Abstract: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

Abstract: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

Abstract: A processor memory is stress tested with a variable list insertion depth using list insertion test segments with non-naturally aligned data boundaries. List insertion test segments are interspersed into test code of a processor memory tests to change the list insertion depth without changing results of the test code. The list insertion test segments are the same structure as the segments of the test code and have non-naturally aligned boundaries. The list insertion test segments include list insertion segments and load/store segments. The list insertion segments locate a current memory location using a fixed segment at a known location. The load/store segments load and store list elements in memory.

Abstract: A processor memory is stress tested with a variable list insertion depth using list insertion test segments with non-naturally aligned data boundaries. List insertion test segments are interspersed into test code of a processor memory tests to change the list insertion depth without changing results of the test code. The list insertion test segments are the same structure as the segments of the test code and have non-naturally aligned boundaries. The list insertion test segments include list insertion segments and load/store segments. The list insertion segments locate a current memory location using a fixed segment at a known location. The load/store segments load and store list elements in memory.

Abstract: Efficiently generating effective address translations for memory management test cases including obtaining a first set of EAs, wherein each EA comprises an effective segment ID and a page, wherein each effective segment ID of each EA in the first set of EAs is mapped to a same first effective segment; obtaining a set of virtual address corresponding to the first set of EAs; translating the first set of EAs by applying a hash function to each virtual address in the set of virtual addresses to obtain a first set of PTEG addresses mapped to a first set of PTEGs; and generating a translation for a second set of EAs to obtain a second set of PTEG addresses mapped to the first set of PTEGs.

Abstract: Efficiently generating effective address translations for memory management test cases including obtaining a first set of EAs, wherein each EA comprises an effective segment ID and a page, wherein each effective segment ID of each EA in the first set of EAs is mapped to a same first effective segment; obtaining a set of virtual address corresponding to the first set of EAs; translating the first set of EAs by applying a hash function to each virtual address in the set of virtual addresses to obtain a first set of PTEG addresses mapped to a first set of PTEGs; and generating a translation for a second set of EAs to obtain a second set of PTEG addresses mapped to the first set of PTEGs.

Abstract: A processor memory is stress tested with a variable list insertion depth using list insertion test segments with non-naturally aligned data boundaries. List insertion test segments are interspersed into test code of a processor memory tests to change the list insertion depth without changing results of the test code. The list insertion test segments are the same structure as the segments of the test code and have non-naturally aligned boundaries. The list insertion test segments include list insertion segments and load/store segments. The list insertion segments locate a current memory location using a fixed segment at a known location. The load/store segments load and store list elements in memory.

Abstract: Disclosed is a system, method and/or computer product that includes generating translation requests that are identical but have different expected results, transmitting the translation requests from a MMU tester to a non-core MMU disposed on a processor chip, where the non-core MMU is external to a processing core of the processor chip, and where the MMU tester is disposed on a computing component external to the processor chip. The method also includes receiving memory translation results from the non-core MMU at the MMU tester, comparing the results to determine if there is a flaw in the non-core MMU.

Abstract: Embodiments of the present invention provide methods, computer program products, and systems for generating comprehensive test cases covering new events yet to be covered. Embodiments of the present invention can be used to receive a request to generate a test case, wherein the request comprises a coverage schema associated with a first set of events to be covered in the generated test case. Embodiments of the present invention can update the coverage schema, wherein updating the coverage schema comprises adding a second set of events to be covered in the generated test case and generate constraints used to satisfy requirements for meeting the first and the second set of events in the updated coverage schema. Embodiments of the present invention can generate a test case using the generated constraints and the updated schema.

Abstract: In an approach to validation of correctness of interrupt triggers and delivery a computer allocates one or more flags of a gang of flags. The computer allocates one or more interrupt source numbers, wherein each interrupt source number of the one or more interrupt source numbers corresponds to a flag of the gang of flags. The computer allocates one or more virtual processors to process the one or more interrupt source numbers. The computer schedules the one or more virtual processors. The computer receives one or more interrupt triggers corresponding to the one or more interrupt source numbers. The computer updates the one or more flags corresponding to the one or more received interrupt triggers. The computer determines whether all of the one or more flags in the gang of flags is updated. The computer determines a lost interrupt source number.

