Abstract: The present disclosure relates to a method for production of CNHs composite material. The method includes the following steps: a first step: the silicon particles and graphite powder are mixed for a preset time by planetary ball mill device, and the weight ratio of silicon element to carbon element is 10-40%, then the Si/C precursor is obtained; a second contact step: the Si/C precursor is pressed into a precursor block, then using precursor block to the CNHs composite material by a DC arc plasma device.

Abstract: Systems and methods of observing a sample using a charged-particle beam apparatus in voltage contrast mode are disclosed. The charged-particle beam apparatus comprises a charged-particle source, an optical source, a charged-particle detector configured to detect charged particles, and a controller having circuitry configured to apply a first signal to cause the optical source to generate the optical pulse, apply a second signal to the charged-particle detector to detect the second plurality of charged particles, and adjust a time delay between the first and the second signals. In some embodiments, the controller having circuitry may be further configured to acquire a plurality of images of a structure, to determine an electrical characteristic of the structure based on the rate of gray level variation of the plurality of images of the structure, and to simulate, using a model, a physical characteristic of the structure based on the determined electrical characteristic.

Abstract: A charged particle beam apparatus for inspecting a sample is provided. The apparatus includes a pixelized electron detector to receive signal electrons generated in response to an incidence of an emitted charged particle beam onto the sample. The pixelized electron detector includes multiple pixels arranged in a grid pattern. The multiple pixels may be configured to generate multiple detection signals, wherein each detection signal corresponds to the signal electrons received by a corresponding pixel of the pixelized electron detector. The apparatus further includes a controller includes circuitry configured to determine a topographical characteristic of a structure within the sample based on the detection signals generated by the multiple pixels, and identifying a defect within the sample based on the topographical characteristic of the structure of the sample.

Abstract: An improved system and method for inspection of a sample using a particle beam inspection apparatus, and more particularly, to systems and methods of scanning a sample with a plurality of charged particle beams. An improved method of scanning an area of a sample using N charged particle beams, wherein N is an integer greater than or equal to two, and wherein the area of the sample comprises a plurality of scan sections of N consecutive scan lines, includes moving the sample in a first direction. The method also includes scanning, with a first charged particle beam of the N charged particle beams, first scan lines of at least some scan sections of the plurality of scan sections moving towards a probe spot of the first charged particle beam. The method further includes scanning, with a second charged particle beam of the N charged particle beams, second scan lines of at least some scan sections of the plurality of scan sections moving towards a probe spot of the second charged particle beam.

Abstract: The present disclosure relates to a beverage or food brewing method and a beverage or food brewing machine. The beverage or food brewing method includes following steps: actuating a beverage or food brewing machine to produce powder through a grinding device and to output the powder to a powder holder; when the powder in the powder holder reaches a set amount, obtaining a first grinding time value T11 of the beverage or food brewing machine; according to the first grinding time value T11, obtaining a prolonged grinding time value T12 corresponding to the first grinding time value T11; making the grinding device continue operating for a period of time determined by the prolonged grinding time value T12 and outputting the powder from the grinding device to the powder holder.

Abstract: A communication method includes receiving, by a first security edge protection proxy (SEPP) device, a roaming message from an IP exchange (IPX) operator device. The roaming message is used to implement a roaming service between the first SEPP device and a second SEPP device. The communication method also includes determining, by the first SEPP device, that the roaming message cannot be processed. The communication method also includes, in response to determining that the roaming message cannot be processed, sending, by the first SEPP device, a feedback message to the IPX operator device. The feedback message is used to indicate that the first SEPP device cannot process the roaming message.

