Patents by Inventor Kenji Watanabe

Kenji Watanabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110315675
    Abstract: There are provided amplifying part (5) for amplifying an output signal of infrared detecting part (4), gain switching part (6) for switching a gain of amplifying part (5) to one of a plurality of gains according to magnitude of the output signal of amplifying part (5), and measuring part (12) for calculating a temperature based on an increase in the output signal of amplifying part (5) relative to an initial reference value, and after writing command input part (11) input a writing command, the output signal of amplifying part (5) is written as the initial reference value for each of the plurality of gains in storage medium (13). Since measuring part (12) uses the initial reference value corresponding to the gain as the initial reference value, temperature of object to be heated (1) can be accurately measured over a wide range.
    Type: Application
    Filed: March 8, 2010
    Publication date: December 29, 2011
    Applicant: PANASONIC CORPORATION
    Inventors: Kuniaki Sakakibara, Kenji Watanabe, Keiko Isoda, Taizo Ogata
  • Patent number: 8076654
    Abstract: The present invention provides a surface inspection method and apparatus for inspecting a surface of a sample, in which a resistive film is coated on the surface, and a beam is irradiated to the surface having the resistive film coated thereon, to thereby conduct inspection of the surface of the sample. In the surface inspection method of the present invention, a resistive film having an arbitrarily determined thickness t1 is first coated on a surface of a sample. Thereafter, a part of the resistive film having the arbitrarily determined thickness t1 is dissolved in a solvent, to thereby reduce the thickness of the resistive film to a desired level. This enables precise control of a value of resistance of the resistive film and suppresses distortion of an image to be detected.
    Type: Grant
    Filed: May 19, 2008
    Date of Patent: December 13, 2011
    Assignee: Ebara Corporation
    Inventors: Masahiro Hatakeyama, Kenji Watanabe, Takeshi Murakami, Tohru Satake, Nobuharu Noji
  • Patent number: 8072597
    Abstract: Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are analyzed. Since the inspection apparatus outputs a large number of detected particles/defects, an immense time is required for analyzing the detected particles/defects, resulting in a delay in taking countermeasures to a failure in the manufacturing processes. In the present invention, an apparatus for optically inspecting particles or defects relates a particle or defect size to a cause of failure in an inspection result. A data processing circuit points out a cause of failure from the statistics on the inspection result, and displays information on the inspection result.
    Type: Grant
    Filed: June 13, 2008
    Date of Patent: December 6, 2011
    Assignees: Hitachi, Ltd., Hitachi Electronics Engineering Co., Ltd.
    Inventors: Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Kenji Watanabe, Tetsuya Watanabe, Takahiro Jingu
  • Publication number: 20110293913
    Abstract: A resin composition comprising a fiber component and a resin component, wherein the fiber component is (A) a surface-treated fiber (component A) which comprises 100 parts by weight of a fiber comprising a polyalkylene terephthalate and/or a polyalkylene naphthalene dicarboxylate (component Af) and 0.1 to 10 parts by weight of a sizing agent having a glass transition point of ?80° C. or higher and lower than 70° C.
    Type: Application
    Filed: May 25, 2011
    Publication date: December 1, 2011
    Applicants: TEIJIN FIBERS LIMITED, SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Kenji WATANABE, Kenji ATARASHI, Kumiko CHATANI, Motoomi ARAKAWA
  • Publication number: 20110294956
    Abstract: A production process of a resin composition containing 100 parts by weight of a polyester fiber, 1 to 600 parts by weight of a copolymer of ethylene with a glycidyl group-carrying monomer, and 0.3 to 500 parts by weight of an unsaturated carboxylic acid-modified polyolefin resin, the process comprising steps of (1) melt-kneading the copolymer with the modified polyolefin resin, and (2) kneading the resultant melted resin with the polyester fiber at a temperature lower than a melting point of the polyester fiber.
    Type: Application
    Filed: April 15, 2011
    Publication date: December 1, 2011
    Applicant: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Kenji WATANABE
  • Patent number: 8053726
    Abstract: An inspection apparatus by an electron beam comprises: an electron-optical device 70 having an electron-optical system for irradiating the object with a primary electron beam from an electron beam source, and a detector for detecting the secondary electron image projected by the electron-optical system; a stage system 50 for holding and moving the object relative to the electron-optical system; a mini-environment chamber 20 for supplying a clean gas to the object to prevent dust from contacting to the object; a working chamber 31 for accommodating the stage device, the working chamber being controllable so as to have a vacuum atmosphere; at least two loading chambers 41, 42 disposed between the mini-environment chamber and the working chamber, adapted to be independently controllable so as to have a vacuum atmosphere; and a loader 60 for transferring the object to the stage system through the loading chambers.
    Type: Grant
    Filed: July 1, 2008
    Date of Patent: November 8, 2011
    Assignees: Ebara Corporation, Kabushiki Kaisha Toshiba
    Inventors: Mamoru Nakasuji, Nobuharu Noji, Tohru Satake, Masahiro Hatakeyama, Toshifumi Kimba, Hirosi Sobukawa, Shoji Yoshikawa, Takeshi Murakami, Kenji Watanabe, Tsutomu Karimata, Shin Oowada, Mutsumi Saito, Yuichiro Yamazaki, Takamitsu Nagai, Ichirota Nagahama
  • Publication number: 20110263738
    Abstract: A foamed article comprising a polyolefin resin composition (I) comprising a polyvinyl alcohol fiber (A), a polyolefin resin (B), and an unsaturated carboxylic acid-modified polyolefin resin and/or an unsaturated carboxylic acid derivative-modified polyolefin resin (C); the polyvinyl alcohol fiber (A) being present in an amount of 1 to 70 mass %, the polyolefin resin (B) being present in an amount of 20 to 98.5 mass %, and the modified polyolefin resin (C) being present in an amount of 0.5 to 40 mass % with respect to the total amount of the polyvinyl alcohol fiber (A), the polyolefin resin (B), and the modified polyolefin resin (C); the foamed article having an expansion ratio ranging from 1.3 to 5; the polyvinyl alcohol fiber (A) comprising polyvinyl alcohol filaments (A-I) and a sizing agent (A-II), the sizing agent (A-II) being present in an amount of 0.1 to 10 parts by mass per 100 parts by mass of the polyvinyl alcohol filaments (A-I).
    Type: Application
    Filed: December 18, 2009
    Publication date: October 27, 2011
    Applicants: Kuraray Co., LTD., SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Yuya Yamamoto, Nobuhiro Usui, Kenji Atarashi, Kenji Watanabe
  • Publication number: 20110259877
    Abstract: The present invention provides an induction heating cooker, which is structured to cut off visible light being incident upon an infrared sensor, yet being capable of more accurately sensing any abnormality of the infrared sensor before heating is started. To this end, the induction heating cooker includes a sensor failure sensing-purpose light emitting portion that emits visible light for sensing any failure of an infrared sensor, a visible light cutting filter provided on a surface of a printed circuit board holding the infrared sensor so as to cover the field of view of the infrared sensor, and a control unit that limits the output of an inverter circuit supplying a high-frequency current to a heating coil when the output of the infrared sensor is equal to or less than a threshold value in a situation where the sensor failure sensing-purpose light emitting portion is lit up.
    Type: Application
    Filed: November 30, 2009
    Publication date: October 27, 2011
    Applicant: PANASONIC CORPORATION
    Inventors: Kenji Watanabe, Takahiro Miyauchi, Tomoya Fujinami, Hiroshi Tominaga
  • Patent number: 8040414
    Abstract: The solid-state imaging device includes: a first node for receiving a first signal from outside the solid-state imaging device; a second node for receiving a second signal from outside the solid-state imaging device; a test signal selection circuit for outputting the first signal received at the first node and the second signal received at the second node as a test signal by switching between the first and second signals at desired timing; and a test signal input circuit for supplying the test signal from the test signal selection circuit to an input of the A/D converter.
    Type: Grant
    Filed: March 24, 2009
    Date of Patent: October 18, 2011
    Assignee: Panasonic Corporation
    Inventors: Toshinobu Nakao, Masayuki Hirota, Masashi Murakami, Kenji Watanabe, Masaya Hirose
  • Patent number: 8039781
    Abstract: In a solid state imaging device to be included in an imaging device such as a digital camera, a ramp run-up AD conversion circuit for AD converting a pixel signal is provided corresponding to one or a plurality of pixel columns. A column counter provided in each ramp run-up AD conversion circuit holds an upper bit, and a clock signal is supplied to one or plural latches for holding a lower bit. Thus, fast and accurate AD conversion can be realized while suppressing increase of clock frequency.