Abstract: In an approach to validation of correctness of interrupt triggers and delivery a computer allocates one or more flags of a gang of flags. The computer allocates one or more interrupt source numbers, wherein each interrupt source number of the one or more interrupt source numbers corresponds to a flag of the gang of flags. The computer allocates one or more virtual processors to process the one or more interrupt source numbers. The computer schedules the one or more virtual processors. The computer receives one or more interrupt triggers corresponding to the one or more interrupt source numbers. The computer updates the one or more flags corresponding to the one or more received interrupt triggers. The computer determines whether all of the one or more flags in the gang of flags is updated. The computer determines a lost interrupt source number.

Abstract: A mapping may be changed in a table stored in memory. The table may map a first set of addresses, for a set of data, to a second set of addresses. The changing of the mapping may including mapping the first set of addresses to a third set of addresses. In response to the changing of the mapping, one or more flush operations may be executed to invalidate one or more entries within one or more address translation caches. The one or more entries may include the second set of addresses. In response to the executing of the one or more flush operations, a first test case may be run. The first test case may be to test whether any of the first set of addresses are mapping to the second set of addresses.

Abstract: A processor memory is stress tested with a variable link stack depth using link stack test segments with non-naturally aligned data boundaries. Link stack test segments are interspersed into test code of a processor memory tests to change the link stack depth without changing results of the test code. The link stack test segments are the same structure as the segments of the test code and have non-naturally aligned boundaries. The link stack test segments include branch to target, push/pop, push and pop segments. The depth of the link stack is varied independent of the memory test code by changing the number to branches in the branch to target segment and varying the number of the push/pop segments.

Abstract: Embodiments disclose techniques for scheduling test cases without regeneration to verify and validate a computing system. In one embodiment, a testing engine generates a test case for a plurality of processors. Each test case includes streams of instructions. The testing engine also allocates at least one cache line associated with the streams of instructions of the generated test case such that each of the plurality of processors accesses different memory locations within the at least one cache line. The testing engine further schedules the generated test case for execution by the plurality of processors to achieve at least a first test coverage among the plurality of processors. The testing engine further re-schedules the generated test case for re-execution by the plurality of processors to achieve at least a second test coverage among the plurality of processors.

Abstract: Test cases for testing speculative execution of instructions are replicated into a memory with non-naturally aligned data boundaries to create a non-contiguous instruction stream to efficiently test a processor. Placing test cases with test code and test data in the non-naturally aligned data boundaries as described herein allows test code to test speculative execution of branches. The test case includes a branch with a hint bit set to cause the hardware to mispredict the path of the branch to cause speculative execution of test code, bad code or erroneously execute data. The processor can then be tested to see if it properly flushes the speculatively executed code upon taking the opposite branch of the mispredicted path.

Abstract: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

Abstract: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

Abstract: A circuit and method provide efficient stress testing of address translations in an integrated circuit such as a link processing unit. A random DMA mode (RDM) circuit provides a random input to index into a translation validation table (TVT) that is used to generate the real memory address. The RDM circuit allows testing all entries of the TVT, and thus all DMA modes, regardless of what bus agents are connected to the link processing unit. The RDM circuit may use a multiplexer to select between a runtime input and a random test input provided by the random bit generator. When the link processing unit is in a test mode a mode selection bit is asserted to select the random test input.

Abstract: A transactional memory test tests a transactional memory system on a computer processor. A test case with a transactional memory test is constructed such that the transactional memory test proceeds further in the transaction mode if the transaction is successful. In contrast, if there is a failure of the transaction, then the transactional memory test is executed in the non-transaction state. The transactional memory test stresses both transaction success and transaction failure cases of the processor for more efficient validation of the computer processor. Also, when checking the correctness of the test case the correct result remains the same whether the transaction passes or fails to simplify verification.

Abstract: Test code and test data is replicated into a memory cache with non-naturally aligned data boundaries to reduce the time needed to generate test cases for testing a processor. Placing test code and test data in the non-naturally aligned data boundaries as described herein allows test code and data to be replicated throughout a cache memory while preserving double word and quad word boundaries in segments of the replicated test code and test data. Coherency of the processor memory can be tested when the same cache line from the level two (L2) cache is simultaneously in both the level one (L1) instruction cache and the L1 data cache.