Patents by Inventor Kazutaka Tsuji

Kazutaka Tsuji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6511417
    Abstract: An endoscope shape detection system has a CPU included in a control unit. The CPU performs frequency sampling on digital data to calculate coordinates indicating the spatial positions of source coils incorporated in an insertion unit of an endoscope and of marker coils. An inserted state of the insertion unit of the endoscope is estimated based on the calculated coordinate data indicating the positions of the source coils. Display data based on which shape of the endoscope depicted is produced from the calculated coordinate data indicating the positions of the source coils, and output to a video RAM. Display data based on which marker coils are depicted is produced from the calculated coordinate data indicating the positions of the marker coils, and output to the video RAM. Consequently, the positions of the markers are depicted together with the shape of the endoscope. The positional relationship between the insertion unit of the endoscope and a patient's body can therefore be ascertained.
    Type: Grant
    Filed: September 1, 1999
    Date of Patent: January 28, 2003
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Akira Taniguchi, Chieko Aizawa, Yasuhiro Yoshizawa, Fumiyuki Onoda, Seiki Toriyama, Takeshi Kawabata, Katsuyoshi Sasagawa, Sumihiro Uchimura, Masanao Hara, Kazutaka Tsuji, Takayasu Miyagi, Hiroki Moriyama, Hiroshi Ishii, Yoshinao Oaki, Tsugio Okazaki, Jun Hasegawa, Yasuo Hirata, Tetsuo Nonami
  • Patent number: 6432041
    Abstract: A source coil line-break/short-circuit detecting circuit and a probe connection detecting circuit are provided to the source coil driving circuit unit of an endoscope shape detecting apparatus. The source coil line-break/short-circuit detecting circuit detects line-breaks and short-circuits of the source coils. The probe connection detecting circuit detects whether a connection exists with a probe. A marker coil line-break/short-circuit detecting circuit detects line-breaks and short-circuits of the marker coils. A marker connection detecting circuit detects whether a connection exists with a marker. Accordingly, using the apparatus without being connected to a probe or markers can be avoided by detecting the connection of the probe and markers by the probe connection detecting circuit and marker connection detecting circuit, respectively, when the system is energized, thereby avoiding detecting noise and consequently displaying a random image on the monitor.
    Type: Grant
    Filed: September 9, 1999
    Date of Patent: August 13, 2002
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Akira Taniguchi, Chieko Aizawa, Yasuhiro Yoshizawa, Fumiyuki Onoda, Seiki Toriyama, Takeshi Kawabata, Katsuyoshi Sasagawa, Sumihiro Uchimura, Masanao Hara, Kazutaka Tsuji, Takayasu Miyagi, Hiroki Moriyama, Hiroshi Ishii, Yoshinao Oaki, Tsugio Okazaki, Jun Hasegawa, Yasuo Hirata
  • Patent number: 6051834
    Abstract: 3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen are carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. A scanning transmission electron microscope has an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons.
    Type: Grant
    Filed: July 30, 1998
    Date of Patent: April 18, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji, Tatsuo Makishima, Mikio Ichihashi, Shigeto Isakozawa, Ruriko Tsuneta, Kuniyasu Nakamura, Kensuke Sekihara, Jun Motoike
  • Patent number: 5880470
    Abstract: A 2-dimensional radiation image detector wherein a plurality of conversion elements for converting a radiation into visible light and a plurality of photo-sensitive elements for detecting the visible light and accumulating signals are formed an elements board includes two elements boards arranged in an overlapping relationship with each other and each having the plurality of photo-sensitive elements arranged two-dimensionally thereon such that the distance between centers of the photo-sensitive elements in one direction of the arrangement is substantially equal to a width of the photo-sensitive elements while the distance between the centers of the photo-sensitive elements in a direction perpendicular to the one direction is substantially equal to twice the width of the photo-sensitive elements and such that that portion of a radiation directed upon the two overlapping elements boards which has passed through a first one of the elements boards other than locations of the photo-sensitive elements is detected b
    Type: Grant
    Filed: May 6, 1996
    Date of Patent: March 9, 1999
    Assignees: Hitachi, Ltd., Hitachi Medical Corporation
    Inventors: Keiji Umetani, Ken Ueda, Tetsurou Minemura, Kazutaka Tsuji, Koichi Koike
  • Patent number: 5866905
    Abstract: A scanning transmission electron microscope including an electron detection system having a scattering angle limiting aperture (for the inner angle) and a scattering angle limiting aperture (for the outer angle) between a specimen and an electron detector (comprising a scintillator and a light guide) and only one electron detector is installed.
