Abstract: Techniques relate to dynamic complex fault model generation for diagnostics simulation and pattern generation. Inline fabrication parametric data is received, and the inline fabrication parametric data is a collection of physical measurements made on a device under test during a manufacturing fabrication of the device under test. A fault model of defects is generated according to the inline fabrication parametric data, where the fault model is based on a physical design of the device under test combined with the inline fabrication parametric data for the device under test. Test patterns are generated based on the fault model and the inline fabrication parametric data, such that the test patterns are configured to test the device under test in order to obtain results that are based on the inline fabrication parametric data. A simulation is run of the device under test using the results and the inline fabrication parametric data.

Abstract: According to an embodiment of the present invention, a computer-implemented method for testing a microelectronic chip is described. The method may include dividing, via a processor running a scanning engine, a plurality of sections of the microelectronic chip. Each of the plurality of sections includes at least two latch sets in at least one scan chain. The method may further include determining, via the processor, based on the dividing, whether each of the plurality of sections fail a data test. The determining comprises interleaving the plurality of sections by scanning, via the processor, an alternating latch set from each scan chain in a first section, and scanning an alternating latch set from each scan chain in a second section.

Abstract: Embodiments include methods, and processing system, and computer program products providing portion isolation design to a chip design to facilitate partial-good portion isolation test of the chip. Aspects include: retrieving a chip design file of a chip, the chip design file having pin related information from a chip design database, generating, via a pin group utility module, a pin group file according to the pin related information retrieved, combining, via a portion wrapper insertion utility module, the pin group file with one or more portion netlists to form one or more localized portion wrapper segments, stitching, via the portion wrapper insertion utility module, the one or more localized portion wrapper segments to form a portion boundary wrapper chain, and inserting, via the portion wrapper insertion utility module, the portion boundary wrapper chain into the chip design file to facilitate partial-good portion isolation test.

Abstract: Embodiments are directed to a computer implemented method and system for the testing, characterization and diagnostics of integrated circuits. A system might include a device under test, such as an integrated circuit, that includes an adaptive microcontroller. The method includes loading a testing program for execution by the adaptive microcontroller, causing the microcontroller to execute the testing program. Once results from the testing program are received, the testing program can be adaptively modified based on the results. The modified testing program can be run again. The testing program can modify parameters of the integrated circuit that are not externally accessible. Other embodiments are also disclosed.

Abstract: A tool for determining unknown sources in a circuit design for exclusion from logic built-in self test (LBIST) verification for the circuit. Responsive to initializing each of one or more latches in one or more test channels of the circuit design being tested, the tool determines whether a latch of the one or more latches is corrupted by an unknown source. The tool gathers each of the one or more latches determined to be an unknown source after a capture clock phase. The tool performs a backward traverse of logic circuitry feeding each of the one or more latches determined to be an unknown source. The tool verifies that a fence on one or more unknown source nets associated with each of the one or more latches blocked the unknown source from contributing to a test signature.

Abstract: Aspects include techniques for bypassing an encoded latch on a chip during a test-pattern scan and using on-chip circuitry to generate a desired encoded pattern, which is inserted into a scan-bypassed latch, to test the on-chip circuitry for defects. A computer-implemented method may include applying a global control bit to the chip; initializing a scan of the chip while bypassing the encoded latch; and applying an extra scan clock to initiate the encoded latch after completing the scan, wherein the encoded latch is updated with check bits generated by the on-chip circuitry.

Abstract: Aspects include techniques for implementing a clock path technique for using on-chip circuitry to generate a correct encode pattern to test the on-chip circuitry for encoding and correction of a chip. A computer-implemented method may include initializing a scan of the chip including data and a set of check bits protecting the data; applying a global control bit to a latch on the chip; and applying an additional clock to the latch so the check bits are updated using the on-chip circuitry.

Abstract: Aspects include techniques for implementing a clock path technique for using on-chip circuitry to generate a correct encode pattern to test the on-chip circuitry for encoding and correction of a chip. A computer-implemented method may include initializing a scan of the chip including data and a set of check bits protecting the data; applying a global control bit to a latch on the chip; and applying an additional clock to the latch so the check bits are updated using the on-chip circuitry.

Abstract: Aspects include techniques for bypassing an encoded latch on a chip during a test-pattern scan and using on-chip circuitry to generate a desired encoded pattern, which is inserted into a scan-bypassed latch, to test the on-chip circuitry for defects. A computer-implemented method may include applying a global control bit to the chip; initializing a scan of the chip while bypassing the encoded latch; and applying an extra scan clock to initiate the encoded latch after completing the scan, wherein the encoded latch is updated with check bits generated by the on-chip circuitry.

