comparison result based on the successive approximation mechanism to selectively enable the higher-bit and the lower-bit capacitors to connect to the reference voltage by using the capacitor enabling circuit and outputs a digital output signal according to the final comparison result.

Abstract: A voltage regulation integrated circuit (IC) includes a first transistor, a feedback circuit, a bias circuit, an amplifier circuit, and a transient coupling circuit. The first transistor is configured to generate an output voltage according to an input voltage and a control voltage. The feedback circuit is configured to generate a feedback voltage according to the output voltage. The output voltage includes an AC component. The bias circuit is configured to generate a first bias voltage. The amplifier circuit is configured to generate the control voltage according to the first bias voltage and the feedback voltage. The transient coupling circuit is configured to generate a coupling voltage according to the AC component and to assist the change of the first bias voltage according to the coupling voltage, so that the output voltage is maintained at a voltage level.

Abstract: The present invention discloses a programmable gain amplifier having mode-switching mechanism. An operational amplifier includes a first input terminal, a second input terminal and an output terminal. The second input terminal is coupled to a ground terminal. The output terminal generates an output signal. A variable resistor and a first switch are coupled in series between a first terminal and a second terminal that coupled to the first input terminal. A first variable capacitor and a second switch are coupled in series between the first terminal and the second terminal. A second variable capacitor and a third switch are coupled in series between the first terminal and the ground terminal. A low-pass resistor and a low-pass capacitor are coupled in parallel between the first input terminal and the output terminal. An input resistor is coupled between a signal input terminal and the first terminal to receive an input signal from the signal input terminal.

Abstract: An electronic package structure and a chip thereof are provided. The electronic package structure includes a supporting element, a chip, an internal bonding wire, and a plurality of external bonding wires. The supporting element has a chip arrangement portion. The chip has a first surface and a second surface opposite to the first surface. The chip is arranged on the chip arrangement portion with the second surface facing toward the supporting element. The chip includes a first common pad and an individual core pad that are disposed on the first surface. The internal bonding wire is connected between the first common pad and the individual core pad. The external bonding wires are connected between the chip and the supporting element, in which a first external bonding wire of the external bonding wires and the internal bonding wire are jointly connected to the first common pad.

Abstract: A method of operating an analog-to-digital converter includes in a first conversion period, a comparator generating a first comparison result, a first selection circuit switching a voltage output to a first capacitor of a set of larger capacitor of a first capacitor array, and a second selection circuit switching a voltage output to a second capacitor of a set of larger capacitor of a second capacitor array, and in a second conversion period after the first conversion period, the comparator generating a second comparison result different from the first comparison result, the first selection circuit switching back the voltage output to a first capacitor portion of the first capacitor of the set of larger capacitor of the first capacitor array, and the second selection circuit switching back the voltage output to a first capacitor portion of the second capacitor of the set of larger capacitor of the second capacitor array.

Abstract: An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

Abstract: Disclosed is a voltage reference buffer circuit including a first, second, third, and fourth bias generators and a first, second, third, and fourth driving components. The first, second, third, and fourth bias generators generate bias voltages to control the first, second, third, and fourth driving components respectively. The first, second, third, and fourth driving components are coupled in sequence, wherein the first and second driving components are different types of transistors and jointly output a first reference voltage, the third and fourth driving components are different types of transistors and jointly output a second reference voltage, and the group of the first and second driving components is separated from the group of the third and fourth driving components by a resistance load.

Abstract: A method of operating an analog-to-digital converter includes in a first conversion period, a comparator generating a first comparison result, a first selection circuit switching a voltage output to a first capacitor of a set of larger capacitor of a first capacitor array, and a second selection circuit switching a voltage output to a second capacitor of a set of larger capacitor of a second capacitor array, and in a second conversion period after the first conversion period, the comparator generating a second comparison result different from the first comparison result, the first selection circuit switching back the voltage output to a first capacitor portion of the first capacitor of the set of larger capacitor of the first capacitor array, and the second selection circuit switching back the voltage output to a first capacitor portion of the second capacitor of the set of larger capacitor of the second capacitor array.

Abstract: An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

Abstract: A pipeline analog to digital converter (ADC) includes converter circuitries, a detector circuitry, and a clock generator circuit. The converter circuitries sequentially convert an input signal to be digital codes. One of the converter circuitries includes a sub-ADC circuit and a multiplying digital to analog converter (MDAC) circuit. The sub-ADC circuit performs a quantization according to a first signal to generate a corresponding one of the digital codes, in which the first signal is the input signal or a previous stage residue signal. The MDAC circuit processes the corresponding one of the digital codes in response to a first clock signal, in order to generate a current stage residue signal. The detector circuitry detects whether the quantization is complete, in order to generate a control signal. The clock generator circuit adjusts a timing of the first clock signal according to the control signal.

Abstract: A method of operating an analog-to-digital converter includes in a first sampling stage, switching a swap signal to a first level for a first selection circuit to reset a first capacitor array according to a first voltage configuration and for a second selection circuit to reset a second capacitor array according to the first voltage configuration, and in a second sampling stage, switching the swap signal to a second level for the first selection circuit to reset the first capacitor array according to the second voltage configuration and for the second selection circuit to reset the second capacitor array according to the second voltage configuration. A control logic circuit is used to switch the swap signal between the first level and the second level in a uniform order in a plurality of sampling stages.

