Patents by Inventor Leijie Wang
Leijie Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11703361Abstract: A five-degree-of-freedom heterodyne grating interferometry system comprises: a single-frequency laser for emitting single-frequency laser light, the single-frequency laser light can be split into a reference light beam and a measurement light beam; an interferometer lens set and a measurement grating for converting the reference light and the measurement light into a reference interference signal and a measurement interference signal; and multiple optical fiber bundles respectively receiving the measurement interference signal and the reference interference signal, wherein each optical fiber bundle has multiple multi-mode optical fibers respectively receiving interference signals at different positions on the same plane. The system is not over-sensitive to the environment, is small and light, and is easy to arrange.Type: GrantFiled: June 26, 2019Date of Patent: July 18, 2023Assignees: BEIJING U-PRECISION TECH CO., LTD., TSINGHUA UNIVERSITYInventors: Ming Zhang, Yu Zhu, Fuzhong Yang, Leijie Wang, Rong Cheng, Xin Li, Weinan Ye, Jinchun Hu
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Publication number: 20230215624Abstract: A manufacturing method of a thin-film power inductor includes: Alloy powder is mixed with plasticizer, adhesive, curing agent, dispersing agent and organic solvent to form slurry; the slurry is applied on a PET film, and drying to form a magnetic band; and the magnetic band is cut to form a plurality of magnetic sheets. A hole is opened on a magnetic sheet to form a hole-shaped magnetic sheet. Electrodes are processed on an insulating substrate to form a coil layer. Magnetic sheets, hole-shaped magnetic sheets, and the coil layer are stacked to form a block. The block is pressed, and the block is cut to form an individual product. The individual product is baked to form a main body. Silver paste is applied on the main body to form outer electrodes. A nickel layer and a tin layer are electroplated on outer electrodes to form a thin-film power inductor.Type: ApplicationFiled: November 27, 2020Publication date: July 6, 2023Applicant: Hengdian Group DMEGC Magnetics Co., LTDInventors: Quan Zhu, Yangdong Yu, Gan Liu, Leijie Wang
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Patent number: 11612375Abstract: A method and device for detecting inflammation activity of a tissue. The method includes: determining whether there is a possibility for tissue inflammation; and when there is a possibility for tissue inflammation, determining the inflammation activity of a tissue according to tissue stiffness or a parameter reflecting tissue stiffness. The tissue stiffness or the parameter reflecting tissue stiffness can be detected by means of a non-invasive quantitative detection technique of tissue elastic modulus, avoiding defects caused by tissue biopsy, and can detect inflammation activity of a tissue non-invasively, continuously and accurately.Type: GrantFiled: July 17, 2020Date of Patent: March 28, 2023Assignees: Wuxi Hisky Medical Technologies Co., Ltd.Inventors: Fengmin Lu, Mingjie Yao, Leijie Wang, Jinhua Shao, Jin Sun, Houli Duan
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Patent number: 11525673Abstract: A five-degree-of-freedom heterodyne grating interferometry system, comprising a single frequency laser device (1) and an acousto-optic modulator (2); the single frequency laser device (1) emits a single frequency laser, and the single frequency laser is coupled by optical fiber and, after being split, enters the acousto-optic modulator (2) to obtain two linearly polarized lights of different frequencies, one being a reference light, and one being a measurement light; an interferometer lens group (3) and a measurement grating (4), used for forming the reference light and the measurement light into a measurement interference signal and a compensation interference signal; and multiple optical fiber bundles (5), respectively receiving the measurement interference signal and the compensation interference signal, each optical fiber bundle (5) having multiple multimode optical fibers respectively receiving signals at different positions on the same plane.Type: GrantFiled: November 16, 2018Date of Patent: December 13, 2022Assignee: TSINGHUA UNIVERSITYInventors: Yu Zhu, Ming Zhang, Leijie Wang, Weinan Ye, Fuzhong Yang, Yizhou Xia, Xin Li
