Abstract: Provided is a multi-layered memory apparatus including an oxide thin film transistor. The multi-layered memory apparatus includes an active circuit unit and a memory unit formed on the active circuit unit. A row line and a column line are formed on memory layers. A selection transistor is formed at a side end of the row line and the column line.

Abstract: A stacked memory device includes a plurality of memory layers, where at least one of the plurality of memory layers is stacked on another of the plurality of memory layers and each of the memory layers includes an array of memory cells, a first active circuit unit configured to classify and process address information for at least one of the memory cells as vertical address information and horizontal address information, and at least one second active circuit unit configured to generate a memory selection signal for at least one of the memory cells based on signals processed by the first active circuit unit.

Abstract: A self-calibrating temperature sensor and a method thereof are provided. The self-calibrating temperature sensor may include a reference voltage generator to generate a reference voltage based on temperature, a digital-to-analog converter to convert a first digital signal into an analog sensing voltage, a comparator to compare the reference voltage with the analog sensing voltage, and to generate a comparison result signal, a digital signal generator to generate and update the first digital signal based on the comparison result signal, a first storage circuit to store the first digital signal based on a first temperature, a data output unit to output data corresponding to a second temperature based on the first digital signal and a second digital signal output from the first storage circuit.

Abstract: A dynamic random access memory device having reduced power consumption and a refresh cycle method. The memory device includes a monitoring address storage unit storing multiple monitoring addresses, an error correction code (ECC) engine detecting whether or not an error occurs in monitoring bits corresponding to the monitoring addresses, and a refresh cycle determining circuit adjusting a self refresh cycle depending on whether or not an error occurs in the monitoring bits.

Abstract: Provided are a semiconductor device having a block state confirmation cell that may store information indicating the number of data bits written to a plurality of memory cells, a method of reading memory data based on the number of the data bits written, and/or a memory programming method of storing the information indicating the number of the data bits written. The semiconductor device may include one or more memory blocks and a controller. Each of the memory blocks may include a plurality of memory cells each storing data, and a block state confirmation cell storing information indicating the number of data bits written to the memory cells. The controller may read the data bits from the memory blocks based on the number of data bits, which is indicated in the information in the block state confirmation cell.

Abstract: A memory device has a global input/output line pair configured for data transfer. The memory device includes a sense amplifier, a detecting unit and a detect control signal generating unit. The sense amplifier is coupled to the global input/output line pair. The detecting unit detects a potential difference between the global input/output line pair. The detect control signal generating unit disables an operation of the sense amplifier and precharges the global input/output line pair to a predetermined voltage. A precharge operation of a memory device may be performed at a higher speed so that a high speed operation of the memory device may be achieved. In addition, the operating time of the sense amplifier may be decreased so that the power consumption of the memory device may be reduced.

Abstract: A self-calibrating temperature sensor and a method thereof are provided. The self-calibrating temperature sensor may include a reference voltage generator to generate a reference voltage based on temperature, a digital-to-analog converter to convert a first digital signal into an analog sensing voltage, a comparator to compare the reference voltage with the analog sensing voltage, and to generate a comparison result signal, a digital signal generator to generate and update the first digital signal based on the comparison result signal, a first storage circuit to store the first digital signal based on a first temperature, a data output unit to output data corresponding to a second temperature based on the first digital signal and a second digital signal output from the first storage circuit.

Abstract: A memory device having a dual port function includes a memory cell array and a switching unit. The memory cell array has a first port and a second port. The switching unit assigns first data received through a data bus to the first port in response to a leading edge of a clock signal and assigns second data received through the data bus to the second port in response to a trailing edge of the clock. Methods of operating memory devices having a dual port mode are also disclosed.

Abstract: An output driver is responsive to an input signal and a swing width control signal (TE). The output driver is configured to generate an output signal having a first swing width (e.g., less than rail-to-rail) when the swing width control signal designates a normal mode of operation and a second swing width (e.g., rail-to-rail) when the swing width control signal designates a test mode of operation.

Abstract: I claim a device and method for reducing current consumption. The device including a memory cell array having a first region to store normal data and a second region to store both normal data and parity data associated with error correction functionality, and a refresh control unit to perform refresh operations on the memory cell array, the refresh control unit adapted to adjust a cycle associated with the performance of the refresh operations responsive to the storage of normal data in the second region.

