Abstract: The present invention is directed to the use of a messaging component for sharing a common network communication channel by a plurality of threads of execution. The messaging component receiving a message and forwarding the message to one or more of the threads using information in a payload portion of the message, which is compared with supplied registration information. In addition, according to the present invention, messaging and job components may be used by each of a plurality of execution threads to negotiate a manner of transferring data between two network computers, wherein the job component proposes a manner of transfer, which is communicated using the messaging component to a receiving a computer. The proposed manner of transfer may be accepted or rejected by the receiving computer. An alternative manner of transfer may be proposed, where another manner of transfer is found to be unacceptable.

Abstract: A system for testing an integrated circuit on a semiconductor wafer so as to achieve low probe needle contact resistance with low probe needle force and without substantial scrubbing includes a probe and supporting a plurality of probe needles electrically coupled to an electrical test system above and in alignment with a plurality of contact pads of the integrated circuit, respectively. The wafer is mechanically moved to press probe needles to bring a tip of each probe needle into physical contact with a corresponding contact pad, and is further moved to increase a needle force of each tip against the corresponding contact pad and cause flexing of a curved portion of each probe needle. Each probe needle is curved such that the flexing causes the tip of each probe needle to rock without appreciable sliding on the surface of the contact pad.