Patents by Inventor Kenji Takubo

Kenji Takubo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12188769
    Abstract: A defect inspection device (100) includes an excitation unit that excites an elastic wave, an irradiation unit (2) that applies laser lights, a measurement unit (3) that measures the interfered laser lights, and a control unit that acquires vibration state information which is information about a state of the elastic wave excited in an inspection target (P) for a plurality of frequencies by changing a frequency of excitation vibration caused by the excitation unit in order to excite the elastic wave in the inspection target (P), and extracts recommended frequencies (F) recommended for inspecting a defect of the inspection target (P) from among the plurality of frequencies based on the acquired vibration state information for the plurality of frequencies.
    Type: Grant
    Filed: October 12, 2020
    Date of Patent: January 7, 2025
    Assignee: SHIMADZU CORPORATION
    Inventors: Koki Yoshida, Kenji Takubo, Takahide Hatahori
  • Patent number: 12111266
    Abstract: A vibration measurement device 10 includes an excitation unit (signal generator 11 and vibrator 12) for exciting an elastic wave to an inspection target S, an illumination unit (wavelength stabilized laser beam source 13 and illumination light lens 14) for performing stroboscopic illumination to a measurement region of a surface of the inspection target S using a wavelength stabilized laser beam source 13, a displacement measurement unit (speckle-sharing interferometer 15) for collectively measuring a displacement of each point of the measurement region in the back-and-forth direction by speckle interferometry or speckle-sharing interferometer. By using the wavelength stabilized laser beam source 13, an interference image can be obtained even when the inspection target S has large surface irregularities.
    Type: Grant
    Filed: December 13, 2018
    Date of Patent: October 8, 2024
    Assignee: SHIMADZU CORPORATION
    Inventors: Takahide Hatahori, Yuya Nagata, Kenji Takubo
  • Publication number: 20240319081
    Abstract: The quantum optical system changes a phase of quantum interference occurring between a plurality of physical processes, in each of which a quantum entangled photon pair of a signal photon and an idler photon is generated. Each of a plurality of pixels outputs a detection signal of the signal photon in a state where a sample is arranged in an optical path of the idler photon. A processor calculates an absorption spectroscopy characteristic based on an interferogram indicating a variation in a signal intensity acquired from each of the plurality of pixels in accordance with the change in the phase of the quantum interference. The processor: applies a processing to reduce phase difference of the interferogram among the plurality of pixels; spatially integrates, over the plurality of pixels, the interferogram having gone through the processing to reduce phase differences; and calculates the absorption spectroscopy characteristic based on the integrated interferogram.
    Type: Application
    Filed: March 18, 2024
    Publication date: September 26, 2024
    Inventors: Hideaki KATSU, Koji TOJO, Kenji TAKUBO, Yuya NAGATA, Shigeki TAKEUCHI, Ryo OKAMOTO
  • Patent number: 12099000
    Abstract: In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.
    Type: Grant
    Filed: December 7, 2022
    Date of Patent: September 24, 2024
    Assignee: SHIMADZU CORPORATION
    Inventors: Takahide Hatahori, Kenji Takubo, Tomotaka Nagashima
  • Publication number: 20240230601
    Abstract: A defect inspection apparatus (100) according to the present invention includes an exciter (1), an irradiator (laser illuminator 2) configured to irradiate an inspection target (8) with laser light, and a measurer (3) configured to change a phase of the laser light reflected by the inspection target (8) to cause the laser light having an unchanged phase to interfere with the laser light having a changed phase, and to measure the interference light. The measurer (3) is configured to acquire an interference image (71) representing a vibration state of the inspection target (8) as viewed in a direction extending along a first light path (21), and an interference image (72) representing a vibration state of the inspection target (8) as viewed in a direction extending along a second light path (22) in which the reflected laser light travels from the inspection target (8) in a direction different from the first light path (21).
    Type: Application
    Filed: March 25, 2022
    Publication date: July 11, 2024
    Applicant: SHIMADZU CORPORATION
    Inventors: Hiroshi HORIKAWA, Kenji TAKUBO, Takahide HATAHORI
  • Patent number: 11982641
    Abstract: The method for examining a clinched portion of a tubular body includes the steps of: giving an elastic vibration to a clinched body 90 formed by clinching a tubular body 91 with a clinch-target member 92; and acquiring, for each of a plurality of view areas 95 which differ from each other in the position in the circumferential direction of the tubular body 91, a vibration distribution optically and simultaneously measured within the view area 95 including a clinched portion 93 of the tubular body 91 and the clinch-target member 92, to determine whether or not the state of clinching is satisfactory over the entire clinched portion 93.
    Type: Grant
    Filed: April 13, 2020
    Date of Patent: May 14, 2024
    Assignees: SHIMADZU CORPORATION, Kobe Steel, Ltd.
