Abstract: In order to improve visibility of a measurement/inspection image in an inspection measurement apparatus inspecting or measuring a fine pattern, a charged particle beam device is configured to include a charged particle optical system that irradiates a surface of a sample with a converged charged particle beam so as to perform scanning, a detection unit that detects secondary charged particles generated from the sample irradiated with the charged particle beam by the charged particle optical system, an image forming unit that receives a detection signal from the detection unit and forms an image of the sample, an image processing unit that processes the image formed in the image forming unit, and a display unit that displays a result processed by the image processing unit, in which the image forming unit includes an analog signal processing portion that processes an analog signal component of the detection signal in the detection unit so as to form an image, a pulse count method signal processing portion that

Abstract: A multilayer structure includes a layer of a resin composition containing an ethylene-vinyl alcohol copolymer and a thermoplastic elastomer, wherein a mass ratio of the ethylene-vinyl alcohol copolymer to the thermoplastic elastomer is from 65/35 to 95/5 and the layer of the resin composition has one surface directly adjacent to a layer of polyolefin with no polar functional group. A multilayer structure is thus provided that is excellent in gas barrier properties, transparency, and flexibility and also has good delamination properties between the layer of the resin composition and the layer of the polyolefin with no polar functional group.

Abstract: An objective is to provide a hitherto not-existing retention component that is for a wiring bundle and can be manufactured without tying the wiring bundle, a wire harness including the retention component, and a manufacturing method and a manufacturing device for the wire harness. A metal mold that is used has a penetration hole in which a wiring bundle is to be penetratingly disposed, an annular retention portion-molding space for surrounding the outer circumference of the wiring bundle, and an engagement portion-molding space communicatively connected with the retention portion-molding space. The wiring bundle is disposed in the penetration hole, a melt resin is poured in the retention portion-molding space from the engagement portion-molding space, and solidified through cooling to mold a retention portion integrally with a engagement portion in a state of being closely adhered to an outer circumference of the wiring bundle.

Abstract: A terminal device (300) includes a projection target holding unit that holds projection information to be projected by an image projection device (200), a storage unit that stores position information indicating a position on the retina of a user (P) at which the projection information is to be projected, a position information acquisition unit that acquires the position information from the storage unit, an image data generation unit that generates image data (D) of an image (202G) that projects the projection information at the position indicated by the position information, and an image output processing unit that outputs the image data (D) to the image projection device (200).

Abstract: A terminal device includes an image data holding unit that holds examination image data, an image output processing unit that outputs the examination image data to a visual field/visual acuity examination device, a display unit that displays an image, and a display control unit that generates an examination image based on the examination image data and displays the examination image on the display unit. The visual field/visual acuity examination device includes a light source unit that emits a light beam, an image input unit that inputs the examination image data from the terminal device, a control unit that generates an image light beam based on the input examination image data and controls emission of the image light beam from the light source unit, a scanning mirror that scans the image light beam to generate an examination image light beam, and a projection unit that projects the examination image light beam as the examination image on an eyeball of a test subject.

Abstract: An imaging apparatus includes a substrate including an imaging element, one or two attachment portions that attach the substrate by screwing and are capable of inclining a board surface of the substrate, by screwing in a screw, relative to a plane perpendicular to an optical axis of an optical system that forms an optical image on the imaging element; and one or more supports configured to abut the substrate from an opposite direction to a screwing direction of the attachment portion at any position, on the substrate, that rotates in the screwing direction of the attachment portion when the board surface is inclined by screwing. As a result, an imaging apparatus that allows an imaging element to be installed at a desired position and orientation while reducing the size of the substrate is provided.

Abstract: A charged particle beam device includes a charged particle source that generates a charged particle beam, a focus adjustment unit that adjusts a focal position of the charged particle beam, a deflection unit for scanning the charged particle beam on the sample, a detection unit that detects charged particles generated when the sample is irradiated with the charged particle beam, a detected charged particle selection unit that selects charged particles to be detected by the detection unit, and a control processing unit that makes focus adjustment of the focus adjustment unit and reference adjustment of the detected charged particle selection unit by using information from the detection unit acquired from one scan.

Abstract: The objective of the present invention is to provide a charged particle detector and a charged particle beam device with which it is possible to acquire a high luminous output while rapidly eliminating charged particles that are incident to a scintillator. In order to achieve said objective the present invention proposes: a charged particle detector provided with a light-emitting unit including a laminated structure obtained by laminating a GaInN-containing layer and a GaN layer, and provided with a conductive layer that is in contact with the GaInN-containing layer on the charged particle incidence surface side of the laminated structure; and a charged particle beam device.

Abstract: A scanning electron microscope capable of properly determining a step of a step pattern formed on a sample regardless of combination of material of a groove of the step pattern and material of a projection of the step pattern, the scanning electron microscope includes a beam source, a detection unit having a first detection unit that detects a secondary electron emitted from the sample at an angle between an optical axis direction of the primary electron beam which is equal to or less than a predetermined value, and a second detection unit that detects a secondary electron emitted from the sample at an angle between the optical axis direction of the primary electron beam which is greater than the predetermined value, and a processing unit to obtain information on the step pattern using the information on a ratio between signals outputted from the first and the second detection unit.

Abstract: An image projection device includes: a projection unit that projects an image light beam forming an image onto a pupil of an eyeball of a user to project the image onto a retina of the eyeball; a detection unit that detects a direction in which the pupil has moved relative to a face of the user and a speed of movement of the pupil; and a control unit that performs different controls of the image when the pupil has moved at different speeds in a same direction.

