Abstract: A storage device test system includes: a storage device mounting unit configured to mount a storage device therein; a test control unit configured to transmit and/or receive test signals to and/or from the storage device; an interface plug that is electrically connected to the test control unit and coupled to the storage device mounted in the storage device mounting unit; and a plugging driving unit that controls a relative location between the interface plug and the storage device mounting unit. By using the storage device test system, the causes of defects that may occur while using a storage device may be easily detected.

Abstract: An apparatus of an electron cyclotron resonance ion source may include: a magnet unit containing a magnet for generating magnetic fields; an ionizing chamber housing unit for generating ions through electron cyclotron resonance from a plasma; a microwave generating unit for injecting microwaves to the ionizing chamber housing unit to generate ions; and a beam integrating and guiding unit for treating the generated ions. The magnet unit may include: a bobbin for winding the magnet; a variable spacer for dividing the bobbin into a plurality of sections; and the magnet which is wound into the form of a wire or a tape in the plurality of sections formed by the variable spacer.

Abstract: A built-in antenna apparatus of a mobile terminal includes a main board having at least one feeding portion for feeding RF power and at least one grounding portion at ground potential. The antenna apparatus includes first and second thin metal plates configured to be stacked on the main board and spaced from one another. The second metal plate is electrically connected to the feeding portion and has a length sufficient to resonate within a communication frequency band of the mobile terminal The first metal plate is electrically connected to the grounding portion and electromagnetically coupled with the second metal plate to resonate.

Abstract: Example embodiments of the inventive concept are directed to solid state device products, intermediate solid state devices, and methods of manufacturing and testing the same, with removable test terminals, which may permit in situ testing of one or more components of the solid state device products.

Abstract: According to example embodiments, a solid state drive system includes at least one semiconductor memory, a control circuit including first connection terminals, and second connection terminals. The first connection terminals may be configured to supply one or more operational voltages to the at least one semiconductor memory. The second connection terminals may be configured to supply one or more test voltages to the at least one semiconductor memory.

Abstract: A mounting structure for a boss of a display module. The mounting structure is constructed with a reinforcing member installed on a chassis base of the display module, a boss including a threaded length having an outer portion on which a screw surface is formed and being coupled to the reinforcing member, and a connecting portion extending from the threaded length in a direction away from the reinforcing member and having an end portion in which a coupling hole is formed, and a supporting nut screwed into the threaded length to press the boss toward the reinforcing member.

Abstract: A built-in antenna of a portable terminal and a method of forming the same are provided. The built-in antenna includes a first conductor having a specific length and used for a ground, a second conductor disposed with a specific distance in parallel to the first conductor to couple with the first conductor and used for power feeding, and a separating element disposed between the first conductor and the second conductor to separate the first and second conductors. Accordingly, the built-in antenna may exhibit a smooth radiation property even if a metal construction is used in a device and thus may implement robustness improvement of the device and make the device slim and have an attractive outer appearance. In addition, a method of improving antenna efficiency may prevent deterioration of the radiation property of the antenna radiator of the related art by using simple processing, and the metal construction may be used as a radiator.

Abstract: A communication terminal and an antenna apparatus of the communication terminal are provided. The communication terminal includes a board body having a structure of a flat panel, an antenna element which is arranged at one end of the body and, when electric current is supplied, resonant in a resonant frequency band for transmitting and receiving signals, and at least one blocking plate which is arranged around the antenna element and alters, when the antenna element is resonant, at least one of a radiation pattern and a radiation strength of the antenna element.

Abstract: A communication terminal and an antenna apparatus of the communication terminal are provided. The communication terminal includes a body having a circuit board, an antenna element which is mounted inside the body and connected electrically to the circuit board and, when electric current is supplied via a main plate, resonant in a resonant frequency band for transmitting and receiving signals, and a metal case having an antenna pattern which is coupled to an edge of the body to be resonant and, when the antenna element is resonant, in the resonant frequency band for supporting operation of the antenna element.

Abstract: A display device is disclosed. In one embodiment, the display device includes i) a display panel configured to display an image, ii) a chassis base configured to support the display panel, iii) an auxiliary chassis disposed between the display panel and the chassis base, wherein one end of the auxiliary chassis covers and contacts an edge of the chassis base. The display device further includes i) a driving board disposed at the back of the chassis base and configured to drive the display panel and ii) at least one signal transmission member comprising at least one circuit device and configured to electrically connect the display panel and the driving board, wherein one side of the at least one signal transmission member is supported by the auxiliary chassis, and wherein the one side faces the edge of the chassis base.

