Abstract: In some embodiments, a semiconductor device is provided. The semiconductor device includes a gate electrode disposed on a substrate. Source/drain regions are disposed on or within the substrate along opposing sides of the gate electrode. A noise reducing component is arranged along an upper surface of the gate electrode and/or along an upper surface of the substrate over the source/drain regions. A cap layer covers the upper surface of the gate electrode and/or the upper surface of the substrate over the source/drain regions. An inter-level dielectric (ILD) is disposed over and along one or more sidewalls of the cap layer.

Abstract: A cap feeding device is for a nap nailer that includes a machine body, a muzzle, a nail feeding device, a nail striking device, and an electronic control device. The cap feeding device includes a cartridge, a cap rail, a cap solenoid valve, and a cap pushing member. The cartridge is adapted for accommodating a plurality of caps. The cap rail is connected to the cartridge, and extends toward the muzzle. The cap solenoid valve is mounted to the cap rail, and includes a valve rod that is drivable by an electromagnetic force to move. The cap pushing member is swingably connected to the valve rod, and is urged by the valve rod to move relative to the muzzle between a first position, in which the cap pushing member is adjacent to the muzzle, and a second position, in which the cap pushing member is distal from the muzzle.

Abstract: A semiconductor device includes a semiconductor stack, a reflective structure, and a conductive structure. The semiconductor stack includes a first semiconductor structure, a second semiconductor structure and an active region located between the first semiconductor structure and the second semiconductor structure. The reflective structure is located at a side of semiconductor stack closed to the first semiconductor structure, and includes a first metal. The conductive structure locates between the reflective structure and the first semiconductor structure, and includes a first region overlapping with the active structure and a second region which does not overlap with the active structure. The first metal in the second region has a concentration smaller than 5 atomic percent.

Abstract: A semiconductor structure includes: a first conductive layer arranged over a substrate; a dielectric layer arranged over the first conductive layer; a second conductive layer arranged within the dielectric layer and electrically connected to the first conductive layer, the second conductive layer including a sidewall distant from the dielectric layer by a width; and a first blocking layer over a surface of the first conductive layer between the second conducive layer and the dielectric layer. The first blocking layer includes at least one element of a precipitant.

Abstract: A slurry composition, a semiconductor structure and a method for forming a semiconductor structure are provided. The slurry composition includes a slurry and a precipitant dispensed in the slurry. The semiconductor structure comprises a blocking layer including at least one element of the precipitant. The method includes using the slurry composition with the precipitant to polish a conductive layer and causing the precipitant to flow into the gap.

Abstract: A frame structure of aquaponic system assembled by module elements, comprising a base, at least a cultivating tank, a fix cover and a plurality of connecting members. Said elements of a frame structure are connected by the friction of elements through mortise-tenon joint and are easy for assembly and maintenance.

Abstract: An easy assembly outdoor sofa is disclosed, comprising such components of a base and a backrest (or armrest). The plane of the base extends horizontally to form a seat, and the periphery of the base is formed with a bar portion having oval section. The bar portion extends downward to form a frame, wherein the bottom of the backrest (or armrest) extends laterally to form an L-shaped connecting portion. A C-shaped opening is formed at the intersection part between the bottom and the L-shaped connecting portion. The C-shaped opening is to receive the oval bar portion of the base; as a characteristic feature, both the upper edge and lower edge of the bar portion of the base are configured with a positioning tenon, and corresponding to the positioning tenon, the L-shaped connecting portion is configured with a positioning mortise with larger width. Moreover, the base and the L-shaped connecting portion are configured with fixing holes matching each other.

Abstract: An online material moisture measurement system is provided. The online material moisture measurement system includes a fixed conveyor unit, a sensor and a constant-volume material guiding device. The fixed conveyor unit has a conveying side provided for passing a material. The sensor is installed onto the conveying side. A flow channel is formed between the constant-volume material guiding device and the fixed conveyor unit and has a material inlet and a material outlet. When the material enters into the material inlet and passes through the material outlet, the material has a volume greater than a lower limit and moves and passes through the sensor steadily. The material measured in a unit time can be situated at a stable state to improve the measurement precision.

Abstract: A method for measuring a permittivity (?) of a material (30) includes following steps. A sensing rod (14) of a material level sensor (10) inserts into a tank (20). The material level sensor (10) proceeds with a material level measurement of the material (30) to obtain a first feature value. The material level sensor (10) is vertically moved with a vertical distance (Hair). The material level sensor (10) proceeds with the material level measurement to obtain a second feature value, and subtracts the first feature value by the second feature value to obtain a feature value variation, and calculates the feature value variation to obtain the permittivity (?) of the material (30).

