Patents by Inventor Martin S. Piltch

Martin S. Piltch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10786948
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: September 29, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20200249099
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: November 8, 2019
    Publication date: August 6, 2020
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 10520372
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: June 7, 2019
    Date of Patent: December 31, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20190323903
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: June 7, 2019
    Publication date: October 24, 2019
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Patent number: 10317294
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Grant
    Filed: September 26, 2016
    Date of Patent: June 11, 2019
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, Mark J. Cola, R. Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20180264553
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: May 18, 2018
    Publication date: September 20, 2018
    Applicant: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 9999924
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Grant
    Filed: August 21, 2015
    Date of Patent: June 19, 2018
    Assignee: SIGMA LABS, INC.
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Publication number: 20170016781
    Abstract: An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.
    Type: Application
    Filed: September 26, 2016
    Publication date: January 19, 2017
    Inventors: Vivek R. Dave, Mark J. Cola, Bruce Madigan, Martin S. Piltch, Alberto Castro
  • Publication number: 20160184893
    Abstract: This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e. those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.
    Type: Application
    Filed: August 21, 2015
    Publication date: June 30, 2016
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Publication number: 20160185048
    Abstract: This invention teaches a multi-sensor quality inference system for additive manufacturing. This invention still further teaches a quality system that is capable of discerning and addressing three quality issues: i) process anomalies, or extreme unpredictable events uncorrelated to process inputs; ii) process variations, or difference between desired process parameters and actual operating conditions; and iii) material structure and properties, or the quality of the resultant material created by the Additive Manufacturing process. This invention further teaches experimental observations of the Additive Manufacturing process made only in a Lagrangian frame of reference. This invention even further teaches the use of the gathered sensor data to evaluate and control additive manufacturing operations in real time.
    Type: Application
    Filed: November 18, 2015
    Publication date: June 30, 2016
    Inventors: Vivek R. Dave, David D. Clark, Matias Roybal, Mark J. Cola, Martin S. Piltch, R. Bruce Madigan, Alberto Castro
  • Publication number: 20160098825
    Abstract: The present invention provides a feature extraction system that extracts geometrical features of a part using in-process data acquired during an additive manufacturing process. The geometric features are extracted by applying a number of image processing operations to images taken of a powder bed during the additive manufacturing process. In this way, both internal and external geometries of the part can be characterized. In some embodiments, geometric feature extraction can be used in conjunction with other part characterizing operations, such as for example, thermal characterization processes.
    Type: Application
    Filed: September 30, 2015
    Publication date: April 7, 2016
    Inventors: Vivek R. Dave, R. Bruce Madigan, Mark J. Cola, Martin S. Piltch
  • Patent number: 9110024
    Abstract: System is provided for detecting the presence of an analyte of interest in a sample, said system comprising an elongated, transparent container for a sample; an excitation source in optical communication with the sample, wherein radiation from the excitation source is directed along the length of the sample, and wherein the radiation induces a signal which is emitted from the sample; and, at least two linear arrays disposed about the sample holder, each linear array comprising a plurality of optical fibers having a first end and a second end, wherein the first ends of the fibers are disposed along the length of the container and in proximity thereto; the second ends of the fibers of each array are bundled together to form a single end port.
    Type: Grant
    Filed: March 25, 2010
    Date of Patent: August 18, 2015
    Assignee: Los Alamos National Security, LLC
    Inventors: Martin S. Piltch, Perry Clayton Gray, Richard Rubenstein
  • Publication number: 20120112069
    Abstract: System is provided for detecting the presence of an analyte of interest in a sample, said system comprising an elongated, transparent container for a sample; an excitation source in optical communication with the sample, wherein radiation from the excitation source is directed along the length of the sample, and wherein the radiation induces a signal which is emitted from the sample; and, at least two linear arrays disposed about the sample holder, each linear array comprising a plurality of optical fibers having a first end and a second end, wherein the first ends of the fibers are disposed along the length of the container and in proximity thereto; the second ends of the fibers of each array are bundled together to form a single end port.
    Type: Application
    Filed: March 25, 2010
    Publication date: May 10, 2012
    Applicant: Los Alamos National Security ,LLC.
