Abstract: Disclosed are metal reinforced layers disposed at the upper and lower surfaces of the thin substrate to reinforce the strength of the thin substrate. With reinforced strength, the thin substrate is not susceptible to deform due to temperature fluctuation during packaging process, and thus the warpage for the semiconductor package is significantly eliminated. According to another aspect of the present invention, the metal reinforced layer at the lower surface of the thin substrate is functioned as a ground plane for the ball grid array (BGA) semiconductor package for better grounding effect. The present invention provides an optimal design for the return current path and impedance matching control. Besides, in high frequency application, the metal reinforced layer also can reduce the noise and cross talk among the signal lines of the ball grid array (BGA) semiconductor package.

Abstract: A thermal enhanced ball grid array package is provided. The substrate for the package includes a metal core layer and at least a first patterned wiring layer provided thereon. A first insulating layer is provided between the first patterned wiring layer and the metal core layer. At least a second patterned wiring layer is provided on the substrate, opposite to the surface having the first patterned wiring layer. A second insulating layer having solder balls between the second patterned wiring layer and the metal core layer. The second patterned wiring layer is electrically connected to the first patterned wiring layer. Blind vias are provided in the second patterned wiring layer and the second insulating layer. A heat conductive material or solder material is filled into the blind vias to form thermal balls. The heat from the chip to the metal core layer is transferred directly through the thermal balls.

Abstract: A method of making a printed circuit board mainly comprises mechanically and electrically attaching a first substrate to a second substrate having an opening defined therein via solder balls, column-like solder bumps or anisotropic conductive adhesive film (ACF) thereby obtaining a multilayer circuit board with a cavity or a three-dimensional structure. The upper surface of the first substrate is provided with a first set of contacts adapted for electrical coupling to a semiconductor chip and a second set of contacts. For making electrical connection to an outside printed circuit board, the lower surface of the first substrate is provided with a third set of contacts which are designed to electrically interconnect to the first set of contacts and the second set of contacts. The second substrate is provided with a set of interconnection pads formed on a lower surface thereof.

Abstract: A lead-bond type chip package includes a multilayer substrate for supporting and electrical interconnecting a semiconductor chip. The multilayer substrate has a slot defined therein. The multilayer substrate comprises an interlayer circuit board having prepregs disposed thereon, a plurality of leads on the prepreg on the upper surface of the interlayer circuit board, and a plurality of solder pads for making external electrical connection on the prepreg on the lower surface of the interlayer circuit board. The leads of the multilayer substrate are bonded to corresponding bonding pads formed on the semiconductor chip. A package body is formed on the multilayer substrate around the semiconductor chip and in the slot of the multilayer substrate. The multilayer substrate is capable of providing a power or ground plane formed therein for enhancing the electrical performance of the package, and providing a high wiring density for packaging a chip with high I/O connections.

Abstract: A chip scale package mainly comprises a substrate attached to the active surface of a semiconductor chip through an anisotropic conductive adhesive film (ACF). The substrate is provided with a plurality of contact pads on the lower surface thereof and a plurality of solder pads on the upper surface thereof wherein the contact pads are electrically coupled to corresponding solder pads. A plurality of metal bumps provided on the contact pads of the substrate. The metal bumps on the substrate are electrically coupled to corresponding bonding pads on the chip through the ACF. The side portions of the substrate and the ACF are sealed in a package body. The present invention further provides a method of making the chip scale package at the wafer level. The method is characterized by attaching substrates onto the chips of a wafer one by one so as to greatly reduce the problems associated with CTE mismatch between the wafer and the substrate thereby significantly enhancing the product yield.

Abstract: A chip scale package comprises a film substrate attached to the active surface of a semiconductor chip by an adhesive layer. The adhesive layer has a plurality of apertures formed corresponding to bonding pads on the chip. The film substrate includes a film and a plurality of conductive leads formed thereon. The film has a plurality of first openings formed corresponding to the apertures of the adhesive layer and a plurality of second openings. Each lead on the film has a first end portion projecting into one of the first openings of the film and a second end portion exposed from one of the second openings of the film. Each aperture and corresponding first opening are filled with a conductive paste embedding the first end portion of one lead therein so as to electrically connect the bonding pads of the chip and the conductive leads of the film substrate. A plurality of solder bumps formed on the second end portions of leads through the second openings of the film.

Abstract: A chip scale package mainly comprises a substrate attached to the active surface of a semiconductor chip through an anisotropic conductive adhesive film (ACF). The substrate is provided with a plurality of contact pads on the lower surface thereof and a plurality of solder pads on the upper surface thereof wherein the contact pads are electrically coupled to corresponding solder pads. A plurality of metal bumps provided on the contact pads of the substrate. The metal bumps on the substrate are electrically coupled to corresponding bonding pads on the chip through the ACF. The side portions of the substrate and the ACF are sealed in a package body. The present invention further provides a method of making the chip scale package at the wafer level. The method is characterized by attaching substrates onto the chips of a wafer one by one so as to greatly reduce the problems associated with CTE mismatch between the wafer and the substrate thereby significantly enhancing the product yield.

