Patents by Inventor Makoto Fukushima

Makoto Fukushima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7867063
    Abstract: A substrate holding apparatus is for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus comprises a vertically movable member, and an elastic member for defining a chamber. The elastic member comprises a contact portion which is brought into contact with the substrate, and a circumferential wall extending upwardly from the contact portion and connected to the vertically movable member. The circumferential wall has a stretchable and contractible portion which is stretchable and contractible vertically.
    Type: Grant
    Filed: May 15, 2009
    Date of Patent: January 11, 2011
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Hiroshi Yoshida, Osamu Nabeya, Makoto Fukushima, Koichi Fukaya
  • Patent number: 7850509
    Abstract: The present invention relates to a substrate holding apparatus for holding and pressing a substrate against a polishing surface. The substrate holding apparatus includes a top ring body for holding the substrate, an elastic pad for contacting the substrate, and a support member for supporting the elastic pad. The substrate holding apparatus further includes a contact member mounted on a lower surface of the support member and disposed in a space formed by the elastic pad and the support member. The contact member has an elastic membrane for contacting the elastic pad. A first pressure chamber is defined in the contact member, and a second pressure chamber is defined outside of the contact member. The substrate holding apparatus also includes a fluid source for independently supplying a fluid into, or creating a vacuum in, the first pressure chamber and the second pressure chamber.
    Type: Grant
    Filed: October 16, 2008
    Date of Patent: December 14, 2010
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Ikutaro Noji, Keisuke Namiki, Hozumi Yasuda, Shunichiro Kojima, Kunihiko Sakurai, Nobuyuki Takada, Osamu Nabeya, Makoto Fukushima, Hideki Takayanagi
  • Publication number: 20100273405
    Abstract: A polishing apparatus is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. The polishing apparatus includes a polishing table (100) having a polishing surface (101a), a top ring body (2) configured to hold and press a substrate against the polishing surface (101a), and a retainer ring (3) provided at an outer peripheral portion of the top ring body (2) and configured to press the polishing surface (101a). A fulcrum for receiving a lateral force applied from the substrate to the retainer ring (3) during polishing of the substrate is located above a central portion of the substrate.
    Type: Application
    Filed: February 9, 2009
    Publication date: October 28, 2010
    Inventors: Makoto Fukushima, Tetsuji Togawa, Hozumi Yasuda, Koji Saito, Osamu Nabeya, Tomoshi Inoue
  • Patent number: 7754365
    Abstract: A membrane electrode assembly includes an electrolyte membrane, an anode disposed on one face of the electrolyte membrane, and a cathode disposed on the other face of the electrolyte membrane. The electrolyte membrane has a non-electrode-forming region where the cathode is not disposed on the surface of the non-electrode-forming region and an electrode-forming region where the cathode is disposed on the surface of the electrode-forming region. The non-electrode-forming region has a thin membrane region where the membrane is thinner than that in the electrode-forming region. The drop in power generation efficiency by water generated at the cathodes is prevented.
    Type: Grant
    Filed: March 6, 2008
    Date of Patent: July 13, 2010
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Makoto Fukushima, Takashi Yasuo, Shinichiro Imura
  • Publication number: 20100056028
    Abstract: The present invention relates to a substrate holding apparatus for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus according to the present invention comprises a top ring body having a receiving space therein, and a vertically movable member which is vertically movable within the receiving space in the top ring body. An abutment member having an elastic membrane is attached to a lower surface of the vertically movable member. The elastic membrane of the abutment member comprises an abutment portion, having a flange projecting outwardly, brought into direct or indirect contact with the substrate, and a connecting portion extending upwardly from a base portion of the flange of the abutment portion and being connected to the vertically movable member. The connecting portion is made of a material having a flexibility higher than that of material of the abutment portion.
