Patents by Inventor Martijn Krans

Martijn Krans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100115683
    Abstract: The present invention relates to a signage system (10) comprising: a plurality of textile products (12) each comprising a flexible display device (16). For controlling the displays (16), the system further comprises a central unit (14, 24) adapted to emit at least one control signal, each of which being a sound signal or a light signal. To this end, each textile product further comprises means (20, 26) for detecting the control signal(s) emitted by the central unit (14, 24), and means (18) linked to the detection means (20, 26) and display (16) for controlling the display (16) in accordance with the detected control signal(s). The present invention also relates to a method, central units and uses of such for controlling a plurality of flexible display devices each comprised in a textile product.
    Type: Application
    Filed: February 5, 2008
    Publication date: May 13, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Martijn Krans, Anthonie Hendrik Bergman, Bartel Marinus Van De Sluis, Erich Zainzinger, Wouter Bastiaan Zeper, Guido Theo Maria Lamerichs, Thomas Schuler
  • Patent number: 7682034
    Abstract: A light-source comprising at least one lighting unit (101) being arranged on a substrate (102) and a diffusing element (103) being arranged to receive and diffuse light emitted by said at least one lighting unit (101) is provided. The diffusing element (103) comprises a layer of non-woven fabric having a lower density at a side facing the lighting unit and a higher density at a side opposite to the lighting unit to obtain good diffusing properties.
    Type: Grant
    Filed: May 23, 2006
    Date of Patent: March 23, 2010
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Sima Asvadi, Martijn Krans, Michel Paul Barbara Van Bruggen, Johannes Theodorus Adriaan Wilderbeek, Jacob Marinus Jan Den Toonder
  • Publication number: 20100050488
    Abstract: The present invention relates to a signage system (10) comprising a plurality of textile products (12), wherein each textile product comprises a flexible display device (14) adapted to show a display content forming part of a unified message. The system is characterized in that each flexible display device (14) further is adapted to show an indication of the position of the display content of the flexible display device in relation to the display contents of the other flexible display devices in the unified message, before showing the display content. The present invention also relates to a method for presenting a unified message by means of a plurality of flexible display devices (14) each comprised in a textile product (12).
    Type: Application
    Filed: February 5, 2008
    Publication date: March 4, 2010
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Martijn Krans, Anthonie Hendrik Bergman, Bartel Marinus Van De Sluis, Erich Zainzinger, Wouter Bastiaan Zeper, Guido Theo Maria Lamerichs, Thomas Schuler
  • Publication number: 20090174325
    Abstract: The present invention relates to a pixelated electroluminescent textile, comprising a first set of spaced apart conductive lines extending in a first direction, a second set of spaced apart conductive lines extending in a second direction, the second direction being non-parallel to the first direction, the sets of conducting lines forming a matrix structure, and at least one light emitting element. The at least one light emitting element comprises two interleaving comb electrodes arranged in one plane, and light emitting means arranged in spaces between digits of the comb electrodes, wherein the light emitting element is arranged in an area formed between two adjacent conductive lines in the first set and two adjacent conductive lines in the second set, wherein each of the comb electrodes connects to at least one yarn of the first and the second set, respectively, so that when applying a driving voltage to the at least one yarn in the first and second sets, said light emitting means is excited to emit light.
    Type: Application
    Filed: June 14, 2007
    Publication date: July 9, 2009
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Michel Paul Barbara Van Bruggen, Martijn Krans, Adrianus Sempel, Sima Asvadi
  • Publication number: 20080316580
    Abstract: A fibre (10) comprises an inner conductor (12), a volume (14) of electro-optic material (16), an external conductor (20), with a photoconductor (18) between the inner conductor and an external conductor. The volume of electro-optic material comprises capsules of electrophoretic, black and white charged particles (24, 26), the black particles having an opposite charge to the white particles. The components of the fibre are flexible, such that the fibre is suitable for use in a flexible display device.
    Type: Application
    Filed: September 9, 2005
    Publication date: December 25, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Murray Gillies, Lucas J.M. Schlangen, Edzer Huitema, Martijn Krans
  • Publication number: 20080317408
    Abstract: A fibre or filament comprising an electro-optically active layer; a first electrode; a second electrode; the electro-optically active layer being positioned at least partially between the first and second electrodes; the fibre or filament further comprising control means for controllably varying the optical state of a predetermined region of the fibre or filament, such that the length of the predetermined region may be controlled.
    Type: Application
    Filed: September 15, 2005
    Publication date: December 25, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Alwin R.M. Verschueren, Martijn Krans, Sander J. Roosendaal
  • Publication number: 20080266112
    Abstract: A communication device (100) includes a tactile sensor (120) configured to receive tactile input including a traced shape, a predefined shape or a constricting pressure, which is classified or characterized as a hug when covering a large area of the tactile sensor, such as forces directed toward each other applied on opposing surfaces of the tactile sensor (120). A controller (110) is configured to categorize the tactile input in accordance with presets, e.g., stored in a memory (130) of the communication device (100). The controller (110) is further configured to output a transmit signal including a characterization of the tactile input in accordance with the presets. A renderer (140) is configured to provide an illuminating pattern associated with the characterization and/or the tactile input, which may be a symbol, icon, word and drawing, where additionally the characterization may be a hug.
