Abstract: An oscilloscope is described that has a compensation signal generator configured to generate a compensation signal, a probe connector configured to be connected to the passive probe and a detection unit configured to detect whether the passive probe is connected to the probe connector or not. Further, a test and measurement system and a method are described.

Abstract: A signal correction method for correcting a measured signal has the following steps: processing a digital representation of a first signal at a first measurement input; processing a digital representation of a second signal at a second measurement input corresponding to the first signal convoluted with a transfer function; and determining the transfer function for correcting the measured signal. Further, a use of the method, a system for correcting a measured signal, and an oscilloscope are provided.

Abstract: The present invention provides a measurement equipment configured to be connected to a measurement device. The measurement equipment comprises an HF coaxial connection element and a torque limiter. The torque limiter is configured for connecting the HF coaxial connection element with the measurement device with a predetermined torque. Furthermore, the invention provides an HF coaxial connection element configured to be connected to a corresponding HF coaxial connection element. The HF coaxial connection element comprises a torque limiter configured for detachably connecting the HF coaxial connection element with the corresponding HF coaxial connection element with a predetermined torque. Furthermore, the HF coaxial connection element comprises a centering element for centering the HF coaxial connection element with respect to the corresponding HF coaxial connection element.

Abstract: The invention relates to a real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function for measurements of a device under test (DUT). The real-time oscilloscope comprises at least one built-in generator and at least one real-time measurement channel. The built-in generator is in communication with the real-time measurement channel and the device under test (DUT) and is configured to generate incident signals. The real-time measurement channel is configured to capture incident signals transmitted to and reflected by and/or transmitted by the device under test (DUT).

Abstract: A probe correction system is provided. Said probe correction system comprises a time domain reflectometry signal source comprising at least one output port. A test fixture comprises at least one probing point and at least one input port configured to be connectable to the at least one output port. A measurement device comprises at least one input channel. A probe under test comprises at to least one probe input port configured to be connectable to the at least one probing point of the test fixture and at least one probe output port configured to be connectable to at least one input channel of the measurement device.

Abstract: Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Abstract: A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.

Abstract: A circuit for compensating an offset voltage in an amplifier or a DC component in a signal supplied to the amplifier comprises the amplifier and a first voltage source. The amplifier has at least one measurement signal port and at least two contacts for a supply voltage. Each of two contacts is connected to a different terminal of the first voltage source. The potential at each contact is separated from a ground potential and from an external supply potential.

Abstract: A differential signal measurement system is provided. The differential signal measurement system includes a measurement device, with at least one differential signal input, a differential connection interface configured to connect the at least one differential signal input of the measurement device to a device under test, and a differential signal source, with at least one differential signal output, configured to generate at least one differential output signal. The differential connection interface is further configured to pass the at least one differential output signal to the at least one differential signal input of the measurement device, and the measurement device is configured to capture the at least one differential output signal.

Abstract: A measurement input circuit for a measurement device for measuring an electric signal in a device under test comprises a signal input that receives the electronic signal from the device under test and provides the received electronic signal at a signal node, a direct signal coupling path that is coupled between the signal node an electrical ground and comprises a first impedance value, an alternating signal coupling path that is coupled between the signal node and the electrical ground, and comprises a second impedance value that is lower than the first impedance value, and a signal output that is coupled to the signal node and outputs the received electronic signal.

Abstract: A dynamic probe for probing a dynamic data signal comprising a switching unit configured to provide at least two different input impedances, wherein the switching unit is configured to select a first input impedance in a first mode and a second input impedance in a second mode, the switching unit being configured to be operated dynamically based on an event in the data signal processed. Further, a dynamic measurement system and a method for probing a dynamic data signal are described.

Abstract: An oscilloscope is described that has a compensation signal generator configured to generate a compensation signal, a probe connector configured to be connected to the passive probe and a detection unit configured to detect whether the passive probe is connected to the probe connector or not. Further, a test and measurement system and a method are described.

Abstract: A signal correction method for correcting a measured signal has the following steps: processing a digital representation of a first signal at a first measurement input; processing a digital representation of a second signal at a second measurement input corresponding to the first signal convoluted with a transfer function; and determining the transfer function for correcting the measured signal. Further, a use of the method, a system for correcting a measured signal, and an oscilloscope are provided.

Abstract: A probe for measurements on a device under test with low source impedance is described. The probe has a resistor coupled in series between a probe tip and a probe cable connected to a measuring apparatus. The resistor having an impedance equal to a characteristic impedance of the probe cable or equal to the difference between the characteristic impedance of the probe cable and an output resistance of the device under test. Further, a measuring system and a test setup are described.

Abstract: An adapter for a current probe is described, said adapter being configured to be connected with said current probe. Said adapter enables a voltage measurement by using said adapter and said current probe. Said adapter comprises a current loop and at least one transconductance unit. Said transconductance unit transforms the voltage to be measured into a current wherein the current obtained is forwarded by said current loop. Further, a testing system is described.

Abstract: A test and measurement system for testing a device under test comprises a logic probe with a first probe tip for contacting the device under test, a logic receiver unit connected to the first probe tip for receiving a digital signal from the device under test via the first probe tip, and a DC voltage measuring unit connected to the first probe tip for measuring a DC voltage at the device under test via the first probe tip.

Abstract: A multi-level logic analyzer for analyzing multi-level digital signals comprises a plurality of signal inputs, each signal input being configured to receive a multi-level digital signal, a plurality of comparison units, each comparison unit comprising a first comparator input and a second comparator input and being configured to compare a signal received at the first comparator input with a signal received at the second comparator input, and first switching means configured to couple at least one of the signal inputs with the first comparator inputs of at least two of the comparison units.

Abstract: A dynamic measuring system is described that comprises a measuring device. The measuring system has an acquisition unit and a post processing unit that is configured to post process the digital signal. The post processing unit has at least one signal correction filter being configured to be operated in at least two different modes for processing the digital signal. The signal correction filter has at least a first signal correction filter setting being used in a first mode and a second signal correction filter setting being used in a second mode. In addition, the measuring system has a switching unit that is configured to select the first mode or the second mode, the switching unit being configured to be operated dynamically based on an event in the data signal. The signal correction filter comprises time variable coefficients. Further, a method for probing a dynamic data signal is also described.

Abstract: A logic signal analyzer for analyzing logic signals has a positive measurement input providing a positive measurement input voltage value, a negative measurement input providing a negative measurement input voltage value, a third input providing a third input voltage value, and a comparison unit. The comparison unit being configured to provide a first and a second comparison output voltage value each based on one of at least four comparison modes. The first and second comparison output values are based on different comparison modes.

Abstract: A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.