Abstract: A system for dynamic integrated circuit power distribution and control is disclosed. The system includes an external power consumption target generator configured to generate a power dissipation target for one or more integrated circuits. The system also includes a first integrated circuit that includes an IC power control unit coupled to the external power consumption target generator. The first integrated circuit also includes a first plurality of functional units, each functional unit of the first plurality including a unit power level control and a first power control grid coupling the IC power control unit to one or more of the first plurality of functional units. The IC power control unit is configured to generate a mode control signal which places at least one of plurality of functional units into a first mode of operation based upon the power consumption target.

Abstract: An integrated circuit (IC) including a warranty and enforcement system and a method are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded.

Abstract: A design structure is embodied in a machine readable medium for designing, manufacturing, or testing a design. The design structure includes a threshold register having a counter, a count register, and a non-volatile storage for storing a state when a value of the count register equals or exceeds a value of the threshold register. Also provided is a method of predicting and/or estimating a power cycle duration in order to save a state in non-volatile memory and a circuit. The method includes setting a threshold value; determining that the threshold value has been equaled or exceeded; and saving the state in the non-volatile memory at a first checkpoint based on the threshold value being equaled or exceeded.

Abstract: The invention generally relates to the utilization of electric power, and more particularly to systems and methods for selectively utilizing secondary power sources during peak power times. A method includes receiving a notification of a peak power time, and discontinuing use of a primary power supply and beginning use of a secondary power supply based upon the notification.

Abstract: The embodiments of the invention provide an apparatus, method, etc. for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises functional cores each having a functional debug logic element. The cores are connected to an interconnect structure that links the functional debug logic elements. Each functional debug logic element is specifically dedicated to a function of its corresponding core, wherein the functional debug logic elements generate a table of function-specific system events. The system events are function-specific with respect to an associated core, wherein the system events include transaction events, controller events, processor events, interconnect structure arbiter events, interconnect interface core events, high speed serial link core events, and/or codec events.

Abstract: A design structure embodied in a machine readable medium used in a design process includes a voltage divider device, including a double gate field effect transistor (FET) having a first gate and a second gate disposed at opposite sides of a body region; the first and second gates configured to have an input voltage coupled thereacross; and at least one of a source of the FET and a drain of the FET configured to have an output voltage taken therefrom; wherein the output voltage represents a divided voltage with respect to the input voltage.

Abstract: A circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes an input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line.

Abstract: A design structure for a circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes and input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line.

Abstract: Disclosed are embodiments of a method and an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch.

Abstract: Integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC systems architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-clip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributers; the noise event arbiter determining when each noise contributer may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributer as to when permission is granted to execute its operations.

Abstract: Processing engines (PE's) disposed on the substrate. Each processing engine includes a measurement and storage unit, and a PE controller coupled to each of the processing engines. The processing engines perform self-tests and store the results of the self-tests in the measurement and storage unit. The PE controller reads the results and selects a sub-set of processing engines based on the results and an optimization algorithm.

Abstract: A universal peripheral processor architecture on an integrated circuit (IC) includes first and second data buses coupled to interface logic devices for enabling communication between the first and second data buses including enabling interface of multiple signaling protocols. One or more processors communicate with the first and second data buses to manage control functions on the IC. A data path enables transfer of data between the first and second data buses, and communicates with data storage devices. A data control path enables communication between the data storage devices and the processors.

Abstract: A design structure including universal peripheral processor architecture on an integrated circuit (IC) includes first and second data buses coupled to interface logic devices for enabling communication between the first and second data buses including enabling interface of multiple signaling protocols. One or more processors communicate with the first and second data buses to manage control functions on the IC. A data path enables transfer of data between the first and second data buses, and communicates with data storage devices. A data control path enables communication between the data storage devices and the processors.

Abstract: A design structure for a system and method of predicting power events in intermittent power environments and dispatching computational operations of an integrated circuit accordingly. A power management prediction system includes a controller executing a prediction algorithm, an arrangement of computation circuitry, a non-volatile storage device containing a power requirements log and a power history log, a clock generator, an intermittent power source, and a power monitor circuit.

Abstract: A design structure integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC system architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-chip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributors; the noise event arbiter determining when each noise contributor may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributor as to when permission is granted to execute its operations.

Abstract: An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: a data retaining device; a charge storing device coupled to the data retaining device such that a use of the data retaining device triggers a charging of the charge storing device by a charge source; and means for measuring a potential of the charge storing device, the measuring means being communicatively coupled to a calculating mean which determines a relative amount of usage of the data retaining device based on the measured potential.

Abstract: An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: a data retaining device; a partially depleted silicon-on-insulator (PD SOI) device electrically coupled to the data retaining device; and a measurement device coupled to the PD SOI device for measuring a state of the PD SOI device indicating a body voltage thereof, the measuring device being communicatively coupled to a calculating means which determines a history state of a data in the data retaining device based on the measured state of the PD SOI device.

Abstract: The embodiments of the invention provide a design structure for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a zero gate-to-source voltage. A controller is also provided to configure node voltages of the device and/or the reference device to reflect different regions of device operations found in digital and analog circuit applications. Moreover, the controller measures a difference in current between the stress device and the reference device to determine whether NBTI induced threshold degradation has occurred in the stress device. The controller also adjusts an output power supply voltage of the stress device until a performance of the stress device matches a performance of the reference device to account for the NBTI induced threshold degradation.

Abstract: Disclosed are embodiments of a manufacturing method that establishes a library of pre-made and pre-qualified masks for patterning different blocks of circuitry that meet established performance and timing requirements. The embodiments of the method use stepped exposures of multiple masks, including at least one mask selected from this library, to pattern a chip design onto a silicon wafer, where the chip design is made up of two or more interconnected blocks of circuitry. Consequently, for a given integrated circuit design, pre-made/pre-qualified mask(s) can be selected from the library to pattern one, some or all blocks of circuitry for the design. Optionally, additional masks can be specially made and qualified to pattern other block(s) of circuitry (e.g., application specific logic) within the design. The blocks of circuitry patterned in this manner can be electrically connected via generic or customized interfaces in order to complete the chip design.

Abstract: Disclosed are embodiments of on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors.