Abstract: A method for positioning a body that has a surface extending along a circular arc, includes: attaching the body to a machine part that is capable of swiveling; attaching a stationary, first distance gauge; attaching a stationary, second distance gauge; determining three first distance values and three second distance values at three defined angular positions of the machine part different from each other; calculating a first offset value, based on the three first distance values and the corresponding angular positions, and a second offset value, based on the three second distance values and the corresponding angular positions; shifting the body relative to the machine part, until the first offset value is determined by the first distance gauge and the second offset value is determined by the second distance gauge within permissible tolerances.

Abstract: A method for positioning a body that has a surface extending along a circular arc, includes: attaching the body to a machine part that is capable of swiveling; attaching a stationary, first distance gauge; attaching a stationary, second distance gauge; determining three first distance values and three second distance values at three defined angular positions of the machine part different from each other; calculating a first offset value, based on the three first distance values and the corresponding angular positions, and a second offset value, based on the three second distance values and the corresponding angular positions; shifting the body relative to the machine part, until the first offset value is determined by the first distance gauge and the second offset value is determined by the second distance gauge within permissible tolerances.

Abstract: An optical position-measurement device includes a reflection measuring standard and a scanning unit, which is movable in relation thereto in at least one measurement direction. The reflection measuring standard has an incremental measuring graduation and a reference marking in at least one reference position. In addition to scanning device(s) for the incremental signal generation, the scanning unit includes for the reference signal generation at least one light source, imaging optics, a diaphragm structure arranged in a diaphragm plane, and a plurality of detector elements. Via the imaging optics, imaging of the reference marking onto the diaphragm structure is implemented. The reference marking is provided on the reflection measuring standard and is integrated into the incremental measuring graduation. In addition, the imaging optics has a variable, object-side focal length along a transversal direction oriented perpendicular to the measurement direction.

Abstract: An optical position-measurement device includes a reflection measuring standard and a scanning unit, which is movable in relation thereto in at least one measurement direction. The reflection measuring standard has an incremental measuring graduation and a reference marking in at least one reference position. In addition to scanning device(s) for the incremental signal generation, the scanning unit includes for the reference signal generation at least one light source, imaging optics, a diaphragm structure arranged in a diaphragm plane, and a plurality of detector elements. Via the imaging optics, imaging of the reference marking onto the diaphragm structure is implemented. The reference marking is provided on the reflection measuring standard and is integrated into the incremental measuring graduation. In addition, the imaging optics has a variable, object-side focal length along a transversal direction oriented perpendicular to the measurement direction.

Abstract: In an optical position measuring device for the interferential determination of the relative distance of two objects which are movable relative to each other in at least one measuring direction, a bundle of rays emitted by a light source is split up into at least two partial bundles of rays, which fall on a grating or a plurality of gratings on separate optical paths and undergo distance-dependent phase shifts as a result. The partial bundles of rays are superpositioned at a mixing grating, whereupon at least three pairs of interfering partial bundles of rays propagate in different directions in space. Via the mixing grating, each pair of interfering partial bundles of rays is focused on a detector element so that at least three position-dependent, phase-shifted incremental signals are detectable via the detector elements.

Abstract: In an optical position measuring device for the interferential determination of the relative distance of two objects which are movable relative to each other in at least one measuring direction, a bundle of rays emitted by a light source is split up into at least two partial bundles of rays, which fall on a grating or a plurality of gratings on separate optical paths and undergo distance-dependent phase shifts as a result. The partial bundles of rays are superpositioned at a mixing grating, whereupon at least three pairs of interfering partial bundles of rays propagate in different directions in space. Via the mixing grating, each pair of interfering partial bundles of rays is focused on a detector element so that at least three position-dependent, phase-shifted incremental signals are detectable via the detector elements.

Abstract: An optical position-measuring device for sensing a position of two relatively movable objects includes a scale connected to one object and having a measuring graduation. A scanning unit is disposed on the other object and has optical elements. An arrangement and design of the optical elements of the scanning unit results in a scanning beam path in which split and subsequently interfered sub-beams propagate mirror-symmetrically with respect to a plane of symmetry and either impinge on and/or are reflected back from the scale in a V-shape. The plane of symmetry is tilted by a defined tilt angle relative to the scale about an axis of rotation that is oriented parallel to a surface of the scale and extends perpendicular to the graduation direction. The sub-beams that are interfered are deflected at the measuring graduation into symmetric diffraction orders. The sub-beams travel identical optical path lengths between splitting and recombination.

Abstract: An optical position-measuring device for sensing a position of two relatively movable objects includes a scale connected to one object and having a measuring graduation. A scanning unit is disposed on the other object and has optical elements. An arrangement and design of the optical elements of the scanning unit results in a scanning beam path in which split and subsequently interfered sub-beams propagate mirror-symmetrically with respect to a plane of symmetry and either impinge on and/or are reflected back from the scale in a V-shape. The plane of symmetry is tilted by a defined tilt angle relative to the scale about an axis of rotation that is oriented parallel to a surface of the scale and extends perpendicular to the graduation direction. The sub-beams that are interfered are deflected at the measuring graduation into symmetric diffraction orders. The sub-beams travel identical optical path lengths between splitting and recombination.

Abstract: An optical position-measuring device includes a scanning unit and a material measure that is movable relative thereto in a measuring direction. The scanning unit includes a splitting device and an optoelectronic detector arrangement. The splitting device is configured to separate sub-beams incident thereon as a function of wavelength. The splitting device is configured as an asymmetrical interferometer that includes two interferometer arms having different optical path lengths, within which the sub-beams propagate between splitting and recombination until the recombined sub-beams arrive at the detector arrangement. The optical position-measuring device is configured to generate a plurality of phase-shifted scanning signals indicative of a relative position of the scanning unit and of the material measure, wherein phase relations of the generated phase-shifted scanning signals are wavelength-dependent.

Abstract: An optical position measuring instrument including a scale and a scanning unit, wherein the scanning unit and the scale are movable with respect to one another. The scanning unit includes a detector unit, and a reflector unit that has a first and second wave front correctors and a beam direction inverter. The reflector unit is disposed so that beams first pass through the scale and the first wave front corrector, then a back-reflection of partial beams is effected in a direction of the scale, and the partial beams then pass through the scale and the second wave front corrector before the partial beams then arrive at the detector unit, wherein it is ensured that wave front deformations of the partial beams are converted into wave front deformations that compensate for resultant wave front deformations of the partial beams upon a second diffraction at the scale.

Abstract: The present invention relates to an optical position-measuring device for generating a plurality of phase-shifted scanning signals regarding the relative position of a fiber optic scanning head and a reflection measuring standard movable relative thereto in at least one measuring direction. In the fiber optic scanning head, a scanning reticle is disposed before the measuring standard end of an optical fiber. The scanning signals are coded in a wavelength-dependent manner. To this end, a beam incident on the scanning reticle is split into at least two sub-beams which strike the reflection measuring standard and are subsequently recombined to interfere with each other so as to generate the phase-shifted scanning signals. The sub-beams travel different optical path lengths between splitting and recombination.

Abstract: An optical position-measuring device includes a scanning unit and a material measure that is movable relative thereto in a measuring direction. The scanning unit includes a splitting device and an optoelectronic detector arrangement. The splitting device is configured to separate sub-beams incident thereon as a function of wavelength. The splitting device is configured as an asymmetrical interferometer that includes two interferometer arms having different optical path lengths, within which the sub-beams propagate between splitting and recombination until the recombined sub-beams arrive at the detector arrangement. The optical position-measuring device is configured to generate a plurality of phase-shifted scanning signals indicative of a relative position of the scanning unit and of the material measure, wherein phase relations of the generated phase-shifted scanning signals are wavelength-dependent.

Abstract: A position-measuring device includes a cylindrical object rotatable about a longitudinal axis and having a circumferential annular reflection measuring graduation. A stationary scanning unit is disposed opposite the cylindrical object and has a light source, a transmission grating and a detector. The scanning unit is configured to optically scan the reflection measuring graduation by beams of light emitted from the light source passing through the transmission grating and then striking the reflection measuring graduation, from where the beams of light are reflected back toward the detector, which is configured to generate rotation-dependent position signals. An optically effective perpendicular distance between the detector and the reflection measuring graduation is selected to be one of greater or less than an optically effective perpendicular distance between the transmission grating and the reflection measuring graduation depending on a radius of the cylindrical object.