    Type: Grant
    Filed: January 7, 2010
    Date of Patent: October 18, 2011
    Assignee: Panasonic Corporation
    Inventors: Kenichi Shimomura, Kenji Watanabe, Yutaka Abe
  • Patent number: 8040503
    Abstract: A method and apparatus of inspecting a sample, in which the sample is inspected under a plurality of inspection conditions, and inspection data obtained by inspecting the sample under each of the plurality of inspection conditions and position information on the sample of the inspection date in correspondence with the respective inspection conditions, are stored. The inspection data for each of the plurality of inspection conditions is against each other by the use of the position information on the sample to determine a position to be inspected in detail, and an image of the sample at a position to be inspected in detail is obtained. The obtained image is classified, the inspection condition of the sample by the use of information of classification of the image is determined.
    Type: Grant
    Filed: January 5, 2010
    Date of Patent: October 18, 2011
    Assignees: Hitachi, Ltd., Hitachi High-Technologies Corporation
    Inventors: Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya, Maki Tanaka, Kenji Watanabe, Tetsuya Watanabe, Yoshio Morishige
  • Publication number: 20110243301
    Abstract: An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).
    Type: Application
    Filed: July 1, 2010
    Publication date: October 6, 2011
    Applicant: RIGAKU CORPORATION
    Inventors: Kenji Watanabe, Yoshiyuki Kataoka, Yasujiro Yamada, Atsushi Morikawa
  • Patent number: 8013315
    Abstract: A charged particle beam apparatus 300 for observing and estimating a sample W by applying a charged particle beam to sample W to detect secondary charged particles, such as electrons emitted from the sample, reflected electrons and backscattered electrons comprises astigmatism adjusting means 17 for adjusting astigmatism of the charged particle beam. Astigmatism adjusting means 17 is supplied with a correction voltage which maximizes a focal estimation value obtained from a pattern formed on sample W. Astigmatism adjusting means 17 is a multipole including a plurality of pairs of electrodes or coils facing each other to place the optical axis of the charged particle beam at the center. Also disclosed is a charged particle beam apparatus 400 capable of observation and estimation of a sample surface in a condition where no charge up exists over the whole sample W.
    Type: Grant
    Filed: September 11, 2007
    Date of Patent: September 6, 2011
    Assignee: Ebara Corporation
    Inventors: Kenji Watanabe, Takeshi Murakami, Ryo Tajima, Masahiro Hatakeyama, Masatoshi Tsuneoka, Nobuharu Noji
  • Patent number: 7976097
    Abstract: A cowl structure including a cowl box having a partition panel joined to both rear and bottom walls thereof inside the cowl box. The partition panel constitutes, together with the rear and bottom walls, a hollow member portion extending in a vehicle width direction. An outside air introducing port is provided in the cowl box, for introducing outside air into the cowl box outside of the member portion. A communication port is provided in the partition panel, for allowing the inside and outside of the member portion to communicate with each other inside the cowl box. An air supplying port is provided in the rear wall at a location spaced upward from the bottom wall, for allowing the inside of the member portion and a vehicle compartment to communicate with each other. The communication port and the air supplying port overlap each other in the vehicle width direction.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: July 12, 2011
    Assignee: Nissan Motor Co., Ltd.
    Inventors: Kenji Watanabe, Hidekazu Saitou
  • Publication number: 20110155905
    Abstract: A technique capable of improving the ability to observe a specimen using an electron beam in an energy region which has not been conventionally given attention is provided. This specimen observation method comprises: irradiating the specimen with an electron beam; detecting electrons to be observed which have been generated and have obtained information on the specimen by the electron beam irradiation; and generating an image of the specimen from the detected electrons to be observed. The electron beam irradiation comprises irradiating the specimen with the electron beam with a landing energy set in a transition region between a secondary emission electron region in which secondary emission electrons are detected and a mirror electron region in which mirror electrons are detected, thereby causing the secondary emission electrons and the mirror electrons to be mixed as the electrons to be observed.
