Abstract: An apparatus that includes a plurality of first memory mats each including a plurality of common column sections except for at least one associated column section, the at least one associated column sections being selected by respective column addresses which are different from one another; and a second memory mat including the at least one corresponding column sections therein.

Abstract: Apparatuses and methods for signal line buffer timing control are disclosed. An example apparatus includes a plurality of signal lines including first and second control lines and further including data lines, and further includes first and second signal line buffers. The first signal line buffer includes first driver circuits configured to drive respective data signals on the data lines and to drive first and second control signals on the first and second control lines, respectively. The second signal line buffer includes second driver circuits configured to be activated to receive the data signals. The first and second control signals arrive at the second signal line buffer at different times. The second driver circuits are activated responsive a later one of active first and second control signals and are deactivated responsive to an earlier one of inactive first and second control signals.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. A first latch may hold the encoded bit and provide it as a write parity bit to the memory array as part of a write operation. A second latch may hold a parity bit read from the memory array and the ECC circuit may generate a command signal based on that parity bit. A multiplexer latch may hold the encoded bit and provide a syndrome bit based on the command signal and the encoded bit. The syndrome bit may indicate if there is mismatch between the parity bit and the encoded bit. The logic which handles generating the syndrome bit may be separated from the logic tree.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. A first latch may hold the encoded bit and provide it as a write parity bit to the memory array as part of a write operation. A second latch may hold a parity bit read from the memory array and the ECC circuit may generate a command signal based on that parity bit. A multiplexer latch may hold the encoded bit and provide a syndrome bit based on the command signal and the encoded bit. The syndrome bit may indicate if there is mismatch between the parity bit and the encoded bit. The logic which handles generating the syndrome bit may be separated from the logic tree.

Abstract: Apparatuses, systems, and methods for latch reset logic. Banks may have local latches which are coupled between a global data bus and the bank. Some of the local latches may be shared local latches which are coupled to a first bank and a second bank. The shared latches may latch data responsive to a first clock signal and a second clock signal, and may reset responsive to a combined reset signal. A reset logic circuit may receive the clock signals and a first and second reset signal. The reset logic circuit may provide the combined reset signal based on the first and second clock signals and reset signals. The clocks signals may be column active commands and the reset signals may be waveforms (e.g., falling edges) of row active commands used as part of access operations on the first or the second memory bank.

Abstract: Apparatuses and methods for signal line buffer timing control are disclosed. An example apparatus includes a plurality of signal lines including first and second control lines and further including data lines, and further includes first and second signal line buffers. The first signal line buffer includes first driver circuits configured to drive respective data signals on the data lines and to drive first and second control signals on the first and second control lines, respectively. The second signal line buffer includes second driver circuits configured to be activated to receive the data signals. The first and second control signals arrive at the second signal line buffer at different times. The second driver circuits are activated responsive a later one of active first and second control signals and are deactivated responsive to an earlier one of inactive first and second control signals.

Abstract: Apparatuses, systems, and methods for error correction. A memory device may have a number of memory cells each of which stores a bit of information. A first latch may hold the encoded bit and provide it as a write parity bit to the memory array as part of a write operation. A second latch may hold a parity bit read from the memory array and the ECC circuit may generate a command signal based on that parity bit. A multiplexer latch may hold the encoded bit and provide a syndrome bit based on the command signal and the encoded bit. The syndrome bit may indicate if there is mismatch between the parity bit and the encoded bit. The logic which handles generating the syndrome bit may be separated from the logic tree.

Abstract: Apparatuses, systems, and methods for latch reset logic. Banks may have local latches which are coupled between a global data bus and the bank. Some of the local latches may be shared local latches which are coupled to a first bank and a second bank. The shared latches may latch data responsive to a first clock signal and a second clock signal, and may reset responsive to a combined reset signal. A reset logic circuit may receive the clock signals and a first and second reset signal. The reset logic circuit may provide the combined reset signal based on the first and second clock signals and reset signals. The clocks signals may be column active commands and the reset signals may be waveforms (e.g., falling edges) of row active commands used as part of access operations on the first or the second memory bank.

