Patents by Inventor Masakatsu Hasuda

Masakatsu Hasuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ion beam device and ion beam processing method, and holder member
    Publication number: 20050236587
    Abstract: An apparatus has a holder member (21) which holds a sample (3), and a removing beam source (13) which irradiates an inert ion beam onto a cross section (4) of the sample (3) held by a holder member (21) and removes a fracture layer on the cross section (4). Then, the removing beam source (13) is disposed on the holding end side of the sample (3) with respect to the normal L of the cross section (4) so that the irradiating direction of the inert ion beam is tilted at the tilt angle ? to the normal L with respect to the cross section (4).
    Type: Application
    Filed: July 9, 2003
    Publication date: October 27, 2005
    Inventors: Toshio Kodama, Masakatsu Hasuda, Toshiaki Fujii, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi
  • Ion beam apparatus, ion beam processing method and sample holder member
    Patent number: 6838685
    Abstract: An ion beam processing device has a sample holder for fixing a sample on which a section has been formed by irradiation of a specified focused ion beam from a surface side, and gas ion beam irradiation device for irradiating a gas ion beam to a region of the sample fixing using the holder member that contains the section to remove a damage layer on the section. The gas ion beam from the gas ion beam irradiation device irradiates the section from a rear surface side of the sample at a specified incident angle.
    Type: Grant
    Filed: July 29, 2003
    Date of Patent: January 4, 2005
    Assignee: SII Nanotechnology Inc.
    Inventors: Toshio Kodama, Masakatsu Hasuda, Toshiaki Fujii, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi