Patents by Inventor Ke Xiao

Ke Xiao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9519129
    Abstract: A method for analyzing porosity of a particle and a medium disposed in the porosity of the particle. A video-holographic microscope is provided to analyze interference patterns produced by providing a laser source to output a collimated beam, scattering the collimated beam off a particle and interacting with an unscattered beam to generate the interference pattern for analyzation to determine the refractive index of the particle and a medium disposed in the porosity of the particle to measure porosity and the medium.
    Type: Grant
    Filed: November 4, 2011
    Date of Patent: December 13, 2016
    Assignee: New York University
    Inventors: Fook Chiong Cheong, Ke Xiao, David Pine, David G. Grier
  • Publication number: 20160324487
    Abstract: Embodiments described herein may fully integrate personal computing and health care into a wearable waistband having a length sensor, a pressure sensor, and a motion sensor; or into a wearable “mesh” having an array of sound sensors, which will create convenient and seamless access to a personal computer and biofeedback of the wearer. Such biofeedback from the waistband may include determining respiration rate, waist length, food quantity of a meal, sitting or sleep time, and frequency of visits to the bathroom. Such biofeedback from the mesh or array may include determining whether there is or has been damage or other issues of the heart, lungs, bones, joints, jaw, throat, arteries, digestive tract, and the like. Such biofeedback may also detect whether whether a person has an allergic reaction at a location, is drinking (and what volume of fluid), is walking, is jogging or is running.
    Type: Application
    Filed: November 27, 2014
    Publication date: November 10, 2016
    Inventors: Mao GUO, Junfeng ZHAO, Michael P. SKINNER, Ke XIAO, Jiamiao TANG, Bin LIU, Li DENG
  • Patent number: 9407565
    Abstract: Aspects of the present disclosure relate to detecting and repairing permanently pauses on a flow controlled fabric. In one aspect, one or more computing devices, such as a switch or a centralized controller, may detect whether a port of a network device receives one or more pause messages. The pause messages may instruct the network device to pause data transmission. Further, the one or more computing devices may determine a period of time during which the port receives the one or more pause messages and identify the port as a permanently paused port based on the determined period of time. The one or more computing devices may then reconfigure the permanently paused port to stop complying with the one or more pause messages.
    Type: Grant
    Filed: June 18, 2014
    Date of Patent: August 2, 2016
    Assignee: Google Inc.
    Inventors: Jiangbo Li, Junlan Zhou, Ke Xiao, Victor Lin, Ashish Vibhakar Naik, Shidong Zhang
  • Publication number: 20160216195
    Abstract: An in-line holographic microscope can be used to analyze on a frame-by-frame basis a video stream to track individual colloidal particles' three-dimensional motions. The system and method can provide real time nanometer resolution, and simultaneously measure particle sizes and refractive indexes. Through a combination of applying a combination of Lorenz-Mie analysis with selected hardware and software methods, this analysis can be carried out in near real time. An efficient particle identification methodology automates initial position estimation with sufficient accuracy to enable unattended holographic tracking and characterization.
    Type: Application
    Filed: April 4, 2016
    Publication date: July 28, 2016
    Applicant: New York University
    Inventors: David G. GRIER, Fook Chiong CHEONG, Ke XIAO
  • Patent number: 9316578
    Abstract: An in-line holographic microscope can be used to analyze on a frame-by-frame basis a video stream to track individual colloidal particles' three-dimensional motions. The system and method can provide real time nanometer resolution, and simultaneously measure particle sizes and refractive indexes. Through a combination of applying a combination of Lorenz-Mie analysis with selected hardware and software methods, this analysis can be carried out in near real time. An efficient particle identification methodology automates initial position estimation with sufficient accuracy to enable unattended holographic tracking and characterization.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: April 19, 2016
    Assignee: New York University
    Inventors: David G. Grier, Fook Chiong Cheong, Ke Xiao
  • Publication number: 20160064261
    Abstract: A method of dispatching wafer lots through a plurality of process chambers, wherein the process chambers are disposed in at least one machine. The method includes: receiving wafer lot information and process chamber data, wherein the wafer lot information identifies the wafer lots to be processed at the machine, and the process chamber data includes process information associated with the process chambers; determining a load factor of each process chamber based on the wafer lot information and process chamber data; receiving historical data of run lots previously processed through the process chambers, and determining a processing time of the wafer lots based on the historical data; generating a dispatching criteria for the wafer lots based on the load factors of the process chambers and the determined processing time of the wafer lots; and dispatching the wafer lots through the process chambers based on the dispatching criteria.