Abstract: An image projection device includes: a projection unit that irradiates a pupil 40 of an eyeball 36 of a user with an image light beam 34a forming an image to project the image onto a retina 38 of the eyeball; a detection unit that detects a direction 52 in which the pupil has moved relative to a face of the user; and a control unit that controls the projection unit based on a detected direction in which the pupil has moved so that the pupil is irradiated with the image light beam and the image is moved in a direction opposite to the direction in which the pupil has moved with respect to a position on which the image has been projected before a move of the pupil in a coordinate system visually recognized by the user.

Abstract: The present invention is an image projection device that includes: a light source 12 that emits a laser beam 34; a scanning mirror 14 that two-dimensionally scans the laser beam 34 emitted from the light source 12; and a projection mirror 24 that projects scanned light onto a retina 26 of an eyeball 22 of a user to project an image onto the retina 26, the scanned light being composed of the laser beam 34 that has been scanned by the scanning mirror 14, wherein the laser beam 34 emitted from the light source 12 is scanned by using a part of an operating range of the scanning mirror 14.

Abstract: A numerical control device that controls servomotors configured to process a workpiece into an arbitrary finishing shape by performing a plurality of processing operations so that the tool moves along a processing locus, the numeral control device includes: an initial locus deriving unit configured to derive the processing locus based on the arbitrary finishing shape; a processed range acquiring unit configured to acquire a processed range in which the tool has performed the processing operation; a receiving unit configured to receive a processing instruction for a changed finishing shape different from the arbitrary finishing shape; and a changed locus deriving unit configured to derive a changed processing locus based on a shape of a changed processed part obtained by excluding the processed range from the changed finishing shape at the time of interruption of the processing.

Abstract: An optical unit (13) includes an optical system (16), a lens barrel (15), and a securing portion (21). The optical system (16) includes a plurality of optical elements (22 to 26). The lens barrel (15) has an object side opening smaller than an outermost periphery of the optical element (22) closest to an object side in the optical system (16). The lens barrel (15) has an imaging side opening equal to or larger than an outermost periphery of the optical element (26) closest to an imaging side in the optical system (16). The lens barrel (15) accommodates the optical system (16). The securing portion (21), at the imaging side opening, secures the optical system (16) inserted from the imaging side opening and accommodated in the lens barrel (15).

Abstract: A charged particle beam device includes a charged particle source that generates a charged particle beam, a focus adjustment unit that adjusts a focal position of the charged particle beam, a deflection unit for scanning the charged particle beam on the sample, a detection unit that detects charged particles generated when the sample is irradiated with the charged particle beam, a detected charged particle selection unit that selects charged particles to be detected by the detection unit, and a control processing unit that makes focus adjustment of the focus adjustment unit and reference adjustment of the detected charged particle selection unit by using information from the detection unit acquired from one scan.

Abstract: The present invention is an image projection device that includes: a light source 12 that emits a laser beam 34; a scanning mirror 14 that two-dimensionally scans the laser beam 34 emitted from the light source 12; and a projection mirror 24 that projects scanned light onto a retina 26 of an eyeball 22 of a user to project an image onto the retina 26, the scanned light being composed of the laser beam 34 that has been scanned by the scanning mirror 14, wherein the laser beam 34 emitted from the light source 12 is scanned by using a part of an operating range of the scanning mirror 14.

Abstract: The present display device is a retinal scan display device including: a projection optical system configured to project an image to a retina of an eye; a distortion correcting unit configured to correct a distortion of the image; an image inverting unit configured to invert the image; and a storage unit configured to store correction data for correcting the distortion of the image when the image is projected to a left eye and correction data for correcting the distortion of the image when the image is projected to a right eye, wherein, based on a switching signal that represents that a side at which the projection optical system is arranged has been switched from one eye side to the other eye side, the distortion correcting unit performs distortion correction, by switching from correction data corresponding to one eye to correction data corresponding to the other eye, and the image inverting unit performs image inversion.

Abstract: In order to improve visibility of a measurement/inspection image in an inspection measurement apparatus inspecting or measuring a fine pattern, a charged particle beam device is configured to include a charged particle optical system that irradiates a surface of a sample with a converged charged particle beam so as to perform scanning, a detection unit that detects secondary charged particles generated from the sample irradiated with the charged particle beam by the charged particle optical system, an image forming unit that receives a detection signal from the detection unit and forms an image of the sample, an image processing unit that processes the image formed in the image forming unit, and a display unit that displays a result processed by the image processing unit, in which the image forming unit includes an analog signal processing portion that processes an analog signal component of the detection signal in the detection unit so as to form an image, a pulse count method signal processing portion that

Abstract: An object of the present invention is to provide a charged particle beam device which can realize improved contrast of an elongated pattern in a specific direction, such as a groove-like pattern. In order to achieve the above-described object, the present invention proposes a charged particle beam device including a detector for detecting a charged particle obtained based on a charged particle beam discharged to a sample. The charged particle beam device includes a charged particle passage restricting member that has at least one of an arcuate groove and a groove having a longitudinal direction in a plurality of directions, and a deflector that deflects the charged particle discharged toward the groove from the sample. The charged particle discharged from the sample is deflected to a designated position of the groove.

Abstract: An image projection device includes: a first mirror oscillating to scan an image light beam forming an image projected onto a retina of a user; a light source emitting the image light beam and a detection light beam to the first mirror at different timings; a second mirror having a first region reflecting-the image light beam reflected by the first mirror to the retina and a second region reflecting the detection light beam reflected by the first mirror in a direction different from a direction in which the image light beam is reflected, and scanning neither the image light beam nor the detection light beam reflected by the first mirror; a detector detecting the detection light beam reflected by the second region; and a controller adjusting oscillation of the first mirror and an emission timing of the image light beam based on a detection result by the detector.