Abstract: A fine structure imprinting machine is provided which can surely and easily eliminate static electricity in removing a stamper from an imprinting object. The fine structure imprinting machine is adapted to bring the stamper with a fine concavo-convex pattern formed thereon into contact with the imprinting object, thereby to imprint the fine concavo-convex pattern of the stamper onto a surface of the imprinting object. The stamper has a conductive film on at least a pattern formation surface thereof. The stamper is fixed by a conductive holding member, the conductive film is connected to the holding member via the conductor, and the holding member is connected to a ground within the machine.

Abstract: A resin stamper is provided that is intended for use in an optical transfer-based nanostructure transfer apparatus and which is capable of automatic transport and alignment. The resin stamper comprises a support member made of a light transmitting material and having mechanical strength, an intermediate layer also made of a light transmitting material, and a patterned resin layer which is also made of a light transmitting material, the support member being larger in size than the intermediate layer and the patterned resin layer, the intermediate layer being more flexible than the patterned resin layer, and the patterned resin layer having a pattern of high and low areas formed in a surface thereof that is the obverse of the pattern of high and low areas in a mold.

Abstract: In the present invention, through a provision of a relay stand including a first relaying point, a second relaying point and a plurality of work mounting bases, a discharge/feed process of works between the relay stand and the work feed container and the work accommodation container is performed at the first relaying point and a load/unload process of works between the relay stand and the plurality of work inspection machines is performed at the second relaying point.

Abstract: In the present invention, a coil generating DC magnetic field applied to a magnetic head is divided into two in that a first coil and a second coil, which are provided on a frame shape core. An distance of an air gap is shortened, a slider head is held on a table having a top end portion of thin thickness, while advancing and retreating the table in the direction perpendicular to the core, the head slider is inserted into the air gap from the lateral direction. Thereby, the distance of the air gap is reduced to about half of the conventional one and a reduction of inductance of the first coil and the second coil is realized.

Abstract: In the present invention, a coil generating DC magnetic field applied to a magnetic head is divided into two in that a first coil and a second coil, which are provided on a frame shape core. An distance of an air gap is shortened, a slider head is held on a table having a top end portion of thin thickness, while advancing and retreating the table in the direction perpendicular to the core, the head slider is inserted into the air gap from the lateral direction. Thereby, the distance of the air gap is reduced to about half of the conventional one and a reduction of inductance of the first coil and the second coil is realized.

Abstract: Pressing means is provided to press a movable base to a surface of a reference base to make the movable base in contact with the surface of the reference base to thereby lock-down the movable base on the surface of the reference base. The movable base is moved while slightly floating with respect to the reference base. A movable floating mechanism is provided to float the movable base from the reference base against pressing force of the pressing means exerted on the movable base to thereby relieve the locking. A floating amount of the movable base from the reference base may be small enough to reduce or substantially remove sliding friction between the movable base and the reference base. For example, the floating amount may be as small as ten to several hundreds microns.

Abstract: An XY stage includes a movable frame having a rectangular space inside thereof and movable on a reference base along one of X and Y axes, a first drive source provided in the reference base for moving the movable frame, a rectangular movable base mounted in the rectangular space of the movable frame, which is movable on the reference base along the other of the X and Y axes and stopped on the reference base, and a second drive source provided in the movable frame, for moving the movable base.

Abstract: An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Alternatively, the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.

Abstract: An XY stage includes a movable frame having a rectangular space inside thereof and movable on a reference base along one of X and Y axes, a first drive source provided in the reference base for moving the movable frame, a rectangular movable base mounted in the rectangular space of the movable frame, which is movable on the reference base along the other of the X and Y axes and stopped on the reference base, and a second drive source provided in the movable frame, for moving the movable base.

Abstract: Pressing means is provided to press a movable base to a surface of a reference base to make the movable base in contact with the surface of the reference base to thereby lock-down the movable base on the surface of the reference base. The movable base is moved while slightly floating with respect to the reference base. A movable floating mechanism is provided to float the movable base from the reference base against pressing force of the pressing means exerted on the movable base to thereby relieve the locking. A floating amount of the movable base from the reference base may be small enough to reduce or substantially remove sliding friction between the movable base and the reference base. For example, the floating amount may be as small as ten to several hundreds microns.

Abstract: An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Or the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.

Abstract: A test data is written in an arbitrary point p on a non-linear characteristics portion of a hysteresis characteristics of a piezo actuator by a write head and the written test data is read out by an MR head using the point p as a reference to detect a maximum read-out voltage to thereby obtain a drive voltage of the piezo actuator corresponding thereto. From the drive voltage of the piezo actuator thus obtained, a position of the MR head whose offset is to be corrected is detected. In a magnetic disk certifier, the position of the MR head is corrected by applying the drive voltage corresponding to the maximum read-out voltage to the piezo actuator and the written test data is read out thereby. Thus, the position of the MR head on the piezo actuator becomes that of the write head when the offset correction value is detected and it becomes possible to correct the offset of the MR head with respect to the write head.

Abstract: The improved for measuring the flying height of a magnetic head comprises a clear disk made of single-crystal sapphire, a spindle on which said disk is mounted for rotation, a mechanism for loading the magnetic head above one surface of said disk, measuring optics having a photoelectric converter that receives the light produced by interference of reflected light from said one surface of said disk with reflected light from the surface of said magnetic head as a result of application of light to said one surface through the other surface of said disk, and which converts the received interference light to an electric signal by means of said photoelectric converter, and a processing unit for calculating the flying height of said magnetic head in response to said electric signal from said measuring optics.

Abstract: A protrusion sensor according to the present invention comprises a protrusion sensing head, a suspension spring having a front end portion fixedly mounting the protrusion sensing head and a rear end portion fixedly secured to one surface of a support arm, a carriage for supporting the support arm and a vibration sensor of piezo-electric ceramics fixedly mounted on the other surface of the support arm. A protrusion is detected by the collision of the protrusion sensing head flying by air flow on a surface of a rotary disc caused by rotation thereof with a protrusion.

Abstract: A magnetic disk tester according to the present invention comprises a first head moving mechanism for fixedly mounting a first certification testing head and a burnishing head perpendicularly of a moving direction thereof and a second head moving mechanism for fixedly mounting a second certification testing head and a glide testing head perpendicularly of a moving direction thereof. The burnishing head and the glide testing head are switched by the first certification testing head and the second certification testing head, respectively, by moving a spindle in an orthogonal direction to the head moving direction.

Abstract: A disk chuck mechanism for chucking a disk in a stepped-down portion of a rotary chuck member and releasing the disk by vertically moving a chuck head coupled to an operating shaft is disclosed wherein a ring member having a cut in part is provided for its diameter to be enlarged opposite to the stepped-down portion of the rotary chuck member for chucking the disk and biased in the direction in which its diameter contracts. The chuck head is moved in the axial direction to utilize an inclined side face of the chuck head to enlarge the diameter of the ring member. With this arrangement, it is ensured that the disk is chucked in between the stepped-down portion of the rotary chuck member and the ring member with the one stroke movement of the chuck head.