Abstract: A probe (14) of a material level measuring apparatus (10) inserts into a container (20). The material level measuring apparatus (10) transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (30), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (14), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t1) and a second time-passing difference value (t2) are obtained. According to the first time-passing difference value (t1), the second time-passing difference value (t2) and a predetermined empty container time-passing difference value (t3), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.

Abstract: A radar liquid level measuring apparatus (10) includes a first oscillation module (102), a second oscillation module (104), a frequency comparator (106) and a control module (107). The first oscillation module (102) has a first oscillation frequency. The first oscillation module (102) generates a first pulse signal (10202). The second oscillation module (104) has a second oscillation frequency. The second oscillation module (104) generates a second pulse signal (10402). The frequency comparator (106) converts the first pulse signal (10202) and the second pulse signal (10402) into an adjusted signal (10602). The control module (107) compares the adjusted signal (10602) with an expectation value (10818) to obtain a comparative result signal. According to the comparative result signal, the control module (107) adjusts the second oscillation frequency, so that the second oscillation frequency and the first oscillation frequency have a constant frequency difference.

Abstract: A measurement device for detecting a material level and a temperature has a cable, a level sensing module, a thermal sensing module, a processing module, and a power module. The measurement device detects difference of currents between an electrode of the cable and the earth, and calculates a material level of a material stored in a silo according to the RF admittance. The cable comprises a plurality of thermal sensing units for detecting a temperature of the material. The measurement device further calibrates a material capacitance of the material with the temperature for avoiding an error caused by an inaccurate parameter.

Abstract: A multifunctional signal isolation converter (10) is arranged in a safe area (20), and is applied to an electronic apparatus (40) arranged in a dangerous area (30). The multifunctional signal isolation converter (10) includes a microprocessor (108) and a power supply unit (116). The microprocessor (108) determines whether internal functions of the multifunctional signal isolation converter (10) are normal or not to obtain a first judgment value. The electronic apparatus (40) sends an input signal (42) to the microprocessor (108). The microprocessor (108) determines whether functions of the electronic apparatus (40) are normal or not to obtain a second judgment value according to the input signal (42). The microprocessor (108) controls whether the power supply unit (116) supplies a driving power (122) to the electronic apparatus (40) or not according to the first judgment value and the second judgment value.

Abstract: A time domain reflectometry waveguide structure (1) includes: a control module (10) for transmitting a sensing signal and receiving a reflection signal fed back from the sensing signal; a waveguide sensor (20) connected to the control module (10) and including a first probe (21) connected to the control module (10), a curved probe (22) connected to the first probe (21) and a second probe (23) extended from the curved probe (22); a protective cover (30) coaxially sheathed on the first probe (21) and exposing the curved probe (22), and a sensing signal passing through the protective cover (30) and the first probe (21) without interference and transmitted to the curved probe (22) and the second probe (23) to obtain the reflection signal; and an insulator (40) covered onto the waveguide sensor (20) and the protective cover (30) to prevent interference, facilitate measurements, and measure environmental parameters of different media.

Abstract: A material level indicator includes a probe, first and second signal compensating units, arranged at first and second ends of the probe respectively, and a controlling module arranged at the first end and includes a signal processor, a signal emitter, and a signal receiver. The second end is opposite to the first end. The signal processor is connected to the signal emitter and the signal receiver. The signal emitter emits an electromagnetic signal from the first end to the second end of the probe. The first and second signal compensating units reflect the electromagnetic signal, and the signal processor generates first and second time interval differences according to the reflected electromagnetic signal received by the signal receiver. The signal processor calibrates an environmental coefficient and indicates a dielectric coefficient of the material according to the first and second time interval differences respectively.

Abstract: A material level indicator includes a probe, first and second signal compensating units, arranged at first and second ends of the probe respectively, and a controlling module arranged at the first end and includes a signal processor, a signal emitter, and a signal receiver. The second end is opposite to the first end. The signal processor is connected to the signal emitter and the signal receiver. The signal emitter emits an electromagnetic signal from the first end to the second end of the probe. The first and second signal compensating units reflect the electromagnetic signal, and the signal processor generates first and second time interval differences according to the reflected electromagnetic signal received by the signal receiver. The signal processor calibrates an environmental coefficient and indicates a dielectric coefficient of the material according to the first and second time interval differences respectively.