    Inventors: Martin S. Piltch, Perry Clayton Gray, Richard Rubenstein
  • Publication number: 20110140001
    Abstract: System for high-throughput detection of the presence of an analyte of interest in a sample, said system comprising a multi-well plate sample container; an automated means for successively transporting samples from the multi-well plate sample container to a transparent capillary contained within a sample holder; an excitation source in optical communication with the sample, wherein radiation from the excitation source is directed along the length of the capillary, and wherein the radiation induces a signal which is emitted from the sample; and, at least one linear array comprising: a proximal end disposed in proximity to the sample holder and a single end port distal from the proximal end; a plurality of optical fibers extending from the proximal end to the end port and having a first end and a second end, wherein the first ends of the individual optical fibers are arranged substantially parallel and adjacent to one another, and wherein the second ends of the optical fibers form a non-linearly arranged bundle,
    Type: Application
    Filed: December 13, 2010
    Publication date: June 16, 2011
    Applicant: LOS ALAMOS NATIONAL SECURITY, LLC
    Inventors: Martin S. Piltch, Perry Clayton Gray
  • Publication number: 20100261195
    Abstract: Methods for detection of the presence or absence of PrPSc in a biological sample suspected of having them comprising the steps of concentrating the PrPSc as may be present in the sample by substantially separating the PrPSc from the sample matrix; labeling the concentrated PrPSc with at least one molecular label to produce labeled PrPSc; and detecting the labeled PrPSc on an instrument capable of detecting an attomole quantity of labeled PrPSc, and wherein the duration of time between concentrating the PrPSc and analyzing the labeled PrPSc is about 48 hours or less.
    Type: Application
    Filed: March 25, 2010
    Publication date: October 14, 2010
    Inventors: Richard Rubenstein, Martin S. Piltch, Perry Clayton Gray
  • Patent number: 6874434
    Abstract: An apparatus is disclosed for disposing of biomass material. The apparatus may include a receiving chamber for receiving a biomass, a maceration chamber for macerating the biomass received from the receiving chamber and producing macerated biomass, and an incinerating chamber incinerating the macerated biomass into a incinerated biomass. The apparatus is particularly suited to operate in remote or zero-gravity environments.
    Type: Grant
    Filed: April 18, 2003
    Date of Patent: April 5, 2005
    Assignee: Bigelow Aerospace
    Inventors: Robert T. Bigelow, Martin S. Piltch
  • Patent number: 6576863
    Abstract: Refractory materials, such as fused quartz plates and rods are welded using a heat source, such as a high power continuous wave carbon dioxide laser. The radiation is optimized through a process of varying the power, the focus, and the feed rates of the laser such that full penetration welds may be accomplished. The process of optimization varies the characteristic wavelengths of the laser until the radiation is almost completely absorbed by the refractory material, thereby leading to a very rapid heating of the material to the melting point. This optimization naturally occurs when a carbon dioxide laser is used to weld quartz. As such this method of quartz welding creates a minimum sized heat-affected zone. Furthermore, the welding apparatus and process requires a ventilation system to carry away the silicon oxides that are produced during the welding process to avoid the deposition of the silicon oxides on the surface of the quartz plates or the contamination of the welds with the silicon oxides.
    Type: Grant
    Filed: May 4, 2001
    Date of Patent: June 10, 2003
    Assignee: Regents of the University of California
    Inventors: Martin S. Piltch, Robert W. Carpenter, McIlwaine Archer, III
  • Patent number: 6469794
    Abstract: Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is introduced into a device under test and to a time delay. Light reflected from the interior surfaces of the device under test is introduced into one end of a dye-cell and the time-delayed light is introduced into the other end. The amount of time delay is adjusted to produce two-photon fluorescence in the dye-cell so that the amount of time delay is representative of the interior surfaces of the device under test.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: October 22, 2002
    Inventors: Martin S. Piltch, R. Alan Patterson, Gerald W. Leeches, John Van Nierop, John J. Teti, Jr.
  • Patent number: 6229617
    Abstract: Apparatus and method for inspecting the interior surfaces of devices such as vessels having a single entry port. Laser energy is launched into the vessel, and the light reflected from the interior surfaces is interfered with reference laser energy to produce an interference pattern. This interference pattern is analyzed to reveal information about the condition of the interior surfaces of the device inspected.
    Type: Grant
    Filed: February 4, 1999
    Date of Patent: May 8, 2001
    Assignee: The Regents of the University of California
    Inventors: Martin S. Piltch, R. Alan Patterson, Gerald W. Leeches, John Van Nierop, John J. Teti
  • Patent number: 5367141
    Abstract: Apparatus for the cutting of garment patterns from one or more layers of fabric. A laser capable of producing laser light at an ultraviolet wavelength is utilized to shine light through a pattern, such as a holographic phase filter, and through a lens onto the one or more layers of fabric. The ultraviolet laser light causes rapid photochemical decomposition of the one or more layers of fabric, but only along the pattern. The balance of the fabric of the one or more layers of fabric is undamaged.
    Type: Grant
    Filed: March 26, 1993
    Date of Patent: November 22, 1994
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: Martin S. Piltch