    Type: Grant
    Filed: July 26, 1996
    Date of Patent: February 2, 1999
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji, Tatsuo Makishima, Mikio Ichihashi, Shigeto Isakozawa, Ruriko Tsuneta, Kuniyasu Nakamura, Kensuke Sekihara, Jun Motoike
  • Patent number: 5717207
    Abstract: A transmission electron microscope has a camera system that is linked to the optical lens system of the electron microscope by linking the number of electron beam scanning lines of the camera system with the zoom function of the optical lens system. Thus, the number of scanning lines increases as the magnification of the transferred image decreases. Further, the specimen under observation is photographed with a constant number of pixels at all times regardless of the magnification of the transferred image by the optical lens system, thus preventing a reduction in the amount of specimen information.
    Type: Grant
    Filed: July 22, 1996
    Date of Patent: February 10, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Masanari Koguchi, Hiroshi Kakibayashi, Hiroyuki Tanaka, Shigeto Isakozawa, Keiichi Kanehori, Tatsuo Makishima, Kazutaka Tsuji
  • Patent number: 5552602
    Abstract: 3-dimensional observation on the atomic arrangement and atomic species in a thin-film specimen as well as conventional electron microscope observations is carried out at high speed and accuracy by an electron microscope which measures electrons emitted at high angle from the specimen. For that purpose, the present invention provides a scanning transmission electron microscope having an electron detection device comprising a scintillator converting electrons detected thereby to photons, a photoconductive-film converting photons from the scintillator detected thereby to c.a. 1000 times as many electron-hole pairs as these photons (i.d. avalanche multiplication), an electron gun emitting an electron beam toward the photoconductive-film to detect the holes generated therein, and electron deflector electrodes deflecting the electron beam on the photoconductive-film.
    Type: Grant
    Filed: March 6, 1995
    Date of Patent: September 3, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Tadokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji, Tatsuo Makishima, Mikio Ichihashi, Shigeto Isakozawa
  • Patent number: 5488386
    Abstract: A photoconductive target having a transparent electrode layer and a photoconductive layer on a transparent substrate is disposed opposite to a group of integrated electron beam emitters having gate electrodes. A number of the electron emitters are activated to apply electron beams to the photoconductive target and the activated ones of the electron beam emitters are temporally changed over by an electron emitter selector circuit and a gate selector circuit. Signal charge generated and stored in the photoconductive layer is read. A time-series electric signal corresponding to a spatial distribution of the incident light is generated. A thin imaging apparatus suitable for a larger area is thus provided.
    Type: Grant
    Filed: December 2, 1993
    Date of Patent: January 30, 1996
    Assignee: Hitachi, Ltd. & Nippon Hoso Kyokai
    Inventors: Toshio Yamagishi, Masakazu Nanba, Norifumi Egami, Kenkichi Tanioka, Mitsuhiro Kurashige, Kazutaka Tsuji, Yoshiyuki Kaneko, Tatsuo Makishima, Kazuyuki Nagatsuma, Tetsuya Ohshima, Yasushi Nakano
  • Patent number: 5233265
    Abstract: A photoconductive device having a photoconductive layer which includes an amorphous semiconductor layer capable of charge multiplication in at least a part thereof is disclosed. The method of operating such a photoconductive device is also disclosed. By using the avalanche effect of the amorphous semiconductor layer, it is possible to realize a highly sensitive photoconductive device while maintaining low lag property. In one aspect of the present invention, the amorphous semiconductor layer is amorphous Se. In another aspect of the present invention, the amorphous semiconductor layer is composed mainly of tetrahedral elements including at least an element of hydrogen or halogens. When using the amorphous semiconductor layer composed mainly of tetrahedral elements, the charge multiplication effect is produced mainly in the interior of the amorphous semiconductor, and thus it is possible to obtain a thermally stable photoconductive device having a high sensitivity while keeping a good photoresponse.
    Type: Grant
    Filed: August 1, 1990
    Date of Patent: August 3, 1993
    Assignees: Hitachi, Ltd., Nippon Hoso Kyokai
    Inventors: Yukio Takasaki, Kazutaka Tsuji, Tatsuo Makishima, Tadaaki Hirai, Sachio Ishioka, Tatsuro Kawamura, Keiichi Shidara, Eikyu Hiruma, Kenkichi Tanioka, Junichi Yamazaki, Kenji Sameshima, Hirokazu Matsubara, Kazuhisa Taketoshi, Mitsuo Kosugi, Shiro Suzuki, Takashi Yamashita, Masaaki Aiba, Yoshizumi Ikeda, Tsuyoshi Uda, Naohiro Goto, Yasuhiko Nonaka, Eisuke Inoue, Hirofumi Ogawa
  • Patent number: 5196702
    Abstract: An optically reading type photo-sensor for reading out an information signal of a signal light with a signal reading light includes a first photoconductor (101) and a second photoconductor (102) interposed between two electrodes (104 and 105); an intermediate region (103) disposed between those two photoconductors for storing and recombining carriers; and an optical source (107) for emitting a signal reading light for uninformalizing the potential in said second photoconductor (102), whereby a successive signal reading can be accomplished without any special preparations for the incidence of the signal light. The photo-sensor can be applied to a variety of imaging devices.