Abstract: Provided is a moving target positioning capability testing device for a coal mine, including a timing unit, a control unit, a laser emitting unit, a laser receiving unit and a constant-speed traveling device, wherein multiple groups of clocks, laser receivers and laser emitters, as test points, are arranged; and the constant-speed traveling device is used to drive positioning identification cards fixed on a positioning vehicle to move forwards from a position outside a coverage boundary of a positioning sub-station in a constant-speed manner, count time of the clocks, and calculate a difference between a position of the positioning vehicle fixed with the positioning identification cards after moving a distance at the same time as a receiving time recorded by a moving target positioning system server and a position of the clock as a dynamic error evaluation value of the moving target positioning ability.

Abstract: A system for scanning an object is provided. The system may include: a supporting table configured to support the object; a first signal conversion unit configured to receive one or more first signals associated with the object and convert the first signals into one or more second signals; and a signal receiver board configured to receive the one or more second signals. The first signal conversion unit may include a plurality of first signal receiving channels. Each first signal receiving channel may be configured to receive a first signal associated with a portion of the object. The supporting table and the signal receiver board may be configured to move relative to each other to cause the signal receiver board to receive at least one second signal corresponding to at least one first signal received by at least one target channel of the first signal receiving channels.

Abstract: A pressure compensation device with an accumulator group for controlled pressure drilling includes an electrical flat valve, a check valve, an accumulator group, a flanged pup joint and a support base. The electrical flat valve is connected to the check valve and is mounted on a top surface of the support base. The accumulator group mounted on the whole support base is a pre-storage pressure compensation device for controlled pressure drilling, and is located at a downstream position of the check valve. The liquid inlet end of the accumulator group is connected to the check valve, and the liquid discharge end is connected to the flanged pup joint.

Abstract: An improved charged particle beam inspection apparatus, and more particularly, a particle beam inspection apparatus for detecting a thin device structure defect is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source to direct charged particles to a location of a wafer under inspection over a time sequence. The improved charged particle beam apparatus may further include a controller configured to sample multiple images of the area of the wafer at difference times over the time sequence. The multiple images may be compared to detect a voltage contrast difference or changes to identify a thin device structure defect.

Abstract: Apparatuses, systems, and methods for generating a beam for inspecting a wafer positioned on a stage in a charged particle beam system are disclosed. In some embodiments, a controller may include circuitry configured to classify a plurality of regions along a stripe of the wafer by type of region, the stripe being larger than a field of view of the beam, wherein the classification of the plurality of regions includes a first type of region and a second type of region; and scan the wafer by controlling a speed of the stage based on the type of region, wherein the first type of region is scanned at a first speed and the second type of region is scanned at a second speed.

Abstract: A tower section and a wind generating set. The tower section comprises a tower section body and hoisting lugs, wherein through holes are provided in the sidewall of the tower section body, and an inner cavity of the tower section is communicated with the outside by means of the through holes; the hoisting lugs are provided in the through holes, are movable along central lines of the through holes, and can move between a first position where the hoisting lugs extend out of the tower section body and a second position where the hoisting lugs are retracted to the tower section body, so as to hoist the tower section. Because the hoisting lugs can selectively extend out, a tower hoist is not needed to be connected to a flange in a tower section hoisting process, and the hoist is mounted on the hoisting lugs.

Abstract: Disclosed are a pharmaceutical composition and method for relieving/eliminating morphine-induced analgesic tolerance. The pharmaceutical composition includes a therapeutically effective amount of a short peptide and morphine as active ingredients, and a pharmaceutically-acceptable carrier. The short peptide is a peptide consisting of an amino acid sequence shown in SEQ ID NO: 1 or a pharmaceutically-acceptable salt thereof. In the method, the short peptide and morphine are administered to a subject simultaneously; or the short peptide is injected to the subject followed by administration of the morphine; or a pharmaceutical composition including the short peptide and morphine is administered to the subject.

Abstract: A wafer inspection system is disclosed. According to certain embodiments, the system includes an electron detector that includes circuitry to detect secondary electrons or backscattered electrons (SE/BSE) emitted from a wafer. The electron beam system also includes a current detector that includes circuitry to detect an electron-beam-induced current (EBIC) from the wafer. The electron beam system further includes a controller having one or more processors and a memory, the controller including circuitry to: acquire data regarding the SE/BSE; acquire data regarding the EBIC; and determine structural information of the wafer based on an evaluation of the SE/BSE data and the EBIC data.