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Publication number: 20220260452Abstract: Disclosed is a plane grating calibration system, comprising an optical subsystem, a frame , first vibration isolator, a vacuum chuck, a workpiece stage, second vibration isolator, a base platform and a controller; the optical subsystem is mounted on the frame, and the frame is isolated from vibration by the first vibration isolator; the vacuum chuck is rotatably mounted on the workpiece stage, the workpiece stage is positioned on the base platform, and the base platform is isolated from vibration by the second vibration isolator. A displacement interferometer is integrated into the optical subsystem, the entire optical subsystem adopts a method of sharing a light source, thereby avoiding the problems of low wavelength precision and poor coherence of separate light sources.Type: ApplicationFiled: May 13, 2020Publication date: August 18, 2022Inventors: Leijie WANG, Ming ZHANG, Yu ZHU, Jiankun HAO, Xin LI, Rong CHENG, Kaiming YANG, Jinchun HU
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Patent number: 11307018Abstract: A two-degree-of-freedom heterodyne grating interferometry measurement system, comprising: a single-frequency laser device for emitting a single-frequency laser, and the single-frequency laser can be split into a beam of reference light and a beam of measurement light; an interferometer mirror group and a measurement grating for forming a reference interference signal and a measurement interference signal from the reference light and the measurement light; and a receiving optical fiber for receiving the reference interference signal and the measurement interference signal, wherein a core diameter of the receiving optical fiber is smaller than a width of an interference fringe of the reference interference signal and the measurement interference signal, so that the receiving optical fiber receives a part of the reference interference signal and the measurement interference signal.Type: GrantFiled: June 26, 2019Date of Patent: April 19, 2022Assignees: TSINGHUA UNIVERSITY, BEIJING U-PRECISION TECH CO., LTD.Inventors: Yu Zhu, Ming Zhang, Leijie Wang, Fuzhong Yang, Rong Cheng, Xin Li, Weinan Ye, Jinchun Hu
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Publication number: 20220042792Abstract: A five-degree-of-freedom heterodyne grating interferometry system, comprising a single frequency laser device (1) and an acousto-optic modulator (2); the single frequency laser device (1) emits a single frequency laser, and the single frequency laser is coupled by optical fiber and, after being split, enters the acousto-optic modulator (2) to obtain two linearly polarized lights of different frequencies, one being a reference light, and one being a measurement light; an interferometer lens group (3) and a measurement grating (4), used for forming the reference light and the measurement light into a measurement interference signal and a compensation interference signal; and multiple optical fiber bundles (5), respectively receiving the measurement interference signal and the compensation interference signal, each optical fiber bundle (5) having multiple multi-mode optical fibers respectively receiving signals at different positions on the same plane.Type: ApplicationFiled: November 16, 2018Publication date: February 10, 2022Inventors: Yu ZHU, Ming ZHANG, Leijie WANG, Weinan YE, Fuzhong YANG, Yizhou XIA, Xin LI
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Patent number: 11228113Abstract: A wide-beam planar backfire and bidirectional circularly-polarized antenna. An entire planar sectorial magnetic dipole is of a semi-closed structure, the planar sectorial magnetic dipole comprises two identical sectorial patches and a vertical short-circuit wall, and the vertical short-circuit wall is connected with straight sides of the two sectorial patches along a radial direction of the planar sectorial magnetic dipole; two sets of concentric annular electric dipoles are respectively used as a top concentric annular radiating element and a bottom concentric annular radiating element, as well as a top concentric annular reflector and a bottom anti-concentric annular reflector; and the top concentric annular radiating element is connected with an upper surface of the planar sectorial magnetic dipole through a top connecting branch, and the bottom concentric annular radiating element is connected with a lower surface of the planar sectorial magnetic dipole through a bottom connecting branch.Type: GrantFiled: October 25, 2018Date of Patent: January 18, 2022Assignee: Nanjing University of Posts and TelecommunicationsInventors: Wenjun Lv, Yun Shao, Leijie Wang, Zhuang Li, Weili Zhang, Shanshan Gu, Hongbo Zhu
