Abstract: A device comprises a magnet and an angle sensor, wherein the angle sensor is configured to detect a rotation angle of the magnet. The device also contains a rotation counter, wherein the rotation counter is configured to record a number of rotations of the magnet. The angle sensor and the rotation counter are implemented in physically separate components.

Abstract: A device includes an analog main signal path and a digital control circuit. The digital control circuit determines and provides a digital control signal to the analog main signal path to reduce a gain error of the analog main signal path.

Abstract: An exemplary embodiment of a sensor system includes a magnet system which is designed to generate a magnetic field. Furthermore, the sensor system includes a first magnetic field sensor which is movable in a first direction relative to the magnet system and has a first distance from the magnet system in a second direction perpendicular to the first direction. The sensor system also includes a second magnetic field sensor which is movable in the first direction relative to the magnet system and has a second distance from the magnet system in the second direction, the second distance being greater than the first distance.

Abstract: The present disclosure relates to chopper amplifier circuits with inherent chopper ripple suppression. Example implementations can realize a doubly utilized chopper amplifier circuit that is a current-saving circuit with a wake-up function that is capable of providing a self-wake signal in order to change into a fast, low-jitter/low-latency mode, and to provide a wake-up signal for a sleeping microprocessor or a system in response to signal changes.

Abstract: The present disclosure relates to a magnetic field sensor circuit including at least one coil for measuring a magnetic field, a first stage amplifier circuit coupled to the coil and having a first transfer function with a pole at a first frequency, and a second stage amplifier circuit coupled to an output of the first stage amplifier circuit and having a second transfer function with a zero at the first frequency. In some embodiments, a temperature dependent frequency drift of the pole of the first transfer function corresponds to a temperature dependent frequency drift of the zero of the second transfer function.

Abstract: A stress sensor includes a semiconductor substrate with a first transistor arrangement and a second transistor arrangement. The first transistor arrangement includes a first transistor with a first source-drain channel region and a second transistor with a second source-drain channel region. The first transistor and the second transistor are aligned relative to each other such that the current flow directions in the first and the second source-drain channel regions are opposite to each other. The second transistor arrangement includes a third transistor with a third source-drain channel region and a fourth transistor with a fourth source-drain channel region. The third transistor and the fourth transistor are aligned relative to each other such that the current flow directions in the third and the fourth source-drain channel regions are opposite to each other. The stress sensor generates a gradient-compensated output signal used to determine a mechanical stress acting on the semiconductor substrate.

Abstract: A sensor device comprises an electrically conductive chip carrier, wherein the chip carrier comprises an auxiliary structure, wherein the auxiliary structure comprises a first precalibration current terminal and a second precalibration current terminal, a magnetic field sensor chip arranged on a mounting surface of the chip carrier, wherein the magnetic field sensor chip comprises a sensor element, wherein the shape of the auxiliary structure is embodied such that an electrical precalibration current flowing from the first precalibration current terminal to the second precalibration current terminal through the auxiliary structure induces a predefined precalibration magnetic field at the location of the sensor element, wherein during measurement operation of the precalibrated sensor device, no precalibration current flows between the first precalibration current terminal and the second precalibration current terminal.

Abstract: Sensor circuits having a filter and methods for filtering a sensor signal are provided. In this case, a passband width of an adjustable low-pass filter or bandpass filter is adjusted on the basis of a comparison of a measure of a signal change of a sensor signal with a threshold value.

Abstract: The present disclosure relates to chopper amplifier circuits featuring inherent chopper ripple suppression.

Abstract: Methods and apparatuses for comparing redundant signals in functional safe systems are provided, including methods for mitigating differing signal path delays and for signal weighting of the redundant signals are proposed. An Apparatus includes a first signal path for a first measurement signal of a physical quantity, the first signal path having a first signal propagation delay; a second signal path for a second measurement signal of the physical quantity, the second signal path having a second signal propagation delay different from the first signal propagation delay; a delay compensation circuit configured to compensate for a difference between the first and second signal propagation delays to generate delay-compensated first and second measurement signals; and comparison circuitry configured to compare the delay-compensated first and second measurement signals.

Abstract: Apparatuses and methods for analog-digital conversion and corresponding systems having a sensor and an apparatus of this type are provided. Demodulation is executed with no variable preamplification, followed by continuous-time analog-digital conversion, at least in time segments, which further employs chopper techniques.

