Patents by Inventor Marc Vanden Bossche

Marc Vanden Bossche has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140167793
    Abstract: The present invention relates to a measurement system for characterising a device under test (DUT) wherein impedance is controlled or varied over a set of measurement conditions and a parameter or a set of parameters measured for each measurement condition. The measurement system comprises at least one impedance control device, signal separation hardware connected with the impedance control device, receiving means for measuring electrical quantities related to characteristics of the DUT and for converting the measured electrical quantities, a data processing unit connected to the receiving means and adapted to provide characteristics of the device under test based on the converted electrical quantities, whereby the at least one impedance control device is integrated into the signal separation hardware.
    Type: Application
    Filed: August 7, 2012
    Publication date: June 19, 2014
    Applicant: National Instruments Ireland Resources Limited
    Inventor: Marc Vanden Bossche
  • Publication number: 20140103946
    Abstract: An impedance control device for tuning a device under test comprising: a first terminal port arranged for connecting a device under test, a second terminal port arranged for connecting a termination, a first signal path for a signal travelling between the first and the second terminal port, first coupling means arranged for picking up a part of the signal travelling in the first signal path, a second signal path arranged for receiving the part of the signal from the first coupling means, said second signal path comprising a correction circuit for adapting as a function of frequency the amplitude and phase of the received part of the signal, second coupling means arranged for coupling back into the first signal path an adapted signal outputted by the correction circuit, and an attenuator and phase shifter for applying attenuation and phase shifting on the signals travelling between the first and the second terminal port.
    Type: Application
    Filed: October 14, 2013
    Publication date: April 17, 2014
    Applicant: National Instruments Ireland Resources Limited
    Inventor: Marc Vanden Bossche
  • Publication number: 20120082251
    Abstract: The present invention is related to a system (1) for determining a representation of a multi-tone signal (2) comprising a plurality of phase coherent tones, at least two of said phase coherent tones being modulated by a modulating signal, said system comprising an input (3) for applying the multi-tone signal (2), phase coherent mixing means (5) for demodulation in connection with data acquisition means (6) for digitization, said mixing means and data acquisition means arranged for being fed with the multi-tone signal and with a reference signal (8) comprising said phase coherent tones, each pair of phase coherent tones having a fixed phase difference, whereby the data acquisition means is arranged for being triggered by a trigger signal (4) for yielding a representation of said modulation signals with fixed delay, processing means (7) arranged for receiving digital signals output from the data acquisition means and for comparing phase information of a downconverted tone of the multi-tone signal after demodula
    Type: Application
    Filed: June 14, 2010
    Publication date: April 5, 2012
    Applicant: NMDG NV
    Inventor: Marc Vanden Bossche
  • Patent number: 7486067
    Abstract: A measurement system for determining at least one characteristic of a device under test (DUT) at at least one frequency is described. The measurement system includes a network analyzer being in connection at least with a first source via a first connector and a second source via a second connector. Each source generates a signal. The network analyzer further includes signal paths arranged for applying the generated signals to the DUT and arranged for receiving signals output by the DUT. The frequency content of the signal generated by the second source includes at least a frequency component offset from the at least one frequency at which the DUT is characterized, the at least one frequency being included in the frequency content of the signal generated by the first source.
    Type: Grant
    Filed: December 7, 2006
    Date of Patent: February 3, 2009
    Assignee: NMDG NV
    Inventor: Marc Vanden Bossche