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Publication number: 20210367349Abstract: A wide-beam planar backfire and bidirectional circularly-polarized antenna. An entire planar sectorial magnetic dipole is of a semi-closed structure, the planar sectorial magnetic dipole comprises two identical sectorial patches and a vertical short-circuit wall, and the vertical short-circuit wall is connected with straight sides of the two sectorial patches along a radial direction of the planar sectorial magnetic dipole; two sets of concentric annular electric dipoles are respectively used as a top concentric annular radiating element and a bottom concentric annular radiating element, as well as a top concentric annular reflector and a bottom anti-concentric annular reflector; and the top concentric annular radiating element is connected with an upper surface of the planar sectorial magnetic dipole through a top connecting branch, and the bottom concentric annular radiating element is connected with a lower surface of the planar sectorial magnetic dipole through a bottom connecting branch.Type: ApplicationFiled: October 25, 2018Publication date: November 25, 2021Inventors: Wenjun LV, Yun SHAO, Leijie WANG, Zhuang LI, Weili ZHANG, Shanshan GU, Hongbo ZHU
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Publication number: 20210262834Abstract: A five-degree-of-freedom heterodyne grating interferometry system comprises: a single-frequency laser for emitting single-frequency laser light, the single-frequency laser light can be split into a reference light beam and a measurement light beam; an interferometer lens set and a measurement grating for converting the reference light and the measurement light into a reference interference signal and a measurement interference signal; and multiple optical fiber bundles, respectively receiving the measurement interference signal and the reference interference signal, wherein each optical fiber bundle has multiple multi-mode optical fibers respectively receiving interference signals at different positions on the same plane. The measurement system is not over-sensitive to the environment, is small and light, and is easy to arrange.Type: ApplicationFiled: June 26, 2019Publication date: August 26, 2021Inventors: Ming ZHANG, Yu ZHU, Fuzhong YANG, Leijie WANG, Rong CHENG, Xin LI, Weinan YE, Jinchun HU
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Publication number: 20210164772Abstract: A two-degree-of-freedom heterodyne grating interferometry measurement system, comprising: a single-frequency laser device for emitting a single-frequency laser, and the single-frequency laser can be split into a beam of reference light and a beam of measurement light; an interferometer mirror group and a measurement grating for forming a reference interference signal and a measurement interference signal from the reference light and the measurement light; and a receiving optical fiber for receiving the reference interference signal and the measurement interference signal, wherein a core diameter of the receiving optical fiber is smaller than a width of an interference fringe of the reference interference signal and the measurement interference signal, so that the receiving optical fiber receives a part of the reference interference signal and the measurement interference signal.Type: ApplicationFiled: June 26, 2019Publication date: June 3, 2021Inventors: Yu ZHU, Ming ZHANG, Leijie WANG, Fuzhong YANG, Rong CHENG, Xin LI, Weinan YE, Jinchun HU
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Publication number: 20200352541Abstract: A method and device for detecting inflammation activity of a tissue. The method includes: determining whether there is a possibility for tissue inflammation; and when there is a possibility for tissue inflammation, determining the inflammation activity of a tissue according to tissue stiffness or a parameter reflecting tissue stiffness. The tissue stiffness or the parameter reflecting tissue stiffness can be detected by means of a non-invasive quantitative detection technique of tissue elastic modulus, avoiding defects caused by tissue biopsy, and can detect inflammation activity of a tissue non-invasively, continuously and accurately.Type: ApplicationFiled: July 17, 2020Publication date: November 12, 2020Applicants: Wuxi Hisky Medical Technologies Co., Ltd.Inventors: Fengmin LU, Mingjie YAO, Leijie WANG, Jinhua SHAO, Jin SUN, Houli DUAN
