Patents by Inventor Keiichi Okamoto

Keiichi Okamoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170218206
    Abstract: A multilayer coating film 12 includes a bright layer 15 and a colored layer 16 superposed on the bright layer 15, the bright layer 15 including aluminum flakes 22, and the colored layer 16 including a black pigment 23 dispersed in the colored layer 16. The black pigment 23 in the colored layer 16 has a particle size distribution with a peak at a particle size of 200 nm or lower.
    Type: Application
    Filed: November 2, 2015
    Publication date: August 3, 2017
    Applicant: MAZDA MOTOR CORPORATION
    Inventors: Takakazu YAMANE, Keiichi OKAMOTO, Kouji TERAMOTO
  • Patent number: 9409198
    Abstract: The invention is a method, an apparatus, and a coated product-manufacturing method each capable of applying a coating solution to a flexible backing sheet using a die coater while preventing contaminants from forming defects. A virtual line L is drawn to pass through the discharge port 74 of the die coater 7 and to extend perpendicular to the backing sheet 1, the distance D1 between a starting line P1 and a boundary line P2 is 50 mm or less, and the distance between the starting line P1 and a line on the roller P3 is 5 ?m or more.
    Type: Grant
    Filed: November 24, 2011
    Date of Patent: August 9, 2016
    Assignee: NITTO DENKO CORPORATION
    Inventors: Toshitsugu Hosokawa, Keiichi Okamoto, Satoru Yamamoto
  • Publication number: 20130243957
    Abstract: The invention is a method, an apparatus, and a coated product-manufacturing method each capable of applying a coating solution to a flexible backing sheet using a die coater while preventing contaminants from forming defects.
    Type: Application
    Filed: November 24, 2011
    Publication date: September 19, 2013
    Applicant: NITTO DENKO CORPORATION
    Inventors: Toshitsugu Hosokawa, Keiichi Okamoto, Satoru Yamamoto
  • Publication number: 20100169484
    Abstract: A server controlling each computer is provided with means for distributing file patterns for identifying unauthorized communication programs. Said computer is provided with a filtering module for performing monitoring and regulation processing on communications originating from the computer. Said filtering module is provided with a database for storing the file patterns acquired from the server, means for monitoring the communications of a communication module started by the computer and detecting the occurrence of a communication start request to other computers, means for comparing the file pattern of the communication module to the file patterns within the database and inspecting whether or not the communication module is an unauthorized communication program, and means for regulating the communications of the communication module when the inspection means has judged it to be an unauthorized communication program.
    Type: Application
    Filed: December 15, 2005
    Publication date: July 1, 2010
    Inventors: Keiichi Okamoto, Ryu Naeki
  • Publication number: 20100169472
    Abstract: A centralized control server for controlling each computer includes a step for setting monitoring rules including warning conditions and processing forms at the time of warning for web accesses which are improper from a business or educational point of view. A client computer is provided with a filtering module for monitoring web accesses. Said filtering module includes a step for analyzing the communication contents of the client computer and detecting the occurrence of a web access to an object to be monitored prescribed by the monitoring rules, a step for counting an access quantity at the time of detection of the web access, and a step for issuing warning processing in real time to a user or an administrator in accordance with the processing forms at the time of warning when it is judged that the access quantity has reached an upper limit value prescribed by the warning conditions.
    Type: Application
    Filed: December 15, 2005
    Publication date: July 1, 2010
    Inventors: Keiichi Okamoto, Ryu Naeki
  • Publication number: 20070243367
    Abstract: A method of manufacturing an optical functional film including an application step of applying a resin solution onto a substrate film made of a thermoplastic resin and an immobilizing step of immobilizing a resin applied to form a resin layer, characterized by that it further comprises, prior to the application step, a stretching step of stretching the substrate film with the substrate film kept heated.
