Patents by Inventor Kuei-Hung Shen

Kuei-Hung Shen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220291306
    Abstract: Disclosed methods include placing a semiconductor wafer containing MRAM devices into a first magnetic field that has a magnitude sufficient to magnetically polarize MRAM bits and has a substantially uniform field strength and direction over the entire area of the wafer. The method further includes placing the wafer in a second magnetic field having an opposite field direction, a substantially uniform field strength and direction over the entire area of the wafer, and magnitude less than a design threshold for MRAM bit magnetization reversal. The method further includes determining a presence of malfunctioning MRAM bits by determining that such malfunctioning MRAM bits have a magnetic polarization that was reversed due to exposure to the second magnetic field. Malfunctioning MRAM bits may further be characterized by electrically reading data bits, or by using a chip probe to read one or more of voltage, current, resistances, etc., of the MRAM devices.
    Type: Application
    Filed: September 9, 2021
    Publication date: September 15, 2022
    Inventors: Cheng-Wei Chien, Harry-Hak-Lay Chuang, Kuei-Hung Shen, Kuo-Feng Huang, Bo-Hung Lin, Chun-Chi Chen
  • Patent number: 11316096
    Abstract: The present disclosure relates to an integrated circuit. The integrated circuit includes a an inter-layer dielectric (ILD) structure laterally surrounding a conductive interconnect. A dielectric protection layer is disposed over the ILD structure and a passivation layer is disposed over the dielectric protection layer. The passivation layer includes a protrusion extending outward from an upper surface of the passivation layer. A bottom electrode continuously extends from over the passivation layer to between sidewalls of the passivation layer. A data storage element is over the bottom electrode and a top electrode is over the data storage element.
    Type: Grant
    Filed: June 12, 2020
    Date of Patent: April 26, 2022
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Harry-Hak-Lay Chuang, Hung Cho Wang, Tong-Chern Ong, Wen-Ting Chu, Yu-Wen Liao, Kuei-Hung Shen, Kuo-Yuan Tu, Sheng-Huang Huang
  • Patent number: 11227893
    Abstract: The present disclosure provides a semiconductor structure, including a logic region and a memory region adjacent to the logic region. The memory region includes a Nth metal layer, a bottom electrode over the Nth metal layer, a magnetic tunneling junction (MTJ) layer over the bottom electrode, a top electrode over the MTJ layer, and a (N+1)th metal layer over the top electrode. The top electrode includes material having an oxidation rate lower than that of Tantalum or Tantalum derivatives. N is an integer greater than or equal to 1.
    Type: Grant
    Filed: June 22, 2018
    Date of Patent: January 18, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Kuei-Hung Shen
  • Patent number: 10991758
    Abstract: The present disclosure provides a semiconductor structure. The semiconductor structure includes a bottom electrode via (BEVA) in a dielectric layer, a recap layer on the BEVA, a bottom electrode on the recap layer, and a magnetic tunneling junction (MTJ) layer over the recap layer and vertically aligning with the BEVA. The BEVA includes a lining layer over a bottom and a sidewall of a trench of the BEVA and a copper layer over the lining layer, filling the trench of the BEVA. The copper layer has a dimpled structure with a top surface lower than a top surface of the dielectric layer. The recap layer overlaps a top surface of the lining layer, an entire top surface of the copper layer, and a portion of the dielectric stack adjacent to the lining layer.
    Type: Grant
    Filed: May 21, 2019
    Date of Patent: April 27, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Kuei-Hung Shen, Hsun-Chung Kuang, Cheng-Yuan Tsai, Ru-Liang Lee
  • Patent number: 10868234
    Abstract: A storage device includes: a plurality of first magnetic tunnel junction (MTJ) cells disposed on a first portion of a substrate; and a plurality of second MTJ cells disposed on a second portion different from the first portion of the substrate; wherein each of the plurality of first MTJ cells has a first cross-sectional surface area viewing from a top of the substrate, each of the plurality of second MTJ cells has a second cross-sectional surface area viewing from the top of the substrate, and the second cross-sectional surface area is greater than the first cross-sectional surface area.
