Patents by Inventor Kiyoshi Ogawa
Kiyoshi Ogawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090278042Abstract: The main voltage generator (5) applies a rectangular-wave radio-frequency voltage to the ring electrode (21) in order to capture ions inside the ion trap (2). In the case where the TOFMS (3) is operated in the reflectron mode, the radio-frequency voltage is changed into a constant voltage value when the phase thereof is 1.5?, and a voltage for expelling ions is applied to the end cap electrodes (22, 23) to expel the ions from the exit aperture (25) and introduce them into the TOFMS (3). In this case, since the velocity spread of the ions inside the ion trap (2) is small and so is the spatial spread thereof, a high mass resolution and accuracy can be achieved while assuring a high detection sensitivity. In the case where the TOFMS (3) is operated in the linear mode, the radio-frequency voltage is changed into a constant voltage value when the phase thereof is 0.5?, and then the ions are expelled.Type: ApplicationFiled: December 12, 2007Publication date: November 12, 2009Applicant: SHIMADZU CORPORATIONInventors: Hideaki Izumi, Kengo Takeshita, Kiyoshi Ogawa
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Publication number: 20090272890Abstract: A sample S is irradiated with a two-dimensionally spread ray of laser light to simultaneously ionize substances within a two-dimensional area on the sample. The resultant ions are mass-separated by a TOF mass separator 4 without changing the interrelationship of the emission points of the ions. The separated ions are then directed to a two-dimensional detector section 7 through a deflection electric field created by deflection electrodes 61 and 62. The two-dimensional detector section 7 consists of a plurality of detection units 7a arranged in parallel, each unit including an MCP 8a, fluorescent plate 9a and two-dimensional array detector 10a. The magnitude of deflecting the flight path of the ions by the deflection electric field is changed in a stepwise manner with the lapse of time from the generation of the ions so that a plurality of mass analysis images are sequentially projected on each detection unit 7.Type: ApplicationFiled: May 30, 2006Publication date: November 5, 2009Applicants: SHIMADZU CORPORATION, KINKI UNIVERSITYInventors: Kiyoshi Ogawa, Takeharu Etoh
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Publication number: 20090230301Abstract: Disclosed is a mass spectrometry apparatus and method capable of providing enhanced analysis sensitivity in a mass spectrometric analysis for a small amount of ions. A quadrupole rod-type ion guide is employed to temporarily accumulate ions to be introduced into an ion trap, and ions are introduced into the ion guide in an amount less than a saturated ion amount in the ion guide, and accumulated in an exit end of the ion guide. As compared with an octopole rod-type ion guide, the quadrupole rod-type ion guide has a higher ion-converging capability, and therefore can confine and hold a small amount of ions around an ion optical axis, although it is inferior in ion-accumulating capability. This makes it possible to efficiently introduce the ions into the ion trap through two openings of an electric field-correcting electrode and an entrance endcap electrode, so as to perform a high-sensitive analysis.Type: ApplicationFiled: January 16, 2009Publication date: September 17, 2009Applicant: Shimadzu CorporationInventors: Osamu furuhashi, Takahiro Harada, Hideaki Izumi, Kiyoshi Ogawa
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Patent number: 7582866Abstract: Disclosed is an ion trap mass spectrometer for MSn analysis, which comprises a frequency-driven ion trap section operable to trap sample ions and isolate a precursor ion from the sample ions, while setting an ion-trapping RF voltage waveform at a first frequency providing a first low-mass cutoff (LMCO) value, and, then after setting the ion-trapping RF voltage waveform at a second frequency greater than the first frequency to provide a second LMCO value less than the first LMCO value, without changing an amplitude of the ion-trapping RF voltage waveform, to irradiate the precursor ion in a trapped state with light so as to photodissociate the precursor ion into fragment ions; and an analyzer section operable to subject the fragment ions ejected from the ion trap section, to mass spectrometry so as to obtain information about a molecular structure of the precursor ion. The ion trap mass spectrometer of the present invention can maximize a mass range coverable in one cycle of MSn analysis.Type: GrantFiled: October 3, 2007Date of Patent: September 1, 2009Assignee: Shimadzu CorporationInventors: Osamu Furuhashi, Kengo Takeshita, Kiyoshi Ogawa
