Abstract: Disclosed is a design structure for an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch.

Abstract: Integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC systems architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-clip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributers; the noise event arbiter determining when each noise contributer may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributer as to when permission is granted to execute its operations.

Abstract: A system, method and program product for determining a relative amount of usage of a data retaining device are disclosed. A charge storing device is coupled to a data retaining device in a manner that a use of the data retaining device triggers a charging of the charge storing device. In a period that the data retaining device idles, charges in the charge storing device decay due to natural means. As such, a potential of the charge storing device may be used to indicate an amount of usage of the data retaining device. A comparison of the potentials of two charge storing devices coupled one-to-one to two data retaining devices may be used as a basis to determine a relative amount of usage of each of the two data retaining devices comparing to the other.

Abstract: A design structure embodied in a machine readable medium used in a design process includes a voltage divider device, including a double gate field effect transistor (FET) having a first gate and a second gate disposed at opposite sides of a body region; the first and second gates configured to have an input voltage coupled thereacross; and at least one of a source of the FET and a drain of the FET configured to have an output voltage taken therefrom; wherein the output voltage represents a divided voltage with respect to the input voltage.

Abstract: A system, method and program product for determining a relative amount of usage of a data retaining device are disclosed. A charge storing device is coupled to a data retaining device in a manner that a use of the data retaining device triggers a charging of the charge storing device. In a period that the data retaining device idles, charges in the charge storing device decay due to natural means. As such, a potential of the charge storing device may be used to indicate an amount of usage of the data retaining device. A comparison of the potentials of two charge storing devices coupled one-to-one to two data retaining devices may be used as a basis to determine a relative amount of usage of each of the two data retaining devices comparing to the other.

Abstract: A structure comprising an FPGA (Field-Programmable Gate Array) for relieving bottlenecks, and a method for operating the structure. The FPGA comprises multiple FPGA elements each of which includes a CLB (Configurable Logic Block), an instruction queue, and a data buffer. One functional block after another (separate from one another) can be formed in the FPGA via a first local IO (Input/Output) circuit and moved to a second local IO circuit. Within each functional block, a mapped logic location function calculates the direction, distance, and the time for the step from the current location of the functional block stored in a mapped location register, and the destination stored in a mapped destination register, and the time allowed for the movement, and stores the direction and distance of the step in the mapped movement register. Then, the functional block moves according the direction and distance stored in the mapped movement register.

Abstract: The embodiments of the invention provide an apparatus, method, etc. for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises functional cores each having a functional debug logic element. The cores are connected to an interconnect structure that links the functional debug logic elements. Each functional debug logic element is specifically dedicated to a function of its corresponding core, wherein the functional debug logic elements generate a table of function-specific system events. The system events are function-specific with respect to an associated core, wherein the system events include transaction events, controller events, processor events, interconnect structure arbiter events, interconnect interface core events, high speed serial link core events, and/or codec events.

Abstract: The embodiments of the invention provide an apparatus and method for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a zero gate-to-source voltage. A controller is also provided to configure node voltages of the device and/or the reference device to reflect different regions of device operations found in digital and analog circuit applications. Moreover, the controller measures a difference in current between the stress device and the reference device to determine whether NBTI induced threshold degradation has occurred in the stress device. The controller also adjusts an output power supply voltage of the stress device until a performance of the stress device matches a performance of the reference device to account for the NBTI induced threshold degradation.

Abstract: A structure comprising an FPGA (Field-Programmable Gate Array) for relieving bottlenecks, and a method for operating the structure. The FPGA comprises multiple FPGA elements each of which includes a CLB (Configurable Logic Block), an instruction queue, and a data buffer. One functional block after another (separate from one another) can be formed in the FPGA via a first local IO (Input/Output) circuit and moved to a second local IO circuit. Within each functional block, a mapped logic location function calculates the direction, distance, and the time for the step from the current location of the functional block stored in a mapped location register, and the destination stored in a mapped destination register, and the time allowed for the movement, and stores the direction and distance of the step in the mapped movement register. Then, the functional block moves according the direction and distance stored in the mapped movement register.

Abstract: A method and system for modulating logic clock oscillator frequency based on voltage supply. The system comprises a logic unit having a logic operation and a device to produce self-adjusting clocks to match the logic operation. The device is configured to use supply voltage as an independent variable to optimize device parameters for voltage variations.

Abstract: A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare.

Abstract: A voltage divider device includes a double gate field effect transistor (FET) having a first gate and a second gate disposed at opposite sides of a body region. An input voltage is coupled between the first and second gates, and an output voltage is taken from at least one of a source of the FET and a drain of the FET, wherein the output voltage represents a divided voltage with respect to the input voltage.

