Patents by Inventor Kenichi Ao

Kenichi Ao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5262666
    Abstract: A semiconductor device including a substrate, a semiconductor element formed on the substrate, a terminal formed on the substrate and electrically connected to the semiconductor element, and a protective resistor formed on the substrate and electrically connected between the semiconductor element and the terminal. The resistor is composed of a ferromagnetic magnetoresistive material including Ni alloy. The device may be extended to detect magnetism by adding a magnetoresistive element composed of a ferromagnetic magnetoresistive material including the same Ni alloy as for the protective resistor and deposited at the same time. The device is superior in an anti-noise characteristic and is integrated. Furthermore, the device for detecting magnetism is formed with a lower cost.
    Type: Grant
    Filed: February 10, 1992
    Date of Patent: November 16, 1993
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yoshimi Yoshino, Hideto Morimoto, Kenichi Ao
  • Patent number: 5005064
    Abstract: According to this invention, a device for detecting magnetism comprises; a substrate, an interposed insulating layer containing impurities therein, formed on the substrate, and a ferromagnetic magnetoresistive element formed on the interposed layer, wherein at least a portion of the interposed layer on which the ferromagnetic magnetoresistive element is formed has a concentration of impurities of less than a predetermined value. Further, in the device of this invention, the surface of the layer interposed between the substrate and the ferromagnetic magnetoresistive element has a surface roughness of less than 120 and an angle between a contacting surface of a conductive wiring and the ferromagnetic magnetoresistive element and the surface of the interposed layer is less than 78 degrees.
    Type: Grant
    Filed: August 18, 1988
    Date of Patent: April 2, 1991
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yoshimi Yoshino, Kenichi Ao, Ichiro Izawa, Toshikazu Arasuna
  • Patent number: 4937521
    Abstract: A current detecting device comprises a substrate, a magnetism sensing member made of ferromagnetic magnetoresistance element, an insulating member, and a conducting member, and these members are formed by a photolithography technique such that the magnetism sensing member is electrically isolated from the conducting member by the insulating member. When a current flows into the conducting member, the magnetism sensing member responds to a magnetic field generated by the current. At this time, the resistance of the magnetism sensing member changes due to a magnetoresistance effect in accordance with the intensity of the current. Therefore, the current can be measured by detecting the resistance change. In such a current detecting device, there is no reactance component thereby achieving high sensitivity when detecting the current.
    Type: Grant
    Filed: July 7, 1988
    Date of Patent: June 26, 1990
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yoshimi Yoshino, Tatuya Kakehi, Hiroshi Sakurai, Kenichi Ao, Toshikazu Arasuna, Ichiroh Izawa
  • Patent number: 4835509
    Abstract: A potentiometer includes a magnetoresistive element made of ferromagnetic material. A device applies a magnetic field to the magnetoresistive element. An absolute value of the magnetic field applied to the magnetoresistive element is equal to or greater than a saturation magnetic field with respect to the ferromagnetic magnetoresistive element. The magnetic field applying device is movable relative to the magnetoresistive element.
    Type: Grant
    Filed: July 23, 1987
    Date of Patent: May 30, 1989
    Assignee: Nippondenso Co., Ltd.
    Inventors: Yoshimi Yoshino, Toshikazu Arasuna, Kenichi Ao, Katsuhiko Ariga, Toshikazu Matsushita, Ichiro Izawa
  • Patent number: 4754221
    Abstract: When applying a bias field in the direction of the easy axis of magnetization of a signal field-detecting MR element assembly, a leakage magnetic field of a magnetic recording medium adapted to generate a signal field is applied as the desired bias field without using any exclusive bias field application device. The magnetic recording medium and the thin-film MR element assembly are arranged in a manner that they make a predetermined angle.
    Type: Grant
    Filed: December 9, 1985
    Date of Patent: June 28, 1988
    Assignee: Nippondenso Co., Ltd.
    Inventors: Kenichi Ao, Yoshimi Yoshino