Abstract: An automatic analyzer and an automatic analyzing system to identify samples and reagents used in the analyzer and members used in measurement of at least two objects in common: system reagents or buffer solution; sensor parts; probes; nozzles; chips; dispensing cups; tubes; ISE electrodes; detectors; deionized water; and waste, and to unify management of identification information thereof and a measurement result.

Abstract: An automatic analyzer includes a storage unit for storing operation information, information about usage histories of expendable supplies provided for the analysis, and an analysis-ID control unit giving an ID to the analysis, the analysis ID being used as information for identifying the analysis to derive a calibration curve. Data stored in the storage unit is organized along the same time axis both in the order of samples subjected to the analysis and inspection, and in the order of analysis items, so that the data is output in a total data display area. The data is organized from the viewpoint of an analysis process of an analysis item of each sample. By use of information used to identify an influence range based on a kind of an abnormal state, which is stored beforehand, a judgment is made as to whether or not it is necessary to perform reinspection.

Abstract: A method of pipetting an accurate quantity of liquid comprising the steps of drawing water into a pipetting chip (2) from a liquid container (8), drawing air into said tip first slowly at a first rate and then quickly at a second rate to turn said drawn water into a mist of drops in said tip (2) and increase the relative humidity of the air in said tip (2), waiting a preset time period, and drawing a tested liquid into said tip (2). This makes the quantity of vapor of the tested liquid in said tip (2) very small and constant and thus the accurate quantity of tested liquid can be pipetted.

Abstract: In an automatic analyzer, necessary setup works are displayed prior to analysis operation. The present invention can realize an automatic analyzer which can be used by an inexperienced operator to execute all necessary setup works. A maintenance button, data erase button, reagent status button, reagent prime button, calibration button and QC button are displayed on a system viewing screen displayed on an operation part. The display colors of the maintenance button or the like are changed (for example, the display color is changed to red, yellow or the like) in response to the status of the automatic analyzer in order to recognize necessary setup works prior to analysis operation for an operator.

Abstract: A multilayer film reflector for X-rays has alternately stacked layers formed on a substrate and comprising a layer (high refractive index layer) comprising a material having a large difference between a refractive index to soft X-ray and a refractive index in vacuum, and a layer (low refractive index layer) comprising a material having a small difference between a refractive index to soft X-ray and a refractive index in vacuum, wherein at least one intermediate layer having a crystalline structure is provided between the low refractive index layer and the high refractive index layer. Thereby, the crystallization of the low refractive index layer is promoted, the refractive index of the low refractive index layer is lowered, so that the reflectance of the multilayer film reflector is improved.

Abstract: To provide an optical thin film structure capable of efficiently dissipating heat in an optical thin film which is generated upon irradiating a surface of an X-ray mirror made up of the optical thin film with an X-ray. The optical thin film having an isotope purity higher than a natural isotope abundance ratio is formed on a mirror to increase heat conductivity of the optical thin film itself and quickly dissipate heat accumulated in the thin film to the outside of an optical system. Consequently, the mirror having high reflectively can be obtained, in which a fine structure of the optical thin film is by no means broken.

Abstract: An automatic analyzer and an automatic analyzing system to identify samples and reagents used in the analyzer and members used in measurement of at least two objects in common: system reagents or buffer solution; sensor parts; probes; nozzles; chips; dispensing cups; tubes; ISE electrodes; detectors; deionized water; and waste, and to unify management of identification information thereof and a measurement result.

Abstract: An X-ray multi-layer mirror having a reflection characteristic with a wider incident angle range is realized by conducting optimization processing on an Mo/Si alternate layer having a constant thickness. Film thickness distributions of Si layers and Mo layers in the Mo/Si alternate layer are determined by optimization processing for widening the angle reflection characteristic of the Mo/Si alternate layer having the constant thickness, which is a fundamental structure.

Abstract: To provide an optical thin film structure capable of efficiently dissipating heat in an optical thin film which is generated upon irradiating a surface of an X-ray mirror made up of the optical thin film with an X-ray. The optical thin film having an isotope purity higher than a natural isotope abundance ratio is formed on a mirror to increase heat conductivity of the optical thin film itself and quickly dissipate heat accumulated in the thin film to the outside of an optical system. Consequently, the mirror having high reflectively can be obtained, in which a fine structure of the optical thin film is by no means broken.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: A multilayer film reflector for X-rays has alternately stacked layers formed on a substrate and comprising a layer (high refractive index layer) comprising a material having a large difference between a refractive index to soft X-ray and a refractive index in vacuum, and a layer (low refractive index layer) comprising a material having a small difference between a refractive index to soft X-ray and a refractive index in vacuum, wherein at least one intermediate layer having a crystalline structure is provided between the low refractive index layer and the high refractive index layer. Thereby, the crystallization of the low refractive index layer is promoted, the refractive index of the low refractive index layer is lowered, so that the reflectance of the multilayer film reflector is improved.

Abstract: In an automatic analyzer, necessary setup works are displayed prior to analysis operation. The present invention can realize an automatic analyzer which can be used by an inexperienced operator to execute all necessary setup works. A maintenance button, data erase button, reagent status button, reagent prime button, calibration button and QC button are displayed on a system viewing screen displayed on an operation part. The display colors of the maintenance button or the like are changed (for example, the display color is changed to red, yellow or the like) in response to the status of the automatic analyzer in order to recognize necessary setup works prior to analysis operation for an operator.

Abstract: Sample sampling to an analysis apparatus 200 or 820 for analyzing a biochemical analysis item is performed by a pipetting device 202 or 840 which uses a repetitively used pipette nozzle, and sample sampling to an analysis apparatus 100 or 810 for analyzing an immune analysis item is performed by a pipetting device 102 or 830 which uses a disposable nozzle tip. A sample bottle containing a sample to be analyzed on both of a biochemical analysis item and an immune analysis item is sample-pipetted by the nozzle tip first, and then transported so as to be sample-pipetted by the pipette nozzle.

Abstract: Multilayer film structure composed of at least one pair of layers including a first layer and a second layer, which are formed from different materials, and a protective layer provided thereon is formed so that the structure is optimized to have the same theoretical reflectance as that of a single-layer film structure at the same incident angle ?. Since the absorption of each layer is not significant, the actual reflectance of the X-ray total reflection mirror having the multilayer film structure is closer to the theoretical value as compared to that of the X-ray total reflection mirror having the single-layer film structure.

Abstract: An X-ray multi-layer mirror having a reflection characteristic with a wider incident angle range is realized by conducting optimization processing on an Mo/Si alternate layer having a constant thickness. Film thickness distributions of Si layers and Mo layers in the Mo/Si alternate layer are determined by optimization processing for widening the angle reflection characteristic of the Mo/Si alternate layer having the constant thickness, which is a fundamental structure.