Abstract: A liquid crystal display device capable of performing image signal writing and display with a field-sequential method in parallel, with a simple pixel configuration. In the liquid crystal display device, image signal writing to pixels in a row can be followed by image signal writing to pixels in a row which is separate from the row by at least two rows. Therefore, in the liquid crystal display device, image signal writing and lighting of the backlights are not performed per pixel portion but can be performed per unit region of the pixel portion. Accordingly, image signal writing and lighting of the backlight can be performed in parallel in the liquid crystal display device.

Abstract: An object is to provide a pulse signal output circuit capable of operating stably and a shift register including the pulse signal output circuit. A pulse signal output circuit according to one embodiment of the disclosed invention includes first to tenth transistors. The ratio W/L of the channel width W to the channel length L of the first transistor and W/L of the third transistor are each larger than W/L of the sixth transistor. W/L of the fifth transistor is larger than W/L of the sixth transistor. W/L of the fifth transistor is equal to W/L of the seventh transistor. W/L of the third transistor is larger than W/L of the fourth transistor. With such a structure, a pulse signal output circuit capable of operating stably and a shift register including the pulse signal output circuit can be provided.

Abstract: An object of the present invention is to provide a pulse signal output circuit capable of operating stably and a shift register including the pulse signal output circuit. In an embodiment of the pulse signal output circuit, a transistor has a source terminal or a drain terminal connected to a gate electrode of another transistor having a source terminal or a drain terminal forming an output terminal of the pulse signal output circuit, the channel length of the transistor being longer than the channel length of the other transistor. Thereby, the amount of a leakage current modifying the gate potential of the other transistor can be reduced, and a malfunction of the pulse signal output circuit can be prevented.

Abstract: It is an object to provide a liquid crystal display device and a driving method of a liquid crystal display device in each of which deterioration of an image display function can be suppressed and power consumption can be sufficiently reduced. In the liquid crystal display device, a fixed potential is input to a capacitor before a power source is turned off, so that a potential difference between electrodes of the capacitor disappears (capacitance becomes almost zero) such that electric field is not applied to liquid crystals, whereby the liquid crystals are in an initial state. When the supply of the power source is stopped after an initial-state image is displayed, unnecessary electric field is not continuously applied to the liquid crystals in an off state, whereby the liquid crystals can be in the stable initial state; therefore, the liquid crystals can be prevented from deteriorating.

Abstract: Disclosed is a liquid crystal display device and a driving method thereof for displaying an image, in which the polarity of a voltage applied to the liquid crystal element is inverted in a first frame period and a second frame period which are sequential. The voltage applied to the liquid crystal element is compensated in the case where images of the first frame period and the second frame period are judged as a still image as a result of comparison of the image of the first frame period with the image of the second frame period and the absolute value of the voltage applied to the liquid crystal element in the first frame period is different from that of the voltage applied to the liquid crystal element in the second frame period.

Abstract: An object is to reduce leakage current and parasitic capacitance of a transistor used for an LSI, a CPU, or a memory. A semiconductor integrated circuit included in an LSI, a CPU, or a memory is manufactured using the transistor which is formed using an oxide semiconductor which is an intrinsic or substantially intrinsic semiconductor obtained by removal of impurities which serve as electron donors (donors) from the oxide semiconductor and has larger energy gap than a silicon semiconductor, and is formed over a semiconductor substrate. With the transistor which is formed over the semiconductor substrate and includes the highly purified oxide semiconductor layer with sufficiently reduced hydrogen concentration, a semiconductor device whose power consumption due to leakage current is low can be realized.

Abstract: An object is to provide a memory device including a memory element that can be operated without problems by a thin film transistor with a low off-state current. Provided is a memory device in which a memory element including at least one thin film transistor that includes an oxide semiconductor layer is arranged as a matrix. The thin film transistor including an oxide semiconductor layer has a high field effect mobility and low off-state current, and thus can be operated favorably without problems. In addition, the power consumption can be reduced. Such a memory device is particularly effective in the case where the thin film transistor including an oxide semiconductor layer is provided in a pixel of a display device because the memory device and the pixel can be formed over one substrate.

Abstract: An object is to reduce leakage current and parasitic capacitance of a transistor used for an LSI, a CPU, or a memory. A semiconductor integrated circuit such as an LSI, a CPU, or a memory is manufactured using a thin film transistor in which a channel formation region is formed using an oxide semiconductor which becomes an intrinsic or substantially intrinsic semiconductor by removing impurities which serve as electron donors (donors) from the oxide semiconductor and has larger energy gap than that of a silicon semiconductor. With use of a thin film transistor using a highly purified oxide semiconductor layer with sufficiently reduced hydrogen concentration, a semiconductor device with low power consumption due to leakage current can be realized.