Abstract: An object of the present invention is to reduce jitter dependent on data patterns by an interface receiver. Another object of the present invention is to provide an LSI capable of automatically adjusting a delay time for jitter reduction so as to be able to control its setting for each device. Since the jitter dependent on the data patterns can be expected according to how the previous state is being placed, the state of data received by the receiver is held, and the timing provided to fetch input data is adjusted according to the held state and the input data. As a control mechanism lying in the receiver, for determining a delay time dependent on the form of mounting, a driver transmits and receives pulse data set at one-cycle intervals and pulse data set at two-cycle intervals as test patterns. The receiver has an automatic control mechanism for determining a delay time optimal to a system from the difference between a rising time of each of pulses different in pulse width and its falling time.

Abstract: An object of the present invention is to reduce jitter dependent on data patterns by an interface receiver. Another object of the present invention is to provide an LSI capable of automatically adjusting a delay time for jitter reduction so as to be able to control its setting for each device. Since the jitter dependent on the data patterns can be expected according to how the previous state is being placed, the state of data received by the receiver is held, and the timing provided to fetch input data is adjusted according to the held state and the input data. As a control mechanism lying in the receiver, for determining a delay time dependent on the form of mounting, a driver transmits and receives pulse data set at one-cycle intervals and pulse data set at two-cycle intervals as test patterns. The receiver has an automatic control mechanism for determining a delay time optimal to a system from the difference between a rising time of each of pulses different in pulse width and its falling time.

Abstract: An object of the present invention is to reduce jitter dependent on data patterns by an interface receiver. Another object of the present invention is to provide an LSI capable of automatically adjusting a delay time for jitter reduction so as to be able to control its setting for each device. Since the jitter dependent on the data patterns can be expected according to how the previous state is being placed, the state of data received by the receiver is held, and the timing provided to fetch input data is adjusted according to the held state and the input data. As a control mechanism lying in the receiver, for determining a delay time dependent on the form of mounting, a driver transmits and receives pulse data set at one-cycle intervals and pulse data set at two-cycle intervals as test patterns. The receiver has an automatic control mechanism for determining a delay time optimal to a system from the difference between a rising time of each of pulses different in pulse width and its falling time.

Abstract: A nonvolatile memory apparatus which includes plural memories one of which is a nonvolatile memory such as a Flash EEPROM capable of being specified a plurality of operations from a processing unit of the apparatus including an erase operation, the erase operation in the nonvolatile memory performs a threshold voltage moving operation and a verify operation, and the nonvolatile memory is capable of releasing the I/O bus during the erase operation to thereby allow accessing of other memories and/or system components. For example, during this erase operation, the Flash EEPROM is able to free the I/O data terminal such that the EEPROM becomes electrically isolated from the CPU. The CPU is then able to perform data processing by the system bus where information can then be transferred/received such as between other memories, e.g., ROM and RAM, and otherwise with the I/O port.

Abstract: In the simulation method of the present invention; one parameter is first selected from a plurality of parameters that relate to input/output characteristics. Next, regarding setting lines provided in a file for setting necessary choices from among a plurality of choices for a selected parameter, it is determined to either set choices by means of comment symbols that cause non-execution of the relevant lines, or set choices by means of identification codes, which are identifiers common to chips in which the same choice are to be set. When choices are to be set by means of comment symbols, the comment symbols of the setting lines of the necessary choices among the plurality of choices are deleted to make these setting lines effective. Alternatively, when choices are to be set by means of identification codes, the identification codes included in setting lines are rewritten to information for setting to the necessary choices. Finally, the simulation is executed.

Abstract: A nonvolatile memory apparatus which includes plural memories one of which is a nonvolatile memory such as a Flash EEPROM capable of being specified a plurality of operations from a processing unit of the apparatus including an erase operation, the erase operation in the nonvolatile memory performs a threshold voltage moving operation and a verify operation, and the nonvolatile memory is capable of releasing the I/O bus during the erase operation to thereby allow accessing of other memories and/or system components. For example, during this erase operation, the Flash EEPROM is able to free the I/O data terminal such that the EEPROM becomes electrically isolated from the CPU. The CPU is then able to perform data processing by the system bus where information can then be transferred/received such as between other memories, e.g., ROM and RAM, and otherwise with the I/O port.

Abstract: A nonvolatile memory apparatus which includes plural memories one of which is a nonvolatile memory such as a Flash EEPROM capable of being specified a plurality of operations from a processing unit of the apparatus including an erase operation, the erase operation in the nonvolatile memory performs a threshold voltage moving operation and a verify operation, and the nonvolatile memory is capable of releasing the I/O bus during the erase operation to thereby allow accessing of other memories and/or system components. For example, during this erase operation, the Flash EEPROM is able to free the I/O data terminal such that the EEPROM becomes electrically isolated from the CPU. The CPU is then able to perform data processing by the system bus where information can then be transferred/received such as between other memories, e.g., ROM and RAM, and otherwise with the I/O port.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An object of the present invention is to reduce jitter dependent on data patterns by an interface receiver. Another object of the present invention is to provide an LSI capable of automatically adjusting a delay time for jitter reduction so as to be able to control its setting for each device. Since the jitter dependent on the data patterns can be expected according to how the previous state is being placed, the state of data received by the receiver is held, and the timing provided to fetch input data is adjusted according to the held state and the input data. As a control mechanism lying in the receiver, for determining a delay time dependent on the form of mounting, a driver transmits and receives pulse data set at one-cycle intervals and pulse data set at two-cycle intervals as test patterns. The receiver has an automatic control mechanism for determining a delay time optimal to a system from the difference between a rising time of each of pulses different in pulse width and its falling time.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: A nonvolatile memory apparatus contains plural memories, at least one of which is a nonvolatile memory, and a processing unit. Data input/output (I/O) terminals of the memories and processing unit are mutually coupled by a bus. When the nonvolatile memory is brought into an erasing mode by the processing unit, it becomes electrically isolated as a result of freeing the connection of the I/O terminal thereof during the erase operation. Accordingly, the processing unit is capable of accessing other memories via the bus where information can then be transferred/received between other memory devices and, otherwise, with the input/output port of the system. Control by the processing unit requires a relatively short time during which the erasing commencement is instructed so as to minimize interruption of the throughput capability of the system. Following the designation of an erasing mode, a data polling mode is designated.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a Vcc power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the Vcc power source is applied to a control gate electrode.

Abstract: An EEPROM having an erasing control circuit that performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation. In one aspect of the disclosure, a VCC power source is applied to a source region or a drain region of each nonvolatile semiconductor memory cell, and an erasure voltage having a polarity opposite to that of the VCC power source is applied to a control gate electrode.

Abstract: Within an EEPROM having a memory array in which the electrically erasable nonvolatile storage elements are arranged in a matrix form, an erasing control circuit is included, which performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith in accordance with externally supplied erasing operation instructions. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation.

Abstract: Within an EEPROM having a memory array in which the electrically erasable nonvolatile storage elements are arranged in a matrix form, an erasing control circuit is included, which performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith in accordance with externally supplied erasing operation instructions. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation.

Abstract: Within an EEPROM having a memory array in which the electrically erasable nonvolatile storage elements are arranged in a matrix form, an erasing control circuit is included, which performs at least the read out operation one time on the corresponding memory cells after an erasing operation is performed in connection therewith in accordance with externally supplied erasing operation instructions. The erasing operation is automatically performed by the internal erasing control circuit while the EEPROM is electrically isolated from the microprocessor in response to instructions from the microprocessor. The control by the microprocessor requires only a slightly short period of time during which the erasing commencement is instructed while the EEPROM remains in the system during the erasing operation.