Abstract: A measurement input circuit for a measurement device for measuring an electric signal in a device under test comprises a signal input that receives the electronic signal from the device under test and provides the received electronic signal at a signal node, a direct signal coupling path that is coupled between the signal node an electrical ground and comprises a first impedance value, an alternating signal coupling path that is coupled between the signal node and the electrical ground, and comprises a second impedance value that is lower than the first impedance value, and a signal output that is coupled to the signal node and outputs the received electronic signal.

Abstract: The present disclosure provides a probe extension system that allows extending the distance between a measurement device and a measurement probe. The probe extension system comprises a first releasable adaptor comprising a device-side electromechanical interface that is releasably couplable to a measurement interface of the measurement device, and a first cable-side electromechanical interface that is releasably couplable to an extension cable harness and that is in the first releasable adaptor electrically coupled to the device-side electromechanical interface, and a second releasable adaptor comprising a second cable-side electromechanical interface that is releasably couplable to the extension cable harness, and a probe-side electromechanical interface that is releasably couplable to the measurement probe and that is in the second releasable adaptor electrically coupled to the second cable-side electromechanical interface.

Abstract: The present disclosure provides an analog-to-digital converter system comprising a sampler configured to sample an input signal and provide at least two output signals with a predetermined output sample rate, and an analog-to-digital converter for each one of the output signals and configured to convert the respective output signal into a digital signal with a predetermined converter sample rate, wherein the converter sample rate is higher than the output sample rate. Further, the present disclosure provides a respective method.

Abstract: A radio frequency connector for establishing a radio frequency connection with a radio frequency device is described. The radio frequency connector includes a radio frequency connection interface, an interchangeable radio frequency adapter and a positioning member. The interchangeable radio frequency adapter is detachably attached with the radio frequency connection interface such that the interchangeable radio frequency adapter is configured to be detached from the radio frequency connection interface in a disassembled state of the radio frequency connector. The positioning member is configured to position the interchangeable radio frequency adapter with respect to the radio frequency connection interface in an assembled state of the radio frequency connector.

Abstract: The present disclosure provides a probe extension system that allows extending the distance between a measurement device and a measurement probe. The probe extension system comprises a first releasable adaptor comprising a device-side electromechanical interface that is releasably couplable to a measurement interface of the measurement device, and a first cable-side electromechanical interface that is releasably couplable to an extension cable harness and that is in the first releasable adaptor electrically coupled to the device-side electromechanical interface, and a second releasable adaptor comprising a second cable-side electromechanical interface that is releasably couplable to the extension cable harness, and a probe-side electromechanical interface that is releasably couplable to the measurement probe and that is in the second releasable adaptor electrically coupled to the second cable-side electromechanical interface.

Abstract: A measurement input circuit for a measurement device for measuring an electric signal in a device under test comprises a signal input that receives the electronic signal from the device under test and provides the received electronic signal at a signal node, a direct signal coupling path that is coupled between the signal node an electrical ground and comprises a first impedance value, an alternating signal coupling path that is coupled between the signal node and the electrical ground , and comprises a second impedance value that is lower than the first impedance value, and a signal output that is coupled to the signal node and outputs the received electronic signal.

Abstract: An adapter for a current probe is described, said adapter being configured to be connected with said current probe. Said adapter enables a voltage measurement by using said adapter and said current probe. Said adapter comprises a current loop and at least one transconductance unit. Said transconductance unit transforms the voltage to be measured into a current wherein the current obtained is forwarded by said current loop. Further, a testing system is described.

Abstract: A measurement input circuit for a measurement device for measuring an electric signal in a device under test comprises a signal input that receives the electronic signal from the device under test and provides the received electronic signal at a signal node, a direct signal coupling path that is coupled between the signal node an electrical ground and comprises a first impedance value, an alternating signal coupling path that is coupled between the signal node and the electrical ground, and comprises a second impedance value that is lower than the first impedance value, and a signal output that is coupled to the signal node and outputs the received electronic signal.

Abstract: A radio frequency connector for establishing a radio frequency connection with a radio frequency device is described. The radio frequency connector includes a radio frequency connection interface, an interchangeable radio frequency adapter and a positioning member. The interchangeable radio frequency adapter is detachably attached with the radio frequency connection interface such that the interchangeable radio frequency adapter is configured to be detached from the radio frequency connection interface in a disassembled state of the radio frequency connector. The positioning member is configured to position the interchangeable radio frequency adapter with respect to the radio frequency connection interface in an assembled state of the radio frequency connector.

