Abstract: In a case where a dispensing tip is imaged from below, liquid attached to the tip falls downward and contaminates an imaging mechanism. An automatic analyzer includes: a buffer that has a hole for holding a tip for dispensing, the hole passing through the tip; a probe for dispensing having a tip to which the tip is attached; an imaging unit that images the tip; and a controller that controls the tip such that the tip is mounted on the probe by pressing the probe against the tip that passes through the hole to be held by the buffer, in which the imaging unit is disposed to image the tip from an upper side to a lower side in a gravity direction.

Abstract: A rocker bogie includes a first base which including a first wheel, a second wheel, and a third wheel each of which is configured to be in contact with a first flat surface, a second base including a fourth wheel which is configured to be in contact with the first flat surface, and a rotary shaft connecting the first base and the second base to each other such that the second base is rotatable with respect to the first base. The rotary shaft is parallel to a first straight line which connects a rotation center of the first wheel and a rotation center of the second wheel to each other and is disposed between a rotation center of the third wheel and the first straight line, and the fourth wheel is disposed at an opposite position to the third wheel across the first straight line.

Abstract: A rocker bogie includes a first base which including a first wheel, a second wheel, and a third wheel each of which is configured to be in contact with a first flat surface, a second base including a fourth wheel which is configured to be in contact with the first flat surface, and a rotary shaft connecting the first base and the second base to each other such that the second base is rotatable with respect to the first base. The rotary shaft is parallel to a first straight line which connects a rotation center of the first wheel and a rotation center of the second wheel to each other and is disposed between a rotation center of the third wheel and the first straight line, and the fourth wheel is disposed at an opposite position to the third wheel across the first straight line.

Abstract: A tuner receives broadcast data on specified channels. A channel search unit controls the tuner to search for available channels, and creates a channel map representing the available channels and a selection order thereof. A channel order setting unit changes setting about enabling/disabling of the selection and/or the selection order of the channels in the channel map. An operation input unit accepts a channel selecting operation of a user. When the user performs an operation for channel forward selection or channel reverse selection through the operation input unit, a channel switching unit changes the selection of the channel according to the channel map and causes the tuner to receive the broadcast data on the selected channel.

Abstract: A tuner receives broadcast data on specified channels. A channel search unit controls the tuner to search for available channels, and creates a channel map representing the available channels and a selection order thereof. A channel order setting unit changes setting about enabling/disabling of the selection and/or the selection order of the channels in the channel map. An operation input unit accepts a channel selecting operation of a user. When the user performs an operation for channel forward selection or channel reverse selection through the operation input unit, a channel switching unit changes the selection of the channel according to the channel map and causes the tuner to receive the broadcast data on the selected channel.

Abstract: A tuner receives broadcast data on specified channels. A channel search unit controls the tuner to search for available channels, and creates a channel map representing the available channels and a selection order thereof. A channel order setting unit changes setting about enabling/disabling of the selection and/or the selection order of the channels in the channel map. An operation input unit accepts a channel selecting operation of a user. When the user performs an operation for channel forward selection or channel reverse selection through the operation input unit, a channel switching unit changes the selection of the channel according to the channel map and causes the tuner to receive the broadcast data on the selected channel.

Abstract: A tuner receives broadcast data on specified channels. A channel search unit controls the tuner to search for available channels, and creates a channel map representing the available channels and a selection order thereof. A channel order setting unit changes setting about enabling/disabling of the selection and/or the selection order of the channels in the channel map. An operation input unit accepts a channel selecting operation of a user. When the user performs an operation for channel forward selection or channel reverse selection through the operation input unit, a channel switching unit changes the selection of the channel according to the channel map and causes the tuner to receive the broadcast data on the selected channel.

Abstract: An object of the present invention is to present a transmission type liquid crystal display device capable of achieving at least one of reduction of size of device and enhancement of performance of operation and display. A liquid crystal panel is divided into four divided regions in vertical direction in plan view, and corresponding to these divided regions, four ray emission light sources composed of fluorescent lamps are disposed vertically at the left side of a light guide plate, and the light emitted from the ray emission light sources illuminates the divided regions by way of the light guide plate. By turning on and off switches, the ray emission light sources are independently controlled to be lit up or put out, and only in a specific time including the time of all pixels of divided regions settling at target transmissivity, one ray emission light source out of ray emission light sources responsible for a corresponding divided region is lit up (illuminated, light-emitted).

Abstract: An object is to compatibly improve processing speed and storage capacity of semiconductor memory that the operation portion can use. Each of units (10a, 10b) each having an operation portion (11) and a memory portion (12) is formed of a single semiconductor chip. A data signal is separately stored in the two memory portions (12) in a bit-sliced form and each of the two operation portions (11) can use the 32-bit-wide data signal stored in the entirety of the two memory portions (12) through interconnections (22, 23). That is to say, each operation portion (11) can use a storage capacity twice larger than the capacity that can be ensured in a single semiconductor chip. Provided as interconnections for coupling the semiconductor chips are only the interconnections (22, 23) for transferring data signals from the two memory portions to the two operation portions (11).

Abstract: An integrated circuit device is structured by a plurality of functional modules (2a, 2b) each performing a predetermined function, each functional module including a test circuit (3) for testing the corresponding module. Each test circuit comprises a scan path (3a-3d) for receiving test data from a single common input line to perform a test and outputting a test output, a tri-state buffer (4a) for controlling an output of the test output from the scan path to a single common output line, and a scan path selecting circuit (5a) for selectively driving the tri-state buffer. All the selecting circuits in the integrated circuit device are connected in series to constitute as a whole a shift register. A selecting signal of the serial data is inputted to the shift register, so that the test output of each scan path is selectively supplied to the common output line.