    Type: Application
    Filed: December 12, 2006
    Publication date: October 30, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Bartel Marinus van de Sluis, Martijn Krans
  • Publication number: 20080218369
    Abstract: The present invention relates to a flexible display device (10) comprising a flexible substrate (12), and a plurality of electro-optical switching elements (14) accommodated on the substrate. The device is characterized in that the substrate has a plurality of through openings (16) being arranged in a repetitive pattern so that the electro-optical switching elements are located in areas of the substrate adjacent to the openings. The through openings allow for bending the display device in two directions simultaneously, with reduced tensile or compressive stress in the plane of the substrate.
    Type: Application
    Filed: May 22, 2006
    Publication date: September 11, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Martijn Krans, Murray Fulton Gillies, Edzer Huitema, Sima Asvadi, Albert Hendrik Jan Immink, Johannes Theodorus Adriaan Wilderbeek, Alexander Ulrich Douglas, Jacqueline Van Driel, Eduard Josephus Hultermans, Michel Paul Barbara Van Bruggen
  • Publication number: 20080205035
    Abstract: A light-source comprising at least one lighting unit (101) being arranged on a substrate (102) and a diffusing element (103) being arranged to receive and diffuse light emitted by said at least one lighting unit (101) is provided. The diffusing element (103) comprises a layer of non-woven fabric having a lower density at a side facing the lighting unit and a higher density at a side opposite to the lighting unit to obtain good diffusing properties.
    Type: Application
    Filed: May 23, 2006
    Publication date: August 28, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Sima Asvadi, Martijn Krans, Michel Paul Barbara Van Bruggen, Johannes Theodorus Adriaan Wilderbeek, Jacob Marinus Jan Den Toonder
  • Publication number: 20080200085
    Abstract: A textile or fabric (2) comprising a first light emitting component (4) and a second pressure sensitive component (6), wherein the first component comprises an output device adapted to emit an output signal that is dependent on a parameter of an applied pressure applied to the second component via the first component.
    Type: Application
    Filed: May 30, 2006
    Publication date: August 21, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Michel P.B. Van Bruggen, Albert H.J. Immink, Martijn Krans
  • Publication number: 20080196783
    Abstract: A textile is formed from interwoven electrically conductive and non-conductive yarns to provide an array of connection points on one or both surfaces of the textile, facilitating the connection of electronic components to the surface of the textile, in an array. The textile comprises a multi-layer warp having electrically conductive and non-conductive yarns and a weft having electrically conductive and non-conductive yarns. At least some of the electrically conductive weft yarns cross selected electrically conductive warp yarns without electrical contact therebetween by being separated from the electrically conductive warp yarns by at least one non-conductive warp yarn in each layer of the multi-layer warp. Loops formed by the electrically conductive weft yarns provide electrical connection points together with proximal portions of electrically conductive warp yarns.
    Type: Application
    Filed: May 30, 2006
    Publication date: August 21, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Michel P.B. Van Bruggen, Martijn Krans, Sima Asvadi, Johannes T.A. Wilderbeek
  • Publication number: 20080171914
    Abstract: A device (1) for determining a stress related condition of a person and providing feedback about this condition comprises body sensors (20) for detecting stress related body parameters, a stress assessing element (40), and a feedback device, wherein the stress assessing element (40) is designed for processing input provided by the body sensors (20) and for determining control parameters for controlling the feedback device, on the basis of the input provided by the body sensors (20). The body sensors (20) are integrated in a textile structure, so that the tested person does not sense the sensors (20), as a result of which there is no chance that the test results get influenced by an interaction between the device (1) and the person.
    Type: Application
    Filed: February 3, 2006
    Publication date: July 17, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Martin Ouwerkerk, Martijn Krans
  • Publication number: 20070275620
    Abstract: An electro-optic fibre (4) or filament comprising: a first electrode (6); a second electrode (8); and an electro-optically active material (10) positioned at least partially between the first and second electrodes, the second electrode comprising a plurality of spaced apart segments (12) each segment having a length that is no more than a maximum length, and no less than a minimum length, extending at least partially along the length of the fibre or filament.
