Patents by Inventor Kuniyasu Nakamura

Kuniyasu Nakamura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9293293
    Abstract: The objective of the present application is to suppress the occurrence of flares and to reduce the amount of secondary electrons arising at an aperture provided to the lead-out electrode of an electron gun. By coating a thin film having a low rate of secondary electron emission such as carbon onto the aperture of a lead-out electrode closest to an electron source in an electron gun, it is possible to reduce the amount of secondary electrons arising. Secondary electrons arising at the lead-out electrode, are reduced, and so as a result, flare is reduced. By incorporating two apertures to the lead-out electrode, and applying to the two apertures a potential that is equipotential to the lead-out electrode, it is possible to eliminate an electric field from seeping from under to over the lead-out electrode. Secondary electrons arising when an electron beam impacts the lead-out electrode cease to incur force in the direction of passage from the lead-out electrode, and consequently there is a reduction in flares.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: March 22, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Shun-ichi Watanabe, Takashi Onishi, Yoichi Ose, Kuniyasu Nakamura, Masaru Moriyama, Tomonori Suzuki
  • Patent number: 8878130
    Abstract: A scanning transmission electron microscope according to the present invention includes an electron lens system having a small spherical aberration coefficient for enabling three-dimensional observation of a 0.1 nm atomic size structure. The scanning transmission electron microscope according to the present invention also includes an aperture capable of changing an illumination angle; an illumination electron lens system capable of changing the probe size of an electron beam probe and the illumination angle; a secondary electron detector (9); a transmission electron detector (13); a forward scattered electron beam detector (12); a focusing unit (16); an image processor for identifying image contrast; an image processor for computing image sharpness; a processor for three-dimensional reconstruction of an image; and a mixer (18) for mixing a secondary electron signal and a specimen forward scattered electron signal.
    Type: Grant
    Filed: July 19, 2012
    Date of Patent: November 4, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiromi Inada, Kuniyasu Nakamura
  • Publication number: 20140197336
    Abstract: The objective of the present application is to suppress the occurrence of flares and to reduce the amount of secondary electrons arising at an aperture provided to the lead-out electrode of an electron gun. By coating a thin film having a low rate of secondary electron emission such as carbon onto the aperture of a lead-out electrode closest to an electron source in an electron gun, it is possible to reduce the amount of secondary electrons arising. Secondary electrons arising at the lead-out electrode, are reduced, and so as a result, flare is reduced. By incorporating two apertures to the lead-out electrode, and applying to the two apertures a potential that is equipotential to the lead-out electrode, it is possible to eliminate an electric field from seeping from under to over the lead-out electrode. Secondary electrons arising when an electron beam impacts the lead-out electrode cease to incur force in the direction of passage from the lead-out electrode, and consequently there is a reduction in flares.
    Type: Application
    Filed: May 22, 2012
    Publication date: July 17, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Shun-ichi Watanabe, Takashi Onishi, Yoichi Ose, Kuniyasu Nakamura, Masaru Moriyama, Tomonori Suzuki
  • Publication number: 20140138542
    Abstract: A scanning transmission electron microscope according to the present invention includes an electron lens system having a small spherical aberration coefficient for enabling three-dimensional observation of a 0.1 nm atomic size structure. The scanning transmission electron microscope according to the present invention also includes an aperture capable of changing an illumination angle; an illumination electron lens system capable of changing the probe size of an electron beam probe and the illumination angle; a secondary electron detector (9); a transmission electron detector (13); a forward scattered electron beam detector (12); a focusing unit (16); an image processor for identifying image contrast; an image processor for computing image sharpness; a processor for three-dimensional reconstruction of an image; and a mixer (18) for mixing a secondary electron signal and a specimen forward scattered electron signal.
    Type: Application
    Filed: July 19, 2012
    Publication date: May 22, 2014
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hiromi Inada, Kuniyasu Nakamura
  • Patent number: 8710438
    Abstract: A scanning transmission electron microscope equipped with an aberration corrector is capable of automatically aligning the position of a convergence aperture with the center of an optical axis irrespective of skill and experience of an operator. The scanning transmission electron microscope system includes an electron source; a condenser lens configured to converge an electron beam emitted from the electron source; a deflector configured to cause the electron beam to perform scanning on a sample; an aberration correction device configured to correct an aberration of the electron beam; a convergence aperture configured to determine a convergent angle of the electron beam; and a detector configured to detect electrons passing through or diffracted by the sample. The system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information.