    Type: Application
    Filed: November 5, 2009
    Publication date: March 4, 2010
    Inventors: Tetsuji TOGAWA, Osamu Nabeya, Makoto Fukushima, Kunihiko Sakurai, Hiroshi Yoshida, Teruhiko Ichimura
  • Publication number: 20100025177
    Abstract: A fluid coupling device, includes a driving rotor, a driven rotor including an operation space, a valve unit supplying fluid stored in a storage space to the operation space and stopping supplying the fluid in accordance with a change in air temperature, and a pump portion for returning the fluid from the operation space to the storage space. A valve member of the valve unit is movable between a closed position and an open position, and includes an intermediate flow passage for keeping a predetermined amount of the fluid in the storage space and supplying the rest of the fluid to the opening when the valve member is in a predetermined position between the closed position and the open position.
    Type: Application
    Filed: July 20, 2009
    Publication date: February 4, 2010
    Applicant: AISIN SEIKI KABUSHIKI KAISHA
    Inventors: Makoto Fukushima, Tadayoshi Sato, Ryuta Miura
  • Patent number: 7635292
    Abstract: A substrate holding device according to the present invention includes an elastic membrane to be brought into contact with a rear surface of a substrate, an attachment member for securing at least a portion of the elastic membrane, and a retainer ring for holding a peripheral portion of the substrate while in contact with the elastic membrane. The elastic membrane comprises at least one projecting portion, and the attachment member comprises at least one engagement portion engaging side surfaces of the at least one projecting portion of the elastic membrane. The elastic membrane further comprises bellows portions expandable in a pressing direction so as to allow the elastic membrane to press the substrate, and contractible along the pressing direction.
    Type: Grant
    Filed: December 6, 2005
    Date of Patent: December 22, 2009
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Hiroshi Yoshida, Osamu Nabeya, Makoto Fukushima, Koichi Fukaya
  • Patent number: 7632173
    Abstract: The present invention relates to a substrate holding apparatus for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus according to the present invention comprises a top ring body having a receiving space therein, and a vertically movable member which is vertically movable within the receiving space in the top ring body. An abutment member having an elastic membrane is attached to a lower surface of the vertically movable member. The elastic membrane of the abutment member comprises an abutment portion, having a flange projecting outwardly, brought into direct or indirect contact with the substrate, and a connecting portion extending upwardly from a base portion of the flange of the abutment portion and being connected to the vertically movable member. The connecting portion is made of a material having a flexibility higher than that of material of the abutment portion.
    Type: Grant
    Filed: December 6, 2007
    Date of Patent: December 15, 2009
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Osamu Nabeya, Makoto Fukushima, Kunihiko Sakurai, Hiroshi Yoshida, Teruhiko Ichimura
  • Publication number: 20090233532
    Abstract: A substrate holding apparatus is for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus comprises a vertically movable member, and an elastic member for defining a chamber. The elastic member comprises a contact portion which is brought into contact with the substrate, and a circumferential wall extending upwardly from the contact portion and connected to the vertically movable member. The circumferential wall has a stretchable and contractible portion which is stretchable and contractible vertically.
    Type: Application
    Filed: May 15, 2009
    Publication date: September 17, 2009
    Inventors: Tetsuji Togawa, Hiroshi Yoshida, Osamu Nabeya, Makoto Fukushima, Koichi Fukaya
  • Publication number: 20090191791
    Abstract: A polishing method can safely detach and lift up a workpiece from a polishing surface without carrying out the operation of making the workpiece overhang the polishing surface. The polishing method includes carrying out processing of a surface to be polished of a workpiece by supplying a liquid to a polishing surface while pressing the surface to be polished of the workpiece held by a holding device against the polishing surface and moving the workpiece and the polishing surface relative to each other, attracting the workpiece after the processing to the holding device while supplying the liquid to the polishing surface at a decreased flow rate, thereby detaching the workpiece from the polishing surface, and lifting up the holding device together with the workpiece on confirmation of detachment of the workpiece from the polishing surface and attachment of the workpiece to the holding device.
    Type: Application
    Filed: January 27, 2009
    Publication date: July 30, 2009
    Inventors: Makoto Fukushima, Tetsuji Togawa, Hozumi Yasuda, Osamu Nabeya, Shingo Saito
  • Publication number: 20090191797
    Abstract: A polishing apparatus (1) has a polishing pad (22), a top ring (20) for holding a semiconductor wafer (W), a vertical movement mechanism (24) operable to move the top ring (20) in a vertical direction, a distance measuring sensor (46) operable to detect a position of the top ring (20) when a lower surface of the top ring (20) is brought into contact with the polishing pad (22), and a controller (47) operable to calculate an optimal position of the top ring (20) to polish the semiconductor wafer (W) based on the position detected by the distance measuring sensor (46). The vertical movement mechanism (24) includes a ball screw mechanism (30, 32, 38, 42) operable to move the top ring (20) to the optimal position.