    Type: Grant
    Filed: December 12, 2018
    Date of Patent: December 15, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Chang-Hung Chen, Kuei-Hung Shen, Wen-Chun You, Tien-Wei Chiang
  • Publication number: 20200350491
    Abstract: The present disclosure provides a semiconductor structure, including an Nth metal layer over a transistor region, where N is a natural number, and a bottom electrode over the Nth metal layer. The bottom electrode comprises a bottom portion having a first width, disposed in a bottom electrode via (BEVA), the first width being measured at a top surface of the BEVA, and an upper portion having a second width, disposed over the bottom portion. The semiconductor structure also includes a magnetic tunneling junction (MTJ) layer having a third width, disposed over the upper portion, a top electrode over the MTJ layer and an (N+1)th metal layer over the top electrode. The first width is greater than the third width.
    Type: Application
    Filed: July 17, 2020
    Publication date: November 5, 2020
    Inventors: Harry-Hak-Lay CHUANG, Shih-Chang LIU, Chern-Yow HSU, Kuei-Hung SHEN
  • Publication number: 20200303629
    Abstract: The present disclosure relates to an integrated circuit. The integrated circuit includes a an inter-layer dielectric (ILD) structure laterally surrounding a conductive interconnect. A dielectric protection layer is disposed over the ILD structure and a passivation layer is disposed over the dielectric protection layer. The passivation layer includes a protrusion extending outward from an upper surface of the passivation layer. A bottom electrode continuously extends from over the passivation layer to between sidewalls of the passivation layer. A data storage element is over the bottom electrode and a top electrode is over the data storage element.
    Type: Application
    Filed: June 12, 2020
    Publication date: September 24, 2020
    Inventors: Harry-Hak-Lay Chuang, Hung Cho Wang, Tong-Chern Ong, Wen-Ting Chu, Yu-Wen Liao, Kuei-Hung Shen, Kuo-Yuan Tu, Sheng-Huang Huang
  • Patent number: 10720571
    Abstract: The present disclosure provides a semiconductor structure, including an Nth metal layer over a transistor region, where N is a natural number, and a bottom electrode over the Nth metal layer. The bottom electrode comprises a bottom portion having a first width, disposed in a bottom electrode via (BEVA), the first width being measured at a top surface of the BEVA, and an upper portion having a second width, disposed over the bottom portion. The semiconductor structure also includes a magnetic tunneling junction (MTJ) layer having a third width, disposed over the upper portion, a top electrode over the MTJ layer and an (N+1)th metal layer over the top electrode. The first width is greater than the third width.
    Type: Grant
    Filed: July 28, 2018
    Date of Patent: July 21, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Shih-Chang Liu, Chern-Yow Hsu, Kuei-Hung Shen
  • Publication number: 20200194662
    Abstract: A storage device includes: a plurality of first magnetic tunnel junction (MTJ) cells disposed on a first portion of a substrate; and a plurality of second MTJ cells disposed on a second portion different from the first portion of the substrate; wherein each of the plurality of first MTJ cells has a first cross-sectional surface area viewing from a top of the substrate, each of the plurality of second MTJ cells has a second cross-sectional surface area viewing from the top of the substrate, and the second cross-sectional surface area is greater than the first cross-sectional surface area.