Abstract: The present invention provides an electrically isolated acquisition of a measurement signal by means of a measurement probe. For this purpose, a probe arrangement is provided with a probe head for electrically measuring a signal. The probe head is coupled to a probe coupler via optical links. In particular, optical links are used for power supply of the probe head and for forwarding optical signals corresponding to the measured electrical signal.

Abstract: A dynamic probe for probing a dynamic data signal comprising a switching unit configured to provide at least two different input impedances, wherein the switching unit is configured to select a first input impedance in a first mode and a second input impedance in a second mode, the switching unit being configured to be operated dynamically based on an event in the data signal processed. Further, a dynamic measurement system and a method for probing a dynamic data signal are described.

Abstract: A probe for measurements on a device under test with low source impedance is described. The probe has a resistor coupled in series between a probe tip and a probe cable connected to a measuring apparatus. The resistor having an impedance equal to a characteristic impedance of the probe cable or equal to the difference between the characteristic impedance of the probe cable and an output resistance of the device under test. Further, a measuring system and a test setup are described.

Abstract: The present invention provides an electrically isolated acquisition of a measurement signal by means of a measurement probe. For this purpose, a probe arrangement is provided with a probe head for electrically measuring a signal. The probe head is coupled to a probe coupler via optical links. In particular, optical links are used for power supply of the probe head and for forwarding optical signals corresponding to the measured electrical signal.

Abstract: A dynamic measuring system is described that comprises a measuring device. The measuring system has an acquisition unit and a post processing unit that is configured to post process the digital signal. The post processing unit has at least one signal correction filter being configured to be operated in at least two different modes for processing the digital signal. The signal correction filter has at least a first signal correction filter setting being used in a first mode and a second signal correction filter setting being used in a second mode. In addition, the measuring system has a switching unit that is configured to select the first mode or the second mode, the switching unit being configured to be operated dynamically based on an event in the data signal. The signal correction filter comprises time variable coefficients. Further, a method for probing a dynamic data signal is also described.

Abstract: Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Abstract: A measurement equipment configured to be connected to a measurement device and an HF coaxial connection element and a torque limiter. The torque limiter is configured for connecting the HF coaxial connection element with the measurement device with a predetermined torque. Furthermore, the invention provides an HF coaxial connection element configured to be connected to a corresponding HF coaxial connection element. The HF coaxial connection element comprises a torque limiter configured for detachably connecting the HF coaxial connection element with the corresponding HF coaxial connection element with a predetermined torque, a centering element for centering the HF coaxial connection element with respect to the corresponding HF coaxial connection element and a twist protection element for preventing twisting motion between the HF coaxial connection element and the corresponding HF coaxial connection element. A corresponding torque limiter is also provided.

Abstract: A differential signal measurement system is provided. The differential signal measurement system includes a measurement device, with at least one differential signal input, a differential connection interface configured to connect the at least one differential signal input of the measurement device to a device under test, and a differential signal source, with at least one differential signal output, configured to generate at least one differential output signal. The differential connection interface is further configured to pass the at least one differential output signal to the at least one differential signal input of the measurement device, and the measurement device is configured to capture the at least one differential output signal.

Abstract: A probe correction system is provided. Said probe correction system comprises a time domain reflectometry signal source comprising at least one output port. A test fixture comprises at least one probing point and at least one input port configured to be connectable to the at least one output port. A measurement device comprises at least one input channel. A probe under test comprises at least one probe input port configured to be connectable to the at least one probing point of the test fixture and at least one probe output port configured to be connectable to at least one input channel of the measurement device.

Abstract: A multi-level logic analyzer for analyzing multi-level digital signals comprises a plurality of signal inputs, each signal input being configured to receive a multi-level digital signal, a plurality of comparison units, each comparison unit comprising a first comparator input and a second comparator input and being configured to compare a signal received at the first comparator input with a signal received at the second comparator input, and first switching means configured to couple at least one of the signal inputs with the first comparator inputs of at least two of the comparison units.

Abstract: The invention relates to a real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function for measurements of a device under test (DUT). The real-time oscilloscope comprises at least one built-in generator and at least one real-time measurement channel. The built-in generator is in communication with the real-time measurement channel and the device under test (DUT) and is configured to generate incident signals. The real-time measurement channel is configured to capture incident signals transmitted to and reflected by and/or transmitted by the device under test (DUT).