    Type: Grant
    Filed: July 11, 2011
    Date of Patent: April 29, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kuniyasu Nakamura, Hiromi Inada
  • Publication number: 20130112875
    Abstract: A scanning transmission electron microscope equipped with an aberration corrector is capable of automatically aligning the position of a convergence aperture with the center of an optical axis irrespective of skill and experience of an operator. The scanning transmission electron microscope system includes an electron source; a condenser lens configured to converge an electron beam emitted from the electron source; a deflector configured to cause the electron beam to perform scanning on a sample; an aberration correction device configured to correct an aberration of the electron beam; a convergence aperture configured to determine a convergent angle of the electron beam; and a detector configured to detect electrons passing through or diffracted by the sample. The system acquires information on contrast of a Ronchigram formed by the electron beam passing through the sample, and determines a position of the convergence aperture on the basis of the information.
    Type: Application
    Filed: July 11, 2011
    Publication date: May 9, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kuniyasu Nakamura, Hiromi Inada
  • Patent number: 7372029
    Abstract: A scanning transmission electron microscope for scanning a primary electron beam on a sample, detecting a transmitted electron from the sample by a detector, and forming an image of the transmitted electron. The scanning transmission electron microscope includes an electron-optics system which enables switching back the transmitted electron beam to the optical axis by a predetermined quantity, and a determining unit for determining the quantity based on a displacement of the transmitted electron with respect to the detector caused by the scanning of the primary electron beam.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: May 13, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto, Kuniyasu Nakamura
  • Patent number: 7285776
    Abstract: The present invention provides a scanning transmission electron microscope which is capable of setting an acceptance angular range of an energy loss spectrometer independent of an acceptance angular range of a scattered electron detector, and makes it unnecessary to change a condition for the energy loss spectrometer with respect to a change in the acceptance angular range of the scattered electron detector.
    Type: Grant
    Filed: June 22, 2005
    Date of Patent: October 23, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kuniyasu Nakamura, Shunichi Watanabe
  • Publication number: 20070228277
    Abstract: A scanning transmission electron microscope for scanning a primary electron beam on a sample, detecting a transmitted electron from the sample by a detector, and forming an image of the transmitted electron. The scanning transmission electron microscope includes an electron-optics system which enables switching back the transmitted electron beam to the optical axis by a predetermined quantity, and a determining unit for determining the quantity based on a displacement of the transmitted electron with respect to the detector caused by the scanning of the primary electron beam.
    Type: Application
    Filed: May 30, 2007
    Publication date: October 4, 2007
    Inventors: Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto, Kuniyasu Nakamura
  • Publication number: 20070158567
    Abstract: A scanning transmission electron microscope is provided including an electron beam source (1), convergent lenses (3), scan coils (10), a dark field image detector (16), a bright field image detector (17), an A/D converter (21), and an information processing device (24). In the scanning transmission electron microscope, a spherical aberration corrector (7) and deflection coils (9a, 9b) are disposed before a pre-magnetic field of objective lens (11). Fourier transform images are produced from scanning transmission images obtained by the dark field image detector (16) or the bright field image detector (17) to evaluate deviation in an aberration correction state due to an image shift caused by the deflection coils (9a, 9b) at a deflection ratio, so a suitable deflection ratio is fed back. As a result, an electron optics of the scanning transmission electron microscope including the corrector can be easily adjusted.
    Type: Application
    Filed: December 26, 2006
    Publication date: July 12, 2007
    Inventors: Taisuke Nakamura, Kuniyasu Nakamura
  • Publication number: 20070158568
    Abstract: In the type of scanning transmission electron microscopes carrying an aberration corrector, a method of assuring more simplified and manipulatable adjustment of the corrector and a scanning transmission electron microscope having that function are provided. A Ronchigram image is acquired using a spherical standard specimen and parameters necessary for the adjustment are acquired from the thus obtained Ronchigram.
    Type: Application
    Filed: December 27, 2006
    Publication date: July 12, 2007
    Inventors: Taisuke Nakamura, Kuniyasu Nakamura
  • Patent number: 7227144
    Abstract: A scanning transmission electron microscope which enhances correction accuracy of a de-scanning coil for canceling a transmitted-electron-beam position change on an electron detector. Here, this transmitted-electron-beam position change appears in accompaniment with a primary-electron-beam position change on a specimen caused by a scanning coil. First, control over the scanning coil is digitized. Moreover, while being synchronized with a digital control signal resulting from this digitization, values in a de-scanning table registered in a FM(2) are outputted to the de-scanning coil. Here, the de-scanning table is created as follows: Diffraction images before and after activating the scanning coil and the de-scanning coil are photographed using a camera. Then, based on a result acquired by analyzing a resultant displacement quantity of the diffraction images by the image processing, the de-scanning table is created.