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

Abstract: A failing latch is identified on a chip including a plurality of latches with the failing latch receiving data propagated from a first set of test input latches. A diagnostic set of latches is determined which includes the failing latch and a set of related latches. The set of related latches each receives data propagated from at least one test input latch from the first set of test input latches. The set of related latches is identified from a related latches table. One or more tests are performed on the chip and test output data is collected from the diagnostic set of latches. The related latches table is created by tracing from a target latch.

Abstract: Techniques relate to an interactive logic diagnostic process. A diagnostic iteration loop is performed. When a critical failure does not have the diagnostic resolution that meets a predefined diagnostic resolution, potential faults related to the critical failure are isolated. When the critical failure has a diagnostic resolution that meets the predefined diagnostic resolution, the diagnostic iteration loop ends. Path focused fault test patterns are applied to the device under test in order to generate updated results of the path focused fault test patterns, such that the diagnostic resolution has been increased because a number of the potential faults related to the critical failure has decreased, and/or a size of a physical area of the potential faults related to the critical failure has decreased. The diagnostic iteration loop is returned to.

Abstract: Techniques relate to dynamic complex fault model generation for diagnostics simulation and pattern generation. Inline fabrication parametric data is received, and the inline fabrication parametric data is a collection of physical measurements made on a device under test during a manufacturing fabrication of the device under test. A fault model of defects is generated according to the inline fabrication parametric data, where the fault model is based on a physical design of the device under test combined with the inline fabrication parametric data for the device under test. Test patterns are generated based on the fault model and the inline fabrication parametric data, such that the test patterns are configured to test the device under test in order to obtain results that are based on the inline fabrication parametric data. A simulation is run of the device under test using the results and the inline fabrication parametric data.

Abstract: Aspects include a method for logic built-in self-testing (LBIST) for use in an integrated circuit with scan chains. The method includes programming a product control generator and a pattern generator with an LBIST pattern comprising at least a number of loops. The LBIST pattern is executed by generating scan-in test values for scan chains with the pattern generator and controlling at least one test parameter with the product control generator. Scan-out responses are collected from the scan chains in a signature register, and a start request is received from a chip tester. The LBIST is started in response to the start request. Test summary data is reported to the chip tester before the whole number of loops has been executed.

Abstract: Aspects include a method for logic built-in self-testing (LBIST) for use in an integrated circuit with scan chains. The method includes programming a product control generator and a pattern generator with an LBIST pattern comprising at least a number of loops. The LBIST pattern is executed by generating scan-in test values for scan chains with the pattern generator and controlling at least one test parameter with the product control generator. Scan-out responses are collected from the scan chains in a signature register, and a start request is received from a chip tester. The LBIST is started in response to the start request. Test summary data is reported to the chip tester before the whole number of loops has been executed.

Abstract: Aspects include a system having logic built-in self-test (LBIST) circuitry for use in an integrated circuit with scan chains. The system includes a pattern generator configured for generating scan-in test values for said scan chains; a signature register configured for collecting scan-out responses from said scan chains after a clock sequence; an on-product control generator configured for controlling at least one test parameter; one or more microcode array or memory elements configured to receive inputs to initialize fields in the microcode array or memory elements; and a test controller. The test controller includes a reader component configured for reading test parameters from a field of the microcode array or the memory elements; and a programming component configured for configuring the on-product control generator and the pattern generator with a LBIST pattern according to the read test parameters.

Abstract: A tool for determining unknown sources in a circuit design for exclusion from logic built-in self test (LBIST) verification for the circuit. The tool initializes, by one or more computer processors, one or more nets contained in an initial nets list, wherein the initial nets list is a representation of a circuit design being tested. The tool removes, by one or more computer processors, the one or more nets initialized in response to initialization of each of one or more latches in one or more test channels of the circuit design being tested. The tool determines, by one or more computer processors, whether a latch of the one or more latches is corrupted by an unknown source.

Abstract: A number of switching transitions of flip-flops during testing is kept below a threshold. Scan-in test data is applied to the flip-flops. Testing result data scanned-out from the flip-flops is captured, and a prediction is made of a number of switching transitions of the flip-flops between a current capture clock cycle and a next capture clock cycle. Furthermore, the testing setup values are modified before the next testing cycle is executed based on the prediction.

Abstract: A number of switching transitions of flip-flops during testing is kept below a threshold. Scan-in test data is applied to the flip-flops. Testing result data scanned-out from the flip-flops is captured, and a prediction is made of a number of switching transitions of the flip-flops between a current capture clock cycle and a next capture clock cycle. Furthermore, the testing setup values are modified before the next testing cycle is executed based on the prediction.