Patents by Inventor Masahiro Nei

Masahiro Nei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120250944
    Abstract: To determine the state of a subject person with a simple structure, an image determining device includes: an imaging unit that captures an image from a first direction, the image including the subject person; a first detector that detects size information from the image, the size information being about the subject person in the first direction; a second detector that detects position-related information, the position-related information being different from the information detected by the first detector; and a determining unit that determines the state of the subject person, based on a result of the detection performed by the first detector and a result of the detection performed by the second detector.
    Type: Application
    Filed: December 28, 2010
    Publication date: October 4, 2012
    Applicant: NIKON CORPORATION
    Inventors: Tetsuya Yamamoto, Masahiro Nei, Isao Totsuka, Tomoyuki Matsuyama, Masamitsu Yanagihara, Satoshi Hagiwara, Masakazu Sekiguchi
  • Patent number: 8208117
    Abstract: An exposure apparatus exposes a substrate by projecting a pattern image onto the substrate through a liquid. The exposure apparatus includes a projection optical system by which the pattern image is projected onto the substrate, and a movable member which is movable relative to the projection optical system. A liquid-repellent member, at least a part of a surface of which is liquid-repellent, is provided detachably on the movable member, the liquid-repellent member being different from the substrate.
    Type: Grant
    Filed: September 10, 2008
    Date of Patent: June 26, 2012
    Assignee: Nikon Corporation
    Inventors: Soichi Owa, Nobutaka Magome, Shigeru Hirukawa, Yoshihiko Kudo, Jiro Inoue, Hirotaka Kohno, Masahiro Nei, Motokatsu Imai, Hiroyuki Nagasaka, Kenichi Shiraishi, Yasufumi Nishii, Hiroaki Takaiwa
  • Patent number: 8089611
    Abstract: A vacuum system for an immersion exposure apparatus includes a flow passage connected to a vacuum source, and a separator provided on the flow passage. The separator separates any gas from a liquid sucked into the flow passage together with the gas.
    Type: Grant
    Filed: March 6, 2009
    Date of Patent: January 3, 2012
    Assignee: Nikon Corporation
    Inventors: Masahiro Nei, Naoyuki Kobayashi
  • Publication number: 20110222037
    Abstract: An exposure apparatus comprises a liquid immersion system, a first mover, and a prescribed member. The exposure apparatus exposes a substrate via an optical member and a liquid. The liquid immersion system performs supply and recovery of the liquid. The first mover can move in a first area, and can hold the liquid between itself and the optical member. The prescribed member is removed from the first mover when the first mover withdraws from a position opposing the optical member, and can hold the liquid between itself and the optical member.
    Type: Application
    Filed: September 8, 2006
    Publication date: September 15, 2011
    Applicant: Nikon Corporation
    Inventors: Tohru Kiuchi, Takeyuki Mizutani, Masahiro Nei, Masato Hamatani, Masahiko Okumura
  • Patent number: 7834976
    Abstract: An exposure apparatus includes a projection optical system for projecting a pattern on a reticle onto an object to be exposed. The apparatus also includes a reference mark that serves as a reference for an alignment between the reticle and the object. The apparatus also includes a first fluid that has a refractive index of 1 or greater, and fills a space between at least part of said projection optical system and the object and a space between at least part of said projection optical system and the reference mark. In addition, an alignment mechanism aligns the object by using said projection optical system and the first fluid.
    Type: Grant
    Filed: July 7, 2006
    Date of Patent: November 16, 2010
    Assignee: Nikon Corporation
    Inventors: Masahiro Nei, Naoyuki Kobayashi
  • Patent number: 7817244
    Abstract: An exposure apparatus performs exposure for a substrate by filling a space between a projection optical system and the substrate with a liquid and projecting an image of a pattern onto the substrate through the liquid by using the projection optical system. The exposure apparatus includes a substrate stage for holding the substrate, a liquid supply unit for supplying the liquid to a side of an image plane of the projection optical system, and a focus/leveling-detecting system for detecting surface information about a surface of the substrate not through the liquid. The exposure apparatus performs liquid immersion exposure for the substrate while adjusting a positional relationship between the surface of the substrate and the image plane formed through the projection optical system and the liquid, on the basis of the surface information detected by the focus/leveling-detecting system. The liquid immersion exposure can be performed at a satisfactory pattern transfer accuracy.
    Type: Grant
    Filed: October 25, 2006
    Date of Patent: October 19, 2010
    Assignee: Nikon Corporation
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Patent number: 7589820
    Abstract: An exposure apparatus exposes a substrate P by locally filling a side of an image plane of a projection optical system PL with a liquid 50 and projecting an image of a pattern onto the substrate P through the liquid 50 and the projection optical system PL. The exposure apparatus includes a recovery unit 20 which recovers the liquid 50 outflowed to the outside of the substrate P. When the exposure process is performed in accordance with the liquid immersion method, the pattern can be transferred accurately while suppressing any environmental change even when the liquid outflows to the outside of the substrate.