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Publication number: 20200345329Abstract: A method and device for detecting tissue fibrosis. The method includes: determining whether there is a possibility for tissue inflammation; and when there is a possibility for tissue inflammation, monitoring tissue stiffness or a parameter reflecting tissue stiffness during a treatment of the tissue inflammation to determine whether the tissue inflammation has been eliminated; when the tissue inflammation has been eliminated or there is no possibility for tissue inflammation, obtaining a degree of tissue fibrosis or information related to the degree of tissue fibrosis according to tissue stiffness or a parameter reflecting tissue stiffness. The embodiments enable the tracking of the tissue stiffness during the treatment of tissue inflammation to determine whether tissue inflammation has been eliminated or not, and since tissue stiffness can be detected by a non-invasive quantitative detection technique of tissue elastic modulus, avoiding defects caused by tissue biopsy.Type: ApplicationFiled: July 17, 2020Publication date: November 5, 2020Applicants: Wuxi Hisky Medical Technologies Co., Ltd.Inventors: Fengmin Lu, Mingjie Yao, Leijie Wang, Jinhua Shao, Jin Sun, Houli Duan
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Patent number: 9903704Abstract: A three-DOF (Degree of Freedom) heterodyne grating interferometer displacement measurement system comprises a dual-frequency laser, a grating interferometer, a measurement grating, receivers and an electronic signal processing component; the grating interferometer comprises a polarizing beam splitter, a reference grating and dioptric elements; the measurement system realizes displacement measurement on the basis of grating diffraction, the optical Doppler Effect and the optical beat frequency principle. Three linear displacements can be output by the system when the grating interferometer and the measurement grating perform a three-DOF linear relative motion. The measurement system can reach sub-nanometer and higher resolution and precision, and can simultaneously measure three linear displacements.Type: GrantFiled: June 5, 2014Date of Patent: February 27, 2018Assignee: TSINGHUA UNIVERSITYInventors: Yu Zhu, Leijie Wang, Ming Zhang, Zhao Liu, Rong Cheng, Kaiming Yang, Dengfeng Xu, Weinan Ye, Li Zhang, Yanpo Zhao, Huichao Qin, Li Tian, Jin Zhang, Wensheng Yin, Haihua Mu, Jinchun Hu
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Patent number: 9885556Abstract: A dual-frequency grating interferometer displacement measurement system, comprises a dual-frequency laser, an interferometer, a measurement grating and an electronic signal processing component. The measurement system realizes displacement measurement based on grating diffraction, optical Doppler effect and optical beat frequency theory. Dual-frequency laser light is emitted from the dual-frequency laser and split into reference light and measurement light via a polarization spectroscope. The measurement light is incident to the measurement grating to generate positive and negative first-order diffraction. The diffraction light and the reference light form a beat frequency signal containing displacement information about two directions at a photo-detection unit, and linear displacement output is realized after signal processing.Type: GrantFiled: October 28, 2013Date of Patent: February 6, 2018Assignee: TSINGHUA UNIVERSITYInventors: Yu Zhu, Ming Zhang, Leijie Wang, Jinchun Hu, Longmin Chen, Kaiming Yang, Dengfeng Xu, Wensheng Yin, Haihua Mu
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Patent number: 9879979Abstract: A displacement measurement system of heterodyne grating interferometer, comprises a reading head, a measurement grating and an electronic signal processing component. Laser light emitted from the laser tube is collimated, passes through the first polarization spectroscope, and then emits two light beams with an orthogonal polarization direction and an orthogonal propagation direction; the two light beams pass through two acousto-optic modulators and respectively generate two first-order diffraction light beams with different frequencies, which are later divided into reference light and measurement light; two parallel reference light beams form a beat frequency electric signal with positive and negative first-order diffraction measurement light respectively after passing through a measurement signal photo-electric conversion unit; the beat frequency signals are transmitted to the electronic signal processing component for signal processing, thus the output of linear displacement in two directions is realized.Type: GrantFiled: October 28, 2013Date of Patent: January 30, 2018Assignee: TSINGHUA UNIVERSITYInventors: Ming Zhang, Yu Zhu, Leijie Wang, Jinchun Hu, Longmin Chen, Kaiming Yang, Dengfeng Xu, Wensheng Yin, Haihua Mu