    Type: Application
    Filed: August 31, 2015
    Publication date: March 3, 2016
    Inventors: Hong LI, Hao ZHANG, Ke XIAO
  • Publication number: 20150287621
    Abstract: A method for automatically collecting semiconductor manufacturing parameters of a manufacturing equipment is provided. The method includes reporting semiconductor manufacturing parameters obtained by self-monitoring of the manufacturing equipment and obtaining storage locations in an electronic data capture corresponding to reported semiconductor manufacturing parameters and transporting the reported semiconductor manufacturing parameters and corresponding storage locations. The method further includes receiving the reported semiconductor manufacturing parameters and the corresponding storage location and storing each reported semiconductor manufacturing parameters automatically into the electronic data capture of a manufacturing execution system according to the corresponding storage location.
    Type: Application
    Filed: March 27, 2015
    Publication date: October 8, 2015
    Inventors: KE XIAO, JIMIN ZHU, LUNGUO WANG, YUNFEI SUI, XUEQING GAO
  • Publication number: 20150168128
    Abstract: An optical metrology device determines physical characteristics of at least one via in a sample, such as a through-silicon vias (TSV), using signal strength data for modeling of the bottom critical dimension (BCD) and/or for refinement of the data used to determine a physical characteristic of the via, such as BCD and/or depth. The metrology device obtains interferometric data and generates height and signal strength data, from which statistical properties may be obtained. The height and signal strength data for the via is refined by removing noise using the statistical property, and the BCD for the via may be determined using the refined height and signal strength data. In one implementation, a signal strength via map for a via is generated using signal strength data and is fit to a model to determine the BCD for the via.
    Type: Application
    Filed: December 15, 2014
    Publication date: June 18, 2015
    Inventors: Ke XIAO, Brennan PETERSON, Timothy A. JOHNSON
  • Patent number: 8957513
    Abstract: A semiconductor device comprising: a lower semiconductor package that comprises a first set of one or more semiconductor dies, an upper semiconductor package that is stacked on the lower semiconductor package, the upper semiconductor package comprises a second set of one or more semiconductor dies, and a first interconnect pad that is embedded in a top side of the lower semiconductor package to couple the upper semiconductor package to the lower semiconductor package.
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: February 17, 2015
    Assignee: Intel Corporation
    Inventors: Ke Xiao, Henry K. Hong, Gunaranjan Viswanathan
  • Patent number: 8857951
    Abstract: A large-format printing apparatus includes multiple printing head units. Each of the printing head units can intermittently and steppingly move in a first direction and has a printing nozzle which can move reciprocatingly in a second direction which is perpendicular to the first direction for printing sub-images. Before printing starts, the printing head units are disposed at one end of a printing medium, and arranged to seamlessly splice the sub-images printed by the printing head units into a complete large-format printing image.
    Type: Grant
    Filed: May 19, 2010
    Date of Patent: October 14, 2014
    Assignee: Beijing Zhongke Nano-Think Print Technology Co., Ltd.
    Inventors: Yanlin Song, Jianguo Yang, Ke Xiao
  • Patent number: 8766169
    Abstract: A method and system for controlled fractionation of particles. A sample having a plurality of particles of different size distributions. A uniform array for the preparing of optical traps having a selected array lattice constant. The plurality of particles for inputting the plurality of particles to the uniform array of optical traps at a driving direction angle ? and the plurality of particles separating along different directions ?v based on variable particle attributes.
