Abstract: An electrical connector including a main body, a base portion, and a tapered end. The electrical connector extends axially in a first direction and an opposite second direction. The main body is configured to connect to an electrical cable. The base portion abuts the main body at a first end of the base portion and has an outer shoulder at a second end of the base portion. The tapered end extends and tapers from the outer shoulder in the second direction. The tapered end includes a plurality of resilient fingers separated by slots. The fingers extend away from the base portion in the second direction to a distal end of the fingers. The slots extend radially through the tapered end. The slots further extend axially in the first direction from the distal end through the outer shoulder.

Abstract: An electrical connector including a main body, a base portion, and a tapered end. The electrical connector extends axially in a first direction and an opposite second direction. The main body is configured to connect to an electrical cable. The base portion abuts the main body at a first end of the base portion and has an outer shoulder at a second end of the base portion. The tapered end extends and tapers from the outer shoulder in the second direction. The tapered end includes a plurality of resilient fingers separated by slots. The fingers extend away from the base portion in the second direction to a distal end of the fingers. The slots extend radially through the tapered end. The slots further extend axially in the first direction from the distal end through the outer shoulder.

Abstract: A ground spring for receiving a ground end of a high-frequency test probe is described. The ground spring includes a generally annular base portion, and a number of elongated spring fingers extending from the base portion. The fingers extend generally radially inwardly from the base portion and have inner end faces that together define a substantially circular opening in a center portion of the ground spring. Each of the fingers have a tapered shape including a wider base portion end and a narrower inner end portion Each of the fingers has a longitudinal axis that is aslant relative to a reference line extending from the center of the ground spring to a center of the base portion of each finger. BMA connectors including the ground spring and test and measurement devices are also described.

Abstract: A ground spring for receiving a ground end of a high-frequency test probe is described. The ground spring includes a generally annular base portion, and a number of elongated spring fingers extending from the base portion. The fingers extend generally radially inwardly from the base portion and have inner end faces that together define a substantially circular opening in a center portion of the ground spring. Each of the fingers have a tapered shape including a wider base portion end and a narrower inner end portion Each of the fingers has a longitudinal axis that is aslant relative to a reference line extending from the center of the ground spring to a center of the base portion of each finger. BMA connectors including the ground spring and test and measurement devices are also described.

Abstract: A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).

Abstract: A high isolation RF switch for launching a selected one of two RF signals into a slabline transmission line structure has a three switch configuration—a pair of input switches coupled to corresponding input ports and a transition switch coupled to an output port via a slabline transmission line. The input switches select one of the input ports for coupling to the transition switch, and the transition switch couples the selected input port from the input switches to the output port. A grounded conductor is situated between the input ports in a cavity of a housing within which the high isolation RF switch is located to provide isolation between the input ports. Additional isolation between the input ports is provided by coupling the non-selected RF signal to ground, either by grounding the non-selected input to the transition switch or the non-selected input port.

Abstract: A high isolation RF switch for launching a selected one of two RF signals into a slabline transmission line structure has a three switch configuration—a pair of input switches coupled to corresponding input ports and a transition switch coupled to an output port via a slabline transmission line. The input switches select one of the input ports for coupling to the transition switch, and the transition switch couples the selected input port from the input switches to the output port. A grounded conductor is situated between the input ports in a cavity of a housing within which the high isolation RF switch is located to provide isolation between the input ports. Additional isolation between the input ports is provided by coupling the non-selected RF signal to ground, either by grounding the non-selected input to the transition switch or the non-selected input port.

Abstract: A attachable/detachable probing tip system has a housing that includes a probing tip mounting member and opposing substantially orthogonal attachment arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member. First and second probing tips are disposed over the non-compressive, resilient member and secured to the housing by latching means. The attachable/detachable probing tip system allows mounting of the probing tips to probing contacts on a device under test without a measurement probe being attached. The attachment arms allows a measurement probe to be attached and detached to the probing tip system.

Abstract: A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circuit trace. The socket has a height and diameter for supporting a measurement probe in the housing while adding minimal inductance and capacitance to the measurement probe. A probe point contact is disposed in the bore of the socket for receiving a probe point disposed in the end of the measurement probe to secure the probe in the housing. Two surface mount probe point sockets may be joined together with an alignment gage and attached to adjacent circuit traces to produce a surface mount probe point socket system for differential measurement probes.