Abstract: A position measuring arrangement for detecting a relative position is disclosed. The position measuring arrangement includes a reflection scale graduation and a scanning unit having a plurality of optical elements. The plurality of optical elements includes a combining grating, a retro-reflector element, a scanning grating and detector elements. The optical elements are arranged so that light beams and/or partial light beams of a scanning beam path act on the reflection scale graduation at least twice; a directional reversal of the incident partial light beams impinging on the reflection scale graduation perpendicularly with respect to the measuring direction takes place by the retro-reflector element; and a pair of partial light beams impinges in a non-parallel manner on the combining grating, and the combining grating brings the partial light beams impinging on the combining grating to interference, so that phase-shifted signals are detected by the plurality of detector elements.

Abstract: A position-measuring device for generating a reference-pulse signal at at least one reference position includes a scanning unit and also a reflection-measuring graduation displaceable relative thereto in at least one measuring direction. The scanning unit for generating the reference-pulse signal includes a plurality of optical elements, including at least one imaging optics as well as at least two diaphragm structures, which are disposed in a diaphragm plane and have a plurality of diaphragm openings in each case. Furthermore, a light source as well as at least two detector elements are assigned to the scanning unit. The reflection-measuring graduation has a reference marking at the at least one reference position. It includes at least one set of first structure elements, which is arranged in the plane of the reflection-measuring graduation, perpendicular to the measuring direction, periodically at a first transversal periodicity.

Abstract: A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position extends. The scanning unit includes a first scanning device for generating the reference-pulse signal and a second scanning device for generating the incremental signals. To generate the incremental signals, a scanning beam acts at least once upon each incremental graduation in an incremental-signal scanning field. Alternatively, the measuring graduation includes two reference-marking tracks extending in parallel in the measuring graduation and having reference markings at least one reference position, which are formed in symmetry with an axis in the measuring direction.

Abstract: A measuring device for determining the relative offset between two components in a z-direction includes two measuring members. A first measuring member is affixable on a first component, and the second measuring member is affixable on a second component. Furthermore, the measuring device includes a sensor device for determining the relative position of the two measuring members. The first measuring member and the second measuring member are affixable on the first components at a rigid angle. At least one of the measuring members is able to be brought into adhesive contact with the first component or the second component. The measuring device includes support members for at least one measuring member so that the measuring member is able to assume a parking or an operating position. The measuring members are precisely and reproducibly aligned in space relative to each other in the parking position.

Abstract: A position-measuring device for generating a measuring signal includes a track, which has an incremental graduation having a specified graduation period that extends along a measuring direction, having at least one discontinuity of the incremental graduation at a reference position for generating a reference signal and having a scanning unit movable relative to the track along the measuring direction, for scanning the incremental graduation, the at least one discontinuity formed by a modification of a transverse substructure of the incremental graduation that extends perpendicular to the measuring direction, and that deflects radiation beams originating from the scanning unit. The deflection direction at the discontinuity deviates from the deflection direction in other regions of the incremental graduation. The scanning unit includes at least two reference-pulse detectors provided for receiving radiation beams having a different deflection direction.

Abstract: In a position measuring system and a method for operating such a position measuring system, e.g., for the purpose of producing at least one reference pulse signal, the position measuring system includes a gauge with a track in which a periodic incremental scale is disposed and extends in one direction of measurement. The track displays a discontinuity with respect to an optical property in at least one defined reference position. The position measuring system further a scanner unit that may be displaced across a predetermined measuring length relative to the gauge in the direction of measurement and that is provided, in addition to a light source, with a plurality of detector elements for the photoelectric scanning of the incremental scale. In adjacent sections of the measuring length, the incremental scale has different transverse substructures that deflect incident ray beams in first and second directions in space.

Abstract: An interferential position measuring arrangement including a light source, which emits a beam of rays and an optical element, which converts the beam of rays emitted by the light source into an incoming beam of rays. A scale grating which splits the incoming beam of rays into a first partial beam of rays and a second partial beam of rays. A first scanning grating that causes splitting of the first partial beam of rays and a second scanning grating that causes splitting of the second partial beam of rays, wherein a periodically modulated interferential fringe pattern with definite spatial interferential fringe pattern period results in a detection plane. A detection arrangement which causes splitting of light entering through the detection arrangement into at least three different spatial directions and optoelectronic detector elements arranged in the at least three spatial directions for detecting phase-shifted scanning signal.

Abstract: A position-measuring device for generating a measuring signal includes a track, which has an incremental graduation having a specified graduation period that extends along a measuring direction, having at least one discontinuity of the incremental graduation at a reference position for generating a reference signal and having a scanning unit movable relative to the track along the measuring direction, for scanning the incremental graduation, the at least one discontinuity formed by a modification of a transverse substructure of the incremental graduation that extends perpendicular to the measuring direction, and that deflects radiation beams originating from the scanning unit. The deflection direction at the discontinuity deviates from the deflection direction in other regions of the incremental graduation. The scanning unit includes at least two reference-pulse detectors provided for receiving radiation beams having a different deflection direction.

Abstract: In a position measuring system and a method for operating such a position measuring system, e.g., for the purpose of producing at least one reference pulse signal, the position measuring system includes a gauge with a track in which a periodic incremental scale is disposed and extends in one direction of measurement. The track displays a discontinuity with respect to an optical property in at least one defined reference position. The position measuring system further a scanner unit that may be displaced across a predetermined measuring length relative to the gauge in the direction of measurement and that is provided, in addition to a light source, with a plurality of detector elements for the photoelectric scanning of the incremental scale. In adjacent sections of the measuring length, the incremental scale has different transverse substructures that deflect incident ray beams in first and second directions in space.