Patents by Inventor Leah M. Pastel

Leah M. Pastel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for assisting backside focused ion beam device modification
    Patent number: 6566681
    Abstract: An apparatus for assisting backside focused ion beam (FIB) device modification is disclosed. The apparatus for assisting backside FIB device modification includes an FIB device modification circuit and a control circuit. The FIB device modification circuit includes an input, an output, an FIB input pad, and an FIB output pad. The FIB device modification circuit allows the input to be electrically connected to the output. The control circuit, which is coupled to the FIB device modification circuit, may include a jumper and a cut. The control circuit is preferably located in a proximity of a backside of a substrate to allow the jumper and the cut to be modified by an FIB machine.
    Type: Grant
    Filed: July 19, 2001
    Date of Patent: May 20, 2003
    Assignee: International Business Machines Corporation
    Inventors: David E. Lackey, Theodore M. Levin, Leah M. Pastel
  • Internal cache for on chip test data storage
    Publication number: 20030033566
    Abstract: A method of testing a semiconductor device having a memory is disclosed. The method includes selecting a portion of the memory; testing the selected portion of the memory; designating the selected portion of the memory as a designated memory in response to an acceptable testing result; and storing data in the designated portion of the memory for retrieval at a later time. Provision for soft repair of the selected memory is made. Test data can be compressed before being stored in the designated memory.
    Type: Application
    Filed: August 9, 2001
    Publication date: February 13, 2003
    Applicant: International Business Machines Corporation
    Inventors: Thomas W. Bartenstein, L. Owen Farnsworth, Douglas C. Heaberlin, Edward E. Horton, Leendert M. Huisman, Leah M. Pastel, Glen E. Richard, Raymond J. Rosner, Francis Woytowich
  • Apparatus for assisting backside focused ion beam device modification
    Publication number: 20030015671
    Abstract: An apparatus for assisting backside focused ion beam (FIB) device modification is disclosed. The apparatus for assisting backside FIB device modification includes an FIB device modification circuit and a control circuit. The FIB device modification circuit includes an input, an output, an FIB input pad, and an FIB output pad. The FIB device modification circuit allows the input to be electrically connected to the output. The control circuit, which is coupled to the FIB device modification circuit, may include a jumper and a cut. The control circuit is preferably located in a proximity of a backside of a substrate to allow the jumper and the cut to be modified by an FIB machine.
    Type: Application
    Filed: July 19, 2001
    Publication date: January 23, 2003
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: David E. Lackey, Theodore M. Levin, Leah M. Pastel