Abstract: A device and a method for automatically categorizing screwdriver bits are provided. The method includes three main steps: accommodating and mixing, vibration feeding, and type categorizing. The device includes a device body and a vibrating feeding cylinder disposed on the device body. The vibrating feeding cylinder includes a rotating holder for vibrating and moving the screwdriver bits and a directional mechanism for arranging the driving tips of the screwdriver bits facing the same direction. A CCD mechanism is disposed on the device body and is used to detect the shape of the driving tips of the screwdriver bits.

Abstract: A method for evaluating a downhole working condition of a PDC bit includes: performing an indoor test, including performing a drilling test in different full-sized cores by using the PDC bit with different degrees of abrasion and balling under condition of given WOB and rotational speed, to acquire change characteristics of a WOB, a rotational speed, a torque, a ROP and a bit vibration of the PDC bit in different time domains; improving and perfecting an existing prediction model and evaluation method for the downhole working condition through data obtained by the test to obtain the method; reading parameters of the WOB, the rotational speed, the torque and the ROP in real time during drilling; determining the downhole working condition of the PDC bit by using the method in the improving and perfecting.

Abstract: A scan flip-flop circuit includes a selection circuit including first and second input terminals coupled to first and second I/O nodes, a flip-flop circuit coupled to the selection circuit, a first driver coupled between the flip-flop circuit and the first I/O node, and a second driver coupled between the flip-flop circuit and the second I/O node. The selection circuit and drivers receive a scan direction signal. In response to a first logic level of the scan direction signal, the selection circuit responds to a first signal received at the first input terminal, and the second driver outputs a second signal responsive to a flip-flop circuit output signal. In response to a second logic level of the scan direction signal, the selection circuit responds to a third signal received at the second input terminal, and the first driver outputs a fourth signal responsive to the flip-flop circuit output signal.

Abstract: A method of manufacturing an IC structure includes configuring each of an n-well and a p-well in a first IC die to have a first portion extending in a first direction and second and third portions extending from the first portion in a second direction perpendicular to the first direction, and forming IC devices including a first pickup structure electrically connected to the n-well and a second pickup structure electrically connected to the p-well. Forming the IC devices includes forming a PMOS transistor in the second or third portion of the n-well and forming an NMOS transistor in the second or third portion of the p-well.

Abstract: An indexable insert having a tip body formed of a polygonal flat plate. An upper surface of the tip body serves as a rake face, and edges are formed along ridges defined by sides of the rake face. Nose portion edges are formed at corners of the rake face at which the edges adjacent to each other intersect. The nose portion edges each have a rake angle varied between both ends of the nose portion edge.