Abstract: A focus detection device having imaging pixels and focus-detecting pixels using a phase-difference focus detection method implements high-precision focus detection. In the focus detection device, a plurality of pixels each having a photoelectric conversion unit for converting an incident light flux into signal charges, and a microlens having a focus position near the photoelectric conversion unit are arranged. The plurality of pixels include a plurality of imaging pixels for generating a shot image, and a plurality of focus-detecting pixels for generating an image signal for focus detection by the phase-difference focus detection method. An opening for giving a pupil division function to the focus-detecting pixel is formed using electrodes arranged to read out signal charges from the photoelectric conversion unit.

Abstract: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

Abstract: A focus detection apparatus includes an image sensor which includes a pair of pixel groups, outputs a first image signal from one of the pair of pixel groups, and outputs a second image signal from the other of the pair of pixel groups, where the pair of pixel groups receive luminous fluxes passing different pupil regions of an imaging optical system which forms an object image; a calculation unit which generates a first corrected image signal by subtracting the second image signal multiplied by a coefficient from the first image signal and generates a second corrected image signal by subtracting the first image signal multiplied by a coefficient from the second image signal; and a focus detection unit which detects a defocus amount based on a phase difference between the first corrected image signal and the second corrected image signal generated by the calculation unit.

Abstract: An optical apparatus is disclosed which can reliably form AF images and split the AF images to provide excellent focus detection performance in the phase difference detection method. The optical apparatus comprises a light deflection unit including a deflection optical member. The deflection optical member deflects at least one of a first luminous flux and a second luminous flux relative to the other, the first and second luminous fluxes passing through a first area and a second area in the exit pupil of an optical system, respectively, and forming images on a photoelectrical conversion element. The light deflection unit comprises a light-limiting member which limits an image-forming area where at least one of the first and second luminous fluxes emerging from the light deflection unit forms the image on the photoelectrical conversion element.

Abstract: An optical apparatus is disclosed, which is suitable for the focus detection by the TTL phase difference detection method, and capable of producing a pair of phase difference images for focus detection with high accuracy. The optical apparatus comprises a deflection optical element which deflects at least one of first and second luminous fluxes with respect to the other. The first and second luminous fluxes are transmitted respectively through first and second areas of an exit pupil of an optical system, and then reach a photoelectric conversion element. The deflection direction of the luminous flux is different from the division direction of the first and second areas.

Abstract: There is provided an optical apparatus that provides quick and precise TTL phase difference detection and pupil slicing focus detection. An optical apparatus includes a first optical element for splitting a first polarized light component contained in light that passes an exit pupil of a first optical system and directs to a photoelectric conversion element so that the first polarized light component direct to different light-receiving areas on the photoelectric conversion element. The optical apparatus may further include a second optical element for separating a second polarized light component contained in the light from said first optical element, from the first polarized light component.

Abstract: In an upper waveguide structure (14), a width (W1) of the upper portion is larger than a width (W2) of the lower portion. The upper waveguide structure (14) has a side face (14a) which obliquely extends from an edge portion (14b) of the upper face to an edge portion (14c) of the lower face to come close to a normal (PA1) passing through the center of a light receiving surface (2a) of a photoelectric conversion unit (2). A gap (11) in the air gap structure (AG1) is formed by etching a first insulating layer (4a l: see FIG. 4A) serving as a first interlayer dielectric film (4a) so as to expose not an inner region (2a1) but an outer region (2a2) on the light receiving surface (2a) of the photoelectric conversion unit (2).

Abstract: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

Abstract: An image pickup apparatus which is capable of suppressing generation of shadows even when the aperture of the photographic lens is stopped down. A digital camera as an image pickup apparatus includes a photographic lens, a image pickup element that picks up an image of an object, and an optical low-pass filter disposed between the photographic lens and the image pickup element. The filter includes a liner phase diffraction grating having unit cells which are disposed in a regular pattern at a grating pitch P and are formed by equal-width recesses and equal-width protrusions adjacent to each other. When a shortest wavelength of a reference wavelength employed is ?S, and a longest wavelength of the reference wavelength is ?L, an optical path difference ?H between lengths of optical paths of light of which a phase is varied by the phase grating is larger than ?S/2 and smaller than ?L/2.

