Abstract: A PZT ferroelectric layer (55) is used to form an integrated capacitor. The PZT ferroelectric layer (55) is sandwiched between various conductive layers (35), (45), (65), (75), (85), and (95). During the etching processes used to form the capacitor, damaged regions (100) are formed on the PZT layer (55). A wet clean process that comprises exposing the PZT layer to phosphoric acid is used to remove the damaged regions (100).

Abstract: A gas cluster ion beam (GCIB) (40) is formed in an ion beam tool (20). The position of a particle (30) on the wafer surface is determined and the GCIB is directed unto the particle (30) removing the particle from the surface on which it rests.

Abstract: An embodiment of the invention is a method for cleaning high-density capacitors, 3, on a semiconductor wafer with sulfuric acid.

Abstract: One aspect of the invention relates to a method of cleaning high density capacitors. According to the method, the capacitors are cleaned with a plasma that includes fluorine-containing radicals. The plasma removes a small layer from the capacitors, including their sidewalls, and thereby removes surface contaminants. The method is effective even when the capacitors include hard-to-etch dielectric materials, such as tantalum and hafnium oxides. In a preferred embodiment, the plasma clean is combined with a solvent clean.

Abstract: The present invention is directed to a method of forming an FeRAM integrated circuit, which includes performing a capacitor stack etch to define the FeRAM capacitor. The method comprises etching a PZT ferroelectric layer with a high temperature BCl3 etch which provides substantial selectivity with respect to the hard mask. Alternatively, the PZT ferroelectric layer is etch using a low temperature fluorine component etch chemistry such as CHF3 to provide a non-vertical PZT sidewall profile. Such a profile prevents conductive material associated with a subsequent bottom electrode layer etch from depositing on the PZT sidewall, thereby preventing leakage or a “shorting out” of the resulting FeRAM capacitor.

Abstract: The present invention is directed to a method of forming an FeRAM integrated circuit, which includes performing a capacitor stack etch to define the FeRAM capacitor. The method comprises etching a PZT ferroelectric layer with a high temperature BCl3 etch which provides substantial selectivity with respect to the hard mask. Alternatively, the PZT ferroelectric layer is etch using a low temperature fluorine component etch chemistry such as CHF3 to provide a non-vertical PZT sidewall profile. Such a profile prevents conductive material associated with a subsequent bottom electrode layer etch from depositing on the PZT sidewall, thereby preventing leakage or a “shorting out” of the resulting FeRAM capacitor.

Abstract: Chemical mechanical polishing slurry with functionalized silica abrasive particles, the functionalization permits high pH slurry without rapid degradation of silica particles and also permits the modification of surface properties of abrasive particles to modify slurry behavior. One example of modified behavior would be to enhance selectivity by controlling particle interaction with different surfaces on the wafer.

Abstract: A method of formulating a strong oxidizing solution comprising formulating a strong oxidizing solution having from about 2 to about 5 percent PDSA with concentrated sulfuric acid in the ratio of from about 1:8 to about 1:20 parts by volume and storing the strong oxidizing solution in a container having a space over the solution containing one of a vacuum or a non-oxidizing atmosphere inert to the oxidizing solution. The amount of PDSA is preferably about 4 percent by volume and the ratio is preferably about 1:10 parts by volume. The space over the strong oxidizing solution is preferably a vacuum or substantially all nitrogen.

Abstract: A apparatus and method for monitoring impurities in wet chemicals in semiconductor wafer processing comprising a silicon sensor (12) that is electrically connected to a potentiometer (22), a reference electrode (14) electrically connected to the potentiometer (22), wherein a comparison in the potential between the silicon sensor (12) and the reference electrode (14) to a predetermined baseline is used to measure wet chemical impurities, is disclosed.

Abstract: Traditionally, hydrofluoric acid (HF) or buffered bydrofluoric acid (NH.sub.4 F) is mixed with water to form a etching solution for cleaning silicon dioxide from semiconductor wafer surfaces. An etching solution formed by mixing ammonium hydrogen bifluoride ((NH.sub.4)HF.sub.2) with water provides a benign alternative for cleaning silicon dioxide.

Abstract: This invention is for an improved slurry for shallow trench isolation processing in chemical mechanical polishing of semiconductor devices. The oxide/nitride selectivity is enhanced by increasing the pH of the slurry, increasing the solids content of the slurry and/or by adding a fluoride salt to the slurry. With these modifications, selectivity of greater than 10:1 can be attained.