Abstract: An improved system and method for inspection of a sample using a particle beam inspection apparatus, and more particularly, to systems and methods of scanning a sample with a plurality of charged particle beams. An improved method of scanning an area of a sample using N charged particle beams, wherein Nis an integer greater than or equal to two, and wherein the area of the sample comprises a plurality of scan sections of N consecutive scan lines, includes moving the sample in a first direction. The method also includes scanning, with a first charged particle beam of the N charged particle beams, first scan lines of at least some scan sections of the plurality of scan sections moving towards a probe spot of the first charged particle beam. The method further includes scanning, with a second charged particle beam of the N charged particle beams, second scan lines of at least some scan sections of the plurality of scan sections moving towards a probe spot of the second charged particle beam.

Abstract: Disclosed are a pharmaceutical composition and method for relieving/eliminating morphine-induced analgesic tolerance. The pharmaceutical composition includes a therapeutically effective amount of a short peptide and morphine as active ingredients, and a pharmaceutically-acceptable carrier. The short peptide is a peptide consisting of an amino acid sequence shown in SEQ ID NO: 1 or a pharmaceutically-acceptable salt thereof. In the method, the short peptide and morphine are administered to a subject simultaneously; or the short peptide is injected to the subject followed by administration of the morphine; or a pharmaceutical composition including the short peptide and morphine is administered to the subject.

Abstract: An optical fiber inclination measurement apparatus and a differential inclination measurement system are provided, which is related to the field of monitoring technology. The apparatus includes a supporting mechanism with a base and a base frame, a swinging mechanism with a pendulum, a cycloid, and a first reflective film is disposed on the pendulum. The measurement mechanism includes a first optical fiber, and an end surface of the first optical fiber is disposed opposite to the first reflective film. During an earthquake generating process, a landform changes and the pendulum swings, resulting in changes in displacement. The end surface of the first optical fiber together with the first reflective film form a Fabry-Perot cavity. The cavity length of the Fabry-Perot cavity changes before and after the landform deforms, and an angle of inclination is equal to a value obtained by dividing the cavity length variation of the Fabry-Perot cavity by the pendulum length.

Abstract: A detection device includes a frame, a transport mechanism, detection mechanisms, and a grasping mechanism. The transport mechanism includes a feeding line, a first flow line, and a second flow line arranged in parallel on the frame. The detection mechanisms are arranged on the frame and located on two sides of the transport mechanism. The grasping mechanism is arranged on the frame and used to transport workpieces on the feeding line to the detection mechanisms, transport qualified workpieces to the first flow line, and transport unqualified workpieces to the second flow line.

Abstract: A stirring rib (100), a stirring mechanism and a cooking robot are provided. The stirring rib includes a first rotating shaft (110), a second rotating shaft (120), a first connecting rod (130), a second connecting rod (140), a first extending rod (150), a second extending rod (160), and a stirring blade (170). The first connecting rod is connected to one shaft end of the first rotating shaft and is arranged in a downward extending manner. The second connecting rod is connected to one shaft end of the second rotating shaft and is arranged in a downward extending manner. The first extending rod is connected to a bottom of the first connecting rod. The second extending rod is connected to a bottom of the second connecting rod.

Abstract: An improved charged particle beam inspection apparatus, and more particularly, a particle beam inspection apparatus for detecting a thin device structure defect is disclosed. An improved charged particle beam inspection apparatus may include a charged particle beam source to direct charged particles to a location of a wafer under inspection over a time sequence. The improved charged particle beam apparatus may further include a controller configured to sample multiple images of the area of the wafer at difference times over the time sequence. The multiple images may be compared to detect a voltage contrast difference or changes to identify a thin device structure defect.