Abstract: A structure for supporting a wire includes a first portion extending along a first axis. The first portion includes a body portion and an alignment portion. The alignment portion defines a first alignment opening through which the alignment portion receives a fastener. The first alignment opening extends between a first side and a second side. The first side has a first surface portion and a second surface portion. The first surface portion is separated a first distance from the first axis. The second surface portion is separated a second distance from the first axis. The first distance is different than the second distance. The structure includes a second portion defining a second alignment opening through which the second portion receives the fastener. The second portion is spaced a distance from the body portion to define a wire opening into which the wire is received for support by the structure.

Abstract: A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first region having a first functional element, partitioning each of the integrated circuit device samples into at least one second region having at least one second functional element, applying a first stress condition to the first region having the first element, applying a second stress condition to the at least one second region having the at least one second element, determining a first portion of the integrated circuit device samples that functionally failed based on the first stress condition, and determining a second portion of the integrated circuit device samples that functionally failed based on the second stress condition. An acceleration model parameter is derived based on the determining of the first and second portion of the integrated circuit samples that functionally failed.

Abstract: A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first region having a first functional element, partitioning each of the integrated circuit device samples into at least one second region having at least one second functional element, applying a first stress condition to the first region having the first element, applying a second stress condition to the at least one second region having the at least one second element, determining a first portion of the integrated circuit device samples that functionally failed based on the first stress condition, and determining a second portion of the integrated circuit device samples that functionally failed based on the second stress condition. An acceleration model parameter is derived based on the determining of the first and second portion of the integrated circuit samples that functionally failed.

Abstract: A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first region having a first functional element, partitioning each of the integrated circuit device samples into at least one second region having at least one second functional element, applying a first stress condition to the first region having the first element, applying a second stress condition to the at least one second region having the at least one second element, determining a first portion of the integrated circuit device samples that functionally failed based on the first stress condition, and determining a second portion of the integrated circuit device samples that functionally failed based on the second stress condition. An acceleration model parameter is derived based on the determining of the first and second portion of the integrated circuit samples that functionally failed.

Abstract: A multi-functional sensor assembly includes an electrically non-conductive substrate defining at least a distal region, intermediary region, and proximal region that are each covered with electrically conductive traces. The proximal region is configured to be exposed to a media to be sensed and the distal and intermediary regions are configured to be protected from the media. The electrically conductive traces comprise at least electrical circuits to sense temperature and flow of the media and one or more electrodes to sense one or more of conductivity, oxidation reduction potential (ORP), and acidity (pH) of the media.

Abstract: A client system of a network resource service, the network resource service administering a plurality of distributed network resources, the client system comprising: a computer processor for executing stored instructions to: receive over a proximity based wireless communication a network resource identifier of a network resource of the plurality of network resources and a service identifier of the network resource service, the service identifier defining a network address of the network resource service on a communications network configured for non-proximity based communication; and transmit application data to the network resource addressed to the network address on the communications network for subsequent processing by the network resource.

Abstract: A microactuator may be configured by activating a source of electromagnetic radiation to heat and melt a selected set of phase-change plugs embedded in a substrate of the microactuator, pressurizing a common pressure chamber adjacent to each of the plugs to deform the melted plugs, and deactivating the source of electromagnetic radiation to cool and solidify the melted plugs.

Abstract: A network resource access system for providing access by a user to network resources over a communications network, the system comprising: a resource registry including stored resource records associated with each of the network resources and a stored user profile containing a list of network resources such that the network resources have a ranking relative to each other based at least in part on user behaviour with respect to usage of each of the network resources, the user profile associated with the user such that the list of network resources contains the network resources previously accessed by the user; and a resource service for receiving an access query from a network terminal identifying the user and associated with submission of application data for processing by a selected network resource from the list, the resource service further configured for accessing the user profile to identify a suggested network resource from the list in view of the relative ranking and for sending identification of the s

Abstract: A method for applying stress conditions to integrated circuit device samples during accelerated stress testing may include partitioning each of the integrated circuit device samples into a first region having a first functional element, partitioning each of the integrated circuit device samples into at least one second region having at least one second functional element, applying a first stress condition to the first region having the first element, applying a second stress condition to the at least one second region having the at least one second element, determining a first portion of the integrated circuit device samples that functionally failed based on the first stress condition, and determining a second portion of the integrated circuit device samples that functionally failed based on the second stress condition. An acceleration model parameter is derived based on the determining of the first and second portion of the integrated circuit samples that functionally failed.

Abstract: A client system of a network resource service, the network resource service administering a plurality of distributed network resources, the client system comprising: a computer processor for executing stored instructions to: receive over a proximity based wireless communication a network resource identifier of a network resource of the plurality of network resources and a service identifier of the network resource service, the service identifier defining a network address of the network resource service on a communications network configured for non-proximity based communication; and transmit application data to the network resource addressed to the network address on the communications network for subsequent processing by the network resource.

Abstract: The disclosure provides a label-free viscosity-based analyte detection system using paramagnetic beads as an asynchronous magnetic bead rotation (AMBR) microviscometer. It is disclosed herein that the bead rotation period is linearly proportional to the viscosity of a solution comprising analytes surrounding the paramagnetic bead. Optical measurement of asynchronous microbead motion determines solution viscosity precisely in microscale volumes, thus allowing an estimate of analyte concentration. The results demonstrate the feasibility of viscosity-based analyte detection using AMBR in microscale aqueous volumes.

