Abstract: A semiconductor memory device comprises a memory cell array and a control circuit. The memory cell array has a plurality of memory cells arranged in rows and columns. The memory cells store data and are selected according to address signals. The control circuit is configured to receive a clock signal and a first control signal, and output a plurality of data in response to the clock signal after the first control signal is asserted. After the first control signal is asserted, an internal signal which responds to the clock signal transits N times (N is a positive integer and greater than or equal to 2), then output of the data is started. At least one of the data is output at the transition after the output begins.

Abstract: The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite operation, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Abstract: A semiconductor memory device comprises a memory cell array and a control circuit. The memory cell array has a plurality of memory cells arranged in rows and columns. The memory cells store data and are selected according to address signals. The control circuit is configured to receive a clock signal and a first control signal, and output a plurality of data in response to the clock signal after the first control signal is asserted. After the first control signal is asserted, an internal signal which responds to the clock signal transits N times (N is a positive integer and greater than or equal to 2), then output of the data is started. At least one of the data is output at the transition after the output begins.

Abstract: A semiconductor memory device comprises a memory cell array and a control circuit. The memory cell array has a plurality of memory cells arranged in rows and columns. The memory cells store data and are selected according to address signals. The control circuit is configured to receive a clock signal and a first control signal, and output a plurality of data in response to the clock signal after the first control signal is asserted. After the first control signal is asserted, an internal signal which responds to the clock signal transits N times (N is a positive integer and greater than or equal to 2), then output of the data is started. At least one of the data is output at the transition after the output begins.

Abstract: The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite operation, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Abstract: A semiconductor memory device is disclosed, which includes a memory cell array including memory cells arranged in rows and columns, a word line, a bit line, a row decoder and a column decoder, a sense amplifier provided for each of the columns of the memory cell array, a write latch circuit configured to store externally input data and sets data of one row of the memory cell array in the sense amplifiers in test mode, a read latch circuit configured to store data of one row, which is read from the memory cell array and set in the sense amplifiers in test mode, a first comparison circuit configured to compare the data stored in the write latch circuit and the data stored in the read latch circuit, and a first comparison result register configured to store a comparison result of the first comparison circuit.

Abstract: The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Abstract: A semiconductor memory device is disclosed, which comprises a memory cell array including memory cells arranged in rows and columns, a word line, a bit line, a row decoder and a column decoder, a sense amplifier provided for each of the columns of the memory cell array, a write latch circuit configured to store externally input data and sets data of one row of the memory cell array in the sense amplifiers in test mode, a read latch circuit configured to store data of one row, which is read from the memory cell array and set in the sense amplifiers in test mode, a first comparison circuit configured to compare the data stored in the write latch circuit and the data stored in the read latch circuit, and a first comparison result register configured to store a comparison result of the first comparison circuit.

Abstract: A semiconductor device includes first to third functional areas parted each other by a boundary region on a semiconductor substrate. A memory block is formed in the first functional area and includes memory cells and a redundancy memory cell substituted for one memory cell. A functional circuit block is formed in the second functional area and connected with the memory block via an interconnection line. A program interconnection block is formed in the third functional area so that it does not overlap with the interconnection line and includes a program interconnection section which forms a program forming a signal path so that a defective memory cell is substituted by the redundancy memory cell. A data transfer section extends over from the program interconnection block to the memory block and transfers program information relevant to the program of the program interconnection section to the memory block.

Abstract: The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Abstract: The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Abstract: A semiconductor device includes first to third functional areas parted each other by a boundary region on a semiconductor substrate. A memory block is formed in the first functional area and includes memory cells and a redundancy memory cell substituted for one memory cell. A functional circuit block is formed in the second functional area and connected with the memory block via an interconnection line. A program interconnection block is formed in the third functional area so that it does not overlap with the interconnection line and includes a program interconnection section which forms a program forming a signal path so that a defective memory cell is substituted by the redundancy memory cell. A data transfer section extends over from the program interconnection block to the memory block and transfers program information relevant to the program of the program interconnection section to the memory block.

Abstract: A method of accessing a semiconductor device that operates in synchronism with a clock signal, including fetching information indicating a memory cell location in a memory cell array in synchronism with the clock signal, determining first data of a plurality of data to be transferred sequentially, decoding the information indicating the memory cell location in the memory cell array and designating the memory cell, receiving data stored in the memory cell designated by the information indicating the memory cell location in the memory cell array in synchronism with the clock signal after a predetermined number of cycles of the clock signal, and outputting a plurality of data stored in the memory cells in synchronism with the clock signal and storing a plurality of input data in the memory cells in synchronism with the clock signal.

Abstract: A method of accessing a semiconductor device that operates in synchronism with a clock signal, including fetching information indicating a memory cell location in a memory cell array in synchronism with the clock signal, determining first data of a plurality of data to be transferred sequentially, decoding the information indicating the memory cell location in the memory cell array and designating the memory cell, receiving data stored in the memory cell designated by the information indicating the memory cell location in the memory cell array in synchronism with the clock signal after a predetermined number of cycles of the clock signal, and outputting a plurality of data stored in the memory cells in synchronism with the clock signal and storing a plurality of input data in the memory cells in synchronism with the clock signal.

Abstract: A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for enterring them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic cl

Abstract: A semiconductor device includes a memory cell array, a counting section, a control section, a specification section and a data input/output section. The counting section configured to count transition of the clock signal and determine first data of a plurality of data to be transferred sequentially. The control section configured to fetch information indicating a memory cell location in the memory cell array in response to a counting result of the counting section and control consecutive input and output of a plurality of data stored in the memory cell array every cycle of the clock signal. The specification section configured to decode the information fetched by the control section and designate a memory cell in the memory cell array. The data input/output section configured to input data to or output data from the memory cell designated by the specification section, wherein input and output of the data are time-shared.

Abstract: A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix: a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for enterring them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the Consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic cl

Abstract: A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for entering them in an active state; a data input/output (I/O) circuit .

Abstract: A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for enterring them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic cl

Abstract: A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for enterring them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic cl