    Type: Grant
    Filed: December 21, 2010
    Date of Patent: July 1, 2014
    Assignee: New York University
    Inventors: David G. Grier, Ke Xiao
  • Publication number: 20140027907
    Abstract: A semiconductor device comprising: a lower semiconductor package that comprises a first set of one or more semiconductor dies, an upper semiconductor package that is stacked on the lower semiconductor package, the upper semiconductor package comprises a second set of one or more semiconductor dies, and a first interconnect pad that is embedded in a top side of the lower semiconductor package to couple the upper semiconductor package to the lower semiconductor package.
    Type: Application
    Filed: September 26, 2013
    Publication date: January 30, 2014
    Inventors: Ke XIAO, Henry K. HONG, Gunaranjan VISWANATHAN
  • Patent number: 8580609
    Abstract: A semiconductor device comprising: a lower semiconductor package that comprises a first set of one or more semiconductor dies, an upper semiconductor package that is stacked on the lower semiconductor package, the upper semiconductor package comprises a second set of one or more semiconductor dies, and a first interconnect pad that is embedded in a top side of the lower semiconductor package to couple the upper semiconductor package to the lower semiconductor package.
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: November 12, 2013
    Assignee: Intel Corporation
    Inventors: Ke Xiao, Henry K. Hong, Gunaranjan Viswanathan
  • Publication number: 20130278743
    Abstract: A method for analyzing porosity of a particle and a medium disposed in the porosity of the particle. A video-holographic microscope is provided to analyze interference patterns produced by providing a laser source to output a collimated beam, scattering the collimated beam off a particle and interacting with an unscattered beam to generate the interference pattern for analyzation to determine the refractive index of the particle and a medium disposed in the porosity of the particle to measure porosity and the medium.
    Type: Application
    Filed: November 4, 2011
    Publication date: October 24, 2013
    Applicant: New York University
    Inventors: Fook Chiong Cheong, Ke Xiao, David Pine, David G. Grier
  • Publication number: 20130057612
    Abstract: A large-format printing apparatus includes multiple printing head units. Each of the printing head units can intermittently and steppingly move in a first direction and has a printing nozzle which can move reciprocatingly in a second direction which is perpendicular to the first direction for printing sub-images. Before printing starts, the printing head units are disposed at one end of a printing medium, and arranged to seamlessly splice the sub-images printed by the printing head units into a complete large-format printing image.
    Type: Application
    Filed: May 19, 2010
    Publication date: March 7, 2013
    Applicant: BEIJING ZHONGKE NANO-THINK PRINT TECHNOLOGY CO., LTD.
    Inventors: Yanlin Song, Jianguo Yang, Ke Xiao
  • Publication number: 20120273664
    Abstract: A method and system for controlled fractionation of particles. A sample having a plurality of particles of different size distributions. A uniform array for the preparing of optical traps having a selected array lattice constant. The plurality of particles for inputting the plurality of particles to the uniform array of optical traps at a driving direction angle and the plurality of particles separating along different directions based on variable particle attributes.
    Type: Application
    Filed: December 21, 2010
    Publication date: November 1, 2012
    Inventors: David G. Grier, Ke Xiao
  • Publication number: 20120135535
    Abstract: An in-line holographic microscope can be used to analyze on a frame-by-frame basis a video stream to track individual colloidal particles' three-dimensional motions. The system and method can provide real time nanometer resolution, and simultaneously measure particle sizes and refractive indexes. Through a combination of applying a combination of Lorenz-Mie analysis with selected hardware and software methods, this analysis can be carried out in near real time. An efficient particle identification methodology automates initial position estimation with sufficient accuracy to enable unattended holographic tracking and characterization.
    Type: Application
    Filed: January 14, 2010
    Publication date: May 31, 2012
    Inventors: David G. Grier, Fook Chiong Cheong, Ke Xiao
  • Publication number: 20100327420
    Abstract: A semiconductor device comprising: a lower semiconductor package that comprises a first set of one or more semiconductor dies, an upper semiconductor package that is stacked on the lower semiconductor package, the upper semiconductor package comprises a second set of one or more semiconductor dies, and a first interconnect pad that is embedded in a top side of the lower semiconductor package to couple the upper semiconductor package to the lower semiconductor package.
    Type: Application
    Filed: June 30, 2009
    Publication date: December 30, 2010
    Inventors: Ke Xiao, Henry K. Hong, Gunaranjan Viswanathan