Abstract: An integrated circuit (IC) architecture includes a library of intellectual property (IP) cores configured to provide a plurality of individual circuit functions. The IP cores arranged in a manner compatible with a customized, functional selection of individual ones of the IP cores, wherein individually selected cores are accessible through a communication structure included within the library.

Abstract: A field programmable gate array (FPGA) device including a non-programming-based default power-on electronic configuration. The non-programming-based default power-on electronic configuration defines a default state to initial a first logic function. Upon power-up, the FPGA device would be enabled to enter the default state without having first to be configured via a conventional programming mode, thus saving processing time during power-up. Several embodiments are disclosed, such as a mask via circuit, an asynchronous set/reset circuit, an unbalanced latch circuit and a flush and scan circuit. A related method is also disclosed to reduce the memory size dedicated to the first logic function to facilitate further programming after power-up. In addition to time saving and further programming, the FPGA device can also allow partial or incremental programming to expand the full functionality to match customer's different needs.

Abstract: The invention provides replacement operation code for specific defective lines of operation code contained in a ROM often on an ASIC chip which code is used in a processor. ROM memory constitutes the best use of chip space and is the most economical to manufacture of all of the various options. ROM memory is not changeable after it is set in ROM and, hence, if there is any change in the code (hereinafter sometimes faulty code) required after the code has been incorporated in the ROM memory, such change cannot be made in the ROM itself without replacing the entire ROM. The present invention allows change in any specific lines of faulty contained in ROM without replacing the entire ROM, and provides for changing only the faulty lines of code. It also allows the new code to have the same, more, or fewer lines than the faulty code.

Abstract: Disclosed is an integrated circuit comprising a plurality of cores attached to at least one transmitter and receiver, an optical transmission network embedded within the wire levels of the integrated circuit, and wherein the transmitter and receivers send and receive data on the network. Also disclosed is a method of transmitting signals within an integrated circuit comprising an integrated circuit comprising a plurality of cores and optical paths, selecting an optical path from the plurality of optical paths for transmitting data, and transmitting the data on the selected optical path. Also disclosed is an integrated circuit comprising an optical transmission network, a plurality of cores, and a plurality of controllers, all three being operatively attached to each other.

Abstract: A field programmable gate array (FPGA) device including a non-programming-based default power-on electronic configuration. The non-programming-based default power-on electronic configuration defines a default state to initial a first logic function. Upon power-up, the FPGA device would be enabled to enter the default state without having first to be configured via a conventional programming mode, thus saving processing time during power-up. Several embodiments are disclosed, such as a mask via circuit, an asynchronous set/reset circuit, an unbalanced latch circuit and a flush and scan circuit. A related method is also disclosed to reduce the memory size dedicated to the first logic function to facilitate further programming after power-up. In addition to time saving and further programming, the FPGA device can also allow partial or incremental programming to expand the full functionality to match customer's different needs.

Abstract: An apparatus for monitoring the temperature of an integrated circuit device includes a conductive wiring pattern formed on the integrated circuit device, extending into areas of the device to be monitored. A deterministic signal source is configured to generate a deterministic signal along the conductive wiring pattern, with one or more return paths tapped from selected locations along the pattern. A temperature change determination circuit is coupled to the one or more return paths and to a reference signal taken from the deterministic signal source. The circuit is configured to determine a delay between the reference signal and a delay signal traveling through at least a portion of the wiring pattern and a corresponding one of the return paths.

Abstract: Operating code fixes are supplied to multiple processors utilizing the same operating code by storing the correction code fixes in a central RAM, and distributing the code fixes over a dedicated code fix bus to a local cache for each processor. The first processor encountering a code fix requests the code fix from the RAM, which then distributes the code fix over the code fix bus to all of the local caches which are automatically updated with the new code. The system is particularly applicable to an integrated circuit having multiple processors fabricated on a chip, wherein the RAM is on-chip and is connected to an off-chip EEPROM that loads corrected code fixes to the on-chip RAM at power-up.

Abstract: A communication system for transmitting data between cores embedded in an integrated circuit on a silicon chip. Communication system includes transmitter circuitry for wirelessly transmitting data between cores and receiver circuitry for wirelessly receiving the transmission of data from other cores. Both transmitter circuitry and receiver circuitry may include of a phase-locked loop circuit having a voltage-controlled oscillator. Each core may transmit and receive data on a unique frequency with respect to other cores embedded in an integrated circuit on a silicon chip or transmit and receive data on the same frequency as other cores embedded in an integrated circuit on a silicon chip. Groups of cores may share transmitter and receiver circuitry.