    Type: Application
    Filed: April 10, 2009
    Publication date: June 30, 2011
    Applicant: EBARA CORPORATION
    Inventors: Masahiro Hatakeyama, Takeshi Murakami, Yoshihiko Naito, Kenji Terao, Norio Kimura, Kenji Watanabe
  • Publication number: 20110136951
    Abstract: A resin composition includes a fiber and a polyolefin resin and can provide a molded article having excellent mechanical strength such as flexural strength and impact resistance. The resin composition includes (i) a surface-treated fiber (A) which comprises 100 parts by weight of a fiber (A-I) comprising a polyalkylene terephthalate and/or a polyalkylene naphthalene dicarboxylate and 0.1 to 10 parts by weight of a sizing agent (A-II) adhered to the surface of the fiber (A-I), and (ii) a polyolefin resin modified with an unsaturated carboxylic acid and/or an unsaturated carboxylic acid derivative (a modified polyolefin resin (B)) as a resin component.
    Type: Application
    Filed: January 22, 2009
    Publication date: June 9, 2011
    Applicants: SUMITOMO CHEMICAL COMPANY, LIMITED, TEIJIN FIBERS LIMITED
    Inventors: Katsuhisa Kitano, Kenji Watanabe, Kenji Atarashi, Shinichi Takahashi
  • Patent number: 7952510
    Abstract: It is an object of the present invention to provide a solid-state imaging device for enhancing accuracy of AD conversion and active switching of up-counting and down-counting in the asynchronous counter without limiting the AD conversion frequency. The solid-state imaging device according to the present invention includes an asynchronous counter having an up-counting mode in which up-counting is performed, a down-counting mode in which down-counting is performed, and a holding mode for switching operation settings between the up-counting and the down-counting while maintaining a count value held in the asynchronous counter.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: May 31, 2011
    Assignee: PANASONIC Corporation
    Inventors: Kenichi Shimomura, Kenji Watanabe
  • Patent number: 7952085
    Abstract: The invention provides a surface inspection apparatus and a method for inspecting the surface of a sample that are capable of inspecting discriminatingly between the scratch of various configuration and the adhered foreign object that occur on the surface of a work target when the work target (for example, an insulating film on a semiconductor substrate) is subjected to polishing process such as CMP or grinding process in semiconductor manufacturing process or magnetic head manufacturing process.
    Type: Grant
    Filed: August 22, 2008
    Date of Patent: May 31, 2011
    Assignees: Hitachi, Ltd., Hitachi High-Technologies Corporation
    Inventors: Ichiro Ishimaru, Minori Noguchi, Ichiro Moriyama, Yoshikazu Tanabe, Yasuo Yatsugake, Yukio Kenbou, Kenji Watanabe, Hirofumi Tsuchiyama
  • Patent number: 7941063
    Abstract: An image forming apparatus is provided, which prevents occurrence of conveying malfunction or image failure due to variation of conveying speed caused by endurance of a fixing unit or a conveying unit, variation of using environment, or a type of a recording material. The image forming apparatus includes: a fixing unit for heating and fixing a toner image on a recording sheet (P); a secondary transferring portion for conveying the recording sheet (P) to the fixing unit; a loop sensor for detecting a degree of a loop of the recording sheet (P) generated according to a speed difference between a conveying speed of the fixing unit and a conveying speed of the secondary transferring portion; a CPU for controlling the conveying speed of the fixing unit; a fixing deliver sensor for detecting a used amount of the fixing unit; and an EEPROM for storing information on the used amount of the fixing unit detected by the fixing deliver sensor.
    Type: Grant
    Filed: January 16, 2009
    Date of Patent: May 10, 2011
    Assignee: Canon Kabushiki Kaisha
    Inventors: Akimichi Suzuki, Hideo Nanataki, Kenji Watanabe, Kenji Takagi
  • Patent number: D646725
    Type: Grant
    Filed: October 27, 2010
    Date of Patent: October 11, 2011
    Assignee: Bandai Co., Ltd.
    Inventors: Tsubasa Utsumi, Kenji Watanabe, Yusuke Maekawa