Abstract: It is required to store data to be stored for a holding period required for this data and then erase the data while suppressing power consumption. A memory device 10 to solve such a problem has the following configuration. The memory device 10 includes an ReRAM (resistance random access memory) 100 and a storage controller 101. The storage controller 101 performs control to store, in a storing condition according to a holding period required for data to be stored, the data in the ReRAM 100.

Abstract: In order to appropriately set a condition for measurement of a sensor for measuring an object to be measured in accordance with a change of an external index that can affect the object to be measured, a sensor system includes first and second sensors, a determination unit for outputting a detection signal when a measurement result of the first sensor satisfies a predetermined condition, a measurement condition storage unit for storing a condition for measurement of the second sensor, and a control unit for performing measurement by the second sensor separately from measurement in accordance with the condition for measurement, when having received the detection signal, and for updating the condition for measurement of the second sensor stored in the measurement condition storage unit based on a result of the performed measurement.

Abstract: It is required to store data to be stored for a holding period required for this data and then erase the data while suppressing power consumption. A memory device 10 to solve such a problem has the following configuration. The memory device 10 includes an ReRAM (resistance random access memory) 100 and a storage controller 101. The storage controller 101 performs control to store, in a storing condition according to a holding period required for data to be stored, the data in the ReRAM 100.

Abstract: A semiconductor device includes a MISFET. The semiconductor device also includes a silicon nitride film 12 and a silicon nitride film 10 arranged on the silicon nitride film 12. The silicon nitride film 12 covers at least a portion of an upper part of a source/drain 8 of the MISFET and has a film thickness thinner than a height of a gate electrode 4. The source/drain 8 includes nickel silicide 9 on its boundary to the silicon nitride film 10. The silicon nitride film 10 is a stressed film. A tight adhering property between the silicon nitride film 12 and the surface of the source/drain 8 and that between the silicon nitride film 12 and the silicon nitride film 10 are rendered higher than a tight adhering property which would prevail when the silicon nitride film 10 be made to adhere tightly to the source/drain 8.

Abstract: A semiconductor device includes a MISFET. The semiconductor device also includes a silicon nitride film 12 and a silicon nitride film 10 arranged on the silicon nitride film 12. The silicon nitride film 12 covers at least a portion of an upper part of a source/drain 8 of the MISFET and has a film thickness thinner than a height of a gate electrode 4. The source/drain 8 includes nickel silicide 9 on its boundary to the silicon nitride film 10. The silicon nitride film 10 is a stressed film. A tight adhering property between the silicon nitride film 12 and the surface of the source/drain 8 and that between the silicon nitride film 12 and the silicon nitride film 10 are rendered higher than a tight adhering property which would prevail when the silicon nitride film 10 be made to adhere tightly to the source/drain 8.

Abstract: A semiconductor device includes a MISFET. The semiconductor device also includes a silicon nitride film 12 and a silicon nitride film 10 arranged on the silicon nitride film 12. The silicon nitride film 12 covers at least a portion of an upper part of a source/drain 8 of the MISFET and has a film thickness thinner than a height of a gate electrode 4. The source/drain 8 includes nickel silicide 9 on its boundary to the silicon nitride film 10. The silicon nitride film 10 is a stressed film. A tight adhering property between the silicon nitride film 12 and the surface of the source/drain 8 and that between the silicon nitride film 12 and the silicon nitride film 10 are rendered higher than a tight adhering property which would prevail when the silicon nitride film 10 be made to adhere tightly to the source/drain 8.

Abstract: A semiconductor device includes a MISFET. The semiconductor device also includes a silicon nitride film 12 and a silicon nitride film 10 arranged on the silicon nitride film 12. The silicon nitride film 12 covers at least a portion of an upper part of a source/drain 8 of the MISFET and has a film thickness thinner than a height of a gate electrode 4. The source/drain 8 includes nickel suicide 9 on its boundary to the silicon nitride film 10. The silicon nitride film 10 is a stressed film. A tight adhering property between the silicon nitride film 12 and the surface of the source/drain 8 and that between the silicon nitride film 12 and the silicon nitride film 10 are rendered higher than a tight adhering property which would prevail when the silicon nitride film 10 be made to adhere tightly to the source/drain 8.

Abstract: In a semiconductor device, a contact stopper film having a stress is provided to cover a group of MISFETs arranged in a gate-length direction. The stopper film has an extension part that extends by a length L=1 ?m or more toward the outside of the gate electrode of the MISFET located the endmost part of the MISFET group.

Abstract: A strained Si layer 2 is epitaxially grown on a base SiGe layer 1, and a gate insulating film 3a and a gate electrode 4a are formed. An impurity is then ion-implanted (FIG. 2A) into the base SiGe layer 1 and the strained Si layer 2 using the gate electrode 4a as a mask, heat treatment is performed for activation, and a source/drain region 6 is formed (FIGS. 2B and 2C). In this instance, the film thickness of the strained Si layer 2 is set to 2Tp, where Tp (=Rp) is the depth having the maximum concentration of the impurity in the source/drain region 6 of the finished MISFET.

Abstract: A strained Si layer 2 is epitaxially grown on a base SiGe layer 1, and a gate insulating film 3a and a gate electrode 4a are formed. An impurity is then ion-implanted (FIG. 2A) into the base SiGe layer 1 and the strained Si layer 2 using the gate electrode 4a as a mask, heat treatment is performed for activation, and a source/drain region 6 is formed (FIGS. 2B and 2C). In this instance, the film thickness of the strained Si layer 2 is set to 2Tp, where Tp (=Rp) is the depth having the maximum concentration of the impurity in the source/drain region 6 of the finished MISFET.