Abstract: Power consumption is reduced in a semiconductor integrated circuit. In a conventional flip-flop circuit, there is a transistor between one side current electrode of a PMOS transistor (PTr7) and an node (V0) of a power source. This transistor is deleted and one side current electrode of (PTr7) is connected to an node (D2). In a similar manner, one side current electrode of (PTr13) is connected to an node (D13), one side current electrode of an NMOS transistor (NTr6) is connected to an node (D6), and one side current electrode of (NTr14) is connected to an node (D12). Thus, by deleting transistors, the capacity of transistors which are to be driven by a clock signal is reduced, and therefore, power consumption is reduced.

Abstract: It is an object to obtain a semiconductor integrated circuit with reduced power consumption without reducing operation speed. In clock input control means (27), an exclusive OR gate (26a) receives comparison data (S1 and S2) and an NAND gate (27a) receives output of the exclusive OR gate (26a) and a reference clock (T) and outputs its output, a control signal (SC1) to an AND gate (G1) and an AND gate (G2) in a data holding portion (31a). An exclusive OR gate (26b) receives comparison data (S3 and S4) and an NAND gate (27b) receives the output of the exclusive OR gate (26b) and the reference clock (T), and outputs its output, a control signal (SC2) to an OR gate (G5) and an OR gate (G6) in a data holding portion (31b). Appropriately selecting the comparison data (S1-S4) allows data transfer at high speed of input data (D), output data (Q), inverted output data (QC), and so forth.

Abstract: Programmable logical blocks (3a to 3c) selected from a block library including information of a plurality of types of programmable logical blocks are disposed in a core region of a semiconductor integrated circuit (100). The degree of freedom of designing a field programmable gate array (FPGA) and the degree of integration are increased. A logic LSI is permitted to have redundancy to flexibly cope with design changes. This affords reduction in develop period and develop costs.

Abstract: A semiconductor integrated circuit, which can process n-bit (n is an integer, n>1) instructions or data at a time, has queues for storing instructions or data of m (m>1) times n bits received from an external memory through an instruction bus or a data bus. Therefore, it is possible to achieve an improvement in performance of the semiconductor integrated circuit and further to provide a low-priced semiconductor integrated circuit.

Abstract: A register circuit an arithmetic circuit a register circuit and a logic circuit form a bit slice cell corresponding to a path of propagation connecting the circuits in this order. Similarly, an arithmetic circuit register circuits and a logic circuit form a bit slice cell and an arithmetic circuit register circuits and a logic circuit form a bit slice cell. The bit slice cells are arranged generally in parallel to form a bit slice circuit which prevents redundant lines for connecting the functional circuits, whereby the bit slice circuit is developed in a short period without a decreased degree of integration and prolonged delay time.

Abstract: By the disclosed apparatus, the method and the electronic circuit device employing the disclosed apparatus, a configurable semiconductor integrated circuit device is manufactured in a reduced time. A regular logic input/output terminal (6) of a configurable semiconductor integrated circuit device (FPGA) (1) is connected to a data processing apparatus (52) through an interface circuit (51). On a magnetic disk (55), logic function specifying basic data are stored which define basic logic functions which are attainable with circuit diagram data and by the FPGA (1). The data processing apparatus (52) generates logic function specifying final data based on the circuit diagram data while utilizing basic logic operations of the FPGA (1) which is loaded with a logic. Since the basic logic operations of the logic-loaded FPGA (1) are used in generating the logic function specifying final data, the FPGA (1) is manufactured in a reduced time.

Abstract: A method of manufacturing a plurality of integrated circuit devices includes the steps as follows. First, a predetermined plurality number of bonding pads (11, 21) in a predetermined geometry are formed on the surface of each of a plural number of substrate (10, 20). Next, circuits (12, 22) having different signal processing functions respectively are formed in regions of the substrates (10, 20) not occupied by the bonding pads (11, 21), and then, input/output terminals of the circuits (12, 22) are interconnected to respective ones of the bonding pads (11, 21). According to such a manufacturing method of integrated circuit devices, it is possible to employ common devices for wafer test and the same packages for incorporating, and thus reduce production cost and development cost, in case of small quantity production of various types.

Abstract: In designing a layout of a semiconductor integrated circuit device having a large scale circuit block and logic circuit elements provided together, a power supply connecting line is formed rectilinearly to increase the integration density, reduce power supply noise and achieve automation of layout and interconnection. The semiconductor integrated circuit device includes one large scale circuit block and a plurality of logic circuit elements. VDD and GND annular power supply interconnecting lines are provided to surround the large scale circuit block. The annular power supply interconnecting lines extending in the lateral direction are divided into two lines to be disposed, respectively. Connection of the logic circuit elements and the annular power supply interconnecting lines are made by rectilinear VDD and GND power supply branch interconnecting lines.

Abstract: Test data applied serially from a data input terminal 6 is bypassed by a selecting circuit in modules that are not the object of testing and applied to a scan path in modules that are the object of testing. Test data is applied to the control point of the functional module from the scan path, and test result data provided from the observation point of the functional module and fetched by the scan path. The scan path shifts the fetched test result data to provide serially from a data output terminal 7. Each of selecting means 5a-5c operates in response to the selecting data held in the corresponding selecting data holding/propagating circuits 9a-9c. These selecting data holding/propagating circuits 9a-9c shift and hold selecting data applied serially from a data input terminal 10.

Abstract: Three shift path circuits (10', 20', 30') each comprising a bypass circuit are connected in series between a test data input (TDI) and a test data output (TDO). Each shift path circuit constitutes a design definition test data register connected to a circuit to be tested. Design modification of a testing circuit can be minimized by selectively operating the bypass circuit provided in a shift path circuit, even if there is circuit modification in the circuit to be tested. The period of time required for testing circuits to be tested is reduced.