    Type: Application
    Filed: February 25, 2009
    Publication date: July 30, 2009
    Inventors: Osamu NABEYA, Tetsuji TOGAWA, Makoto FUKUSHIMA, Hozumi YASUDA
  • Publication number: 20090142996
    Abstract: A polishing apparatus is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. The polishing apparatus includes a polishing table having a polishing surface, a polishing head having at least one elastic membrane configured to form a plurality of pressure chambers for being supplied with a pressurized fluid, and a controller configured to control supply of the pressurized fluid to the pressure chambers. The controller controls supply of the pressurized fluid so that the pressurized fluid is supplied first to the pressure chamber located at a central portion of the substrate when the substrate is brought into contact with the polishing surface, and then the pressurized fluid is supplied to the pressure chamber located at a radially outer side of the pressure chamber located at the central portion of the substrate.
    Type: Application
    Filed: November 24, 2008
    Publication date: June 4, 2009
    Inventors: Hozumi Yasuda, Makoto Fukushima, Tetsuji Togawa
  • Publication number: 20090111362
    Abstract: A polishing apparatus is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. The polishing apparatus includes a polishing table having a polishing surface, a top ring body configured to hold and press a substrate against the polishing surface, a retainer ring provided at an outer peripheral portion of the top ring body and configured to press the polishing surface, and a retainer ring guide fixed to the top ring body and configured to be brought into sliding contact with a ring member of the retainer ring to guide a movement of said ring member. Either one of sliding contact surfaces of the ring member and the retainer ring guide which are brought into sliding contact with each other comprises a low friction material.
    Type: Application
    Filed: October 16, 2008
    Publication date: April 30, 2009
    Inventors: Osamu Nabeya, Tetsuji Togawa, Hozumi Yasuda, Koji Saito, Makoto Fukushima
  • Publication number: 20090061748
    Abstract: The present invention relates to a substrate holding apparatus for holding and pressing a substrate against a polishing surface. The substrate holding apparatus includes a top ring body for holding the substrate, an elastic pad for contacting the substrate, and a support member for supporting the elastic pad. The substrate holding apparatus further includes a contact member mounted on a lower surface of the support member and disposed in a space formed by the elastic pad and the support member. The contact member has an elastic membrane for contacting the elastic pad. A first pressure chamber is defined in the contact member, and a second pressure chamber is defined outside of the contact member. The substrate holding apparatus also includes a fluid source for independently supplying a fluid into, or creating a vacuum in, the first pressure chamber and the second pressure chamber.
    Type: Application
    Filed: October 16, 2008
    Publication date: March 5, 2009
    Inventors: Tetsuji TOGAWA, Ikutarao NOJI, Keisuke NAMIKI, Hozumi YASUDA, Shunichiro KOJIMA, Kunihiko SAKURAI, Nobuyuki TAKADA, Osamu NABEYA, Makoto FUKUSHIMA, Hideki TAKAYANAGI
  • Patent number: 7491117
    Abstract: The present invention relates to a substrate holding apparatus for holding and pressing a substrate against a polishing surface. The substrate holding apparatus includes a top ring body for holding the substrate, an elastic pad for contacting the substrate, and a support member for supporting the elastic pad. The substrate holding apparatus further includes a contact member mounted on a lower surface of the support member and disposed in a space formed by the elastic pad and the support member. The contact member has an elastic membrane for contacting the elastic pad. A first pressure chamber is defined in the contact member, and a second pressure chamber is defined outside of the contact member. The substrate holding apparatus also includes a fluid source for independently supplying a fluid into, or creating a vacuum in, the first pressure chamber and the second pressure chamber.
