Patents by Inventor Koichi Shinoda

Koichi Shinoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5956676
    Abstract: A pattern adapting apparatus including an input pattern forming unit, a tree structure standard pattern storing unit for storing a tree structure standard pattern including a tree structure indicative of inclusive relationships among categories and a parameter set at each node of the tree structure, a pattern matching unit for matching categories of the tree structure standard pattern with input samples of an input pattern, a tree structure standard pattern modifying unit for modifying a tree structure standard pattern based on the results of pattern matching, a node set selecting unit for calculating a description length with respect to a plurality of node sets in a tree structure pattern to select an appropriate node set, a modified standard pattern forming unit for forming a modified standard pattern by using a parameter set of a selected node set, and a standard pattern for recognition storing unit for storing a modified standard pattern.
    Type: Grant
    Filed: August 27, 1996
    Date of Patent: September 21, 1999
    Assignee: NEC Corporation
    Inventor: Koichi Shinoda
  • Patent number: 5274737
    Abstract: In a reference pattern adapting device for adapting reference pattern parameter groups (1-M) to adapted reference pattern parameter groups (1-M) by using training patterns (1-L) derived from a training pattern signal (TP). A similarity calculating unit (15) calculates a group of primary degrees of similarity between (a) each of M reference pattern element groups representative of reference patterns (output of a vector group memory 11) and (b) each of M reference pattern parameter groups (output of pattern parameter memory 12). A difference calculating unit (16) calculates a group of differences between reference pattern elements of each of the M reference pattern element groups and training pattern elements of each of L training pattern element groups representative of the training patterns (1-L). A first calculating unit (21) calculates a primary difference value by using the group of primary degrees of similarity and the group of differences.
    Type: Grant
    Filed: July 31, 1991
    Date of Patent: December 28, 1993
    Assignee: NEC Corporation
    Inventor: Koichi Shinoda