    Type: Application
    Filed: December 12, 2018
    Publication date: June 18, 2020
    Inventors: HARRY-HAK-LAY CHUANG, CHANG-HUNG CHEN, KUEI-HUNG SHEN, WEN-CHUN YOU, TIEN-WEI CHIANG
  • Patent number: 10686125
    Abstract: The present disclosure, in some embodiments, relates to an integrated circuit. The integrated circuit includes a dielectric protection layer disposed over a dielectric structure that laterally surrounds one or more conductive interconnect layers. The dielectric protection layer has a protrusion extending outward from an upper surface of the dielectric protection layer. A bottom electrode is disposed over the dielectric protection layer and has sidewalls extending outward from a lower surface of the bottom electrode through the dielectric protection layer. The bottom electrode has a substantially planar upper surface over the protrusion. A data storage element is over the substantially planar upper surface of the bottom electrode, and a top electrode is over the data storage element.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: June 16, 2020
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Harry-Hak-Lay Chuang, Hung Cho Wang, Tong-Chern Ong, Wen-Ting Chu, Yu-Wen Liao, Kuei-Hung Shen, Kuo-Yuan Tu, Sheng-Huang Huang
  • Patent number: 10665321
    Abstract: The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: May 26, 2020
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chia-Yu Wang, Ching-Huang Wang, Chun-Jung Lin, Tien-Wei Chiang, Meng-Chun Shih, Kuei-Hung Shen
  • Patent number: 10636961
    Abstract: The present disclosure provides a semiconductor structure and a method for manufacturing the same. The semiconductor structure comprises a memory region. The memory region comprises a bottom via, a recap layer on the BV, a bottom electrode on the recap layer, a magnetic tunneling junction layer on the bottom electrode, and a top electrode on the MTJ layer. The material of the recap layer is different from that of the BV.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: April 28, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Hsia-Wei Chen, Hung Cho Wang, Kuei-Hung Shen
  • Publication number: 20190273118
    Abstract: The present disclosure provides a semiconductor structure. The semiconductor structure includes a bottom electrode via (BEVA) in a dielectric layer, a recap layer on the BEVA, a bottom electrode on the recap layer, and a magnetic tunneling junction (MTJ) layer over the recap layer and vertically aligning with the BEVA. The BEVA includes a lining layer over a bottom and a sidewall of a trench of the BEVA and a copper layer over the lining layer, filling the trench of the BEVA. The copper layer has a dimpled structure with a top surface lower than a top surface of the dielectric layer. The recap layer overlaps a top surface of the lining layer, an entire top surface of the copper layer, and a portion of the dielectric stack adjacent to the lining layer.
    Type: Application
    Filed: May 21, 2019
    Publication date: September 5, 2019
    Inventors: HARRY-HAK-LAY CHUANG, KUEI-HUNG SHEN, HSUN-CHUNG KUANG, CHENG-YUAN TSAI, RU-LIANG LEE
  • Patent number: 10304903
    Abstract: The present disclosure provides a semiconductor structure. The semiconductor structure includes a bottom electrode via (BEVA), a recap layer on the BEVA, and a magnetic tunneling junction (MTJ) layer over the recap layer. The BEVA includes a lining layer over a bottom and a sidewall of a trench of the BEVA, and electroplated copper over the lining layer, filling the trench of the BEVA. The recap layer overlaps a top surface of the lining layer and a top surface of the electroplated copper.
    Type: Grant
    Filed: January 10, 2018
    Date of Patent: May 28, 2019
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Harry-Hak-Lay Chuang, Kuei-Hung Shen, Hsun-Chung Kuang, Cheng-Yuan Tsai, Ru-Liang Lee
  • Publication number: 20190123264
    Abstract: The present disclosure, in some embodiments, relates to an integrated circuit. The integrated circuit includes a dielectric protection layer disposed over a dielectric structure that laterally surrounds one or more conductive interconnect layers. The dielectric protection layer has a protrusion extending outward from an upper surface of the dielectric protection layer. A bottom electrode is disposed over the dielectric protection layer and has sidewalls extending outward from a lower surface of the bottom electrode through the dielectric protection layer. The bottom electrode has a substantially planar upper surface over the protrusion. A data storage element is over the substantially planar upper surface of the bottom electrode, and a top electrode is over the data storage element.