Abstract: The present invention relates to an optical position-measuring device for generating a plurality of phase-shifted scanning signals regarding the relative position of a fiber optic scanning head and a reflection measuring standard movable relative thereto in at least one measuring direction. In the fiber optic scanning head, a scanning reticle is disposed before the measuring standard end of an optical fiber. The scanning signals are coded in a wavelength-dependent manner. To this end, a beam incident on the scanning reticle is split into at least two sub-beams which strike the reflection measuring standard and are subsequently recombined to interfere with each other so as to generate the phase-shifted scanning signals. The sub-beams travel different optical path lengths between splitting and recombination.

Abstract: A position-measuring device includes a cylindrical object rotatable about a longitudinal axis and having a circumferential annular reflection measuring graduation. A stationary scanning unit is disposed opposite the cylindrical object and has a light source, a transmission grating and a detector. The scanning unit is configured to optically scan the reflection measuring graduation by beams of light emitted from the light source passing through the transmission grating and then striking the reflection measuring graduation, from where the beams of light are reflected back toward the detector, which is configured to generate rotation-dependent position signals. An optically effective perpendicular distance between the detector and the reflection measuring graduation is selected to be one of greater or less than an optically effective perpendicular distance between the transmission grating and the reflection measuring graduation depending on a radius of the cylindrical object.

Abstract: A measuring device for determining the relative offset between two components in a z-direction includes two measuring members. A first measuring member is affixable on a first component, and the second measuring member is affixable on a second component. Furthermore, the measuring device includes a sensor device for determining the relative position of the two measuring members. The first measuring member and the second measuring member are affixable on the first components at a rigid angle. At least one of the measuring members is able to be brought into adhesive contact with the first component or the second component. The measuring device includes support members for at least one measuring member so that the measuring member is able to assume a parking or an operating position. The measuring members are precisely and reproducibly aligned in space relative to each other in the parking position.

Abstract: A method an optical position measuring instrument for detecting a relative position of a scanning unit and a scale. The optical position measuring instrument includes a scale and a scanning unit, wherein the scanning unit and the scale are movable with respect to one another along a curved measurement direction. The scanning unit includes a detector unit, and a reflector unit that has a first wave front corrector, a beam direction inverter and a second wave front corrector.

Abstract: An arrangement for generating phase-shifted incremental signals characterizing relative positions of two objects moving with respect to each other along a measuring direction. The measuring arrangement includes a light source emitting bundles of beams, a measurement grating, a plurality of optional gratings and a scanning unit. The scanning unit includes a grating in a scanning plane, wherein the grating includes a plurality of blocks arranged periodically along the measuring direction with a grating periodicity equaling a fringe pattern periodicity, and each block includes n grating sections arranged along the measuring direction, each of the n grating sections having a periodic grating structure, deflecting the bundles of beams propagated through each of the n grating sections in several different spatial directions.

Abstract: A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position extends. The scanning unit includes a first scanning device for generating the reference-pulse signal and a second scanning device for generating the incremental signals. To generate the incremental signals, a scanning beam acts at least once upon each incremental graduation in an incremental-signal scanning field.

Abstract: A position-measuring device for generating a reference-pulse signal at at least one reference position includes a scanning unit and also a reflection-measuring graduation displaceable relative thereto in at least one measuring direction. The scanning unit for generating the reference-pulse signal includes a plurality of optical elements, including at least one imaging optics as well as at least two diaphragm structures, which are disposed in a diaphragm plane and have a plurality of diaphragm openings in each case. Furthermore, a light source as well as at least two detector elements are assigned to the scanning unit. The reflection-measuring graduation has a reference marking at the at least one reference position. It includes at least one set of first structure elements, which is arranged in the plane of the reflection-measuring graduation, perpendicular to the measuring direction, periodically at a first transversal periodicity.