Abstract: A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circuit trace. The socket has a height and diameter for supporting a measurement probe in the housing while adding minimal inductance and capacitance to the measurement probe. A probe point contact is disposed in the bore of the socket for receiving a probe point disposed in the end of the measurement probe to secure the probe in the housing. Two surface mount probe point sockets may be joined together with an alignment gage and attached to adjacent circuit traces to produce a surface mount probe point socket system for differential measurement probes.

Abstract: A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lines to a signal source. Probe holders are mounted on the circuit boards to support measurement probes with the probing contacts of the measurement probes coupled to the signal launch contacts. Additional pairs of signal launch contacts may be provided with one pair receiving a positive signal from the signal source and another pair receiving a negative signal via equal length, electromagnetically coupled strip lines from the signal source for deskewing differential measurement probes.

Abstract: A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. The probing contact may be configured as a probing tip having a shaft that tapers at one end to a point and as a square pin adapter with a bore formed in the electrically conductive element that receives a spring contact. The probe tip adapter is useable with both single ended and differential measurement probes.

Abstract: A probe head holder for a measurement probe head has a probe head mount and a highly elastic, high hoop strength retention member that flexibly secures the measurement probe head to the probe head holder. The probe head mount has a first surface adapted to receive the measurement probe head and a second surface extending from the first surface having at least a first groove formed therein normal to the first surface. The retention member is positioned around the holder and the probe head with a portion of the retention member being disposed in the groove. The probe head holder may be attached to a probe arm of a probing station.

Abstract: A probe head holder for a measurement probe head has a probe head mount and a highly elastic, high hoop strength retention member that flexibly secures the measurement probe head to the probe head holder. The probe head mount has a first surface adapted to receive the measurement probe head and a second surface extending from the first surface having at least a first groove formed therein normal to the first surface. The retention member is positioned around the holder and the probe head with a portion of the retention member being disposed in the groove. The probe head holder may be attached to a probe arm of a probing station.

Abstract: A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lines to a signal source. Probe holders are mounted on the circuit boards to support measurement probes with the probing contacts of the measurement probes coupled to the signal launch contacts. Additional pairs of signal launch contacts may be provided with one pair receiving a positive signal from the signal source and another pair receiving a negative signal via equal length, electromagnetically coupled strip lines from the signal source for deskewing differential measurement probes.

Abstract: A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile strength, compression set, hardness, deflection force, elongation and percent recovery for repeatably securing the electrically conductive element to the probing tip of the measurement probe. An element holder is positionable on the measurement probe and has a cavity formed in one end for receiving the measurement probe. At least a first bore is formed in the other end of the element holder extending to the cavity and aligned with the probing tip of the measurement probe. The electrically conductive element is positioned in the holder bore such that the probing tip penetrates the elastomer and the probing contact extends from the holder.

Abstract: A probe adapter for coupling probe tip contacts of a electrical measurement probe to leads of a surface mounted integrated circuit IC device has an insulating housing from which extend first and second flexible electrically conductive leads having a pitch geometry compatible with the leads of the IC device. First and second electrical contacts, respectively coupled to the first and second flexible electrically conductive leads, are disposed in the housing and have a pitch geometry compatible with the probe tip contacts of the electrical measurement probe.