    Type: Application
    Filed: September 13, 2005
    Publication date: November 29, 2007
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
    Inventors: Jacob Den Toonder, Johannes Wilderbeek, Martijn Krans, Michel Van Bruggen
  • Patent number: 6693278
    Abstract: In the production of semiconductors it is necessary to inspect circuit patterns on wafers. In circuits having very small details (for example, 40 nm), inspection can be carried out by means of electron beam columns, a plurality of wafers then being inspected at the same time and the signals being compared on-line. In an inspection apparatus in accordance with the invention more beam columns 1 to 7 are provided for every wafer A, B, C in order to obtain a high feed-through rate. The inspection is carried out by way of an x-y scan and the wafers are fed through according to a rectilinear movement, thus providing the possibility of scanning only the Care Area Fraction of the wafers, resulting in a high feed-through rate for the wafers in the inspection apparatus.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: February 17, 2004
    Assignee: FEI Company
    Inventors: Diederik Jan Maas, Jan Martijn Krans
  • Patent number: 6646261
    Abstract: The invention relates to wafer inspection by means of a scanning electron microscope (SEM) column in which the secondary electron detector 22, 24 is positioned centrally above the objective lens of the column. Secondary electrons that leave the central part of the specimen in a direction substantially perpendicular to its surface are inevitably collected in the central part of the detector surface where the bore 36 for the primary beam 6 is situated. Consequently, such electrons do not contribute to the detector signal. In order to avoid such a detrimental loss of signal contribution, it is proposed to provide a central electrode 35 in the central bore 36 such that secondary electrons that approach the bore are driven aside towards the electron-sensitive detector region 48.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: November 11, 2003
    Inventor: Jan Martijn Krans
  • Patent number: 6593584
    Abstract: Multi-beam lithography apparatus is used for writing patterns on a substrate 14 such as a wafer for ICs. The patterns may have details of various dimensions. In order to enhance the production rate, it is attractive to write fine details with a small spot 16 and large details with a large spot. It is known to vary the spot size by varying the emissive surface of the electron source. In accordance with the invention the spot size is varied by varying the size 22 of the beam limiting aperture 20, thus enabling optimization of the beam current in dependence on the spot size. A preferred embodiment is provided with an additional (condenser) lens 24 such that the object distance remains constant when the magnification of the lens system 18, 24 is varied.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: July 15, 2003
    Assignee: FEI Company
    Inventors: Jan Martijn Krans, Peter Christiaan Tiemeijer
  • Publication number: 20020125428
    Abstract: The invention relates to wafer inspection by means of a scanning electron microscope (SEM) column in which the secondary electron detector 22, 24 is positioned centrally above the objective lens of the column. Secondary electrons that leave the central part of the specimen in a direction substantially perpendicular to its surface are inevitably collected in the central part of the detector surface where the bore 36 for the primary beam 6 is situated. Consequently, such electrons do not contribute to the detector signal. In order to avoid such a detrimental loss of signal contribution, it is proposed to provide a central electrode 35 in the central bore 36 such that secondary electrons that approach the bore are driven aside towards the electron-sensitive detector region 48.
    Type: Application
    Filed: December 20, 2001
    Publication date: September 12, 2002
    Inventor: Jan Martijn Krans
  • Publication number: 20020109089
    Abstract: A SEM with an electrostatic objective lens 14, 16 and a detector 6, 8 for through-the-lens detection of secondary electrons (SEs) 24. A suitable collection efficiency of the SEs would require a comparatively high electric field near the surface of the specimen 18, whereas suitable voltage contrast (voltage range of the order of from 1 to 5 V) would require a moderate electric field near the surface of the specimen. In accordance with the invention an adjustable voltage source is provided in order to adjust at will the voltage of the final electrode 16 relative to the specimen, such that the voltage contrast and the collection efficiency can be adjusted to an optimum value in conformity with the measurement requirements.
    Type: Application
    Filed: October 26, 2001
    Publication date: August 15, 2002
    Inventors: Jan Martijn Krans, Sander Gijsbert Den Hartog, Marcellinus Petrus Carolus Michael Krijn
  • Publication number: 20020079449
    Abstract: The invention relates to a SEM with an electrostatic objective lens 14, 16 and a detector 6, 8 for through-the-lens detection of electrons 24. In accordance with the invention a voltage contrast (voltage range of the order of magnitude of from 1 to 10 V) is achieved by subdividing this detector surface 9 into separate regions, preferably concentric annular regions 36 and 38, and by electronically combining the signals from these regions.
    Type: Application
    Filed: December 6, 2001
    Publication date: June 27, 2002
    Inventors: Marcellinus Petrus Carolus Michael Krijn, Jan Martijn Krans
  • Publication number: 20020079447
    Abstract: In the production of semiconductors it is necessary to inspect circuit patterns on wafers. In circuits having very small details (for example, 40 nm), inspection can be carried out by means of electron beam columns, a plurality of wafers then being inspected at the same time and the signals being compared on-line. In an inspection apparatus in accordance with the invention more beam columns 1 to 7 are provided for every wafer A, B, C in order to obtain a high feed-through rate. The inspection is carried out by way of an x-y scan and the wafers are fed through according to a rectilinear movement, thus providing the possibility of scanning only the Care Area Fraction of the wafers, resulting in a high feed-through rate for the wafers in the inspection apparatus.
    Type: Application
    Filed: December 20, 2001
    Publication date: June 27, 2002
    Inventors: Diederik Jan Maas, Jan Martijn Krans