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Patent number: 7550716Abstract: The present invention provides a mass spectrometer capable of breaking even a sample molecule having a large molecular weight by a CID process. In an embodiment of the present invention, the mass spectrometer includes an ionizing source 10 for turning a sample into ions, mass-separating sections 40 and 60 for mass-separating the sample ions, a detecting section 20 for detecting the mass-separated ions, and a collision section (collision cell) 51 located on an ion path extending from the ionizing source 10 through the mass-separating sections 40 and 60 to the detecting section 20. It also includes a cluster generator 30 for producing clusters of atoms or molecules. The clusters produced by the cluster generator 30 are introduced into the collision cell 51. The use of the clusters having a huge mass as the target gas in the CID process enables the collision energy of the sample ions to be efficiently assigned to the breaking of the ions.Type: GrantFiled: October 17, 2006Date of Patent: June 23, 2009Assignee: Shimadzu CorporationInventors: Osamu Furuhashi, Kiyoshi Ogawa
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Publication number: 20090146053Abstract: In a mass spectrometer for carrying out mass analysis while microscopically observing a two-dimensional area of a sample 15, the observation position for selecting a target portion while observing an image of the sample 15 captured with a CCD camera 23 is separated from the analysis position for carrying out the mass analysis of the sample 15 by delivering laser light from the laser-delivering unit 20 onto the sample 15. The sample 15 is placed on a stage 13, which can be precisely moved between the observation position and the analysis position by a stage-driving mechanism 30. An observation optical system 24 can be set close to the sample 15 at the observation position, without impeding the flight of the ions generated from the sample 15 during the analysis or interfering with a laser-condensing optical system 22. Thus, the spatial resolution for observation is improved without deteriorating the ion-detecting efficiency.Type: ApplicationFiled: August 10, 2006Publication date: June 11, 2009Applicant: SHIMADZU CORPORATIONInventors: Mitsutoshi Setou, Shuichi Shimma, Takahiro Harada, Sadao Takeuchi, Osamu Furuhashi, Kiyoshi Ogawa, Yoshikazu Yoshida
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Publication number: 20090090860Abstract: Disclosed is an ion trap mass spectrometer for MSn analysis, which comprises a frequency-driven ion trap section operable to trap sample ions and isolate a precursor ion from the sample ions, while setting an ion-trapping RF voltage waveform at a first frequency providing a first low-mass cutoff (LMCO) value, and, then after setting the ion-trapping RF voltage waveform at a second frequency greater than the first frequency to provide a second LMCO value less than the first LMCO value, without changing an amplitude of the ion-trapping RF voltage waveform, to irradiate the precursor ion in a trapped state with light so as to photodissociate the precursor ion into fragment ions; and an analyzer section operable to subject the fragment ions ejected from the ion trap section, to mass spectrometry so as to obtain information about a molecular structure of the precursor ion. The ion trap mass spectrometer of the present invention can maximize a mass range coverable in one cycle of MSn analysis.Type: ApplicationFiled: October 3, 2007Publication date: April 9, 2009Applicant: SHIMADZU CORPORATIONInventors: Osamu FURUHASHI, Kengo TAKESHITA, Kiyoshi OGAWA
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Patent number: 7501620Abstract: The present invention provides a laser irradiation mass spectrometer capable of analyzing components of living tissue or living cells with high accuracy. It includes a laser unit for irradiating a sample with a beam of laser light and controlling the irradiation spot of the laser beam on the sample; and a mass analyzer for performing a mass analysis of the ions generated at the irradiation spot, where the mass analyzer uses a frequency-driven ion trap and a time-of-flight mass spectrometer to carry out the mass analysis. The ion trap of this system assuredly traps ions having large mass to charge ratios, and enables the system to carry out analyses on samples of large molecules. Preferably, a digital driving method is used to drive the aforementioned frequency-driven ion trap. Also, a multi-turn time-of-flight mass spectrometer may preferably be used as the aforementioned time-of-flight mass spectrometer.Type: GrantFiled: February 27, 2006Date of Patent: March 10, 2009Assignees: Shimadzu Corporation, Inter-University Research, Institute Corporation National Institutes of Natural Sciences, Osaka UniversityInventors: Kiyoshi Ogawa, Yoshikazu Yoshida, Kozo Shimazu, Mitsutoshi Setou, Shuichi Shimma, Michisato Toyoda
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Patent number: 7500632Abstract: A seat belt device has a gas generator for generating a high pressure gas when the vehicle is in emergency, a cylinder for conducting the high pressure gas from the gas generator, a piston received movably within the cylinder and pressed and moved by the high pressure gas, and a drive unit for rotating a winding shaft of a seat belt retractor in a direction of removing the slack of a belt, using the movement of the piston, wherein the pretensioner is employed with the energy absorbing mechanism, for reversely rotating the winding shaft if a tension acting on the belt exceeds a predetermined value after removing the slack of the belt.Type: GrantFiled: March 19, 2002Date of Patent: March 10, 2009Assignee: NSK Autoliv Co., Ltd.Inventors: Katsuyasu Ono, Sadanori Ohsumi, Masuo Matsuki, Kiyoshi Ogawa
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Publication number: 20080277580Abstract: The number of times of repetition of mass spectrometry analysis for integrating mass profiles is reduced to facilitate reduction in measurement time-period and increase a signal intensity. In a state when ions are trapped by a high-frequency electric field formed within an ion trap, a rectangular-wave high-frequency voltage to be applied from a main voltage generation section to a ring electrode is temporarily stopped, and next ions are introduced from an ion entrance port into the ion trap in a state when only a static electric field exists within the ion trap. The high-frequency voltage application is re-started while at least a part of previously-trapped ions remain within the ion trap, to trap the newly-introduced ions in addition to the previous ions so as to increase an amount of ions to be accumulated, and the accumulated ions are subjected to the mass spectrometry analysis.Type: ApplicationFiled: May 8, 2008Publication date: November 13, 2008Applicant: SHIMADZU CORPORATIONInventors: Kengo TAKESHITA, Kiyoshi Ogawa
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Publication number: 20080210862Abstract: A mass spectrometer is provided in which ions are favorably introduced into a loop orbit or favorably led out from the loop orbit without affecting the motion of the ions flying along the loop orbit. An ion-introduction orbit 5 is set to correspond to the orbit (ejection orbit portion 4) of ions after being bent by the sector-shaped electric field E1 in the loop orbit 4. When ions are introduced, a voltage applied to the electrode unit 11 is put to zero to release the sector-shaped electric field E1. Then the ions emitted along the ion-introduction orbit 5 fly straight in the electrode unit 11. The direction and position of the ions coming out from the exit end of the electric field is the same as those ions flying along the loop orbit 4. Therefore, there is no need for placing a deflection electrode for introducing/leading-out ions on the loop orbit.Type: ApplicationFiled: January 18, 2008Publication date: September 4, 2008Applicant: SHIMADZU CORPORATIONInventors: Shinichi YAMAGUCHI, Masaru NISHIGUCHI, Kiyoshi OGAWA, Yoshihiro UENO
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Publication number: 20070114388Abstract: An imaging mass spectrometer, an image of a sample is generated, and a region in the image is selected in accordance with predetermined criteria. Then, a mass analysis of the region is performed while scanning the sample in the selected region with a laser beam spot. By computing the total or average of the results in the region, a high precision analytical value in the region can be obtained. In a biological sample, by preliminarily performing a staining process on the biological sample using a certain dye, only the objective tissues can be analyzed. Also, a fluorescence microscope can be used.Type: ApplicationFiled: November 1, 2006Publication date: May 24, 2007Applicant: SHIMADZU CORPORATIONInventors: Kiyoshi Ogawa, Sadao Takeuchi, Takahiro Harada, Yoshihiro Ueno, Fujio Inoue, Mitsutoshi Setou
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Patent number: 7216521Abstract: The present invention pertains to a combined machining equipment for steel tubes, and a machining method is of a small size, can easily be moved, and is capable of not only flaring a steel tube, but also grinding a flared surface, forming a groove, and peeling off a lining. A main shaft (121) is rotatably mounted on a slide frame (141) slidable with respect to a common mount (103), and a second machining head (124) is mounted on a flange on the distal end of the main shaft (121). An auxiliary shaft (131) is slidably disposed in the main shaft (121) for rotation therewith. A first machining head (134) is mounted on a mount base (132) on the distal end of the auxiliary shaft (131).Type: GrantFiled: October 22, 2002Date of Patent: May 15, 2007Inventor: Kiyoshi Ogawa
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Publication number: 20070095963Abstract: A spindle (2) of a seat belt retractor is rotationally driven when required by a motor (5) to the webbing take-up direction side through a power transmission mechanism section (6). Further, the spindle (2) is always connected to a take-up spring (7) and is always subjected to rotational power acting to the webbing take-up side. The structure enables a user wearing a seat belt to be restrained even in failure, realizing a safer and more reliable restraining device.Type: ApplicationFiled: November 29, 2004Publication date: May 3, 2007Inventors: Midorikawa Yukinori, Hiroshi Yamada, Masuo Matsuki, Kiyoshi Ogawa
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Publication number: 20070085000Abstract: The present invention provides a mass spectrometer capable of breaking even a sample molecule having a large molecular weight by a CID process. In an embodiment of the present invention, the mass spectrometer includes an ionizing source 10 for turning a sample into ions, mass-separating sections 40 and 60 for mass-separating the sample ions, a detecting section 20 for detecting the mass-separated ions, and a collision section (collision cell) 51 located on an ion path extending from the ionizing source 10 through the mass-separating sections 40 and 60 to the detecting section 20. It also includes a cluster generator 30 for producing clusters of atoms or molecules. The clusters produced by the cluster generator 30 are introduced into the collision cell 51. The use of the clusters having a huge mass as the target gas in the CID process enables the collision energy of the sample ions to be efficiently assigned to the breaking of the ions.Type: ApplicationFiled: October 17, 2006Publication date: April 19, 2007Applicant: SHIMADZU CORPORATIONInventors: Osamu Furuhashi, Kiyoshi Ogawa
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Publication number: 20070045527Abstract: The present invention provides a laser irradiation mass spectrometer capable of analyzing components of living tissue or living cells with high accuracy. It includes a laser unit for irradiating a sample with a beam of laser light and controlling the irradiation spot of the laser beam on the sample; and a mass analyzer for performing a mass analysis of the ions generated at the irradiation spot, where the mass analyzer uses a frequency-driven ion trap and a time-of-flight mass spectrometer to carry out the mass analysis. The ion trap of this system assuredly traps ions having large mass to charge ratios, and enables the system to carry out analyses on samples of large molecules. Preferably, a digital driving method is used to drive the aforementioned frequency-driven ion trap. Also, a multi-turn time-of-flight mass spectrometer may preferably be used as the aforementioned time-of-flight mass spectrometer.Type: ApplicationFiled: February 27, 2006Publication date: March 1, 2007Applicants: SHIMADZU CORPORATION, Inter-University Research Institute Corporation National Institutes of Natural Sciences, Osaka UniversityInventors: Kiyoshi Ogawa, Yoshikazu Yoshida, Kozo Shimazu, Mitsutoshi Setou, Shuichi Shimma, Michisato Toyoda
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Publication number: 20060204904Abstract: A method for manufacturing a metal mask that facilitates easy dimensional control in the manufacturing process and can manufacture multiple metal masks having high and consistent precision. A Cr film 2 having a mask pattern 2a is formed on the surface of a glass plate 1, a dry film 4 is formed on the Cr film 2, the dry film 4 is exposed from the glass plate 1 side with the Cr film 2 as a mask, a mask pattern 4a having the same shape as that of the mask pattern 2a is formed on the dry film 4, and a metal plating layer 6 is formed on the Cr film 2. The metal plating layer 6 is separated to form a metal mask 7.Type: ApplicationFiled: December 1, 2005Publication date: September 14, 2006Inventor: Kiyoshi Ogawa
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Publication number: 20060162410Abstract: The present invention pertains to a combined machining equipment for steel tubes, and a machining method is of a small size, can easily be moved, and is capable of not only flaring a steel tube, but also grinding a flared surface, forming a groove, and peeling off a lining. A main shaft (121) is rotatably mounted on a slide frame (141) slidable with respect to a common mount (103), and a second machining head (124) is mounted on a flange on the distal end of the main shaft (121). An auxiliary shaft (131) is slidably disposed in the main shaft (121) for rotation therewith. A first machining head (134) is mounted on a mount base (132) on the distal end of the auxiliary shaft (131).Type: ApplicationFiled: October 22, 2002Publication date: July 27, 2006Inventor: Kiyoshi Ogawa
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Patent number: 7025865Abstract: A method for manufacturing a metal mask that facilitates easy dimensional control in the manufacturing process and can manufacture multiple metal masks having high and consistent precision. A Cr film 2 having a mask pattern 2a is formed on the surface of a glass plate 1, a dry film 4 is formed on the Cr film 2, the dry film 4 is exposed from the glass plate 1 side with the Cr film 2 as a mask, a mask pattern 4a having the same shape as that of the mask pattern 2a is formed on the dry film 4, and a metal plating layer 6 is formed on the Cr film 2. The metal plating layer 6 is separated to form a metal mask 7.Type: GrantFiled: September 25, 2001Date of Patent: April 11, 2006Assignee: Eastman Kodak CompanyInventor: Kiyoshi Ogawa
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Patent number: 6926045Abstract: In order to prevent an uncut part from being formed in a band portion protruding from a head portion of a binding band, the binding device of the invention has a tightening function of tightening bound articles around which the binding band is wound, and a cutting away function of, after the bound articles are tightened, cutting away an extra part of the band portion.Type: GrantFiled: December 31, 2002Date of Patent: August 9, 2005Assignee: Tyton Company of Japan, Ltd.Inventors: Tadahiro Miyazaki, Kiyoshi Ogawa