    Type: Grant
    Filed: December 11, 1991
    Date of Patent: March 23, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Kazutaka Tsuji, Tadaaki Hirai, Yukio Takasaki, Haruo Itoh, Tetshuhiko Takahashi, Kenichi Okajima
  • Patent number: 5101255
    Abstract: Disclosed is a photoelectric conversion device which comprises: a photoconductive layer made of amorphous semiconductor material which shows charge multiplication and which converts photo signals into electric signals; and a substrate having electric circuits or the like (for example switching elements) for reading the electric signals. The amorphous semiconductor material used according to the invention shows the charge multiplication action under predetermined intensity of electric field so that a high sensitive photoelectric conversion device having a gain which is not smaller than 1 is realized.
    Type: Grant
    Filed: July 24, 1989
    Date of Patent: March 31, 1992
    Inventors: Sachio Ishioka, Yukio Takasaki, Tadaaki Hirai, Kazutaka Tsuji, Tatsuo Makishima, Yasuhiko Nonaka, Tatsuro Kawamura, Takashi Yamashita, Kazuhisa Taketoshi, Keiichi Shidara, Fumihiko Ando, Kenkichi Tanioka
  • Patent number: 5070272
    Abstract: A photoconductive device having a transparent substrate, a transparent conductive film, a photoconductive film and a layer of an insulator provided on at least part of the substrate and of high thermal conductivity, and a method of operating the photoconductive device. Thus, especially, the temperature of a photoconductive film of an imaging device typical of an image pick-up tube or the photoconductive device which may be a one- or a two-dimensional image sensor or a photocell can be controlled precisely and efficiently.
    Type: Grant
    Filed: July 3, 1990
    Date of Patent: December 3, 1991
    Assignees: Hitachi, Ltd., Nippon Hoso Kyokai
    Inventors: Takeshi Kikawa, Kazutaka Tsuji, Kenji Sameshima, Tadaaki Hirai, Junichi Yamazaki, Misao Kubota, Keiichi Shidara
  • Patent number: 4980736
    Abstract: A photoelectric conversion device using an amorphous material composed mainly of tetrahedral elements including at least an element of hydrogen and halogens as semiconductor material is disclosed. When a strong electric field is applied to a layer formed by using this amorphous semiconductor, a charge multiplication effect is produced mainly in the interior of the amorphous semiconductor and thus it is possible to obtain a thermally stable photoelectric conversion device having a high sensitivity while keeping a good photoresponse.
    Type: Grant
    Filed: February 16, 1988
    Date of Patent: December 25, 1990
    Assignees: Hitachi, Ltd., Nippon Hoso Kyokai
    Inventors: Yukio Takasaki, Kazutaka Tsuji, Tatsuo Makishima, Tadaaki Hirai, Sachio Ishioka, Tatsuro Kawamura, Keiichi Shidara, Eikyu Hiruma, Kenkichi Tanioka, Junichi Yamazaki, Kenji Sameshima, Hirokazu Matsubara, Kazuhisa Taketoshi
  • Patent number: 4952839
    Abstract: A photoconductive device having a photoconductive layer which includes an amorphous semiconductor layer capable of charge multiplication in at least a part thereof is disclosed. The method of operating such a photoconductive device is also disclosed. By using the avalanche effect of the amorphous semiconductor layer, it is possible to realize a highly sensitive photoconductive device while maintaining low lag property.
    Type: Grant
    Filed: October 12, 1989
    Date of Patent: August 28, 1990
    Assignees: Hitachi, Ltd, Nippon Hoso Kyokai
    Inventors: Kenkichi Tanioka, Mitsuo Kosugi, Junichi Yamazaki, Keiichi Shidara, Kazuhisa Taketoshi, Tatsuro Kawamura, Eikyuu Hiruma, Shiro Suzuki, Takashi Yamashita, Masaaki Aiba, Yochizumi Ikeda, Tadaaki Hirai, Yukio Takasaki, Sachio Ishioka, Tatsuo Makishima, Kenji Sameshima, Tsuyoshi Uda, Naohiro Goto, Yasuhiko Nonaka, Eisuke Inoue, Kazutaka Tsuji, Hirofumi Ogawa
  • Patent number: 4900975
    Abstract: A target of an image pickup tube is formed by laminating at least a transparent conductive film, an amorphous layer consisting essentially of silicon, and an amorphous layer consisting essentially of selenium in the above order on a light-transmitting substrate.
    Type: Grant
    Filed: June 29, 1987
    Date of Patent: February 13, 1990
    Assignees: Hitachi, Ltd., Nippon Hoso Kyokai
    Inventors: Yasuharu Shimomoto, Sachio Ishioka, Yukio Takasaki, Tadaaki Hirai, Kazutaka Tsuji, Tatsuo Makishima, Hirokazu Matsubara, Kenji Sameshima, Junichi Yamazaki, Kenkichi Tanioka, Mitsuo Kosugi, Keiichi Shidara, Tatsuro Kawamura, Eikyuu Hiruma, Takashi Yamashita
  • Patent number: 4888521
    Abstract: A photoconductive device having a photoconductive layer which includes an amorphous semiconductor layer capable of charge multiplication in at least a part thereof is disclosed. The method of operating such a photoconductive device is also disclosed. By using the avalanche effect of the amorphous semiconductor layer, it is possible to realize a highly sensitive photoconductive device while maintaining low lag property.
    Type: Grant
    Filed: July 2, 1987
    Date of Patent: December 19, 1989
    Assignees: Hitachi Ltd., Nippon Hoso Kyokai
    Inventors: Kenkichi Tanioka, Keiichi Shidara, Tatsuro Kawamura, Junichi Yamazaki, Eikyuu Hiruma, Kazuhisa Taketoshi, Shiro Suzuki, Takashi Yamashita, Mitsuo Kosugi, Yochizumi Ikeda, Masaaki Aiba, Tadaaki Hirai, Yukio Takasaki, Sachio Ishioka, Tatsuo Makishima, Kenji Sameshima, Tsuyoshi Uda, Naohiro Goto, Yasuhiko Nonaka, Eisuke Inoue, Kazutaka Tsuji, Hirofumi Ogawa
  • Patent number: 4884011
    Abstract: A light-detecting device for converting a light to an electrical signal utilizes a charge multiplication function and has a stable gain.The light-detecting device comprises a photo-electric conversion unit for converting a measurement light to an electrical signal, a power supply for applying an electric field to the photo-electric conversion unit, a light source for applying an incident light to the photo-electric conversion unit, signal detection means for detecting the charge converted by the photo-electric conversion unit based on the incident light from the light source, and signal hold means for holding the output signal of the signal detection means at a predetermined level.
    Type: Grant
    Filed: January 13, 1988
    Date of Patent: November 28, 1989
    Assignee: Hitachi, Ltd. & Nippon Hoso Kasai
    Inventors: Tatsuo Makishima, Tadaaki Hirai, Kazutaka Tsuji, Sachio Ishioka, Takashi Yamashita, Keiichi Shidara, Junichi Yamazaki, Masaaki Aiba
  • Patent number: 4866332
    Abstract: A target of an image pickup tube, having a transparent substrate, a transparent conductive film, a p-type photoconductive film made mainly from amorphous Se, and an n-type conductive film capable of forming a rectifying contact at the interface with the p-type photoconductive film, using the rectifying contact as a reverse bias, characterized in that the p-type photoconductive film containing at least a region having more than 35%, and to 60% by weight of Te in the film thickness direction, and at least a region containing 0.005 to 5% by weight of at least a material capable of forming shallow levels in the amorphous Se in the film thickness direction, has good after-image characteristics even if operated at a high temperature.
    Type: Grant
    Filed: February 19, 1987
    Date of Patent: September 12, 1989
    Assignees: Hitachi, Ltd., Nippon Hoso Kyokai
    Inventors: Yukio Takasaki, Tatsuo Makishima, Kazutaka Tsuji, Tadaaki Hirai, Eisuke Inoue, Yasuhiko Nonaka, Naohiro Goto, Masanao Yamamoto, Keiichi Shidara, Kenkichi Tanioka, Takashi Yamashita, Tatsuro Kawamura, Eikyuu Hiruma, Shirou Suzuki, Masaaki Aiba
  • Patent number: 4829345
    Abstract: Within an electronic device having a plurality of circuit parts (such as a three-dimensional device), a light transmission system which transfers signals between the circuit parts by the use of light is provided.The light transmission system is formed of a light emitting source which emits light having a desired wavelength, a photoelectric conversion portion which absorbs the light and converts it into an electric signal, and a light traveling path which conveys the light emitted from the light emitting source to the photoelectric conversion portion.Further, each of the light emitting source, the light traveling path and the photoelectric conversion portion is formed of a superlattice structure in which a plurality of materials of unequal energy gaps are layered.
    Type: Grant
    Filed: April 29, 1986
    Date of Patent: May 9, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Sachio Ishioka, Kazutaka Tsuji, Yukio Takasaki, Yasuharu Shimomoto, Hirokazu Matsubara, Tadaaki Hirai