    Type: Grant
    Filed: June 23, 2006
    Date of Patent: September 15, 2009
    Assignee: Nikon Corporation
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Dai Arai, Soichi Owa
  • Publication number: 20090180089
    Abstract: A vacuum system for an immersion exposure apparatus includes a flow passage connected to a vacuum source, and a separator provided on the flow passage. The separator separates any gas from a liquid sucked into the flow passage together with the gas.
    Type: Application
    Filed: March 6, 2009
    Publication date: July 16, 2009
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi
  • Publication number: 20090015808
    Abstract: An exposure apparatus exposes a substrate by projecting a pattern image onto the substrate through a liquid. The exposure apparatus includes a projection optical system by which the pattern image is projected onto the substrate, and a movable member which is movable relative to the projection optical system. A liquid-repellent member, at least a part of a surface of which is liquid-repellent, is provided detachably on the movable member, the liquid-repellent member being different from the substrate.
    Type: Application
    Filed: September 10, 2008
    Publication date: January 15, 2009
    Applicant: NIKON CORPORATION
    Inventors: Soichi Owa, Nobutaka Magome, Shigeru Hirukawa, Yoshihiko Kudo, Jiro Inoue, Hirotaka Kohno, Masahiro Nei, Motokatsu Imai, Hiroyuki Nagasaka, Kenichi Shiraishi, Yasufumi Nishii, Hiroaki Takaiwa
  • Publication number: 20090015816
    Abstract: An exposure apparatus exposes a substrate by projecting a pattern image onto the substrate through a liquid. The exposure apparatus includes a projection optical system by which the pattern image is projected onto the substrate, and a movable member which is movable relative to the projection optical system. A liquid-repellent member, at least a part of a surface of which is liquid-repellent, is provided detachably on the movable member, the liquid-repellent member being different from the substrate.
    Type: Application
    Filed: September 10, 2008
    Publication date: January 15, 2009
    Applicant: NIKON CORPORATION
    Inventors: Soichi Owa, Nobutaka Magome, Shigeru Hirukawa, Yoshihiko Kudo, Jiro Inoue, Hirotaka Kohno, Masahiro Nei, Motokatsu Imai, Hiroyuki Nagasaka, Kenichi Shiraishi, Yasufumi Nishii, Hiroaki Takaiwa
  • Patent number: 7242455
    Abstract: An exposure apparatus performs exposure for a substrate by filling a space between a projection optical system and the substrate with a liquid and projecting an image of a pattern onto the substrate through the liquid by using the projection optical system. The exposure apparatus includes a substrate stage for holding the substrate, a liquid supply unit for supplying the liquid to a side of an image plane of the projection optical system, and a focus/leveling-detecting system for detecting surface information about a surface of the substrate not through the liquid. The exposure apparatus performs liquid immersion exposure for the substrate while adjusting a positional relationship between the surface of the substrate and the image plane formed through the projection optical system and the liquid, on the basis of the surface information detected by the focus/leveling-detecting system. The liquid immersion exposure can be performed at a satisfactory pattern transfer accuracy.
    Type: Grant
    Filed: June 1, 2005
    Date of Patent: July 10, 2007
    Assignee: Nikon Corporation
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Publication number: 20070035711
    Abstract: An exposure apparatus performs exposure for a substrate by filling a space between a projection optical system and the substrate with a liquid and projecting an image of a pattern onto the substrate through the liquid by using the projection optical system. The exposure apparatus includes a substrate stage for holding the substrate, a liquid supply unit for supplying the liquid to a side of an image plane of the projection optical system, and a focus/leveling-detecting system for detecting surface information about a surface of the substrate not through the liquid. The exposure apparatus performs liquid immersion exposure for the substrate while adjusting a positional relationship between the surface of the substrate and the image plane formed through the projection optical system and the liquid, on the basis of the surface information detected by the focus/leveling-detecting system. The liquid immersion exposure can be performed at a satisfactory pattern transfer accuracy.
    Type: Application
    Filed: October 25, 2006
    Publication date: February 15, 2007
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Publication number: 20060250596
    Abstract: An exposure apparatus includes a projection optical system for projecting a pattern on a reticle onto an object to be exposed. The apparatus also includes a reference mark that serves as a reference for an alignment between the reticle and the object. The apparatus also includes a first fluid that has a refractive index of 1 or greater, and fills a space between at least part of said projection optical system and the object and a space between at least part of said projection optical system and the reference mark. In addition, an alignment mechanism aligns the object by using said projection optical system and the first fluid.
    Type: Application
    Filed: July 7, 2006
    Publication date: November 9, 2006
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Publication number: 20060238730
    Abstract: An exposure apparatus exposes a substrate P by locally filling a side of an image plane of a projection optical system PL with a liquid 50 and projecting an image of a pattern onto the substrate P through the liquid 50 and the projection optical system PL. The exposure apparatus includes a recovery unit 20 which recovers the liquid 50 outflowed to the outside of the substrate P. When the exposure process is performed in accordance with the liquid immersion method, the pattern can be transferred accurately while suppressing any environmental change even when the liquid outflows to the outside of the substrate.