    Type: Grant
    Filed: June 14, 2006
    Date of Patent: February 17, 2009
    Assignee: Ebara Corporation
    Inventors: Tetsuji Togawa, Ikutaro Noji, Keisuke Namiki, Hozumi Yasuda, Shunichiro Kojima, Kunihiko Sakurai, Nobuyuki Takada, Osamu Nabeya, Makoto Fukushima, Hideki Takayanagi
  • Publication number: 20080318492
    Abstract: A substrate holding apparatus prevents a substrate from slipping out and allows the substrate to be polished stably. The substrate holding apparatus has a top ring body for holding and pressing a substrate against a polishing surface, and a retainer ring for pressing the polishing surface, the retainer ring being disposed on an outer circumferential portion of the top ring body. The retainer ring includes a first member made of a magnetic material and a second member having a magnet disposed on a surface thereof which is held in abutment against the first member.
    Type: Application
    Filed: August 19, 2008
    Publication date: December 25, 2008
    Inventors: Hozumi Yasuda, Tetsuji Togawa, Osamu Nabeya, Kenichiro Saito, Makoto Fukushima, Tomoshi Inoue
  • Publication number: 20080318499
    Abstract: A substrate holding apparatus prevents a substrate from slipping out and allows the substrate to be polished stably. The substrate holding apparatus has a top ring body for holding and pressing a substrate against a polishing surface, and a retainer ring for pressing the polishing surface, the retainer ring being disposed on an outer circumferential portion of the top ring body. The retainer ring includes a first member made of a magnetic material and a second member having a magnet disposed on a surface thereof which is held in abutment against the first member.
    Type: Application
    Filed: August 19, 2008
    Publication date: December 25, 2008
    Inventors: Hozumi Yasuda, Tetsuji Togawa, Osamu Nabeya, Kenichiro Saito, Makoto Fukushima, Tomoshi Inoue
  • Publication number: 20080220307
    Abstract: A membrane electrode assembly includes an electrolyte membrane, an anode disposed on one face of the electrolyte membrane, and a cathode disposed on the other face of the electrolyte membrane. The electrolyte membrane has a non-electrode-forming region where the cathode is not disposed on the surface of the non-electrode-forming region and an electrode-forming region where the cathode is disposed on the surface of the electrode-forming region. The non-electrode-forming region has a thin membrane region where the membrane is thinner than that in the electrode-forming region. The drop in power generation efficiency by water generated at the cathodes is prevented.
    Type: Application
    Filed: March 6, 2008
    Publication date: September 11, 2008
    Inventors: Makoto Fukushima, Takashi Yasuo, Shinichiro Imura
  • Publication number: 20080166957
    Abstract: A substrate holding apparatus is for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus comprises a vertically movable member, and an elastic member for defining a chamber. The elastic member comprises a contact portion which is brought into contact with the substrate, and a circumferential wall extending upwardly from the contact portion and connected to the vertically movable member. The circumferential wall has a stretchable and contractible portion which is stretchable and contractible vertically.
    Type: Application
    Filed: March 5, 2008
    Publication date: July 10, 2008
    Inventors: Tetsuji Togawa, Hiroshi Yoshida, Osamu Nabeya, Makoto Fukushima, Koichi Fukaya
  • Publication number: 20080119121
    Abstract: The present invention relates to a substrate holding apparatus for holding a substrate such as a semiconductor wafer in a polishing apparatus for polishing the substrate to a flat finish. The substrate holding apparatus according to the present invention comprises a top ring body having a receiving space therein, and a vertically movable member which is vertically movable within the receiving space in the top ring body. An abutment member having an elastic membrane is attached to a lower surface of the vertically movable member. The elastic membrane of the abutment member comprises an abutment portion, having a flange projecting outwardly, brought into direct or indirect contact with the substrate, and a connecting portion extending upwardly from a base portion of the flange of the abutment portion and being connected to the vertically movable member. The connecting portion is made of a material having a flexibility higher than that of material of the abutment portion.
    Type: Application
    Filed: December 6, 2007
    Publication date: May 22, 2008
    Inventors: Tetsuji Togawa, Osamu Nabeya, Makoto Fukushima, Kunihiko Sakurai, Hiroshi Yoshida, Teruhiko Ichimura