Abstract: A lead-bond type chip package includes a multilayer substrate for supporting and electrical interconnecting a semiconductor chip. The multilayer substrate has a slot defined therein. The multilayer substrate comprises an interlayer circuit board having prepregs disposed thereon, a plurality of leads on the prepreg on the upper surface of the interlayer circuit board, and a plurality of solder pads for making external electrical connection on the prepreg on the lower surface of the interlayer circuit board. The leads of the multilayer substrate are bonded to corresponding bonding pads formed on the semiconductor chip. A package body is formed on the multilayer substrate around the semiconductor chip and in the slot of the multilayer substrate. The multilayer substrate is capable of providing a power or ground plane formed therein for enhancing the electrical performance of the package, and providing a high wiring density for packaging a chip with high I/O connections.

Abstract: A chip scale package comprises a film substrate attached to the active surface of a semiconductor chip by an adhesive layer. The adhesive layer has a plurality of apertures formed corresponding to bonding pads on the chip. The film substrate includes a film and a plurality of conductive leads formed thereon. The film has a plurality of first openings formed corresponding to the apertures of the adhesive layer and a plurality of second openings. Each lead on the film has a first end portion projecting into one of the first openings of the film and a second end portion exposed from one of the second openings of the film. Each aperture and corresponding first opening are filled with a conductive paste embedding the first end portion of one lead therein so as to electrically connect the bonding pads of the chip and the conductive leads of the film substrate. A plurality of solder bumps formed on the second end portions of leads through the second openings of the film.

Abstract: In a flip chip process, a wafer is provided with a plurality of chips therein. Each chip has an active surface on which are formed a plurality of bonding pads. A bump is formed on each bonding pad. A plurality of substrates respectively includes at least a package unit, wherein each package unit has a plurality of contact pads. The substrates are respectively mounted onto the wafer such that each package unit corresponds to one chip and the contact pads of the package unit are respectively connected to the corresponding bumps, wherein two neighboring substrates are separated by a gap. An underfill material fills between the wafer and the substrates, the underfill material being introduced through the gaps between the substrates and from the boundary of the wafer. The underfill material then is solidified. The substrates and the wafer are diced to form individualized packages.

Abstract: The substrate of the present invention mainly includes a plurality of bonding pads, a plurality of ball pads, a plurality of traces, a plurality of holes, a first wire and a second wire. The bonding pads and ball pads are located on a first surface of the substrate and are connected to one another by the traces. The first wire is arranged at the edge of the first surface of the substrate, the second wire is arranged at a slot area of a second surface of the substrate which is adhesively covered by a solder mask and further has two ends connecting to the first wire. The holes connect the first surface to the second surface. The traces are connected the bonding pads and ball pads of the first surface by passing through the corresponding holes and a slot area to the second wire of the second surface to form closed loops. In the slot area, the solder mask adhesively covers the traces.

Abstract: A packaged semi-conductor substrate includes a package encapsulant pouring area, a layout provided on the substrate, a layer of solder mask deposited on the layout, and a film provided on the solder mask. When the package encapsulant is pouted into the package encapsulant pouring area, the package encapsulant is isolated from the solder mask by the film. An adhering force between the film and the package encapsulant is greater than an adhering force between the film and the mask such that the film is degated along with the package encapsulant in the pouring channel during a degating procedure of the pouring channel after a pouring procedure of the package encapsulant. Thus, the film and the package encapsulant are not residual on the substrate.

Abstract: A BGA package includes a substrate, a chip, and a heat spreader. The spreader covers the chip, a bottom part of the spreader is mounted on an upper surface of the substrate by an adhesive. The spreader shields Electro Magnetic Interference to the chip. In addition, the substrate is made of a built-up PCB.

Abstract: A method for plating gold to a plurality of bond leads on a substrate is disclosed. The method first extends a plating line from a plating loop on the edge of the substrate to a bond area in the center portion of the substrate to electrically connect the plurality of bond leads in series. The plating line further extends to connect to the plating loop after connecting the plurality of bond leads together. Then, electricity is applied to the plurality of bond leads via the plating loop and the plating line thereby plates gold to the plurality of bond leads. Finally, a bonding tool is used to cut off and remove the plating line when the bonding tool is provided to bond the plurality of bond leads to a die that is attached to the substrate, whereby the residual plating line remaining on the substrate does not affect the performance of the semiconductor chip.

Abstract: A semiconductor packaging device includes a printed circuit board substrate, a mold gate formed on a periphery of the printed circuit board substrate through which a package encapsulant is poured to enclose electric elements mounted on a side of the printed circuit board, and a layer of non-metallic material covered on the side of the printed circuit board substrate in the mold gate area. The package encapsulant, after hardened, is bonded with the layer of non-metallic material, and the bonded package encapsulant/the layer of non-metallic material is degatable from the mold gate.