    Inventors: Takahide Hatahori, Kenji Takubo, Koki Yoshida, Yoshihaya Imamura
  • Patent number: 11977032
    Abstract: A displacement measurement device 10 is provided with: a laser light source 11 for emitting laser light to a measurement area R of a measurement target object S; a focusing optical system (the beam splitter 151, the first reflecting mirror 1521, the condenser lens 155) having a front focal point in the measurement area R and a rear focal point on a predetermined imaging surface (the detection surface 1561); a non-focusing optical system (the beam splitter 151, the diffuser 153, the second reflecting mirror 1522, and the condenser lens 155) in which light from a measurement area R of a correspondence point in the measurement area corresponding to each point of the imaging surface with respect to the focusing optical system is incident on the point of the imaging surface; and a photodetector (image sensor 156) configured to detect light intensity on the imaging surface for each point.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: May 7, 2024
    Assignee: SHIMADZU CORPORATION
    Inventors: Takahide Hatahori, Kenji Takubo
  • Publication number: 20240076596
    Abstract: A cell culture container includes: an insert member having a membrane on which a cell is seeded, the insert member defining a first inner space that functions as an anaerobic chamber; a container having an attachment/detachment portion to and from which the insert member is attachable and detachable, the container defining a second inner space that functions as an aerobic chamber; a sealing member that closes an opening of the aerobic chamber between the attachment/detachment portion and the insert member with the insert member being attached to the attachment/detachment portion; and a transfer mechanism that transfers force to the sealing member. The sealing member closes the opening in response to an input of the force from the transfer mechanism.
    Type: Application
    Filed: October 14, 2021
    Publication date: March 7, 2024
    Inventors: Tsunehiro INOUE, Toyoyuki HASHIMOTO, Yasuko YONEDA, Kenji TAKUBO, Yoichi FUJIYAMA, Tomoki OHKUBO, Eiichi OZEKI, Ryogo TAKAI, Hiroomi GOTO, Sadamu TOMITA
  • Patent number: 11815493
    Abstract: A defect inspection apparatus (100) is provided with and an excitation unit (1) for exciting elastic waves, an irradiation unit (2) for emitting laser light, a measurement unit (3) for measuring interference light, and a control unit (4). The control unit is configured to acquire an image (61) representing a vibration state of an inspection target object (7) in a measurement area based on a measurement result of the measurement unit (3), detect a discontinuous portion in a vibration state in the measurement area from the image representing the vibration state as a defect (73), and identify a type of the defect based on at least one of a shape (62) of the detected defect and the vibration state of a defective portion.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: November 14, 2023
    Assignee: Shimadzu Corporation
    Inventors: Takahide Hatahori, Kenji Takubo, Koki Yoshida
  • Patent number: 11790513
    Abstract: This defect inspection apparatus (100) is provided with an excitation unit (1), a laser illumination unit (2), an interference unit (3), an imaging unit (35), and a control unit (4) for generating a moving image (61) related to the propagation of an elastic wave of an inspection target (7). The control unit is configured to perform control to display an identified measurement inappropriate region (81) in such a manner as to be distinguishable from a measurement appropriate region (82) in which the vibration state has been correctly acquired in the moving image (61).
    Type: Grant
    Filed: April 17, 2019
    Date of Patent: October 17, 2023
    Assignee: Shimadzu Corporation
    Inventors: Koki Yoshida, Takahide Hatahori, Kenji Takubo
  • Publication number: 20230313103
    Abstract: A cell culture container includes: a container body; a cell culture insert having a tubular portion and an oxygen-permeable membrane; and a lid member. The container body is provided with an opening that communicates with an interior of the container body. The tubular portion includes an upper end and a lower end, and is inserted in the opening such that the lower end is located inside the container body. The lower end side of the tubular portion is closed by the membrane. The upper end side of the tubular portion is closed by the lid member. The lid member includes a lower surface that faces toward an interior of the tubular portion. The lid member is provided with an electrode insertion port and a culture medium outlet port that each communicate with the interior of the tubular portion at the lower surface.
    Type: Application
    Filed: July 7, 2021
    Publication date: October 5, 2023
    Inventors: Tsunehiro INOUE, Toyoyuki HASHIMOTO, Yasuko YONEDA, Kenji TAKUBO, Yoichi FUJIYAMA, Tomoki OHKUBO, Eiichi OZEKI, Ryogo TAKAI, Hiroomi GOTO, Sadamu TOMITA
  • Patent number: 11774746
    Abstract: This interference image imaging apparatus includes a first optical member (21) and a second optical member (22), and has a first portion (8) for transmitting a first bundle of rays (7) to change a direction of outgoing light with respect to incident light, and a second portion (10) for changing a phase of second bundle of rays (9) with respect to the first bundle of rays (7).
    Type: Grant
    Filed: January 17, 2020
    Date of Patent: October 3, 2023
    Assignee: Shimadzu Corporation
    Inventors: Takahide Hatahori, Kenji Takubo, Koki Yoshida
  • Publication number: 20230304787
    Abstract: In a defect detection device (10), an exciter (11) gives a test object (S) a vibration with a variable frequency. A vibration state measurer (15, 163) performs a measurement of the vibration state of the surface of the test object by an optical means while the vibration is given to the test object, and determines, for each position on the surface, a numerical value representing the vibration state based on a result of the measurement. A judgment-index-value determiner (164) determines a judgment index value by Fourier transform based on the numerical value representing the vibration state at each position, where the judgment index value is a numerical value representing a strength of the vibration for each wavenumber. A wavenumber-wavelength determiner (165) determines, based on the judgment index value determined for each wavenumber, a wavenumber or wavelength of an elastic wave induced in the test object by the vibration.