Abstract: An apparatus of an electron cyclotron resonance ion source may include: a magnet unit containing a magnet for generating magnetic fields; an ionizing chamber housing unit for generating ions through electron cyclotron resonance from a plasma; a microwave generating unit for injecting microwaves to the ionizing chamber housing unit to generate ions; and a beam integrating and guiding unit for treating the generated ions. The magnet unit may include: a bobbin for winding the magnet; a variable spacer for dividing the bobbin into a plurality of sections; and the magnet which is wound into the form of a wire or a tape in the plurality of sections formed by the variable spacer.

Abstract: A fuse box for a semiconductor device is disclosed and includes a first fuse group comprising a plurality of first fuses, arranged in a first direction and having a first cutting axis, each first fuse comprising a first portion having a first fuse pitch, a second portion having a second fuse pitch smaller than the first fuse pitch, and a third portion connecting the first and second portions, a second fuse group comprising a plurality of second fuses, arranged in the first direction and having a second cutting axis, each second fuse comprising a first portion having a first fuse pitch, a second portion having a second fuse pitch smaller than the first fuse pitch, and a third portion connecting the first portion and the second portion, and a third fuse group comprising a plurality of third fuses, wherein each third fuse has either the first cutting axis or the second cutting axis, comprises a first pattern arranged in the first direction and having a first fuse pitch, and a second pattern arranged in a second

Abstract: A fuse box for a semiconductor device is disclosed and includes a first fuse group comprising a plurality of first fuses, arranged in a first direction and having a first cutting axis, each first fuse comprising a first portion having a first fuse pitch, a second portion having a second fuse pitch smaller than the first fuse pitch, and a third portion connecting the first and second portions, a second fuse group comprising a plurality of second fuses, arranged in the first direction and having a second cutting axis, each second fuse comprising a first portion having a first fuse pitch, a second portion having a second fuse pitch smaller than the first fuse pitch, and a third portion connecting the first portion and the second portion, and a third fuse group comprising a plurality of third fuses, wherein each third fuse has either the first cutting axis or the second cutting axis, comprises a first pattern arranged in the first direction and having a first fuse pitch, and a second pattern arranged in a second

Abstract: A fuse box of a semiconductor memory device which comprises a plurality of fuse units commonly connected to a power line, each of the fuse units comprising a first fuse connected with the power line; and a plurality of second fuses connected with the first fuse in parallel. If the second fuses are determined to be cut off, the first fuse is cut off instead of the second fuses.

Abstract: A semiconductor device having a fuse structure that can prevent a bridge between a fuse pattern and a guard ring, and a method of fabricating the same are provided. The fuse pattern formed on a multiple-layered metal interconnect layer is stepped shape increasing a vertical distance between the fuse pattern and the guard ring.

Abstract: A display devise includes a display panel and a chassis base supporting the display panel. At least one reinforcing member is attached to the chassis base to add rigidity to the chassis base and at least one stand is attached to the chassis base to allow the chassis base to stand upright. A guide stand couples the reinforcing member to the stand, the guide stand comprising a body and a reinforcing plate substantially extending at an angle from the body.

Abstract: A display device is disclosed. In one embodiment, the display device includes i) a display panel configured to display an image, ii) a chassis base configured to support the display panel, iii) an auxiliary chassis disposed between the display panel and the chassis base, wherein one end of the auxiliary chassis covers and contacts an edge of the chassis base. The display device further includes i) a driving board disposed at the back of the chassis base and configured to drive the display panel and ii) at least one signal transmission member comprising at least one circuit device and configured to electrically connect the display panel and the driving board, wherein one side of the at least one signal transmission member is supported by the auxiliary chassis, and wherein the one side faces the edge of the chassis base.

Abstract: Example embodiments of the inventive concept are directed to solid state device products, intermediate solid state devices, and methods of manufacturing and testing the same, with removable test terminals, which may permit in situ testing of one or more components of the solid state device products.

Abstract: Example embodiments of the inventive concept are directed to solid state device systems and methods of reducing test times of the same.

Abstract: Provided are a semiconductor device including a fuse focus detector, a fabrication method thereof and a laser repair method. In a chip region, fuses may be formed at a first level. A fuse focus detector including first and second conductive layers may be formed in a scribe line region. The first conductive layer may be formed at the first level, while the second conductive layer may be formed at a different level. For a laser repair method, a target region may be divided into sub-regions. In one selected sub-region, the fuse focus detector may be laser scanned in a direction for a reflection light measurement providing information on a thickness of the fuse focus detector. Using the thickness information, a focus offset value of a fuse in the selected sub-region may be calculated. When the focus offset value is within an allowable range, fuse cutting may be performed.