Abstract: A dynamic random access memory device having reduced power consumption and a refresh cycle method. The memory device includes a monitoring address storage unit storing multiple monitoring addresses, an error correction code (ECC) engine detecting whether or not an error occurs in monitoring bits corresponding to the monitoring addresses, and a refresh cycle determining circuit adjusting a self refresh cycle depending on whether or not an error occurs in the monitoring bits.

Abstract: A memory device has a global input/output line pair configured for data transfer. The memory device includes a sense amplifier, a detecting unit and a detect control signal generating unit. The sense amplifier is coupled to the global input/output line pair. The detecting unit detects a potential difference between the global input/output line pair. The detect control signal generating unit disables an operation of the sense amplifier and precharges the global input/output line pair to a predetermined voltage. A precharge operation of a memory device may be performed at a higher speed so that a high speed operation of the memory device may be achieved. In addition, the operating time of the sense amplifier may be decreased so that the power consumption of the memory device may be reduced.

Abstract: A duty cycle correction circuit for use in a semiconductor device, which synchronizes with an external clock and corrects a duty cycle, is provided. The duty cycle correction circuit includes a modulator of an inverter structure having at least one or more transistors. The modulator receives a control signal through a source terminal and a bulk of any one of the transistors and corrects a duty cycle in response to an external clock signal. The duty cycle correction circuit also includes a driver that converts an output signal of the modulator into a full swing level and outputs the converted output signal of the modulator, and a feedback loop that generates the control signal in response to an output signal of the driver.

Abstract: A power-on reset circuit and method for the same may provide reset signals during power-up and/or power-down cycles, to reduce the chances of error. An error may occur, for example, due to voltage fluctuations and/or the ambient temperature of circuit components. Reducing the chances of error during a power-up cycle may include setting an output node of a circuit to a reset state when a power supply voltage reaches a first voltage level and outputting a power-on reset signal to the output node when the power supply voltage equals a second voltage level higher than the first. Reducing the chances of error during a power-down cycle may include setting the output node to a reset state when the output node reaches a third voltage level between the first and second voltage levels.

Abstract: A sense amplifier including a pair of differential transistors configured to amplify a differential signal applied to a pair of I/O lines, each transistor having a terminal, a current supplying circuit configured to supply a current to the differential transistors in response to an enable signal, and a coupling element configured to electrically connect or disconnect the terminals of the differential transistors in response to the enable signal.

Abstract: A DAC circuit can include a plurality of current source circuits configured to operate responsive to respective different bias voltage signals and respective true and complementary binary digit signals.

Abstract: A memory device having a dual port function includes a memory cell array and a switching unit. The memory cell array has a first port and a second port. The switching unit assigns first data received through a data bus to the first port in response to a leading edge of a clock signal and assigns second data received through the data bus to the second port in response to a trailing edge of the clock. Methods of operating memory devices having a dual port mode are also disclosed.

Abstract: A duty cycle correction circuit for use in a semiconductor device, which synchronizes with an external clock and corrects a duty cycle, is provided. The duty cycle correction circuit includes a modulator of an inverter structure having at least one or more transistors. The modulator receives a control signal through a source terminal and a bulk of any one of the transistors and corrects a duty cycle in response to an external clock signal. The duty cycle correction circuit also includes a driver that converts an output signal of the modulator into a full swing level and outputs the converted output signal of the modulator, and a feedback loop that generates the control signal in response to an output signal of the driver.

Abstract: A voltage generating circuit capable of generating a stable output voltage irrespective of a variation in external voltage. The voltage generating circuit includes a voltage comparing circuit that operates in response to an activation signal and outputs output voltage to a control node in response to a difference between a reference voltage and an internal voltage; an internal voltage control circuit that is connected to the control node, and receives the external voltage and controls the level of the internal voltage, which is applied to a load, in response to a voltage value of the control node, and an adjusting means for adjusting an amount of driving current flowing through the internal voltage control circuit by controlling the voltage level at the control node. The adjusting means may include any combination of a clamp circuit, a voltage compensating circuit, and a voltage drop circuit.

Abstract: A DAC circuit can include a plurality of current source circuits configured to operate responsive to respective different bias voltage signals and respective true and complementary binary digit signals.