    Type: Application
    Filed: December 6, 2022
    Publication date: September 28, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomotaka NAGASHIMA, Takahide HATAHORI, Kenji TAKUBO
  • Publication number: 20230251204
    Abstract: This defect inspection apparatus (100) is provided with an excitation unit (1), a laser illumination unit (2), an interference unit (30), an imaging unit (31), a holding member (4) for holding the imaging unit at a position spaced apart from an inspection target (90) by a predetermined distance, a connecting member (5) for connecting the holding member or the imaging unit and the excitation unit, and a controller (6) for generating an image (61) related to the propagation of an elastic wave on an inspection target.
    Type: Application
    Filed: July 2, 2020
    Publication date: August 10, 2023
    Inventors: Hiroshi HORIKAWA, Kenji TAKUBO
  • Publication number: 20230236111
    Abstract: In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.
    Type: Application
    Filed: December 7, 2022
    Publication date: July 27, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Takahide HATAHORI, Kenji TAKUBO, Tomotaka NAGASHIMA
  • Publication number: 20230220323
    Abstract: A cell culture system includes: a first pump; and a first cell culture container and a second cell culture container. The first cell culture container has a first culture medium circulation flow path. The second cell culture container has a second culture medium circulation flow path independent of the first culture medium circulation flow path. The first culture medium circulation flow path and the second culture medium circulation flow path are fluidly connected to the first pump.
    Type: Application
    Filed: June 23, 2021
    Publication date: July 13, 2023
    Inventors: Toyoyuki HASHIMOTO, Kenji TAKUBO, Tsunehiro INOUE, Yasuko YONEDA, Tomoki OHKUBO
  • Publication number: 20230114484
    Abstract: An inspection system includes an image processing unit that suppresses noise of a complex number image on which pixels are represented by a complex number indicating a periodic change in a vibration state of an inspection target. The image processing unit acquires a degree of similarity between a pixel included in a target image region defined in the complex number image and a pixel included in a plurality of reference image regions defined in the complex number image separately from the target image region by comparing complex numbers representing pixels, and executes noise suppression processing of the target image region by using a weight based on the acquired degree of similarity.
    Type: Application
    Filed: October 12, 2022
    Publication date: April 13, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Tomotaka NAGASHIMA, Takahide HATAHORI, Hisanori MORITA, Kenji TAKUBO
  • Publication number: 20230085940
    Abstract: A defect inspection apparatus (100) is configured to approximate a difference value or an absolute value (Ia) of the difference value between a pixel value in at least three captured images (A) captured by an imager in at least three different phases of an elastic wave and a pixel value in a reference image (Aave) separate from the captured images (A) so as to acquire an approximate value for defect inspection corresponding to an amount of change in the pixel value in the captured images (A).
    Type: Application
    Filed: October 9, 2020
    Publication date: March 23, 2023
    Applicant: Shimadzu Corporation
    Inventors: Takahide HATAHORI, Kenji TAKUBO, Koki YOSHIDA
  • Publication number: 20230062821
    Abstract: A defect inspection device (100) includes an excitation unit that excites an elastic wave, an irradiation unit (2) that applies laser lights, a measurement unit (3) that measures the interfered laser lights, and a control unit that acquires vibration state information which is information about a state of the elastic wave excited in an inspection target (P) for a plurality of frequencies by changing a frequency of excitation vibration caused by the excitation unit in order to excite the elastic wave in the inspection target (P), and extracts recommended frequencies (F) recommended for inspecting a defect of the inspection target (P) from among the plurality of frequencies based on the acquired vibration state information for the plurality of frequencies.
    Type: Application
    Filed: October 12, 2020
    Publication date: March 2, 2023
    Applicant: SHIMADZU CORPORATION
    Inventors: Koki YOSHIDA, Kenji TAKUBO, Takahide HATAHORI
  • Publication number: 20220229020
    Abstract: The method for examining a clinched portion of a tubular body includes the steps of: giving an elastic vibration to a clinched body 90 formed by clinching a tubular body 91 with a clinch-target member 92; and acquiring, for each of a plurality of view areas 95 which differ from each other in the position in the circumferential direction of the tubular body 91, a vibration distribution optically and simultaneously measured within the view area 95 including a clinched portion 93 of the tubular body 91 and the clinch-target member 92, to determine whether or not the state of clinching is satisfactory over the entire clinched portion 93.
    Type: Application
    Filed: April 13, 2020
    Publication date: July 21, 2022
    Inventors: Takahide HATAHORI, Kenji TAKUBO, Koki YOSHIDA, Yoshihaya IMAMURA