Abstract: A control circuit of a pipeline analog-to-digital converter (ADC) is provided. The pipeline ADC includes a multiplying digital-to-analog converter (MDAC) which includes a capacitor. The control circuit includes six switches and two buffer circuits. The first and second switches are respectively coupled between one end of the capacitor and the first and second reference voltages. The output terminals of the first and second buffer circuits are respectively coupled to the first and second switches. The input terminal of the first buffer circuit is coupled to the third reference voltage through the third switch, or receives a control signal through the fifth switch. The input terminal of the second buffer circuit is coupled to the fourth reference voltage through the fourth switch, or receives the control signal through the sixth switch. The first and second reference voltages are different, and the first and second switches are not turned on simultaneously.

Abstract: A method of operating an analog-to-digital converter includes in a first sampling stage, switching a swap signal to a first level for a first selection circuit to reset a first capacitor array according to a first voltage configuration and for a second selection circuit to reset a second capacitor array according to the first voltage configuration, and in a second sampling stage, switching the swap signal to a second level for the first selection circuit to reset the first capacitor array according to the second voltage configuration and for the second selection circuit to reset the second capacitor array according to the second voltage configuration. A control logic circuit is used to switch the swap signal between the first level and the second level in a uniform order in a plurality of sampling stages.

Abstract: A flash analog to digital converter includes double differential comparator circuits and a calibration circuit. Each double differential comparator circuit compares a first input signal with a corresponding voltage in a first set of reference voltages, and compares a second input signal with a corresponding voltage in a second set of reference voltages, in order to generate a corresponding signal in first signals. The calibration circuit outputs a first test signal to be the first input signal and outputs a second test signal to be the second input signal in a test mode, and calibrates a common mode level of each of the first input signal and the second input signal, or calibrates at least one first reference voltage in the first set of reference voltages and at least one second reference voltage in the second set of reference voltages according to a distribution of the first signals.

Abstract: A control circuit of a pipeline analog-to-digital converter (ADC) is provided. The pipeline ADC includes a multiplying digital-to-analog converter (MDAC) which includes a capacitor. The control circuit includes six switches and two buffer circuits. The first and second switches are respectively coupled between one end of the capacitor and the first and second reference voltages. The output terminals of the first and second buffer circuits are respectively coupled to the first and second switches. The input terminal of the first buffer circuit is coupled to the third reference voltage through the third switch, or receives a control signal through the fifth switch. The input terminal of the second buffer circuit is coupled to the fourth reference voltage through the fourth switch, or receives the control signal through the sixth switch. The first and second reference voltages are different, and the first and second switches are not turned on simultaneously.

Abstract: A pipeline analog to digital converter (ADC) includes converter circuitries, a detector circuitry, and a clock generator circuit. The converter circuitries sequentially convert an input signal to be digital codes. One of the converter circuitries includes a sub-ADC circuit and a multiplying digital to analog converter (MDAC) circuit. The sub-ADC circuit performs a quantization according to a first signal to generate a corresponding one of the digital codes, in which the first signal is the input signal or a previous stage residue signal. The MDAC circuit processes the corresponding one of the digital codes in response to a first clock signal, in order to generate a current stage residue signal. The detector circuitry detects whether the quantization is complete, in order to generate a control signal. The clock generator circuit adjusts a timing of the first clock signal according to the control signal.

Abstract: A flash analog to digital converter includes double differential comparator circuits and a calibration circuit. Each double differential comparator circuit compares a first input signal with a corresponding voltage in a first set of reference voltages, and compares a second input signal with a corresponding voltage in a second set of reference voltages, in order to generate a corresponding signal in first signals. The calibration circuit outputs a first test signal to be the first input signal and outputs a second test signal to be the second input signal in a test mode, and calibrates a common mode level of each of the first input signal and the second input signal, or calibrates at least one first reference voltage in the first set of reference voltages and at least one second reference voltage in the second set of reference voltages according to a distribution of the first signals.

Abstract: Disclosed is a voltage reference buffer circuit including a first, second, third, and fourth bias generators and a first, second, third, and fourth driving components. The first, second, third, and fourth bias generators generate bias voltages to control the first, second, third, and fourth driving components respectively. The first, second, third, and fourth driving components are coupled in sequence, wherein the first and second driving components are different types of transistors and jointly output a first reference voltage, the third and fourth driving components are different types of transistors and jointly output a second reference voltage, and the group of the first and second driving components is separated from the group of the third and fourth driving components by a resistance load.

Abstract: A filter can perform two filtering processes. The filter includes a switching circuit, a first filter circuit, and a second filter circuit. The first filter circuit is coupled to the switching circuit. The second filter circuit is coupled to the switching circuit. The first filter circuit performs a first filtering process on an input signal according to a state of the switching circuit. The first filter circuit and the second filter circuit work together to perform a second filtering process on the input signal according to the state of the switching circuit.

Abstract: A filter includes a switching circuit, a first filter circuit, and a second filter circuit. The first filter circuit is coupled to the switching circuit. The second filter circuit is coupled to the switching circuit. The switching circuit is controlled to control the first filter circuit to perform a first filtering process on an input signal or control the first filter circuit to work in coordination with the second filter circuit to perform a second filtering process on the input signal.