Abstract: Apparatuses and methods for signal line buffer timing control are disclosed. An example apparatus includes a plurality of signal lines including first and second control lines and further including data lines, and further includes first and second signal line buffers. The first signal line buffer includes first driver circuits configured to drive respective data signals on the data lines and to drive first and second control signals on the first and second control lines, respectively. The second signal line buffer includes second driver circuits configured to be activated to receive the data signals. The first and second control signals arrive at the second signal line buffer at different times. The second driver circuits are activated responsive a later one of active first and second control signals and are deactivated responsive to an earlier one of inactive first and second control signals.

Abstract: Apparatuses, systems, and methods for latch reset logic. Banks may have local latches which are coupled between a global data bus and the bank. Some of the local latches may be shared local latches which are coupled to a first bank and a second bank. The shared latches may latch data responsive to a first clock signal and a second clock signal, and may reset responsive to a combined reset signal. A reset logic circuit may receive the clock signals and a first and second reset signal. The reset logic circuit may provide the combined reset signal based on the first and second clock signals and reset signals. The clocks signals may be column active commands and the reset signals may be waveforms (e.g., falling edges) of row active commands used as part of access operations on the first or the second memory bank.

Abstract: Disclosed herein is a device includes a command generation circuit: that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first, and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: Disclosed herein is a device includes a command generation circuit: that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first, and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: Disclosed herein is a device includes a command generation circuit that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: Disclosed herein is a device includes a command generation circuit that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: Disclosed herein is a device includes a command generation circuit that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: Disclosed herein is a device includes a command generation circuit that activates first and second command signals, an internal circuit that includes a plurality of transistors that are brought into a first operation state when at least one of the first and second command signals is activated, and an output gate circuit that receives a first signal output from the internal circuit, the output gate circuit being configured to pass the first signal when the second command signal is deactivated and to block the first signal when the second command signal is activated.

Abstract: A semiconductor device comprises a memory cell array, a row control circuit for controlling an access to the memory cell array, and a refresh control circuit for instructing the row control circuit to refresh the memory cell array. After temporarily transiting to a reset state due to an activation of a reset signal, the refresh control circuit instructs to refresh the memory cell array in response to a transition to an initial state due to a de-activation of the reset signal.

Abstract: A semiconductor device includes a first circuit that generates a self refresh signal in a predetermined cycle asynchronous with a cycle set externally, a second circuit that generates a refresh address in response to the self refresh signal and updates the refresh address and outputs the refresh address, a third circuit that retains a relief address, a fourth circuit that counts number of generation of the self refresh signal and activates an interrupt signal when a count of the number of generation reaches a predetermined count, a fifth circuit that specifies the refresh address when the interrupt signal is in an inactive state and specifies the relief address when the interrupt signal is in an active state, and a sixth circuit that performs a refresh operation on memory cells specified by the selected refresh address or the relief address. The second circuit temporarily stops updating the refresh address in response to activation of the interrupt signal.

Abstract: A semiconductor device comprises a memory cell array, a row control circuit for controlling an access to the memory cell array, and a refresh control circuit for instructing the row control circuit to refresh the memory cell array. After temporarily transiting to a reset state due to an activation of a reset signal, the refresh control circuit instructs to refresh the memory cell array in response to a transition to an initial state due to a de-activation of the reset signal.

Abstract: A semiconductor device includes a first circuit that generates a self refresh signal in a predetermined cycle asynchronous with a cycle set externally, a second circuit that generates a refresh address in response to the self refresh signal and updates the refresh address and outputs the refresh address, a third circuit that retains a relief address, a fourth circuit that counts number of generation of the self refresh signal and activates an interrupt signal when a count of the number of generation reaches a predetermined count, a fifth circuit that specifies the refresh address when the interrupt signal is in an inactive state and specifies the relief address when the interrupt signal is in an active state, and a sixth circuit that performs a refresh operation on memory cells specified by the selected refresh address or the relief address. The second circuit temporarily stops updating the refresh address in response to activation of the interrupt signal.