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Patent number: 9869857Abstract: An optical grating phase modulator for a laser interference photoetching system is composed of a substrate, an optical grating, an electric motor and an optical grating positioner. The optical grating, the electric motor and the optical grating positioner are all mounted on the substrate. The optical grating is circular or rectangular, and adopt transmission or reflection type optical grating. A light beam is incident on the optical grating and generates diffraction, and when the electric motor drives the optical grating to continuously move relative to the incident light beam, diffracted light will generate a frequency shift, thereby realizing the phase modulation of the light beam. The optical grating phase modulator has the advantages of high phase modulation speed, high regulation precision and wide regulation range, thereby improving the whole performance of an interference photoetching system.Type: GrantFiled: January 13, 2014Date of Patent: January 16, 2018Assignee: Tsinghua UniversityInventors: Yu Zhu, Ming Zhang, Leijie Wang, Rong Cheng, Kaiming Yang, Zhao Liu, Jinchun Hu, Wensheng Yin, Haihua Mu, Chuxiong Hu, Dengfeng Xu
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Publication number: 20160153764Abstract: A three-DOF (Degree of Freedom) heterodyne grating interferometer displacement measurement system comprises a dual-frequency laser, a grating interferometer, a measurement grating, receivers and an electronic signal processing component; the grating interferometer comprises a polarizing spectroscope, a reference grating and dioptric elements; the measurement system realizes displacement measurement on the basis of grating diffraction, the optical Doppler Effect and the optical beat frequency principle. Three linear displacements can be output by the system when the grating interferometer and the measurement grating perform a three-DOF linear relative motion. The measurement system can reach sub-nanometer and even higher resolution and precision, and can simultaneously measure three linear displacements. The measurement system has the advantages of being environmentally insensitive, high in measurement precision, small in size, light in weight, etc.Type: ApplicationFiled: June 5, 2014Publication date: June 2, 2016Inventors: Yu ZHU, Leijie WANG, Ming ZHANG, Zhao LIU, Rong CHENG, Kaiming YANG, Dengfeng XU, Weinan YE, Li ZHANG, Yanpo ZHAO, Huichao QIN, Li TIAN, Jin ZHANG, Wensheng YIN, Haihua MU, Jinchun HU
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Publication number: 20160138903Abstract: A two-DOF heterodyne grating interferometer displacement measurement system, comprising a dual-frequency laser, a grating interferometer, a measurement grating, receivers and an electronic signal processing component, wherein the grating interferometer comprises a polarizing spectroscope, a reference grating and dioptric elements. The measurement system achieves the displacement measurement on the basis of the grating diffraction, the optical Doppler effect and the optical beat frequency principle. When the grating interferometer and the measurement grating conduct two-DOF linear relative motion, the system can output two linear displacements. The measurement system can achieve sub-nanometer or even higher resolution and accuracy, and can simultaneously measure two linear displacements.Type: ApplicationFiled: June 5, 2014Publication date: May 19, 2016Applicant: TSINGHUA UNIVERSITYInventors: Ming ZHANG, Yu ZHU, Leijie WANG, Kaiming YANG, Zhao LIU, Rong CHENG, Hao LIU, Dengfeng XU, Weinan YE, Li ZHANG, Yanpo ZHAO, Li TIAN, Jin ZHANG, Jinchun HU, Haihua MU, Wensheng YIN, Huichao QIN
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Publication number: 20150362723Abstract: An optical grating phase modulator for a laser interference photoetching system is composed of a substrate, an optical grating, an electric motor and an optical grating positioner. The optical grating, the electric motor and the optical grating positioner are all mounted on the substrate. The optical grating is circular or rectangular, and adopt transmission or reflection type optical grating. A light beam is incident on the optical grating and generates diffraction, and when the electric motor drives the optical grating to continuously move relative to the incident light beam, diffracted light will generate a frequency shift, thereby realizing the phase modulation of the light beam. The optical grating phase modulator has the advantages of high phase modulation speed, high regulation precision and wide regulation range, thereby improving the whole performance of an interference photoetching system.Type: ApplicationFiled: January 13, 2014Publication date: December 17, 2015Applicant: Tsinghua UniversityInventors: Yu Zhu, Ming Zhang, Leijie Wang, Rong Cheng, Kaiming Yang, Zhao Liu, Jinchun Hu, Wensheng Yin, Haihua MU, Chuxiong Hu, Dengfeng Xu