Electron microscope

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front, top and right side perspective view of electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a front, top, and right side perspective view thereof with the covers opened, the undisclosed portions are not part of the claimed design.

Claims

We claim the ornamental design for electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D141832 July 1945 Holley
2424791 July 1947 Bachman et al.
D332616 January 19, 1993 Hashimoto et al.
D381031 July 15, 1997 Miyata et al.
Patent History
Patent number: D571385
Type: Grant
Filed: Sep 25, 2006
Date of Patent: Jun 17, 2008
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Onuma (Tokyo), Kuniyasu Nakamura (Hitachinaka), Koichirou Saito (Hitachi), Takahito Hashimoto (Hitachinaka), Hiromi Inada (Hitachinaka)
Primary Examiner: Paula A. Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/266,560
Classifications
Current U.S. Class: Microscope (D16/131)