    Type: Application
    Filed: December 17, 2018
    Publication date: April 25, 2019
    Inventors: Harry-Hak-Lay Chuang, Hung Cho Wang, Tong-Chern Ong, Wen-Ting Chu, Yu-Wen Liao, Kuei-Hung Shen, Kuo-Yuan Tu, Sheng-Huang Huang
  • Patent number: 10270025
    Abstract: The present disclosure provides a semiconductor structure, including an Nth metal layer over a transistor region, where N is a natural number, and a bottom electrode over the Nth metal layer. The bottom electrode comprises a bottom portion having a first width, disposed in a bottom electrode via (BEVA), the first width being measured at a top surface of the BEVA, and an upper portion having a second width, disposed over the bottom portion. The semiconductor structure also includes a magnetic tunneling junction (MTJ) layer having a third width, disposed over the upper portion, a top electrode over the MTJ layer and an (N+1)th metal layer over the top electrode. The first width is greater than the third width.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: April 23, 2019
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Harry-Hak-Lay Chuang, Shih-Chang Liu, Chern-Yow Hsu, Kuei-Hung Shen
  • Publication number: 20190066820
    Abstract: The disclosure is related a method for testing a magnetic memory device and a test apparatus are provided. In some exemplary embodiments, the method includes at least the following steps. The magnetic memory device is initialized by applying a first magnetic field to force write a first data to the magnetic memory device. Then, a second magnetic field is applied to the magnetic memory device. Second data may be obtained from the magnetic memory device by performing a chip probing process. Accordingly, performance of the magnetic memory device may be determined based on the second data.
    Type: Application
    Filed: August 30, 2017
    Publication date: February 28, 2019
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chia-Yu Wang, Ching-Huang Wang, Chun-Jung Lin, Tien-Wei Chiang, Meng-Chun Shih, Kuei-Hung Shen
  • Patent number: 10164169
    Abstract: The present disclosure relates to a method of manufacturing a memory device. The method is performed by forming an inter-layer dielectric (ILD) layer over a substrate, and forming an opening within a dielectric protection layer over the ILD layer. A bottom electrode layer is formed within the opening and over the dielectric protection layer. A chemical mechanical planarization (CMP) process is performed on the bottom electrode layer to form a bottom electrode structure having a planar upper surface and a projection that protrudes outward from a lower surface of the bottom electrode structure to within the opening. A memory element is formed over the bottom electrode structure, and a top electrode is formed over the memory element.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: December 25, 2018
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Harry-Hak-Lay Chuang, Hung Cho Wang, Tong-Chern Ong, Wen-Ting Chu, Yu-Wen Liao, Kuei-Hung Shen, Kuo-Yuan Tu, Sheng-Huang Huang
  • Publication number: 20180351091
    Abstract: The present disclosure provides a semiconductor structure, including an Nth metal layer over a transistor region, where N is a natural number, and a bottom electrode over the Nth metal layer. The bottom electrode comprises a bottom portion having a first width, disposed in a bottom electrode via (BEVA), the first width being measured at a top surface of the BEVA, and an upper portion having a second width, disposed over the bottom portion. The semiconductor structure also includes a magnetic tunneling junction (MTJ) layer having a third width, disposed over the upper portion, a top electrode over the MTJ layer and an (N+1)th metal layer over the top electrode. The first width is greater than the third width.
    Type: Application
    Filed: July 28, 2018
    Publication date: December 6, 2018
    Inventors: Harry-Hak-Lay CHUANG, Shih-Chang LIU, Chern-Yow HSU, Kuei-Hung SHEN
  • Publication number: 20180308899
    Abstract: The present disclosure provides a semiconductor structure, including a logic region and a memory region adjacent to the logic region. The memory region includes a Nth metal layer, a bottom electrode over the Nth metal layer, a magnetic tunneling junction (MTJ) layer over the bottom electrode, a top electrode over the MTJ layer, and a (N+1)th metal layer over the top electrode. The top electrode includes material having an oxidation rate lower than that of Tantalum or Tantalum derivatives. N is an integer greater than or equal to 1.
    Type: Application
    Filed: June 22, 2018
    Publication date: October 25, 2018
    Inventors: HARRY-HAK-LAY CHUANG, KUEI-HUNG SHEN