Abstract: The movement and mixing of microdroplets through microchannels is described employing microscale devices, comprising microdroplet transport channels, reaction regions, electrophoresis modules, and radiation detectors. Microdroplets are metered into defined volumes and are subsequently incorporated into a variety of biological assays. Electronic components are fabricated on the same substrate material, allowing sensors and controlling circuitry to be incorporated in the same device.

Abstract: A structure for supporting a wire includes a first portion extending along a first axis. The first portion includes a body portion and an alignment portion. The alignment portion defines a first alignment opening through which the alignment portion receives a fastener. The first alignment opening extends between a first side and a second side. The first side has a first surface portion and a second surface portion. The first surface portion is separated a first distance from the first axis. The second surface portion is separated a second distance from the first axis. The first distance is different than the second distance. The structure includes a second portion defining a second alignment opening through which the second portion receives the fastener. The second portion is spaced a distance from the body portion to define a wire opening into which the wire is received for support by the structure.

Abstract: A cover apparatus can cover an electrical insulator and an electrical conductor. The cover apparatus includes one or more leg sections for covering a portion of the electrical conductor. The cover apparatus includes a cover section coupled to the one or more leg sections and covering a portion of the electrical insulator. The cover section includes a body portion and an adjustable portion coupled to the body portion at a coupling location. The adjustable portion can be adjusted such that a dimension of the adjustable portion is adjusted according to a dimension of the electrical insulator. An example method of forming a cover apparatus for covering an electrical insulator and an electrical conductor is also provided.

Abstract: A cover apparatus is provided for covering an electrical insulator and a conductor. The cover apparatus includes a first cover portion extending along a first axis. The first cover portion includes a first segment covering a first portion of the electrical insulator and a second segment coupled to the first segment and covering a first portion of the conductor. The cover apparatus includes a second cover portion extending along a second axis. The second cover portion includes a third segment movably attached to the first segment and a fourth segment coupled to the third segment and covering a portion of the conductor. An example method of forming a cover apparatus for covering an electrical insulator and a conductor is also provided.

Abstract: A cover apparatus can cover an electrical insulator and an electrical conductor. The cover apparatus includes a leg section that covers a portion of the electrical conductor. A cover section covers a portion of the electrical insulator. The cover section can include a body portion that is coupled to the leg section at a first coupling location. The cover section includes an adjustable portion coupled to the body portion at a second coupling location located on an opposite side of the body portion relative to the first coupling location. The adjustable portion can be adjusted such that a dimension of the adjustable portion is adjusted according to a dimension of the electrical insulator. A method of forming a cover apparatus for covering an electrical insulator and an electrical conductor is also provided.

Abstract: A cover apparatus can cover an electrical insulator and an electrical conductor. The cover apparatus includes one or more leg sections for covering a portion of the electrical conductor. The cover apparatus includes a cover section coupled to the one or more leg sections and covering a portion of the electrical insulator. The cover section includes a body portion and an adjustable portion coupled to the body portion at a coupling location. The adjustable portion can be adjusted such that a dimension of the adjustable portion is adjusted according to a dimension of the electrical insulator. An example method of forming a cover apparatus for covering an electrical insulator and an electrical conductor is also provided.

Abstract: A cover apparatus can cover an electrical insulator and an electrical conductor. The cover apparatus includes a leg section that covers a portion of the electrical conductor. A cover section covers a portion of the electrical insulator. The cover section can include a body portion that is coupled to the leg section at a first coupling location. The cover section includes an adjustable portion coupled to the body portion at a second coupling location located on an opposite side of the body portion relative to the first coupling location. The adjustable portion can be adjusted such that a dimension of the adjustable portion is adjusted according to a dimension of the electrical insulator. A method of forming a cover apparatus for covering an electrical insulator and an electrical conductor is also provided.

Abstract: A cover apparatus is provided for covering an electrical insulator and a conductor. The cover apparatus includes a first cover portion extending along a first axis. The first cover portion comprises a first segment covering a first portion of the electrical insulator and a second segment coupled to the first segment and covering a first portion of the conductor. The cover apparatus includes a second cover portion extending along a second axis. The second cover portion comprises a third segment movably attached to the first segment and a fourth segment coupled to the third segment and covering a portion of the conductor. An example method of forming a cover apparatus for covering an electrical insulator and a conductor is also provided.

Abstract: A high capacity, continuous production blast freezer includes an insulated enclosure, a refrigeration system supplying cold air to the enclosure and a plurality of trays containing comestibles to be frozen. A tray advancement or pusher mechanism advances a first tray into the enclosure and then advances a second tray into the enclosure, pushing the first tray further into the enclosure. Gradually a first level of the enclosure is filled with trays. An elevator mechanism at both ends of the enclosure allows the trays reaching the end of the enclosure to advance to a second level, and the tray advancement mechanism advances the tray out of the elevator onto the second level. Eventually, as additional trays are pushed into the enclosure, the second level and then optionally further levels of the enclosure are filled with trays.