Abstract: Devices and methods are provided where switches associated with a magnetic field sensor are used to provide error information. In particular, a device is provided that includes a magnetic field sensor, a plurality of switches associated with the magnetic field sensor, and a control circuit configured to control the plurality of switches and to provide at least one signal indicative of a fault based on operation of the switches.

Abstract: An integrated circuit has an oscillator circuit having an on-chip oscillator, a digital phase locked loop and a sensor. A frequency of an output signal from the oscillator circuit is adjustable. The digital phase locked loop receives the output signal from the oscillator circuit at an input and a synchronization signal based on an output signal from an external precision oscillator in the form of a crystal oscillator or MEMS oscillator at an external interface and generates a control signal in order to synchronize the frequency of the oscillator circuit with the frequency of the external crystal oscillator. The sensor is designed to measure at least one environmental parameter, wherein the digital phase locked loop is designed to take into account the at least one measured environmental parameter when generating the control signal.

Abstract: The present disclosure relates to circuits for detecting a line short circuit and/or a line interruption in a differentially operated line network, comprising at least one control circuit configured to control at least one common-mode signal of the differentially operated line network vis-à-vis a predefined common-mode signal variable and to indicate a line short circuit and/or a line interruption in the differentially operated line network if at least one control or controlled variable of the control circuit exceeds a predefined threshold value.

Abstract: The subject matter described herein relates to a semiconductor circuit arrangement with a semiconductor substrate with an integrated Hall sensor circuit. During a first clock phase PHspin1 a first electrical voltage signal ±VHallout(PHspin1) or ±VHallbias(PHspin1) can be generated in the Hall effect region that has a first dependency on a mechanical stress of the semiconductor substrate. During a second clock phase PHspin2 a second electrical voltage signal ±VHallout(PHspin2) or ±VHallbias(PHspin2) can be generated in the Hall effect region that has a second dependency on a mechanical stress of the semiconductor substrate. The semiconductor circuit arrangement is designed to ascertain a specific mechanical stress component based on a combination of the first electrical voltage signal +VHallout(PHspin1) or ±VHallbias(PHspin1) and of the second electrical voltage signal ±VHallout(PHspin2) or ±VHallbias(PHspin2).

Abstract: Systems and methods are provided for which a chopper modulator and a chopper demodulator of a chopped apparatus having a variable chopper frequency are described. A feedback path is used to reduce ripples and/or remaining offsets as a result of the variable chopper frequency.

Abstract: Methods and apparatuses are provided, in which a magnetic field is measured using a coil in a first operating mode and a magnetic field is generated using the coil in a second operating mode in order to test a further magnetic field sensor.

Abstract: A device includes a sensor configured to output an analog sensor signal, an analog-to-digital converter circuit configured to convert the analog sensor signal into a sigma-delta-modulated digital signal having a bit width of n bits, and a pulse width modulator configured to generate a pulse-width-modulated signal based on the sigma-delta-modulated digital signal.

Abstract: An integrated circuit includes a first bandgap voltage reference sub-circuit configured to provide a first bandgap reference voltage; a second bandgap voltage reference sub-circuit configured to provide a second bandgap reference voltage; a voltage regulator sub-circuit configured to derive a first supply voltage using the first bandgap reference voltage and a second supply voltage using the second bandgap reference voltage; a bandgap comparator sub-circuit configured to derive a first internal voltage and a second internal voltage from the first supply voltage, wherein the first internal voltage decreases at a higher rate than the second internal voltage with respect to a decreasing first supply voltage, wherein the bandgap comparator sub-circuit is configured indicate which of the first and the second internal voltages is larger; and a comparator sub-circuit configured to indicate whether a difference between the first supply voltage and the second supply voltage is larger than a predefined threshold.

Abstract: Signal processing circuit for a Hall sensor and signal processing method. Signal processing circuits for four-phase spinning Hall magnetic field sensors, corresponding methods and corresponding magnetic field sensor apparatuses are provided. In this case, a correction signal (c) is generated on the basis of a first feedback signal (fb1) and a second feedback signal (fb2), wherein the first feedback signal (fb1) is provided with a shorter signal propagation time than the second feedback signal (fb2).