    Type: Grant
    Filed: January 10, 2006
    Date of Patent: June 5, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto, Kuniyasu Nakamura
  • Publication number: 20060151701
    Abstract: A scanning transmission electron microscope which enhances correction accuracy of a de-scanning coil for canceling a transmitted-electron-beam position change on an electron detector. Here, this transmitted-electron-beam position change appears in accompaniment with a primary-electron-beam position change on a specimen caused by a scanning coil. First, control over the scanning coil is digitized. Moreover, while being synchronized with a digital control signal resulting from this digitization, values in a de-scanning table registered in a FM (2) are outputted to the de-scanning coil. Here, the de-scanning table is created as follows: Diffraction images before and after activating the scanning coil and the de-scanning coil are photographed using a camera. Then, based on a result acquired by analyzing a resultant displacement quantity of the diffraction images by the image processing, the de-scanning table is created.
    Type: Application
    Filed: January 10, 2006
    Publication date: July 13, 2006
    Inventors: Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto, Kuniyasu Nakamura
  • Publication number: 20050285037
    Abstract: The present invention provides a scanning transmission electron microscope which is capable of setting an acceptance angular range of an energy loss spectrometer independent of an acceptance angular range of a scattered electron detector, and makes it unnecessary to change a condition for the energy loss spectrometer with respect to a change in the acceptance angular range of the scattered electron detector.
    Type: Application
    Filed: June 22, 2005
    Publication date: December 29, 2005
    Inventors: Kuniyasu Nakamura, Shunichi Watanabe
  • Patent number: 6875984
    Abstract: A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing.
    Type: Grant
    Filed: July 18, 2003
    Date of Patent: April 5, 2005
    Assignees: Hitachi, Ltd., Hitachi High-Technologies Corporation
    Inventors: Hiroshi Kakibayashi, Shigeyuki Hosoki, Yuji Takagi, Ryo Miyake, Kuniyasu Nakamura, Mitsugu Sato, Hiroyuki Kobayashi
  • Patent number: 6822233
    Abstract: A scanning transmission electron microscope (STEM) has an electron source for generating a primary electron beam and an electron illuminating lens system for converging the primary electron beam from the electron source onto a specimen for illumination. An electron deflecting system is provided for scanning the specimen with the primary electron beam. The STEM also has a scattered electron detector for detecting scattered electrons transmitted through the specimen. A projection lens system projects the scattered electrons onto a detection surface of the scattered electron detector. An image displaying device displays the scanning transmission electron microscope image of the specimen using a detection signal from the scattered electron detector. A detection angle changing device for establishes the range of the scattering angle of the scattered electrons detected by the scattered electron detector.
    Type: Grant
    Filed: January 17, 2003
    Date of Patent: November 23, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto
  • Publication number: 20040135083
    Abstract: A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing.
    Type: Application
    Filed: July 18, 2003
    Publication date: July 15, 2004
    Inventors: Hiroshi Kakibayashi, Shigeyuki Hosoki, Yuji Takagi, Ryo Miyake, Kuniyasu Nakamura, Mitsugu Sato, Hiroyuki Kobayashi
  • Patent number: 6750451
    Abstract: Disclosed is an observation apparatus and method using an electron beam, capable of measuring stress and strain information on a crystal structure in a specimen using electron beam diffraction images. A method according to the invention includes mounting a specimen on a specimen stage; irradiating a predetermined area in the specimen with an electron beam while scanning the electron beam, and acquiring an enlarged image of a specimen internal structure in the predetermined area; irradiating a specific portion included in the predetermined area and acquiring a diffraction image showing the crystal structure in the specimen; extracting information on the crystal structure in the specimen; displaying the information of the crystal structure in the specimen so as to be superimposed on the acquired enlarged image. The observation method according to the invention can obtain information on the crystal structure in a specimen with a high degree of sensitivity and with a high level of resolution.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: June 15, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Masanari Koguchi, Kuniyasu Nakamura, Kaoru Umemura, Yoshifumi Taniguchi, Mikio Ichihashi
  • Publication number: 20030127595
    Abstract: A scanning transmission electron microscope (STEM) offering substantially the same ease of operation as that of a scanning electron microscope (SEM) and providing substantially the same degree of resolution as that of a transmission electron microscope (TEM). The STEM of the invention is constituted based on the constitution of the SEM.
    Type: Application
    Filed: January 17, 2003
    Publication date: July 10, 2003
    Applicant: Hitachi, Ltd.
    Inventors: Kuniyasu Nakamura, Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto
  • Patent number: D571385
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: June 17, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Onuma, Kuniyasu Nakamura, Koichirou Saito, Takahito Hashimoto, Hiromi Inada