Abstract: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

Abstract: A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

Abstract: An optical apparatus is disclosed which can reliably form AF images and split the AF images to provide excellent focus detection performance in the phase difference detection method. The optical apparatus comprises a light deflection unit including a deflection optical member. The deflection optical member deflects at least one of a first luminous flux and a second luminous flux relative to the other, the first and second luminous fluxes passing through a first area and a second area in the exit pupil of an optical system, respectively, and forming images on a photoelectrical conversion element. The light deflection unit comprises a light-limiting member which limits an image-forming area where at least one of the first and second luminous fluxes emerging from the light deflection unit forms the image on the photoelectrical conversion element.

Abstract: An apparatus for optically detecting rotational position information of a rotating object, includes a light source, a detector which is located at a position to receive scattered light from the rotating object when the rotating object is irradiated with a light beam from the light source, and outputs a frequency signal based on the scattered light, a signal processing system for detecting rotational position information by performing signal processing for the frequency signal from the detector, and a rotation control system for controlling rotation of the rotating object. The rotation control system preliminarily rotates the rotating object in detecting the rotational position information.

Abstract: An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.

Abstract: There is provided an optical apparatus that provides quick and precise TTL phase difference detection and pupil slicing focus detection. An optical apparatus includes a first optical element for splitting a first polarized light component contained in light that passes an exit pupil of a first optical system and directs to a photoelectric conversion element so that the first polarized light component direct to different light-receiving areas on the photoelectric conversion element. The optical apparatus may further include a second optical element for separating a second polarized light component contained in the light from said first optical element, from the first polarized light component.

Abstract: An optical apparatus is disclosed, which is suitable for the focus detection by the TTL phase difference detection method, and capable of producing a pair of phase difference images for focus detection with high accuracy. The optical apparatus comprises a deflection optical element which deflects at least one of first and second luminous fluxes with respect to the other. The first and second luminous fluxes are transmitted respectively through first and second areas of an exit pupil of an optical system, and then reach a photoelectric conversion element. The deflection direction of the luminous flux is different from the division direction of the first and second areas.

Abstract: A MOS transistor with a controlled threshold voltage includes a SOI which includes a substrate composed of a semi-conducting material, a single crystal layer composed of a semi-conducting material and an insulating layer interposed between the substrate and the single crystal layer. The single crystal layer is formed therein with a source region, a drain region and a surrounded region surrounded by the source region and the drain region. The surrounded region includes a depletion layer having a composition surface which is in contact with the insulating layer. The MOS transistor comprises an EIB-MOS transistor of which the substrate is adapted to be applied with a voltage of a first polarity for inducing charges of a second polarity over the composition surface of the surrounded region.

Abstract: An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.

Abstract: An apparatus for optically detecting rotational position information of a rotating object, includes a light source, a detector which is located at a position to receive scattered light from the rotating object when the rotating object is irradiated with a light beam from the light source, and outputs a frequency signal based on the scattered light, a signal processing system for detecting rotational position information by performing signal processing for the frequency signal from the detector, and a rotation control system for controlling rotation of the rotating object. The rotation control system preliminarily rotates the rotating object in detecting the rotational position information.

Abstract: An apparatus for optically detecting rotational position information of a rotating object, includes a light source, a detector which is located at a position to receive scattered light from the rotating object when the rotating object is irradiated with a light beam from the light source, and outputs a frequency signal based on the scattered light, a signal processing system for detecting rotational position information by performing signal processing for the frequency signal from the detector, and a rotation control system for controlling rotation of the rotating object. The rotation control system preliminarily rotates the rotating object in detecting the rotational position information.