    Type: Application
    Filed: July 3, 2006
    Publication date: October 18, 2007
    Applicant: Nitto Denko Corporation
    Inventors: Wataru Nagatake, Seiji Kondou, Keiichi Okamoto, Ryouichi Takamura
  • Patent number: 5767848
    Abstract: A development support system for supporting new product development activities including designing, manufacturing experimental models and testing the functions of the experimental models and for providing an environment for the cooperative activities of a plurality of members of a development project team has a model storage for storing product models, resource models of resources to be used for product development and product development activity models; a target storage for storing target values of schedules of product development, and the cost and the performance of the product; an estimating unit for estimating schedules of product development and the cost and the performance of the product on the basis of the models stored in the model storage; a support unit for support the operations of the members of the development project team for making reference to the models, the target values and the estimated values, and changing and particularizing the models, the target values and the estimated values; a noti
    Type: Grant
    Filed: December 13, 1994
    Date of Patent: June 16, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Kichie Matsuzaki, Keiichi Okamoto, Hideaki Suzuki, Hiroshi Makita, Hisashi Onari, Toshijiro Ohashi, Mitsuharu Hayakawa, Roberto Kishikawa, Hiroshi Kitazawa
  • Patent number: 4777641
    Abstract: A method and apparatus for alignment for use in X-ray exposure or the like wherein a mask is provided having a formation of an alignment pattern made up of at least one linear segment formed in a peripheral section of the mask and a wafer is provided having a formation of an alignment pattern formed in a same direction as the alignment pattern of the mask and made up of linear segments. An illuminating arrangement illuminates a light to the mask alignment pattern along a direction inclined to the alignment direction and the mask alignment pattern and the wafer alignment pattern are imaged and transformed into a video signal. An A/D converts the video signal into a digital signal and stores the digital signal in a memory.
    Type: Grant
    Filed: October 14, 1986
    Date of Patent: October 11, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Akira Inagaki, Yukio Kembo, Ryuichi Funatsu, Asahiro Kuni, Keiichi Okamoto, Yoshihiro Komeyama
  • Patent number: 4744047
    Abstract: An apparatus for testing printed wiring patterns for use in combination with an apparatus including a plurality of dedicated pattern generators for generating arcuate wiring patterns. In contrast to the conventional LSI pattern inspection effected with design data being inputted, the apparatus can inspect the pattern including curved portions peculiar to the printed wiring pattern. Although the conventional LSI inspection technique involves an impracticably increased amount of design data, the invention allows the test or inspection to be performed at a high speed with an improved reliability and can be applied to the inspection of any pattern including arcuate patterns. By inputting graphic data in conformance with the order for generating patterns, pattern generation can be accomplished not only through ordinary raster scan but also by other various scanning methods.
    Type: Grant
    Filed: October 31, 1985
    Date of Patent: May 10, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Keiichi Okamoto, Toshimitsu Hamada, Mineo Nomoto
  • Patent number: 4708484
    Abstract: The present invention relates, in a projection aligner wherein a mask and a wafer are held proximate to one another and wherein a circuit pattern depicted on the mask is transferred onto the wafer, to a method of detecting the respective positions of the mask and the wafer for the relative positioning between the mask and the wafer.
    Type: Grant
    Filed: October 21, 1985
    Date of Patent: November 24, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Yoshihiro Komeyama, Yukio Kembo, Asahiro Kuni, Ryuuichi Funatsu, Akira Inagaki, Minoru Ikeda, Keiichi Okamoto
  • Patent number: 4628531
    Abstract: A pattern checking apparatus carries out the detection of candidate defects through a primary selection with a sensitivity high enough to detect any existing defect, and then carries out a detailed analysis by a controlling processor for a pattern including the periphery of the detected candidate defect through a secondary selection in which a candidate defect which is not a defect in a practical sense is removed from candidates, so that only real defects are detected.
    Type: Grant
    Filed: February 27, 1984
    Date of Patent: December 9, 1986
    Assignee: Hitachi, Ltd.
    Inventors: Keiichi Okamoto, Kozo Nakahata, Yukio Matsuyama, Hideaki Doi, Susumu Aiuchi, Mineo Nomoto
  • Patent number: 3943359
    Abstract: A positioning apparatus comprising marks for position detection which are respectively formed on a plurality of objects, means to cause optical images of the position detecting marks from the respective objects to reach a scanning mechanism, the scanning mechanism scanning the optical images at the same time, a plurality of detectors, each of which consists of a slit and a photoelectric element, the slits being arranged on an identical optical axis so that the optical images of the position detecting marks of the respective objects as scanned by the scanning mechanism may be detected respectively and individually, and a driving device which moves one of the plurality of objects on the basis of signals from the detectors, to effect the relative positioning of the plurality of objects.
    Type: Grant
    Filed: June 17, 1974
    Date of Patent: March 9, 1976
    Assignee: Hitachi, Ltd.
    Inventors: Yoshio Matsumoto, Keiichi Okamoto
  • Patent number: 3941980
    Abstract: The present invention discloses a scanning photoelectric microscope in which a first reference object to be measured which is mounted on a stationary support is disposed relative to a second object to be measured which is disposed on a slidable table so as to form on both sides of the first object to be measured two indication intervals, which are caused to coincide with each other for alignment.
    Type: Grant
    Filed: October 11, 1973
    Date of Patent: March 2, 1976
    Assignees: Hitachi, Ltd., Yasujiro Oshima
    Inventors: Keiichi Okamoto, Yoshio Matsumoto, Yasujiro Oshima