    Type: Application
    Filed: June 23, 2006
    Publication date: October 26, 2006
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Dai Arai, Soichi Owa
  • Publication number: 20060227312
    Abstract: In exposing substrate by projecting an image of a pattern onto substrate via projection optical system and liquid, side surface and underside surface of substrate are applied with liquid-repellent treatment. By such a configuration, an exposure method by which when exposing edge areas of the substrate, the exposure can be performed in a condition that a liquid immersion region is formed well and that flowing out of the liquid to the outside of the substrate stage are prevented is provided.
    Type: Application
    Filed: June 8, 2006
    Publication date: October 12, 2006
    Applicant: NIKON CORPORATION
    Inventors: Soichi Owa, Nobutaka Magome, Shigeru Hirukawa, Yoshihiko Kudo, Jiro Inoue, Hirotaka Kohno, Masahiro Nei, Motokatsu Imai, Hiroyuki Nagasaka, Kenichi Shiraishi, Yasufumi Nishii, Hiroaki Takaiwa
  • Publication number: 20060152699
    Abstract: An exposure apparatus performs exposure for a substrate by filling a space between a projection optical system and the substrate with a liquid and projecting an image of a pattern onto the substrate through the liquid by using the projection optical system. The exposure apparatus includes a substrate stage for holding the substrate, a liquid supply unit for supplying the liquid to a side of an image plane of the projection optical system, and a focus/leveling-detecting system for detecting surface information about a surface of the substrate not through the liquid. The exposure apparatus performs liquid immersion exposure for the substrate while adjusting a positional relationship between the surface of the substrate and the image plane formed through the projection optical system and the liquid, on the basis of the surface information detected by the focus/leveling-detecting system. The liquid immersion exposure can be performed at a satisfactory pattern transfer accuracy.
    Type: Application
    Filed: March 10, 2006
    Publication date: July 13, 2006
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Publication number: 20060139614
    Abstract: In exposing substrate by projecting an image of a pattern onto substrate via projection optical system and liquid, side surface and underside surface of substrate are applied with liquid-repellent treatment. By such a configuration, an exposure method by which when exposing edge areas of the substrate, the exposure can be performed in a condition that a liquid immersion region is formed well and that flowing out of the liquid to the outside of the substrate stage are prevented is provided.
    Type: Application
    Filed: December 9, 2005
    Publication date: June 29, 2006
    Applicant: NIKON CORPORATION
    Inventors: Soichi Owa, Nobutaka Magome, Shigeru Hirukawa, Yoshihiko Kudo, Jiro Inoue, Hirotaka Kohno, Masahiro Nei, Motokatsu Imai, Hiroyuki Nagasaka, Kenichi Shiraishi, Yasufumi Nishii, Hiroaki Takaiwa
  • Publication number: 20050219488
    Abstract: An exposure apparatus exposes a substrate P by locally filling a side of an image plane of a projection optical system PL with a liquid 50 and projecting an image of a pattern onto the substrate P through the liquid 50 and the projection optical system PL. The exposure apparatus includes a recovery unit 20 which recovers the liquid 50 outflowed to the outside of the substrate P. When the exposure process is performed in accordance with the liquid immersion method, the pattern can be transferred accurately while suppressing any environmental change even when the liquid outflows to the outside of the substrate.
    Type: Application
    Filed: June 1, 2005
    Publication date: October 6, 2005
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Dai Arai, Soichi Owa
  • Publication number: 20050219489
    Abstract: An exposure apparatus performs exposure for a substrate by filling a space between a projection optical system and the substrate with a liquid and projecting an image of a pattern onto the substrate through the liquid by using the projection optical system. The exposure apparatus includes a substrate stage for holding the substrate, a liquid supply unit for supplying the liquid to a side of an image plane of the projection optical system, and a focus/leveling-detecting system for detecting surface information about a surface of the substrate not through the liquid. The exposure apparatus performs liquid immersion exposure for the substrate while adjusting a positional relationship between the surface of the substrate and the image plane formed through the projection optical system and the liquid, on the basis of the surface information detected by the focus/leveling-detecting system. The liquid immersion exposure can be performed at a satisfactory pattern transfer accuracy.
    Type: Application
    Filed: June 1, 2005
    Publication date: October 6, 2005
    Applicant: NIKON CORPORATION
    Inventors: Masahiro Nei, Naoyuki Kobayashi, Hiroshi Chiba, Shigeru Hirukawa
  • Patent number: 6813004
    Abstract: A main controller sets an exposure control target value according to the transmittance of an optical system measured by means of a sensor prior to exposure or estimated by predetermined calculation, and exposure is controlled according to the set exposure control target value while a reticle pattern is being transferred onto a wafer through the optical system. Since the exposure energy provided to the image surface changes in a unit time per unit area in accordance with the transmittance of the optical system, the exposure control target value is set according to the transmittance of the optical system, and exposure is controlled according to the set control target value. Thus, exposure with a high precision is achieved without being influenced by the variation of the transmittance.
    Type: Grant
    Filed: October 6, 2000
    Date of Patent: November 2, 2004
    Assignee: Nikon Corporation
    Inventors: Takahiro Horikoshi, Takahisa Kikuchi, Masahiro Nei